CN2031104U

CN2031104U - On-line dual purpose tester for mini-integrated circuit

Info

Publication number: CN2031104U
Application number: CN 88211155
Authority: CN
Inventors: 屠锡瑜; 李珍宝
Original assignee: NANJING INST OF COAL SCIENCE ACADEMY
Current assignee: NANJING INST OF COAL SCIENCE ACADEMY
Priority date: 1988-03-18
Filing date: 1988-03-18
Publication date: 1989-01-18

Abstract

The utility model discloses an on-line dual purpose tester for a mini-integrated circuit, which is a tester for an integrated circuit with small volume, light weight, low cost, convenient operation, and high reliability. The utility model comprises a test clip, a preferred circuit, a comparison test circuit, a memory circuit, an indicating device and an alarm; the comparison test circuit adopts 'AND-OR-NOT' gate; the memory circuit adopts an RS trigger and a 'AND' gate; the indicating device adopts a light emitting diode; the alarm adopts a 'AND' gate and a buzzer. The instrument can be provided with dual purpose of on-line test of integrated circuit logic status and logical function by testing a mode converting switch and a condition switch, which can be widely used for testing and repairing various integrated circuits.

Description

On-line dual purpose tester for mini-integrated circuit

The utility model belongs to the technical field of integrated circuit tester.

At present, integrated circuit has been widely used in technical fields such as various electronic devices, instrument, electronic equipment and computing machine, in case yet machine is out of order, to in many integrated circuit, find out of order reason place, really be a cumbersome thing, especially when integrated circuit is welded on the wiring board, integrated circuit block taken off test one by one, be one and both taken a lot of trouble time-consuming again thing.Occurred a kind of on-line testing instrument recently, but this tester volume is big, price is high, function singleness, a kind of integrated circuit of every test all will be changed the test card on the tester, uses also inconvenient.

Goal of the invention of the present utility model is exactly in order to overcome the above problems, and has manufactured and designed the online dual-purpose tester of a kind of micro integrated circuit, and it has not only cast aside the condition plate, and volume is little, price is low, and is easy to use, has the logic testing of work and makes two kinds of purposes of logic function test.

The online dual-purpose tester of micro integrated circuit of the present utility model mainly is made up of two parts, and first part is the test clip that connects tested integrated circuit, and second part is the host machine part of analysing integrated circuits performance.Host machine part is made up of test section and indicating section, and the test section is standard integrated circuit (1), condition switch (2), relatively detects (3), memory circuit (4), test mode switch (7).Tested integrated circuit (8) directly links to each other with the input end that relatively detects (3) by test clip and lead-in wire, relatively detecting (3) is made of n comparer, wherein the numerical value of n is identical with the terminal pin number of tested integrated circuit (8), each comparer is made of a biconditional gate, two of each comparer input ends wherein, one connects standard integrated circuit (1), and another connects tested integrated circuit (8), the input end of its output termination memory circuit (4).Memory circuit (4) is made up of n memory, each memory is made of a rest-set flip-flop and a Sheffer stroke gate, the another one input end of n memory connects together and is connected to test mode switch (7), the light-emitting diode display (6) of the output termination indicating section of memory circuit (4) and alarm (5), wherein the output terminal of each memory in the memory circuit (4) connects an input end of a light-emitting diode display and alarm (5) respectively.Alarm (5) is made of n NAND gate circuit and a hummer, and hummer is connected on the output terminal of Sheffer stroke gate.Condition switch (2) is made up of n P cock, connects a P cock respectively between two input ends of each biconditional gate.

When this tester is done logic testing, test mode switch (7) is turned to an end of ground connection, a stature that is about to the biconditional gate input end is put logical zero, all condition switches (2) disconnect, (the corresponding switch closure of empty pin and unnecessary pin), this moment, circuit-under-test was connected to another input end of biconditional gate by test clip and lead-in wire.When a certain end currency of tested integrated circuit (8) was " 0 ", biconditional gate was output as " 1 ", and the anode of light-emitting diode display this moment (6) is a high level, so light emitting diode is not luminous; Otherwise when a certain end currency of tested integrated circuit (8) was " 1 ", biconditional gate was output as " 0 ", the lumination of light emitting diode of light-emitting diode display (6).Therefore the current logic state of each terminal pin of tested integrated circuit (8) just can be shown by this tester simultaneously.

