CN203117228U - Connecting device for integrated circuit test - Google Patents
Connecting device for integrated circuit test Download PDFInfo
- Publication number
- CN203117228U CN203117228U CN 201320069952 CN201320069952U CN203117228U CN 203117228 U CN203117228 U CN 203117228U CN 201320069952 CN201320069952 CN 201320069952 CN 201320069952 U CN201320069952 U CN 201320069952U CN 203117228 U CN203117228 U CN 203117228U
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- Prior art keywords
- integrated circuit
- pin
- card extender
- bridge joint
- interface
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Abstract
The utility model discloses a connecting device for integrated circuit test. In the process of testing integrated circuits in the same scheme, an integrated circuit through-connection board with connectors in fixed arrangement sequence is used; and in the process of testing functions of the integrated circuit, a bridging board is used to make arrangement sequence of pins of the integrated circuit to be consistent with the arrangement sequence of the connectors of the integrated circuit through-connection board. The sequence of the connectors of the integrated circuit through-connection board is fixed, and the bridging board enables the pins of the integrated circuit which are inconsistent in the same scheme to be consistent, i.e., by adjusting sequence of the connectors of the integrated circuit through-connection board, it is realized that the same integrated circuit through-connection board is used for testing integrated circuits in the same scheme. The bridging board is simple in design, short in time consumption and low in cost, which avoids the problems of material waster and long delivery time caused by redesign of integrated circuit through-connection boards.
Description
Technical field
The utility model relates to the integrated circuit testing field, particularly relates to a kind of integrated circuit testing coupling arrangement.
Background technology
Integrated circuit (Integrated Circuit, IC) be a kind of microelectronic device, by adopting certain technology, elements such as needed transistor, diode, resistance, electric capacity and inductance in the circuit and wire interconnects are in the same place, be produced on a fritter or a few fritter semiconductor wafer or the dielectric substrate, be encapsulated in then in the shell, become the microstructure with required circuit function.When electronic product is carried out functional test, generally be that the integrated circuit to electronic product carries out functional test.When integrated circuit is carried out functional test, each function pin of integrated circuit need be connected to proving installation by the integrated circuit card extender.
Need the scheme of client's designing integrated circuit at some, the arrangement of each functional module of the integrated circuit of different client design is with is connected may difference, then the cabling of integrated circuit will be different, cause the output order difference of each function pin of integrated circuit.When integrated circuit is carried out functional test connection integrated circuit and proving installation, if the function pin arrangements of integrated circuit order is different, need have the integrated circuit card extender of the integrated circuit (IC) design special use of different pin outputs orders at each.
But at the integrated circuit of same scheme, the classification of function pin and quantity are separately determined in its pin, and difference only is that the output order of each pin may be different.If only just redesign an integrated circuit card extender and not only wasted material but also labor intensive in order to change putting in order of certain several pin, and consuming time long, prolong time friendship phase.
The utility model content
Based on this, be necessary that integrated circuit at the same scheme of different clients design is when carrying out functional test, the output order of pin does not need to design the problem that different integrated circuit card extenders causes waste material, prolongs time friendship phase simultaneously, and the integrated circuit testing coupling arrangement of integrated circuit card extender need be provided when providing a kind of integrated circuit at same scheme to test at every turn.
A kind of integrated circuit testing coupling arrangement is used for connecting described integrated circuit and proving installation when integrated circuit is carried out functional test, comprising:
The integrated circuit card extender, having pin is the converting interface and the data output interface that is connected proving installation of stationary arrangement order;
The bridge joint flap has for the input interface of the pin that connects described integrated circuit and the output interface that docks with described converting interface, and the pin of the transmission same signal of described input interface and output interface connects one to one in described bridge joint flap inside.
Among embodiment, described bridge joint flap is printed circuit board (PCB) therein.
Among embodiment, the output interface of described bridge joint flap is respectively equipped with corresponding signalling channel mark therein.
Among embodiment, the converting interface of described integrated circuit card extender and data output interface are respectively equipped with corresponding signalling channel mark therein.
Among embodiment, described bridge joint flap directly connects described integrated circuit card extender by double contact pin therein.
Among embodiment, described bridge joint flap connects described integrated circuit card extender indirectly by single contact pin tie jumper therein.
Among embodiment, described integrated circuit is the touch-control integrated circuit therein, and described touch-control integrated circuit pin comprises the induction channels pin, drives passage pin and ground wire pin.
