CN203117265U - Novel voltage detection circuit - Google Patents
Novel voltage detection circuit Download PDFInfo
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- CN203117265U CN203117265U CN 201320125878 CN201320125878U CN203117265U CN 203117265 U CN203117265 U CN 203117265U CN 201320125878 CN201320125878 CN 201320125878 CN 201320125878 U CN201320125878 U CN 201320125878U CN 203117265 U CN203117265 U CN 203117265U
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- 238000001514 detection method Methods 0.000 title abstract 2
- 238000006243 chemical reaction Methods 0.000 claims abstract description 9
- 230000002093 peripheral effect Effects 0.000 claims description 55
- 239000004065 semiconductor Substances 0.000 claims description 8
- 239000003990 capacitor Substances 0.000 claims description 5
- 230000003993 interaction Effects 0.000 claims description 4
- 238000001914 filtration Methods 0.000 claims description 3
- 238000004891 communication Methods 0.000 abstract description 2
- 238000010586 diagram Methods 0.000 description 6
- 238000005516 engineering process Methods 0.000 description 2
- 238000007667 floating Methods 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- 230000007958 sleep Effects 0.000 description 2
- 230000005059 dormancy Effects 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
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Abstract
The utility model provides a novel voltage detection circuit which comprises a LIN (local interconnect network) chip, an external interface circuit connected with a LIN pin of the LIN chip, a voltage division circuit connected with an INH pin of the LIN chip, and an external controller connected with the LIN chip and the voltage division circuit respectively. The LIN chip and the outside are in LIN communication through the external interface circuit, the external controller controls the INH pin of the LIN chip to output first power supply voltage which is divided through the voltage division circuit to output second power supply voltage, and the external controller collects the second power supply voltage which serves as power supply voltage after AD (analog to digital) conversion and waveform operation. The INH pin of the LIN chip is used to output a high level which is divided through the voltage division circuit and then collected by the controller to acquire the power supply voltage to complete a power supply management function, power supply voltage collection accuracy is relatively improved, and dormant current is reduced.
Description
Technical field
The utility model relates to automobile control technology field, in particular, relates to a kind of novel voltage testing circuit.
Background technology
At present, for the vehicle dormer window controller, its power management is basic requirements, simultaneously, for acquisition precision and the quiescent current of supply voltage higher requirement is arranged also, and general quiescent current is less than 0.1mA.Existing current techique scheme for the supply voltage collection is to adopt directly power supply is carried out voltage acquisition, or by controllable power supply circuit supply voltage is gathered.
But, directly the controller power supply is carried out voltage acquisition, though precision is higher, for normal electric system, can increase the quiescent current of system, be difficult to satisfy car load for the requirement of skylight control module quiescent current; And adopt controllable power supply circuit that supply voltage is gathered, by controller can control circuit shutoff and conducting, under dormant state, by turn-offing output, can reduce quiescent current, but reduce the precision that supply voltage is gathered.
Therefore, how effectively reducing quiescent current under the prerequisite that satisfies the supply voltage acquisition precision, is the technical matters that those skilled in the art need to be resolved hurrily.
The utility model content
In view of this, the utility model provides a kind of novel voltage testing circuit, to solve the problem that can not effectively reduce quiescent current in the prior art under the prerequisite that satisfies the supply voltage acquisition precision.
For achieving the above object, the utility model provides following technical scheme:
A kind of novel voltage testing circuit, comprise: LIN chip, the external interface circuit that links to each other with the LIN pin of described LIN chip, the bleeder circuit that links to each other with the INH pin of described LIN chip and the peripheral control unit that links to each other with described bleeder circuit with described LIN chip respectively, wherein
Described LIN chip carries out LIN by described external interface circuit with the external world and communicates by letter;
Described peripheral control unit is controlled the INH pin of described LIN chip and is exported first supply voltage;
Described first supply voltage carries out dividing potential drop through described bleeder circuit, output second source voltage;
Described peripheral control unit is gathered described second source voltage, through after AD conversion and the waveform computing as supply voltage.
