CN203572848U - Double-centre test probe - Google Patents
Double-centre test probe Download PDFInfo
- Publication number
- CN203572848U CN203572848U CN201320761689.0U CN201320761689U CN203572848U CN 203572848 U CN203572848 U CN 203572848U CN 201320761689 U CN201320761689 U CN 201320761689U CN 203572848 U CN203572848 U CN 203572848U
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- Prior art keywords
- probe
- slender
- test
- boss
- spring
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Abstract
The utility model discloses a double-centre test probe which comprises a probe, a tube body and a spring. The double-centre test probe is characterized in that: the probe is a slender rod, wherein two ends of the slender rod are provided with a top and the middle part of the slender rod is provided with at least one boss; the tube body is a slender tube shell, wherein two ends of the slender tube shell are provided with a flanging; two probes and the spring are sleeved inside the tube body; one top of the probe is connected with the spring in a pressing manner, the other top extends out of the tube body, and the boss is pressed on the flanging, so that the probe can elastically stretch at two ends of the tube body; and the middle part of the probe is a slender stepped rod of one boss, wherein one end of the slender stepped rod is near to the top or is provided with a convex ring structure. Compared with the prior art, the double-centre test probe can meet the 0.5mm testing distance of the thin and smart notebook computer and the mobile phone circuit board, is large in puncture point elastic force and simple in structure, is especially suitable for testing a smaller detection point when the test probes are densely arranged on the fixture carrier plate, and improves the excellence rate and coverage rate of the test performance.
Description
Technical field
The utility model relates to electronic circuit test technical field, specifically a kind of test probe for detection of circuit board Double Tops pin.
Background technology
At present, the detection of printed circuit board (PCB) generally all adopts probe, during detection, conventionally on the circuit of printed circuit board (PCB), test point is set, the direct test point being positioned at tin cream formation ball bumps structure that contacts of probe by automated test device with tip form, measure the relevant electrical parameters such as resistance value, capacitance or inductance value, to judge whether the electrical parameter of each assembly on printed circuit board (PCB) conforms with quality standard.
The problem that prior art exists is: test probe must insert in the sleeve pipe being arranged on support plate and use, the minimum diameter of test probe can only arrive 0.5 mm at present, and then add that sleeve pipe just cannot meet the test spacing of present light and thin notebook computer and circuit board of mobile phone 0.5 mm, and the thorn breakpoint elastic force of probe low (20mil probe routine is 10g), acceptance rate and the coverage rate of probe test performance only have 70 ~ 80%.
Utility model content
The purpose of this utility model is the test probe of a kind of Double Tops pin of providing for the deficiencies in the prior art, adopt two flexible sonde configurations, effectively shortened the test spacing of probe on tool support plate, met greatly less test point on the test spacing of frivolous, dexterous notebook computer and circuit board of mobile phone 0.5 mm and testing circuit board, simple in structure, assembling and use are all very convenient, are especially applicable to the test of micro-circuit board.
The concrete technical scheme that realizes the utility model object is: a kind of test probe of Double Tops pin, comprise probe, body and spring, and be characterized in that described probe is that two ends are provided with top and middle part is at least provided with elongate stepped rod member or the dumbbell shaped rod member of a boss; Described body is the elongate enclosure that two ends are provided with flange; Described spring and two probe sets are contained in body, probe one top and spring crimping, and body and pressure limit, boss top are stretched out in another top, realize two probes at the elastic telescopic at body two ends.
Described probe middle part is the elongate stepped rod member of a boss, and bulge loop structure is located or established in its one end closely top.
The utility model compared with prior art has the test spacing that meets frivolous, dexterous notebook computer and circuit board of mobile phone 0.5 mm, the thorn breakpoint elastic force of probe increases to 60g, the acceptance rate of test performance and coverage rate are increased to more than 95%, simple in structure, easy to make, be especially applicable to less test point on test micro-circuit board, facilitate client to substitute mandrin with thick probe, further reduce the manufacture of product and client's use cost, improve the quality of products and economic benefit.
Accompanying drawing explanation
Fig. 1 is that prior art is specifically applied schematic diagram;
Fig. 2 is the utility model structural representation;
Fig. 3 is probe structure schematic diagram;
Fig. 4 is another example structure schematic diagram of probe;
Fig. 5 is the another example structure schematic diagram of probe;
Fig. 6 is pipe structure schematic diagram;
Fig. 7 is the utility model application schematic diagram;
Fig. 8 is the utility model Another Application schematic diagram;
Fig. 9 is the local enlarged diagram of Fig. 8;
Figure 10 is the another application schematic diagram of the utility model;
Figure 11 is the local enlarged diagram of Figure 10.
