CN203287470U - High-voltage lossless voltage withstand tester - Google Patents
High-voltage lossless voltage withstand tester Download PDFInfo
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- CN203287470U CN203287470U CN2012206196731U CN201220619673U CN203287470U CN 203287470 U CN203287470 U CN 203287470U CN 2012206196731 U CN2012206196731 U CN 2012206196731U CN 201220619673 U CN201220619673 U CN 201220619673U CN 203287470 U CN203287470 U CN 203287470U
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- constant current
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Abstract
The utility model discloses a high-voltage lossless voltage withstand tester. Two testing contacts are arranged on a high-voltage constant current source, constant current value is equal to a rated safety leakage current value I0 of a device to be tested, and voltage between the two testing contacts is displayed through a voltage meter. Working voltage of the constant current source is provided by a bridge rectifier filtering circuit formed by an isolation boosting transformer, a rectifier bridge and a capacitor, and an input end of the isolation boosting transformer is provided with a power indicating lamp and a safety button. The high-voltage lossless voltage withstand tester is simple in circuit, low in cost, easy to implement and operate, safe and convenient and has remarkable practicality.
Description
Technical field
The utility model relates to a kind of electrical detection instrument, relates in particular to a kind of instrument of measuring electron device or insulating material dc breakdown voltage.
Background technology
Dc breakdown voltage is one of electron device and the most important parameter of electronic material, usually adopt Hi-pot Tester to record, its principle is: to electron device, provide a DC voltage, increase gradually this voltage, when the leakage current of electron device generation equaled setting, the magnitude of voltage of this moment was the dc breakdown voltage that records.
This present class voltage-withstand test instrument circuit is comparatively complicated, and cost is higher, needs to carry out multiple parameters before test and sets, and operation is trouble comparatively, careless mistake easily occurs; Especially the Hi-pot Tester of measuring for the withstand voltage device of height, because output voltage is higher, must equip necessary protective equipment (insulation foot pad, insulating glove, insulation clothes etc., setting parameter) before operation, operate more loaded down with trivial details, in case carelessness, to cause personal injury to the operator, namely have very large potential safety hazard, can not meet the needs of the electrical safety performance test job of development at present fully.
In addition, while adopting present high pressure Hi-pot Tester to measure, while boosting, Control of Voltage is improper, can or cause device to the device injury scraps, and test process is time-consuming longer, therefore generally be applicable to the sampling Detection of product, can not guarantee that device meets standard fully in batches, be not suitable for the voltage-withstand test of certain device yet.
The utility model content
The purpose of this utility model is to provide a kind of circuit simple, with low cost, safe ready, easy operating, and the harmless Hi-pot Tester of high pressure that device under test is not damaged.
The dc breakdown voltage of electronic devices and components is generally to stipulate like this, under the environment temperature and test environment of regulation, device is under high-tension effect, when the leakage current value by it is setting I0, at this moment the magnitude of voltage that bears of measured device is namely the voltage breakdown of this device, leakage current value I0 can be found by relevant criterion, is determined value.
According to above-mentioned principle, the scheme that the utility model adopts is: two test contacts are arranged on a high-voltage constant current source, after connecting device under test, constant current source forms path, the constant current value of design equals the device under test regulation and allows the leakage current value I0 that passes through, the Constant current input end is provided with the test circuit pilot lamp, test contact one side is provided with relay indicating light, and the voltage between two test contacts is shown by voltage table; Constant current source provides operating voltage by the bridge rectifier filter circuit that isolation boosting transformer, rectifier bridge and electric capacity form, and isolation boosting transformer input end is provided with power light and safety switch.
The breakpoint of described safety switch is arranged on live wire.
Described constant current source is connected and composed by stabilivolt W, high back voltage transistors T0 and resistance R 2.
Described high back voltage transistors T0 consists of some complex pipe serial connections according to required withstand voltage.
in above-mentioned constant current source, constant current value is determined by resistance R 2 and stabilivolt W, constant current value equates with the leakage current value I0 of device under test, therefore there is following formula: the base stage of the voltage stabilizing value of constant current value=leakage current value I0=(stabilivolt W-high back voltage transistors T0, magnitude of voltage between emitter)/R2 resistance, leakage current value I0 is determined value, the base stage of high back voltage transistors T0, magnitude of voltage between emitter can obtain through measuring, therefore can basis: R2 resistance=(base stage of the voltage stabilizing value of stabilivolt W-high back voltage transistors T0, magnitude of voltage between emitter)/leakage current value I0, calculate the R2 resistance.