When this tester is done the logic function test, with test mode switch (7) group a end to functional test, each P cock of condition switch (2) is pressed convention and then dialled and put: as this pin is sky pin, input, unnecessary pin, power supply, ground wire, then switch is put the position of " opening ", all the other respective foot inductive switch is put the position of " pass ".After putting condition switch (2) by this principle, the input of tested integrated circuit (8) is in state in parallel with the input of standard integrated circuit (1), and their output then adds to the input end of XOR gate respectively.This moment is if the input end of tested integrated circuit (8) is identical with the signal of the input end of corresponding standard integrated circuit (1), biconditional gate is output as logical one, light-emitting diode display does not work, exporting with door in the alarm also is low level, hummer does not ring, and illustrate that tested integrated circuit (8) is working properly this moment.When the logic function of tested integrated circuit (8) lost efficacy, its logic output is different with preferred circuit, then the biconditional gate output that is output as the logical zero memory also is " 0 ", it is luminous that drive corresponding light-emitting diode display this moment, drive alarm equipment alarm simultaneously, because independent corresponding XOR gate of each output of tested integrated circuit (8), a rest-set flip-flop, a light emitting diode, therefore, when the disabler of some pin of tested integrated circuit (8), except that the lumination of light emitting diode of correspondence, alarm all can be reported to the police.

Adopt the online dual-purpose tester of micro integrated circuit of the present utility model, its advantage is:

1. the XOR gate of this instrument has two kinds of purposes, when doing logic testing, is detection buffer; When doing the logic function test, be logic comparator; Light emitting diode also has two kinds of purposes, when doing logic testing, indicate as the circuit-under-test logic level, when doing the logic function test, therefore it finish two kinds of functions with a cover element again as the inefficacy circuit indicators, significantly reduced the quantity of element, make instrument accomplish microminiaturization, improved reliability, reduced cost.

2. this instrument adopts a set condition switch to make the condition setting of test different model circuit, than the traditional condition that adds in addition plate method of (or claiming test card), have easy to use, the advantage that cost is low, volume is little.

3. instrument adopts cmos circuit, and it is wide to have the power supply usable range, the little advantage that does not influence circuit-under-test that reaches of power consumption.Because each pin of circuit-under-test is all corresponding to a light emitting diode indication on the tester, so the situation of any one pin of circuit-under-test can both be revealed.

4. the not attached power supply of this tester itself is shared with circuit-under-test, therefore, makes this tester weight saving, and cost is lower.

Fig. 1 is a structured flowchart of the present utility model.

Fig. 2 is a circuit theory synoptic diagram of the present utility model.

Embodiment of the present utility model is as follows:

Condition switch (2) adopts miniature combined switch, because the pin number of general integrated circuit is below 40 pin, therefore, the number of its switch is 40.The biconditional gate circuit employing model that relatively detects (3) is 4077; The integrated circuit model that memory circuit (4) adopts is 4044; The NAND gate circuit model that alarm adopts is 4068; Light-emitting diode display adopts micro-led; Test clip adopts 40 double test clip.According to the above, just can make the online dual-purpose tester of micro integrated circuit of the present utility model according to the circuit theory synoptic diagram.

Claims

1, a kind of integrated circuit on-line testing instrument, form by test section and instruction unit branch, it is characterized in that the test section by standard integrated circuit (1), condition switch (2), relatively detect (3), memory circuit (4), test mode switch (7) is formed, relatively detecting (3) is made up of n comparer, wherein each comparer is made of a biconditional gate, one of them connects circuit-under-test two input ends of this comparer, and another connects preferred circuit; Memory circuit (4) is made of n memory, each memory is made up of a rest-set flip-flop and a Sheffer stroke gate, one of them connects the output terminal that relatively detects a comparer in (3) two input ends of rest-set flip-flop, another links to each other with an input end of other rest-set flip-flop, and be connected to test mode switch (7), indicating section is made up of light-emitting diode display (6) and alarm (5), light-emitting diode display (6) is made of n light emitting diode, each light emitting diode correspondence connects the output of a memory, alarm (5) is made up of n Sheffer stroke gate and a hummer, the input correspondence of each Sheffer stroke gate connects the output of a memory, and the numerical value of n is identical with the terminal pin number of circuit-under-test.

2, the online dual-purpose tester of micro integrated circuit according to claim 1, it is characterized in that described condition switch (2) adopts miniature combined switch, wherein each switch correspondence relatively detects a comparer in (3), and two of switch is connected on respectively on two input ends of comparer.