Embodiment
Consult accompanying drawing 3, described probe 1 is provided with top 4 and middle part is provided with the elongate stepped rod member of boss 5 for two ends.
Below by the concrete embodiment applying, the utility model is described in further detail.
Consult accompanying drawing 8 ~ accompanying drawing 9, probe 1 of the present utility model is provided with top 4 and middle part is provided with the elongated dumbbell shaped rod member of two boss 5 for two ends, several the utility model are fixedly installed on the upper cover plate 23 of tool, body 2 one end are installed on upper cover plate 23 as being fixedly connected with, body 2 other ends are installed on the tool support plate 18 that is provided with tail end splicing conducting terminal 19 as being fixedly connected with, top 4 elastic top of one probe 1 are pressed in the test point of circuit board, top 4 elastic top of another probe 1 are pressed on tail end splicing conducting terminal 19, test point electric current is by a probe 1, body 2, spring 3 and another probe 1 carry out performance test through tail end splicing conducting terminal 19 access checkout equipments to circuit board.
Embodiment 3
Consult accompanying drawing 10 ~ accompanying drawing 11, probe 1 of the present utility model is provided with top 4 and middle part is provided with the elongate stepped rod member of boss 5 for two ends, 4 places, nearly top, its one end are provided with bulge loop structure 7, several the utility model are fixedly installed on the upper cover plate 23 of tool, body 2 one end are installed on upper cover plate 23 as being fixedly connected with, body 2 other ends are installed on the tool support plate 18 that is provided with grafting conducting terminal 29 as being fixedly connected with, top 4 elastic top of one probe 1 are pressed in the test point of circuit board, another probe 1 socket joint is pegged graft by bulge loop structure 7 and conducting terminal 29 elasticity in conducting terminal 29, test point electric current is by a probe 1, body 2, spring 3 and another probe 1 flow into conducting terminal 19, tail end lead-in wire 30 access checkout equipments by conducting terminal 19 carry out performance test to circuit board.
The utility model is convenient to that test probe is intensive to be arranged on tool support plate, meets the requirement of 0.5 mm test spacing.More than just the utility model is further described, not in order to limit this patent, all is that the utility model equivalence is implemented, within all should being contained in the claim scope of this patent.
Claims (2)
1. a test probe for Double Tops pin, comprises probe (1), body (2) and spring (3), it is characterized in that described probe (1) is provided with elongate stepped rod member or the dumbbell shaped rod member that top (4) and middle part are at least provided with a boss (5) for two ends; Described body (2) is provided with the elongate enclosure of flange (6) for two ends; Described spring (3) is sleeved in body (2) with two probes (1), probe (1) one top (4) and spring (3) crimping, body (2) and pressure limit, boss (5) top (6) are stretched out in another top (4), realize two probes (1) at the elastic telescopic at body (2) two ends.
2. the test probe of Double Tops pin according to claim 1, is characterized in that described probe (1) middle part is the elongate stepped rod member of a boss (5), and its one end closely comes directly towards (4) and locates or establish bulge loop structure (7).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201320761689.0U CN203572848U (en) | 2013-11-28 | 2013-11-28 | Double-centre test probe |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201320761689.0U CN203572848U (en) | 2013-11-28 | 2013-11-28 | Double-centre test probe |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN203572848U true CN203572848U (en) | 2014-04-30 |
Family
ID=50540575
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201320761689.0U Expired - Fee Related CN203572848U (en) | 2013-11-28 | 2013-11-28 | Double-centre test probe |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN203572848U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104777393A (en) * | 2015-04-21 | 2015-07-15 | 东莞华贝电子科技有限公司 | Adjustable screw detecting device |
-
2013
- 2013-11-28 CN CN201320761689.0U patent/CN203572848U/en not_active Expired - Fee Related
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104777393A (en) * | 2015-04-21 | 2015-07-15 | 东莞华贝电子科技有限公司 | Adjustable screw detecting device |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20140430 Termination date: 20161128 |
|
| CF01 | Termination of patent right due to non-payment of annual fee |