CN203534991U - Sheet test piece fixture used for scanning electron microscope (SEM) - Google Patents
Sheet test piece fixture used for scanning electron microscope (SEM) Download PDFInfo
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- CN203534991U CN203534991U CN201320556474.5U CN201320556474U CN203534991U CN 203534991 U CN203534991 U CN 203534991U CN 201320556474 U CN201320556474 U CN 201320556474U CN 203534991 U CN203534991 U CN 203534991U
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- test piece
- sheet test
- electron microscope
- scanning electron
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Abstract
The utility model provides a sheet test piece fixture used for a scanning electron microscope (SEM). The sheet test piece fixture is characterized by consisting of a base, sealing plates respectively connected at two ends of the base in the length direction, grooves connected to the sealing plates, a groove-shaped slideway formed by the two grooves, a sliding block arranged in the groove-shaped slideway, a bolt connected on the sliding block trough a threaded hole, and a gap between the base and the sliding block. The sheet test piece fixture provided by the utility model has the advantages that stationarity of test piece placement is good, an image does not drift, and multiple sheet test pieces with different thickness and width specifications can be placed simultaneously, so that the sheet test piece fixture is high in working efficiency, and easy to operate and implement.
Description
Technical field
The utility model relates to a kind of object clamping fixture, specifically belongs to a kind of scanning electron microscope sheet metal specimens fixture.
Background technology
Laminar sample often will be analyzed in scanning electron microscope laboratory, as thin slice stretching fracture, silicon chip fracture etc.Sample generally will be erect to place and observe.
At present, conventional sample setting method is with conducting resinl, sample to be sticked on sample holder and fixed, or fix with metal backup etc.Employing conducting resinl is adhered fixed, and the deficiency of its existence is to have certain elasticity due to sample deadweight and conducting resinl, and when image magnification at high multiple, the method is easy to occur image drift.Adopt the fixing stationarity of location that exists of metal backup poor, image equally easily produces drift.And above two kinds of methods all can not be observed more sample, once only can scan one simultaneously, and fix while analyzing and need repeatedly vacuumize, cause work efficiency low.
New by looking into, look into and publish in document, the report relevant for a kind of scanning electron microscope with sheet metal specimens fixture, comprising: the multifunctional sample platform of measuring for Electron Back-Scattered Diffraction; The cross section observation platform of scanning electron microscope fixture that comprises fixed block and sliding shoe; The scanning electron microscope analysis specimen holder of being furnished with bolt and spring leaf; Special scanning electron microscope clamp for inlaying samples; Special fixture for scanning electronic microscope; Sample platform of scanning electronic microscope with set bolt; Scanning electron microscope electron back scattering diffraction in-situ stretching device; Scanning electron microscope Multifunctional Loading Attachment; The scanning electron microscope sample holder detecting for strengthening Multi-example; Be used for scanning the microscopical combined type specimen holder of electron-like; Be used for scanning the microscopical plane specimen holder of electron-like.The problem of its solution be have for back scattering diffraction experiment or solve fixing not firm or increase the electric conductivity etc. of cold inlaying samples.
Utility model content
The purpose of this utility model is to overcome the deficiency that prior art exists, and the stationarity that provides a kind of sample to place is good, can place multi-disc and different-thickness and width sample simultaneously, and image does not drift about, the scanning electron microscope that work efficiency is high sheet steel specimen holder.
Realize the technical measures of above-mentioned purpose:
A kind of scanning electron microscope sheet metal specimens fixture, it is: it is by shrouding of base, each connection at base length direction two ends, be connected in the groove on shrouding, the flute profile slideway being formed by two grooves, the gap being contained between bolt, base and the slide block connecting by tapped through hole on slide block in flute profile slideway, slide block form.
Feature of the present utility model is: the stationarity that sample is placed is good, and image does not drift about, and can place multi-disc different-thickness and width specifications sample simultaneously, and work efficiency is high, simple to operate, easily implements.
Accompanying drawing explanation
Fig. 1 is structural representation of the present utility model;
Fig. 2 be in Fig. 1 the A-A of base after being connected with flute profile slideway to view;
Fig. 3 is the plan structure schematic diagram of Fig. 1;
Fig. 4 is the structural representation of slide block in Fig. 1;
In figure: 1-base, 2-flute profile slideway, 3-slide block, 4-bolt, 5-shrouding, 6-gap, 7-groove.