The utlity model has following beneficial effect: test contact is arranged in constant current source, because predefined constant current value equates with the leakage current value I0 of device under test regulation, so after the constant current source conducting, flow through the current value of device under test also for I0, the voltage at device under test two ends is voltage breakdown, and not increased by input voltage and change, therefore can guarantee device under test not to be damaged; It adopts isolation boosting transformer isolation AC network, and safety switch is arranged on live wire, and is provided with a plurality of pilot lamp, can allow the clear and definite instrument electriferous state of operator, careful operation; Access device under test under powering-off state, only need closed safety switch can know voltage breakdown, step is less, and is simple to operate, is of value to the personal safety that guarantees the operator; High back voltage transistors T0 is formed by some complex pipe string groups, withstand voltage height, and cost is low, and withstand voltage can be adjusted the string group quantity of complex pipe as required, can meet the test of high-breakdown-voltage.In sum, this circuit is simple, and is with low cost, easy to implement; Simple to operate, safe ready, have significant practicality.
Description of drawings
Fig. 1 is the utility model circuit diagram.
Embodiment
Shown in accompanying drawing, the emitter of high back voltage transistors T0 is by resistance R 2 ground connection, the base terminal of high back voltage transistors T0 is by stabilivolt W ground connection simultaneously, the test contact A1, the A2 that are used for the connection device under test are arranged on the collector terminal of high back voltage transistors T0, the digital voltmeter of magnitude of voltage between test contact A1, A2 are provided with and show at 2, after device under test was connected, foregoing circuit formed a high-voltage constant current source, and the electric current of the device under test of flowing through is invariable; According to the definition of voltage breakdown, when the leakage current value of passing through was setting I0, the voltage at device under test two ends was voltage breakdown.And magnitude of voltage shows by digital voltmeter, can realize the mensuration of voltage breakdown; Because test circuit adopts constant current source, the electric current of the device under test of flowing through is the safety electric flow valuve that device allows, and, therefore can guarantee that device under test exempts from destruction, realizes so-called harmless voltage-withstand test.
In above-mentioned high-voltage constant current source, the adjustment of constant current value is the most key, its leakage current value I0 with the device under test regulation is equated, can be found out by diagram, constant current value is determined by resistance R 2 and stabilivolt W, there is following formula: the resistance of the voltage between voltage stabilizing value-A3A4 of constant current value=leakage current value I0=(stabilivolt W)/R2, because leakage current value I0 is determined value (by relevant criterion, being found), the voltage stabilizing value of stabilivolt W and the voltage between A3A4 can obtain through measuring, for determined value, therefore be not difficult to calculate the R2 resistance.
Isolation boosting transformer GLBY, rectifier bridge and direct earth capacitance C form bridge rectifier filter circuit, and it provides operating voltage for high-voltage constant current source, and isolation boosting transformer GLBY input end is provided with safety switch AN on live wire.
Constant-current source circuit is provided with the test circuit pilot lamp of resistance R 1, light emitting diode FG1 formation, and its meaning is to show whether high-voltage constant current source has the high voltage input, and namely whether operator's console is in electriferous state, in order to warn careful operation; Test contact one side is provided with light emitting diode FG2, and it is relay indicating light, after the device under test access, forms path between test contact A1, A2, and relay indicating light FG2 is bright, and its meaning is to show the access situation of device under test; Simultaneously, the alternating current input end of isolation boosting transformer GLBY is provided with light emitting diode FG3 between live wire and zero line, it is power light, when contact A 7, A6 are connected with AC network, power light is bright, and its meaning is whether display instrument has connected AC network.
because this instrument is tested mainly for the device in having high-breakdown-voltage, high back voltage transistors T0 should have very high withstand voltage could meet test request, and general complex pipe is withstand voltage not, therefore high back voltage transistors T0 adopts the means of many group complex pipe serial connections to improve its high withstand voltage purpose, concrete method of attachment is: the complex pipe emitter connects the collector of back complex pipe, the emitter of last complex pipe and base stage are respectively as emitter and the base stage of high back voltage transistors T0, common collector as high back voltage transistors T0 after the base stage of all the other complex pipes is connected by figure with the collector of first complex pipe, balanced for guaranteeing the voltage drop between some complex pipes, the base terminal of complex pipe is provided with divider resistance R, as long as make the electric current I that flows through resistance R be far longer than the current Ib that flows through complex pipe base stage and emitter, just can guarantee that the voltage drop between complex pipe is balanced.
Illustrated high back voltage transistors T0 consists of three groups of complex pipe string groups, and complex pipe is formed by connecting by some triodes respectively, and diagram is take three as example.
This circuit diagram is a kind of embodiment of the present utility model, is intended to illustrate principle of work, the utility model protection domain is not caused restriction,, according to the utility model aim, has multiple method of attachment, all belongs to the utility model protection domain.
