CN201956207U - Top electrode clamping component for capacitor aging test - Google Patents
Top electrode clamping component for capacitor aging test Download PDFInfo
- Publication number
- CN201956207U CN201956207U CN2010206932435U CN201020693243U CN201956207U CN 201956207 U CN201956207 U CN 201956207U CN 2010206932435 U CN2010206932435 U CN 2010206932435U CN 201020693243 U CN201020693243 U CN 201020693243U CN 201956207 U CN201956207 U CN 201956207U
- Authority
- CN
- China
- Prior art keywords
- inner core
- capacitor
- top electrode
- top crown
- electrode
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Images
Landscapes
- Fixed Capacitors And Capacitor Manufacturing Machines (AREA)
Abstract
The utility model discloses a top electrode clamping component for a capacitor aging test, which comprises an upper support plate. A conducting top electrode plate (10) is arranged below the upper support plate; two ends of the conducting top electrode plate are provided with downwardly turned electrode pressing blocks; a columnar spring (30) is arranged between the conducting top electrode plate and the upper support plate; a capacitor inner core positioning rod (20) is arranged in the columnar spring; the upper end of the capacitor inner core positioning rod freely and upwardly penetrates through the upper support plate and is provided with a lifting block; the lower end of the capacitor inner core positioning rod downwardly penetrates through the conducting top electrode plate; and the lower end face (211) of the capacitor inner core positioning rod is lower than an electrode compression joint surface (111) of the top electrode plate. A capacitor inner core can be positioned accurately, access of an electrode aging power source is realized, reliable contacting conduction of a capacitor inner core electrode and the conducting top electrode plate is improved by the aid of downward pressure generated in upward squeezing of the spring and the gravity of the electrode component, an electrode inner core is not easy to be damaged, and the top electrode clamping component is simple and rapid in operation and high in efficiency.
Description
Technical field
The utility model relates to a kind of capacitor aging equipment, especially relates to a kind of use and clamps top electrode assembly in the device in the capacitor ageing test.
Background technology
In order to improve the quality of capacitor product, can carry out the ageing test processing to capacitor or capacitor inner core usually, capacitor wears out a period of time under certain condition, guarantees the product quality of capacitor; And in normally used capacitor aging equipment, easy appearance clamps the damage phenomenon to clamping inconvenient operation or clamping loose contact or be easy to generate of capacitor, or complex structure cost of manufacture height, states such as troublesome maintenance cause producing ageing efficiency and aging quality reduces.
The day for announcing is that the granted patent ZL200720063618.8 on September 10th, 2008 discloses the anchor clamps that a kind of weld tabs formula aging aluminium electrolysis capacitor is used, and comprises cover plate, base plate, spring, dividing plate, and the metal pole piece that is located on the base plate is formed.Two groups of separate little spring crosswise fixed are on base plate, and dividing plate is spaced laterally apart it, and the sheet metal of two isolation is fixed on the base plate positive/negative plate as anchor clamps, connect with lead between the little spring metal pole piece corresponding with this group.When anchor clamps were put into ageing oven, the two metal sheets of base plate just in time was crimped on the power positive cathode, need not manual connection.These anchor clamps contact, and the reliability height uses volume little, the ageing efficiency height.But these anchor clamps by spring to pin carry out the contact of direct electrode clamp aging, spring reduce get off after, the aging effect that clamps of anchor clamps just further reduces, and can not clamp aging to the capacitor inner core that does not have the installing electrodes pin.
The utility model content
The utility model carries out occurring easily in the ageing test clamping inconvenient operation or clamping loose contact or be easy to generate and clamp the damage phenomenon capacitor for solving existing capacitor inner core, or complex structure cost of manufacture height, present situation such as states such as troublesome maintenance and provide a kind of simple in structure effectively, easy to operate, quick, can carry out fast the capacitor inner core is clamped aging and takes off, the capacitor ageing test that improves aging production efficiency and the aging quality of better control clamps the top electrode assembly.
The utility model is to solve the problems of the technologies described above the concrete technical scheme that is adopted to be: a kind of capacitor ageing test clamps the top electrode assembly, comprise the upper bracket plate, it is characterized in that: upper bracket plate below is provided with the conduction top crown, conduction top crown two ends have the pressure utmost point piece that turns over down, be provided with cylindrical spring between conduction top crown and the upper bracket plate, establish capacitor inner core backstay in the cylindrical spring, the upper end freedom of capacitor inner core backstay upwards passes the upper bracket plate and is provided with in upper end carries piece, the bottom of capacitor inner core backstay passes the conduction top crown downwards, and the lower surface of bottom is lower than the electrode crimping face of top crown.The bottom of capacitor inner core backstay can accurately be located the capacitor inner core, be crimped onto the inner core upper end surface of capacitor will conducting electricity top crown, realize the access of the aging power supply of electrode, spring upwards pushes the downward pressure of generation and the action of gravity of electrode assemblie itself simultaneously, further improve reliable the contact conduction of core electrode in the capacitor, and be difficult for the electrode inner core is produced the damage phenomenon with the conduction top crown; Install to place and take to unload and take off the capacitor inner core and can easily mention and press-fit downwards by carrying piece, simple to operate, quick, improve aging production efficiency and clamp aging mass effect, improve the aging quality of aging operation convenience of capacitance core inner core and capacitor inner core.
As preferably, described capacitor inner core backstay adopts has externally threaded screw rod, and the conduction top crown is provided with screwed hole, and the conduction top crown is connected by the external screw thread of screwed hole with capacitor inner core backstay.Be threaded the conduction top crown more can be adapted to have wider differing heights capacitor inner core effectively press-fit contact force, adjust the height and position of conduction top crown, can adjust better and can press-fit aging capacitor inner core height at capacitor inner core backstay lower end.