Preferably, described bleeder circuit comprises two resistance in seriess, i.e. first resistance and second resistance, one end of described first resistance links to each other with the INH pin of described LIN chip, one end ground connection of described second resistance, described peripheral control unit links to each other with the public junction of described first resistance and described second resistance.
Preferably, also comprise:
Be connected the capacitor that described novel voltage testing circuit is carried out signals collecting filtering with described peripheral control unit.
Preferably, described LIN chip links to each other with described peripheral control unit, by receiving the control signal that described peripheral control unit sends, controls closing of described LIN chip internal metal-oxide-semiconductor.
Preferably, the RXD pin of described LIN chip links to each other with described peripheral control unit with the TXD pin, and carries out data interaction between the described peripheral control unit.
Preferably, the SLP_N pin of described LIN chip links to each other with described peripheral control unit, receives the working state signal that described peripheral control unit is used for the described LIN chip of control.
Via above-mentioned technical scheme as can be known, compared with prior art, the utility model openly provides a kind of novel voltage testing circuit, comprise: LIN chip, the external interface circuit that links to each other with the LIN pin of described LIN chip, the bleeder circuit that links to each other with the INH pin of described LIN chip and the peripheral control unit that links to each other with described bleeder circuit with described LIN chip respectively, wherein, described LIN chip carries out LIN by described external interface circuit with the external world and communicates by letter; Described peripheral control unit is controlled the INH pin of described LIN chip and is exported first supply voltage; Described first supply voltage carries out dividing potential drop through described bleeder circuit, output second source voltage; Described peripheral control unit is gathered described second source voltage, through after AD conversion and the waveform computing as supply voltage.This novel voltage testing circuit is by using the INH pin output high level of LIN chip, and after carrying out dividing potential drop by bleeder circuit, collects supply voltage by peripheral control unit, finishes power management function, and improved the precision that supply voltage is gathered relatively; In addition, for the metal-oxide-semiconductor that the LIN chip internal adopts, the INH pin that can control the LIN chip in control procedure turn-offs, and effectively reduces quiescent current.
Description of drawings
In order to be illustrated more clearly in the utility model embodiment or technical scheme of the prior art, to do to introduce simply to the accompanying drawing of required use in embodiment or the description of the Prior Art below, apparently, accompanying drawing in describing below only is embodiment of the present utility model, for those of ordinary skills, under the prerequisite of not paying creative work, can also obtain other accompanying drawing according to the accompanying drawing that provides.
Fig. 1 is the disclosed a kind of novel voltage testing circuit structured flowchart of the utility model embodiment;
Fig. 2 is the disclosed a kind of novel voltage testing circuit concrete structure synoptic diagram of the utility model embodiment;
Fig. 3 is the whole theory structure block diagram of the disclosed a kind of novel voltage testing circuit of the utility model embodiment;
Fig. 4 is the internal circuit block diagram of the disclosed LIN chip of the utility model embodiment.
Embodiment
Below in conjunction with the accompanying drawing among the utility model embodiment, the technical scheme among the utility model embodiment is clearly and completely described, obviously, described embodiment only is the utility model part embodiment, rather than whole embodiment.Based on the embodiment in the utility model, those of ordinary skills are not making the every other embodiment that obtains under the creative work prerequisite, all belong to the scope of the utility model protection.