Embodiment
Below in conjunction with accompanying drawing, be described further:
A kind of scanning electron microscope sheet metal specimens fixture: it adopts welding or riveted joint or bolt to be connected to the shrouding 5 that both sides connect by base 1, on base 1 length direction, adopt welding or the groove 7 of riveting on shrouding 5, the flute profile slideway 2 being formed by two grooves 7, the gap 6 being contained between bolt 4, base 1 and the slide block 3 connecting by tapped through hole on slide block 3 in flute profile slideway 2, slide block 3 form.
Operating principle
Coupons is inserted to the gap 6 between slide block 3 and base 1, and swivel bolt 4 makes bolt 4 hold out against coupons, after vacuumizing, can test; In the time will carrying out multi-disc test, select the slide block 3 of corresponding number to clamp.On flute profile slideway 2, sliding slider 3, get final product the spacing between adjusting slider 3 and slide block 3, to be applicable to the sample of different in width.After detection finishes, unclamp bolt 4, take out coupons.
This embodiment is that the best exemplifies, not the restricted enforcement to technical solutions of the utility model.
Claims (1)
1. a scanning electron microscope sheet metal specimens fixture, is characterized in that: its gap by base, at each shrouding connecting of base length direction two ends, between the bolt, base and the slide block that are connected in groove, the flute profile slideway being formed by two grooves on shrouding, are contained in slide block in flute profile slideway, connect by tapped through hole on slide block forms.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201320556474.5U CN203534991U (en) | 2013-09-09 | 2013-09-09 | Sheet test piece fixture used for scanning electron microscope (SEM) |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201320556474.5U CN203534991U (en) | 2013-09-09 | 2013-09-09 | Sheet test piece fixture used for scanning electron microscope (SEM) |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN203534991U true CN203534991U (en) | 2014-04-09 |
Family
ID=50421186
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201320556474.5U Expired - Fee Related CN203534991U (en) | 2013-09-09 | 2013-09-09 | Sheet test piece fixture used for scanning electron microscope (SEM) |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN203534991U (en) |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105522547A (en) * | 2015-12-15 | 2016-04-27 | 贵州黎阳航空动力有限公司 | Auxiliary blade detection device for scanning electron microscope and application method thereof |
| CN105606635A (en) * | 2015-12-29 | 2016-05-25 | 哈尔滨工业大学 | Sample testbed for EBSD (Electron Back-Scattered Diffraction) testing |
| CN105628723A (en) * | 2016-01-25 | 2016-06-01 | 广州纤维产品检测研究院 | Sample platform |
| CN113109375A (en) * | 2021-03-16 | 2021-07-13 | 合肥波林新材料股份有限公司 | Thin-film material scanning electron microscope cross section sample preparation clamp and sample preparation method thereof |
-
2013
- 2013-09-09 CN CN201320556474.5U patent/CN203534991U/en not_active Expired - Fee Related
Cited By (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105522547A (en) * | 2015-12-15 | 2016-04-27 | 贵州黎阳航空动力有限公司 | Auxiliary blade detection device for scanning electron microscope and application method thereof |
| CN105606635A (en) * | 2015-12-29 | 2016-05-25 | 哈尔滨工业大学 | Sample testbed for EBSD (Electron Back-Scattered Diffraction) testing |
| CN105606635B (en) * | 2015-12-29 | 2018-10-02 | 哈尔滨工业大学 | Sampling test platform for EBSD tests |
| CN105628723A (en) * | 2016-01-25 | 2016-06-01 | 广州纤维产品检测研究院 | Sample platform |
| CN105628723B (en) * | 2016-01-25 | 2018-07-27 | 广州纤维产品检测研究院 | Sample stage |
| CN113109375A (en) * | 2021-03-16 | 2021-07-13 | 合肥波林新材料股份有限公司 | Thin-film material scanning electron microscope cross section sample preparation clamp and sample preparation method thereof |
| CN113109375B (en) * | 2021-03-16 | 2022-09-16 | 合肥波林新材料股份有限公司 | Thin-film material scanning electron microscope cross section sample preparation clamp and sample preparation method thereof |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| TR01 | Transfer of patent right |
Effective date of registration: 20170718 Address after: 430083 Qingshan District, Hubei, Wuhan factory before the door No. 2 Patentee after: Wuhan iron and Steel Company Limited Address before: 430080 Wuhan, Hubei Friendship Road, No. 999, Wuchang Patentee before: Wuhan Iron & Steel (Group) Corp. |
|
| TR01 | Transfer of patent right | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20140409 Termination date: 20180909 |
|
| CF01 | Termination of patent right due to non-payment of annual fee |