Claims (6)
1. a high pressure can't harm Hi-pot Tester, it is characterized in that: two test contacts are arranged on a high-voltage constant current source, after connecting device under test, constant current source forms path, and constant current value equates with the safe leakage current value I0 of the regulation of device under test, the Constant current input end is provided with the test circuit pilot lamp, test contact one side is provided with relay indicating light, and the voltage between two test contacts is shown by voltage table; Constant current source provides operating voltage by the bridge rectifier filter circuit that isolation boosting transformer, rectifier bridge and electric capacity form, and isolation boosting transformer input end is provided with power light and safety switch.
2. the harmless Hi-pot Tester of a kind of high pressure as claimed in claim 1, is characterized in that, the breakpoint of safety switch is arranged on live wire.
3. a kind of high pressure as claimed in claim 1 can't harm Hi-pot Tester, it is characterized in that, described constant current source is connected and composed by stabilivolt W, high back voltage transistors T0 and resistance R 2, and emitter terminal is by resistance R 2 ground connection, and the base terminal of high back voltage transistors T0 is by stabilivolt W ground connection simultaneously.
4. the harmless Hi-pot Tester of a kind of high pressure as claimed in claim 3, is characterized in that R2 resistance=(the voltage stabilizing value of stabilivolt W-base stage of high back voltage transistors T0, the magnitude of voltage between emitter)/leakage current value I0.
5. the harmless Hi-pot Tester of a kind of high pressure as claimed in claim 3, is characterized in that, described high back voltage transistors T0 consists of some complex pipe serial connections according to required withstand voltage.
6. the harmless Hi-pot Tester of a kind of high pressure as claimed in claim 5, is characterized in that, complex pipe is formed by connecting by some triodes respectively.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2012206196731U CN203287470U (en) | 2012-11-22 | 2012-11-22 | High-voltage lossless voltage withstand tester |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2012206196731U CN203287470U (en) | 2012-11-22 | 2012-11-22 | High-voltage lossless voltage withstand tester |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN203287470U true CN203287470U (en) | 2013-11-13 |
Family
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN2012206196731U Expired - Lifetime CN203287470U (en) | 2012-11-22 | 2012-11-22 | High-voltage lossless voltage withstand tester |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN203287470U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103207356A (en) * | 2012-11-22 | 2013-07-17 | 山东明华光电科技有限公司 | High-voltage lossless dielectric strength tester |
-
2012
- 2012-11-22 CN CN2012206196731U patent/CN203287470U/en not_active Expired - Lifetime
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103207356A (en) * | 2012-11-22 | 2013-07-17 | 山东明华光电科技有限公司 | High-voltage lossless dielectric strength tester |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| C56 | Change in the name or address of the patentee | ||
| CP03 | Change of name, title or address |
Address after: 253000, Shandong, Lingxian County province Dezhou Economic Development Zone Xingguo street, South First Patentee after: SHANDONG KOUGIN LIGHTING TECHNOLOGY CO.,LTD. Address before: 253500, Shandong, Lingxian County province Dezhou Economic Development Zone Xingguo street, South First Patentee before: Shandong Minghua Photoelectric Technology Co.,Ltd. |
|
| PE01 | Entry into force of the registration of the contract for pledge of patent right |
Denomination of utility model: High-voltage lossless dielectric strength tester Effective date of registration: 20161202 Granted publication date: 20131113 Pledgee: Bank of Dezhou Limited by Share Ltd. Road 38 branch Pledgor: SHANDONG KOUGIN LIGHTING TECHNOLOGY CO.,LTD. Registration number: 2016990001045 |
|
| PLDC | Enforcement, change and cancellation of contracts on pledge of patent right or utility model | ||
| PC01 | Cancellation of the registration of the contract for pledge of patent right | ||
| PC01 | Cancellation of the registration of the contract for pledge of patent right |
Date of cancellation: 20191203 Granted publication date: 20131113 Pledgee: Bank of Dezhou Limited by Share Ltd. Road 38 branch Pledgor: SHANDONG KOUGIN LIGHTING TECHNOLOGY CO.,LTD. Registration number: 2016990001045 |
|
| PE01 | Entry into force of the registration of the contract for pledge of patent right | ||
| PE01 | Entry into force of the registration of the contract for pledge of patent right |
Denomination of utility model: High-voltage lossless dielectric strength tester Effective date of registration: 20191203 Granted publication date: 20131113 Pledgee: Bank of Dezhou Limited by Share Ltd. Road 38 branch Pledgor: SHANDONG KOUGIN LIGHTING TECHNOLOGY CO.,LTD. Registration number: Y2019990000649 |
|
| CX01 | Expiry of patent term | ||
| CX01 | Expiry of patent term |
Granted publication date: 20131113 |