The utility model openly provides a kind of novel voltage testing circuit, comprise: LIN chip, the external interface circuit that links to each other with the LIN pin of LIN chip, the bleeder circuit that links to each other with the INH pin of LIN chip and the peripheral control unit that links to each other with bleeder circuit with the LIN chip respectively, wherein, the LIN chip carries out LIN by external interface circuit with the external world and communicates by letter; The INH pin of peripheral control unit control LIN chip is exported first supply voltage; First supply voltage carries out dividing potential drop through bleeder circuit, output second source voltage; Peripheral control unit is gathered described second source voltage, through after AD conversion and the waveform computing as supply voltage.This novel voltage testing circuit is by using the INH pin output high level of LIN chip, and after carrying out dividing potential drop by bleeder circuit, collects supply voltage by peripheral control unit, finishes power management function, and improved the precision that supply voltage is gathered relatively; In addition, for the metal-oxide-semiconductor that the LIN chip internal adopts, the INH pin that can control the LIN chip in control procedure turn-offs, and effectively reduces quiescent current.
See also accompanying drawing 1, be the disclosed a kind of novel voltage testing circuit structured flowchart of the utility model embodiment.The utility model embodiment discloses a kind of novel voltage testing circuit, concrete structure sees also accompanying drawing 1, comprise: LIN chip 101, the external interface circuit 102 that links to each other with the LIN pin of described LIN chip 101, the bleeder circuit 103 that links to each other with the INH pin of described LIN chip 101 and the peripheral control unit 104 that links to each other with described bleeder circuit 103 with described LIN chip 101 respectively, wherein, described LIN chip 101 carries out LIN by described external interface circuit 102 with the external world and communicates by letter; The INH pin of the described LIN chip 101 of described peripheral control unit 104 controls is exported first supply voltage, and the described first supply voltage normal range of operation is 9～16V; Described first supply voltage carries out dividing potential drop through described bleeder circuit 103, output second source voltage; Described peripheral control unit 104 is gathered described second source voltage, through after AD conversion and the waveform computing as supply voltage.
The INH pin of the described LIN chip 101 of described peripheral control unit 104 controls is exported first supply voltage, behind bleeder circuit 103, output second source voltage is gathered the INH pin voltage with peripheral control unit 104 again, through after AD conversion and the waveform computing as the supply voltage collection.The first supply voltage scope described above is 0～24V, but normal range of operation is 9～16V.
The utility model openly provides a kind of novel voltage testing circuit, this novel voltage testing circuit is by using the INH pin output high level of LIN chip, and after carrying out dividing potential drop by bleeder circuit, collect supply voltage by peripheral control unit, finish power management function, and improved the precision that supply voltage is gathered relatively.
Preferably, see also accompanying drawing 2, be the disclosed a kind of novel voltage testing circuit concrete structure synoptic diagram of the utility model embodiment.Concrete described bleeder circuit comprises two resistance in seriess, i.e. first resistance R 1 and second resistance R 2, one end of described first resistance R 1 links to each other with the INH pin of described LIN chip, one end ground connection of described second resistance R 2, described peripheral control unit links to each other with the public junction of described first resistance R 1 and described second resistance R 2.
The scope of first supply voltage of the INH pin output of above-mentioned LIN chip is 0～24V, and be 9～16V during operate as normal, but the magnitude of voltage of controller collection can only be the magnitude of voltage less than 5V, therefore need the advanced bleeder circuit of crossing, first supply voltage is carried out exporting after the dividing potential drop, and peripheral control unit is gathered the second source voltage in the range of voltage values.
See also accompanying drawing 3, be the whole theory structure block diagram of the disclosed a kind of novel voltage testing circuit of the utility model embodiment.On the basis of above-mentioned disclosed a kind of novel voltage testing circuit, this novel voltage testing circuit also comprises: be connected with described peripheral control unit, described novel voltage testing circuit carried out the capacitor C1 of signals collecting filtering.As shown in Figure 3, peripheral control unit MCU links to each other with the novel voltage testing circuit that the utility model provides by MCU_AD, gathers the INH port voltage, gathers as supply voltage; Peripheral control unit MCU links to each other with the TXD pin with the RXD pin of LIN chip with LINRXD_PTE0 by LINRXD_PTE1, carries out data interaction with the LIN chip; Peripheral control unit MCU links to each other with the SLP_N pin of LIN chip by LINRXD_PTE2, realizes that peripheral control unit is to the control of LIN chip.The NWAKE pin of LIN chip is through a capacitor C2 ground connection.The BAT pin of LIN chip links to each other by a capacitor C3 with the GND pin, an end ground connection, and another termination VB is for the LIN chip is powered.The LIN pin of LIN chip is adjusted circuit by one, and with supply voltage output, concrete adjustment circuit sees also shown in the accompanying drawing 3.