The said integrated circuit test connecting apparatus, integrated circuit card extender by using converting interface to put in order fixing in the integrated circuit testing procedure of same scheme is adjusted consistent with putting in order of integrated circuit card extender converting interface the order of integrated circuit pin by use bridge joint flap in the integrate circuit function test process.The fixed order of the converting interface of integrated circuit card extender, adjust the pin of the inconsistent integrated circuit of order of the pin of same scheme consistent by the realization of bridge joint flap, be the order of the converting interface of integrated circuit card extender, the integrated circuit of having realized same scheme uses same integrated circuit card extender when testing.Bridge joint flap simplicity of design, weak point consuming time and cost are low, waste of material and the long problem of friendship time phase of having avoided redesign integrated circuit card extender to cause.
Description of drawings
Fig. 1 is the integrated circuit testing coupling arrangement module map of the utility model one embodiment;
Fig. 2 is the synoptic diagram of the order of adjustment touch-control integrated circuit pin.
Embodiment
A kind of integrated circuit testing coupling arrangement, in the integrated circuit testing procedure of same scheme, by using fixing integrated circuit card extender, in the integrate circuit function test process, adjust consistent with putting in order of integrated circuit card extender converting interface the order of integrated circuit pin by use bridge joint flap.The fixed order of the converting interface of integrated circuit card extender, adjust the pin of the inconsistent integrated circuit of order of the pin of same scheme consistent by the realization of bridge joint flap, be the order of the converting interface of integrated circuit card extender, the integrated circuit of having realized same scheme uses same integrated circuit card extender when testing.Bridge joint flap simplicity of design, weak point consuming time and cost are low, waste of material and the long problem of friendship time phase of having avoided redesign integrated circuit card extender to cause.
Below in conjunction with drawings and Examples the utility model integrated circuit testing coupling arrangement is further elaborated.
With reference to figure 1, be the integrated circuit testing coupling arrangement module map of the utility model one embodiment.
A kind of integrated circuit testing coupling arrangement 300 comprises bridge joint flap 310 and integrated circuit card extender 330, is used for connecting when integrated circuit 100 is carried out functional test integrated circuit 100 and proving installation 500.It is that the converting interface 331(of stationary arrangement order is with reference to figure 2 that integrated circuit card extender 330 has pin) with the data output interface 332(that is connected proving installation 500 with reference to figure 2).Bridge joint flap 310 has for the input interface 311 of the pin that connects integrated circuit 100 and the output interface 312 that docks with converting interface 331.The pin of the transmission same signal of input interface 311 and output interface 312 connects one to one in bridge joint flap 310 inside.
When the integrated circuit 100 to same scheme carries out functional test, the integrated circuit 100 that the pin order of finishing at different clients is different, it is consistent by above-mentioned bridge joint flap 310 converting interface 331 of the order adjustment of integrated circuit 100 pins and integrated circuit card extender 330 fixing to be put in order, and connects proving installations 500 and carry out functional test by connecting integrated circuit card extender 330.By using above-mentioned bridge joint flap 310, when the function of the integrated circuit 100 of testing same scheme, realized using uniform integrated circuit card extender 330, bridge joint flap 310 is low with respect to integrated circuit card extender 330 simplicity of design, weak point consuming time and cost, has avoided each test all to need to redesign waste of material and the long problem of friendship time phase that the integrated circuit card extender causes.
Concrete, above-mentioned bridge joint flap 310 is the printed circuit board (PCB) (not shown), printed circuit board (PCB) (Printed Circuit Board, the input interface of pin PCB) connects the pin output terminal of integrated circuit 100, adjusts putting in order of integrated circuit 100 pins by the order of adjusting wiring and puts in order consistent with the converting interface 331 of integrated circuit card extender 330 fixing and from the pin output interface output of bridge joint flap 310.At the different integrated circuit 100 of pin arrangements order in the same design proposal, when carrying out functional test, design a corresponding printed circuit board (PCB) respectively at the different integrated circuit 100 of pin output order at every turn, can or print wiring and adjust putting in order of pin by manual welding.
Said integrated circuit card extender 330 is connected between touch-screen to be tested and the testing tool, and general being used for debugs, overhauls, and is used for introducing or drawing signal.Integrated circuit card extender 330 generally has only connector and track, and individual other is provided with ball bearing made using.Said integrated circuit card extender 330 is provided with a plurality of connectors, be used for connecting integrated circuit and proving installation, and above-mentioned bridge joint flap 310 has only a connector, is used for being connected with said integrated circuit card extender 330.Connector refers to connect the device of two active devices, is used for transmission current or signal, also is called connector, plug and socket.If test and all redesign a new integrated circuit card extender at every turn, cumbersome like this, waste material, and prolong the friendship phase.
