CN202994842U - Chip resistor test clamp - Google Patents
Chip resistor test clamp Download PDFInfo
- Publication number
- CN202994842U CN202994842U CN 201220647934 CN201220647934U CN202994842U CN 202994842 U CN202994842 U CN 202994842U CN 201220647934 CN201220647934 CN 201220647934 CN 201220647934 U CN201220647934 U CN 201220647934U CN 202994842 U CN202994842 U CN 202994842U
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- China
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- fixed
- pressing
- chip resistor
- screw rods
- test clamp
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- Expired - Fee Related
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Abstract
The utility model discloses a chip resistor test clamp belonging to technological equipment, and aims to provide a chip resistor test clamp which is high in detection efficiency and simple and convenient in operation. The chip resistor test clamp comprises a pedestal, and a positioning element and a pressing device, which are arranged on the pedestal. The positioning element is composed of a group of positive electrodes (9) and a group of negative electrodes (7), which are fixed on the pedestal (8). The pressing device is composed of screw rods (1) fixed on the pedestal (8); pressing nuts (5) and adjusting nuts (6), which are fixed on the screw rods (1); a pressing plate (4) arranged on the two screw rods (1) and tightly clamped by the pressing nuts (5) and the adjusting nuts (6); metal pressing needles (2) arranged on the pressing plate (4); and springs (3) fixed on all the metal pressing needles (1) respectively. The chip resistor test clamp is advantaged by simple structure, convenient operation, high detection efficiency, accurate positioning, stable pressing, multiple functions, etc., and is a clamp for detecting electrical property parameters of a chip resistor.
Description
Technical field
The utility model relates to a kind of electronic component performance test fixture, relates in particular to a kind of fixture for test chip resistor temperature characterisitic, dielectric withstanding voltage, Power Processing, the electrical quantity such as aging.
Background technology:For guaranteeing the q﹠r of product, need in the chip resistor production run product is carried out temperature characterisitic, dielectric withstanding voltage, Power Processing, the multinomial experiment such as aging.Traditional way be with Product jointing to glass-fiber-plate, then carry out every test.This way has caused the destruction to product, can not reuse etc.Also have in the dielectric withstanding voltage test process of chip high-voltage resistor, need to add alternating voltage 900V on resistor surface and two end electrodes, because the chip resistor volume is little, must use unit clamp to guarantee safety in adding high voltage processes.But dielectric withstanding voltage test does not at present have desirable unit clamp.
Summary of the invention:In order to overcome the deficiencies in the prior art, the utility model aims to provide a kind of simple to operation, chip resistor test fixture that detection efficiency is high, to satisfy the experiment demands such as chip resistor resistance measurement, dielectric withstanding voltage, temperature characterisitic, Power Processing.
To achieve these goals, the utility model by the following technical solutions: it comprises base, is located at setting element and hold down gag on this base; Described setting element is made of one group of positive electrode and one group of negative electrode of being fixed on base, described hold down gag by be fixed on two screw rods on base, be fixed on gland nut and setting nut on this screw rod, be located at the pressing plate that clamped by described gland nut and setting nut on two screw rods, be located at the some metal pressings on this pressing plate, the spring that is fixed on each described metal pressing consists of; Each positive electrode is by being fixed on the bus on base and connecing.
Compared with the prior art, the utility model is provided with spring owing to having adopted technique scheme on the metal pressing, therefore resistance can be pressed between two electrodes; The utlity model has simple in structure, easy to operate, detection efficiency is high, compression is stable, the advantage such as of many uses.
Description of drawings:
Fig. 1 is structural representation of the present utility model;
Fig. 2 is the A-A cut-open view in Fig. 1.
In figure: screw rod 1 metal pressing 2 spring 3 pressing plate 4 gland nut 5 setting nut 6 negative electrode 7 base 8 positive electrode 9 bus 10 resistance 11
Embodiment:The utility model is described in further detail below in conjunction with accompanying drawing and specific embodiment:
In Fig. 1～2, be fixed with two screw rods 1 on base 8, each described screw rod is provided with a gland nut 5 and a setting nut 6, the pressing plate 4 that is located on two screw rods 1 is fixedly clamped by described gland nut and setting nut, pressing plate 4 is provided with some metal pressings 2, and each metal is stated pressing and is provided with spring 3; One group of positive electrode 9 and one group of negative electrode 7 of being fixed on base 8 surfaces are arranged below pressing plate 4, and each positive electrode 9 is by being fixed on the bus 10 on base 8 and connecing.
During use, resistance 11 is placed between positive electrode 9, negative electrode 7, puts down pressing 2 resistance 11 compressions are got final product.
Claims (1)
1. a chip resistor test fixture, comprise base, be located at setting element and hold down gag on this base; It is characterized in that: described setting element consists of by being fixed on one group of positive electrode (9) on base (8) and one group of negative electrode (7), and described hold down gag is by being fixed on two screw rods (1) on base (8), being fixed on gland nut (5) and setting nut (6) on this screw rod, being located at the upper pressing plate (4) that is clamped by described gland nut and setting nut of two screw rods (1), being located at some metal pressings (2) on this pressing plate, being fixed on spring (3) formation on each described metal pressing; Each positive electrode (9) is by being fixed on the bus (10) on base (8) and connecing.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 201220647934 CN202994842U (en) | 2012-11-30 | 2012-11-30 | Chip resistor test clamp |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 201220647934 CN202994842U (en) | 2012-11-30 | 2012-11-30 | Chip resistor test clamp |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN202994842U true CN202994842U (en) | 2013-06-12 |
Family
ID=48566011
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN 201220647934 Expired - Fee Related CN202994842U (en) | 2012-11-30 | 2012-11-30 | Chip resistor test clamp |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN202994842U (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103604997A (en) * | 2013-11-29 | 2014-02-26 | 北京卫星环境工程研究所 | Resistance measurement system of strain gages for spacecraft |
| CN105004894A (en) * | 2015-08-05 | 2015-10-28 | 哈尔滨工业大学 | Organic photoelectric device test fixture |
| CN105158656A (en) * | 2015-08-26 | 2015-12-16 | 江苏大学 | Circular parallel electrode object dielectric property detection clamping device and detection method thereof |
-
2012
- 2012-11-30 CN CN 201220647934 patent/CN202994842U/en not_active Expired - Fee Related
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103604997A (en) * | 2013-11-29 | 2014-02-26 | 北京卫星环境工程研究所 | Resistance measurement system of strain gages for spacecraft |
| CN103604997B (en) * | 2013-11-29 | 2017-03-29 | 北京卫星环境工程研究所 | Resistance measurement system of strain gages for spacecraft |
| CN105004894A (en) * | 2015-08-05 | 2015-10-28 | 哈尔滨工业大学 | Organic photoelectric device test fixture |
| CN105004894B (en) * | 2015-08-05 | 2017-10-27 | 哈尔滨工业大学 | Organic electro-optic device test fixture |
| CN105158656A (en) * | 2015-08-26 | 2015-12-16 | 江苏大学 | Circular parallel electrode object dielectric property detection clamping device and detection method thereof |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20130612 Termination date: 20211130 |