Preferably, consult accompanying drawing 4, be the internal circuit block diagram of the disclosed LIN chip of the utility model embodiment.The inner structure of LIN chip specifically mainly comprises a controller and a metal-oxide-semiconductor as shown in Figure 4.Described LIN chip links to each other with described peripheral control unit by SLP_N control pin, by receiving the control signal that described peripheral control unit sends, controls closing of described LIN chip internal metal-oxide-semiconductor.The RXD pin of described LIN chip links to each other with described peripheral control unit with the TXD pin, and carries out data interaction between the described peripheral control unit.The SLP_N pin of described LIN chip links to each other with described peripheral control unit, receives the working state signal that described peripheral control unit is used for the described LIN chip of control.
When operate as normal, the INH pin of LIN chip output high level, by divider resistance INH pin output voltage is carried out dividing potential drop after, by peripheral control unit to voltage acquisition, after AD conversion and waveform computing, as supply voltage; When system enters dormancy, by the SLP_N pin output control signal t of peripheral control unit
(SLP_N=0)T
Gotosleep, control LIN chip enters the Sleep state, turn-offs the metal-oxide-semiconductor of chip internal, makes the INH pin of LIN chip be in the Floating state.
With respect to controllable power supply circuit, the pressure drop ratio triode of LIN chip internal metal-oxide-semiconductor is little, and temperature influence is also littler than triode, can effectively improve the supply voltage acquisition precision, and after entering dormant state, the LIN chip also is in the Sleep state, and the INH pin of LIN chip is in the Floating state, can effectively reduce quiescent current.By to the output voltage collection of the INH pin of LIN chip as supply voltage, can effectively improve the supply voltage acquisition precision, simultaneously, satisfy car load factory to the requirement of skylight control module quiescent current, and reduced production cost relatively.
Under LIN communication being arranged and quiescent current and cost etc. are required, the utility model can effectively reduce quiescent current based on the supply voltage collection of LIN chip, reduces cost.In addition, with respect to controllable power supply circuit, adopt this programme, the number of devices of use is fewer, can effectively control cost, and comparatively speaking, can effectively improve the acquisition precision of supply voltage.
The utility model openly provides a kind of novel voltage testing circuit, comprise: LIN chip, the external interface circuit that links to each other with the LIN pin of LIN chip, the bleeder circuit that links to each other with the INH pin of LIN chip and the peripheral control unit that links to each other with bleeder circuit with the LIN chip respectively, wherein, the LIN chip carries out LIN by external interface circuit with the external world and communicates by letter; The INH pin of peripheral control unit control LIN chip is exported first supply voltage; First supply voltage carries out dividing potential drop through bleeder circuit, output second source voltage; Peripheral control unit is gathered described second source voltage, through after AD conversion and the waveform computing as supply voltage.This novel voltage testing circuit is by using the INH pin output high level of LIN chip, and after carrying out dividing potential drop by bleeder circuit, collect supply voltage by peripheral control unit, finish power management function, and improved the precision that supply voltage is gathered relatively, also reduced quiescent current.
To the above-mentioned explanation of the disclosed embodiments, make this area professional and technical personnel can realize or use the utility model.Multiple modification to these embodiment will be apparent concerning those skilled in the art, and defined General Principle can realize under the situation that does not break away from spirit or scope of the present utility model in other embodiments herein.Therefore, the utility model will can not be restricted to these embodiment shown in this article, but will meet the wideest scope consistent with principle disclosed herein and features of novelty.