When the integrated circuit 100 of same design proposal is tested, designing putting in order of integrated circuit card extender 330 passages earlier is fixing the putting in order of the converting interface 331 of integrated circuit card extender 330, and distinguishes the corresponding signalling channel marks of mark (with reference to figure 2) at converting interface 331 and the data output interface 332 of integrated circuit card extender 330.The above-mentioned integrated circuit card extender 330 that puts in order that in advance designs passage can be described as the integrated circuit public plate of transferring, " public plate " refers to a kind of standard design scheme, integrated circuit transfer public plate refer at same design proposal integrated circuit 100, determined a kind of integrated circuit card extender 330 that passage puts in order, can design the corresponding integrated circuit public plate of transferring respectively at the integrated circuit 100 of different designs scheme.
Integrated circuit at the design proposal in same field, the said integrated circuit public plate of transferring also can design a plurality of passages respectively according to predefined procedure at different classes of pin, the above-mentioned integrated circuit card extender 330 that designs a plurality of passages respectively at every kind of pin classification can be applicable to the integrated circuit 100 of the no more than said integrated circuit card extender 330 respective channel quantity of pin number of all categories, make and only need use a kind of integrated circuit public plate of transferring when testing with the integrated circuit 100 of the design proposal of a IC, reduce the design of integrated circuit card extender 330, save cost, make integrated circuit 100 tests simpler, convenient.
With reference to figure 2, be the synoptic diagram of the order of adjusting the touch-control integrated circuit pin.
Said integrated circuit 100 is the touch-control integrated circuit for the integrated circuit of touch screen.Touch screen is called " touch-screen ", " contact panel " again, it is a kind of induction type liquid crystal indicator that receives input signals such as contact, when having contacted the graphic button on the screen, haptic feedback system on the screen can drive various hookup mechanisms according to the formula of programming in advance, can be in order to the push button panel of dessert machine tool formula, and produce lively visual and sound effects by liquid crystal display picture.Above-mentioned touch-control integrated circuit pin generally comprises and drives passage pin 210, induction channels pin 220 and ground wire pin 230(with reference to figure 2).
The stationary arrangement of the converting interface 331 of said integrated circuit card extender 330 is to drive passage pin 210 and the 220 adjacent arrangements of induction channels pin or cut apart mutually to arrange and pass through 230 separations of ground wire pin to drive passage pin and induction channels pin in proper order.Above-mentioned driving passage pin 210 and induction channels pin 220 cut apart mutually to arrange refer to that induction channels pin 220 is separated and drive passage pin 210(with reference to figure 2) or drive passage pin 210 and separate induction channels pin 220(figure and do not show).
With reference to figure 2, putting in order of the converting interface 331 of integrated circuit card extender 330 is induction channels pin 220 equipartitions driving passage pin 210, and separate by ground wire pin 230 and to drive passage pin 210 and induction channels pin 220, the dotted line indication is for adjusting the consistent order that puts in order that the touch-control integrated circuit pins are the converting interface 331 of corresponding and integrated circuit card extender 330 in the way by bridge joint flap 310.In other embodiment, putting in order of the converting interface 331 of said integrated circuit card extender 330 also can be separated driving passage pin 210 in other ratios for induction channels pin 220.
In other embodiment, the putting in order of converting interface 331 of stating integrated circuit card extender 330 also can have other selections, for example drive passage pin 210 and induction channels pin 220 by ground wire pin 230 adjacent arrangements, or drive passage pin 210 according to certain separation ratio separation induction channels pin 220.
When above-mentioned bridge joint flap 310 is connected with said integrated circuit card extender 330, beat male seat (not shown) and female seat (not shown) at bridge joint flap 310 respectively, connect bridge joint flap 310 and integrated circuit card extender 330 by double contact pin (not shown) or single contact pin (not shown).Can directly connect bridge joint flap 310 and integrated circuit card extender 330 by double contact pin, can connect the converting interface 331 of bridge joint flap 310 by single contact pin tie jumper (not shown) indirectly.Above-mentioned wire jumper refers to the metal connecting line of connecting circuit plate (PCB) two demand points.