Claims (6)
1. novel voltage testing circuit, it is characterized in that, comprise: LIN chip, the external interface circuit that links to each other with the LIN pin of described LIN chip, the bleeder circuit that links to each other with the INH pin of described LIN chip and the peripheral control unit that links to each other with described bleeder circuit with described LIN chip respectively, wherein
Described LIN chip carries out LIN by described external interface circuit with the external world and communicates by letter;
Described peripheral control unit is controlled the INH pin of described LIN chip and is exported first supply voltage;
Described first supply voltage carries out dividing potential drop through described bleeder circuit, output second source voltage;
Described peripheral control unit is gathered described second source voltage, through after AD conversion and the waveform computing as supply voltage.
2. novel voltage testing circuit according to claim 1, it is characterized in that, described bleeder circuit comprises two resistance in seriess, i.e. first resistance and second resistance, one end of described first resistance links to each other with the INH pin of described LIN chip, one end ground connection of described second resistance, described peripheral control unit links to each other with the public junction of described first resistance and described second resistance.
3. novel voltage testing circuit according to claim 1 is characterized in that, also comprises:
Be connected the capacitor that described novel voltage testing circuit is carried out signals collecting filtering with described peripheral control unit.
4. novel voltage testing circuit according to claim 1 is characterized in that, described LIN chip links to each other with described peripheral control unit, by receiving the control signal that described peripheral control unit sends, controls closing of described LIN chip internal metal-oxide-semiconductor.
5. novel voltage testing circuit according to claim 1 is characterized in that, the RXD pin of described LIN chip links to each other with described peripheral control unit with the TXD pin, and carries out data interaction between the described peripheral control unit.
6. novel voltage testing circuit according to claim 1 is characterized in that, the SLP_N pin of described LIN chip links to each other with described peripheral control unit, receives the working state signal that described peripheral control unit is used for the described LIN chip of control.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 201320125878 CN203117265U (en) | 2013-03-19 | 2013-03-19 | Novel voltage detection circuit |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 201320125878 CN203117265U (en) | 2013-03-19 | 2013-03-19 | Novel voltage detection circuit |
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| Publication Number | Publication Date |
|---|---|
| CN203117265U true CN203117265U (en) | 2013-08-07 |
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| Application Number | Title | Priority Date | Filing Date |
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| CN 201320125878 Expired - Lifetime CN203117265U (en) | 2013-03-19 | 2013-03-19 | Novel voltage detection circuit |
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| CN (1) | CN203117265U (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108562786A (en) * | 2018-01-17 | 2018-09-21 | 广州小鹏汽车科技有限公司 | A kind of high pressure sampling system and method |
| CN111464412A (en) * | 2020-03-31 | 2020-07-28 | 东风汽车集团有限公司 | L IN transceiving control circuit and dormancy and awakening control method thereof |
-
2013
- 2013-03-19 CN CN 201320125878 patent/CN203117265U/en not_active Expired - Lifetime
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108562786A (en) * | 2018-01-17 | 2018-09-21 | 广州小鹏汽车科技有限公司 | A kind of high pressure sampling system and method |
| CN111464412A (en) * | 2020-03-31 | 2020-07-28 | 东风汽车集团有限公司 | L IN transceiving control circuit and dormancy and awakening control method thereof |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| CP03 | Change of name, title or address |
Address after: 4 / F, building 1, No.14 Jiuxianqiao Road, Chaoyang District, Beijing 100020 Patentee after: Beijing Jingwei Hirain Technologies Co.,Inc. Address before: 100101 Beijing city Chaoyang District Anxiang Beili 11 B block 8 layer Patentee before: Beijing Jingwei HiRain Technologies Co.,Ltd. |
|
| CP03 | Change of name, title or address | ||
| CX01 | Expiry of patent term |
Granted publication date: 20130807 |
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| CX01 | Expiry of patent term |