With reference to figure 2, when said integrated circuit 100 was the touch-control integrated circuit, above-mentioned driving passage pin 210 usefulness symbol DRV represented that induction channels pin 220 usefulness symbol SEN represent that ground wire pin 230 is represented by symbol GND.Said integrated circuit card extender 330 connects proving installation 500 by data output interface 332, the data output interface 332 of said integrated circuit card extender 330 comprises interface of the ground wire, the analog power line interface, the reset line interface, data line interface, the distortion line interface, interrupt line interface and digital power line interface, above-mentioned interface of the ground wire shown in Figure 2, the analog power line interface, the reset line interface, data line interface, the distortion line interface, interrupt line interface and digital power line interface are corresponding symbol: GND by silk marks respectively, AVDD, / RST, SDA, SCL, INT and VDDIO.
The above embodiment has only expressed several embodiment of the present utility model, and it describes comparatively concrete and detailed, but can not therefore be interpreted as the restriction to the utility model claim.Should be pointed out that for the person of ordinary skill of the art under the prerequisite that does not break away from the utility model design, can also make some distortion and improvement, these all belong to protection domain of the present utility model.Therefore, the protection domain of the utility model patent should be as the criterion with claims.
Claims (7)
1. an integrated circuit testing coupling arrangement is used for connecting described integrated circuit and proving installation when integrated circuit is carried out functional test, it is characterized in that, comprising:
The integrated circuit card extender, having pin is the converting interface and the data output interface that is connected proving installation of stationary arrangement order;
The bridge joint flap has for the input interface of the pin that connects described integrated circuit and the output interface that docks with described converting interface, and the pin of the transmission same signal of described input interface and output interface connects one to one in described bridge joint flap inside.
2. integrated circuit testing coupling arrangement according to claim 1 is characterized in that, described bridge joint flap is printed circuit board (PCB).
3. integrated circuit testing coupling arrangement according to claim 1 is characterized in that, the output interface of described bridge joint flap is respectively equipped with corresponding signalling channel mark.
4. integrated circuit testing coupling arrangement according to claim 1 is characterized in that, the converting interface of described integrated circuit card extender and data output interface are respectively equipped with corresponding signalling channel mark.
5. integrated circuit testing coupling arrangement according to claim 1 is characterized in that, described bridge joint flap directly connects described integrated circuit card extender by double contact pin.
6. integrated circuit testing coupling arrangement according to claim 1 is characterized in that, described bridge joint flap connects described integrated circuit card extender indirectly by single contact pin tie jumper.
7. integrated circuit testing coupling arrangement according to claim 1 is characterized in that, described integrated circuit is the touch-control integrated circuit, and described touch-control integrated circuit pin comprises the induction channels pin, drives passage pin and ground wire pin.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 201320069952 CN203117228U (en) | 2013-02-06 | 2013-02-06 | Connecting device for integrated circuit test |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 201320069952 CN203117228U (en) | 2013-02-06 | 2013-02-06 | Connecting device for integrated circuit test |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN203117228U true CN203117228U (en) | 2013-08-07 |
Family
ID=48897563
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN 201320069952 Expired - Fee Related CN203117228U (en) | 2013-02-06 | 2013-02-06 | Connecting device for integrated circuit test |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN203117228U (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103149388A (en) * | 2013-02-06 | 2013-06-12 | 深圳欧菲光科技股份有限公司 | Integrated circuit test connecting device and integrated circuit test connecting method |
| CN111060769A (en) * | 2019-12-31 | 2020-04-24 | 瑞斯康达科技发展股份有限公司 | Test system and test method |
| CN111060772A (en) * | 2019-12-31 | 2020-04-24 | 瑞斯康达科技发展股份有限公司 | Test system and test method |
-
2013
- 2013-02-06 CN CN 201320069952 patent/CN203117228U/en not_active Expired - Fee Related
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103149388A (en) * | 2013-02-06 | 2013-06-12 | 深圳欧菲光科技股份有限公司 | Integrated circuit test connecting device and integrated circuit test connecting method |
| CN103149388B (en) * | 2013-02-06 | 2016-05-04 | 深圳欧菲光科技股份有限公司 | Integrated circuit testing jockey and method |
| CN111060769A (en) * | 2019-12-31 | 2020-04-24 | 瑞斯康达科技发展股份有限公司 | Test system and test method |
| CN111060772A (en) * | 2019-12-31 | 2020-04-24 | 瑞斯康达科技发展股份有限公司 | Test system and test method |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20130807 Termination date: 20170206 |
|
| CF01 | Termination of patent right due to non-payment of annual fee |