As preferably, described pressure utmost point piece is provided with at least 1 electrode crimping face.Raising is provided with 2-3 electrode crimping face certainly usually to the reliable contact of capacitor inner core upper surface.
As preferably, described conduction top crown is connected with the external circuits of capacitor ageing test.The power supply that directly will wear out inserts in the conduction top crown, mounting and dismounting when taking down the capacitor inner core, does not influence operation.
As preferably, the inner core external diameter of described capacitor inner core backstay is less than the inner core internal diameter size of ageing test capacitor.Capacitor inner core backstay can freedom stretch out up and down in the inner core aperture of capacitor, both has been beneficial to the location and has taken down by being beneficial to dismounting.
The beneficial effects of the utility model are: the bottom of capacitor inner core backstay can accurately be located the capacitor inner core, be crimped onto the inner core upper end surface of capacitor will conducting electricity top crown, realize the access of the aging power supply of electrode, spring upwards pushes the downward pressure of generation and the action of gravity of electrode assemblie itself simultaneously, further improve to core electrode in the capacitor with the reliable conduction that contacts of conduction top crown, and be difficult for the electrode inner core produced and damage phenomenon; Install to place and the ageing test of capacitor inner core after dismounting take off the capacitor inner core and can easily mention and press-fit downwards by carrying piece, simple to operate, quick, improve aging production efficiency and clamp aging mass effect, improve the aging quality of aging operation convenience of capacitance core inner core and capacitor inner core.
Description of drawings:
Below in conjunction with the drawings and specific embodiments the utility model is described in further detail.
Fig. 1 is the structural representation that the utility model capacitor ageing test clamps the preferred implementation of top electrode assembly.
Fig. 2 is the structural representation that the utility model capacitor ageing test clamps the conduction top crown preferred implementation of top electrode assembly.
Embodiment
Among the embodiment shown in Figure 1, a kind of capacitor ageing test clamps the top electrode assembly, comprise upper bracket plate 50, upper bracket plate 50 belows are equipped with conduction top crown 10, conduction top crown 10 two ends have the pressure utmost point piece 11 that turns over down, and every end presses to have on the utmost point piece 11 has a recess that makes progress between 111,2 electrode crimping faces 111 of 2 electrode crimping faces, electrode crimping face 111 is used for crimping conduction in capacitor inner core upper surface is inserted the ageing test power supply; Between conduction top crown 10 and the upper bracket plate 50 cylindrical spring 30 is installed, be set with capacitor inner core backstay 20 in the cylindrical spring 30, capacitor inner core backstay 20 can freely move up and down in cylindrical spring 30, upper end 22 freedom of capacitor inner core backstay 20 upwards pass upper bracket plate 50 and 22 places are equipped with and carry piece 40 in the upper end, carrying piece 40 is used for using when the capacitor inner core is taken down in operating personnel's installation and removal, mention piece and can put into the capacitor inner core aging test bed or from aging test bed, take off, convenient to operation; The bottom 21 of capacitor inner core backstay 20 passes conduction top crown 10 downwards, the lower surface 211 of bottom 21 is lower than the electrode crimping face 111 of top crown 10, location in the inner chip hole of capacitor inner core is stretched in bottom 21, and electrode crimping face 111 is crimped on the power supply that will wear out on the upper surface of capacitor inner core and inserts the capacitor inner core.Capacitor inner core backstay 20 adopts the screw rod with external screw thread 201, have screwed hole 12 on the conduction top crown 10, conduction top crown 10 is seen Fig. 2 by screwed hole 12() be connected with the external screw thread of capacitor inner core backstay 20, capacitor inner core backstay 20 inner core external diameters are less than the inner core internal diameter size of ageing test capacitor.Conduction top crown 10 is connected with the external circuits of capacitor ageing test.
During use, when needs ageing test capacitor inner core, mention piece 40, conduction top crown 10 upwards compresses cylindrical spring 30 along with the rising of capacitor inner core backstay 20, after drive conduction top crown 10 upwards rises to certain position, after being placed on the capacitor inner core on the aging test bed aging bottom electrode, and after making capacitor inner chip hole contraposition capacitor inner core backstay 20 location, put down and carry piece 40, conduction top crown 10 is along with the resilience of cylindrical spring 30 presses against downwards on the capacitor inner core upper surface, reach the external power supply that inserts the capacitor ageing test, carry out capacitor inner core ageing test, a plurality of aging upper/lower electrodes ageing test when realizing a plurality of capacitor inner core is set on aging test bed; And after ageing test finishes, mention piece 40 can easily the capacitor inner core be taken off from aging test bed, simple and convenient.
Claims (5)
1. a capacitor ageing test clamps the top electrode assembly, comprise upper bracket plate (50), it is characterized in that: upper bracket plate (50) below is provided with conduction top crown (10), conduction top crown (10) two ends have the pressure utmost point piece (11) that turns over down, be provided with cylindrical spring (30) between conduction top crown (10) and the upper bracket plate (50), establish capacitor inner core backstay (20) in the cylindrical spring (30), upper end (22) freedom of capacitor inner core backstay (20) upwards pass upper bracket plate (50) and in the upper end (22) locate to be provided with and carry piece (40), the bottom (21) of capacitor inner core backstay (20) passes conduction top crown (10) downwards, and the lower surface (211) of bottom (21) is lower than the electrode crimping face (111) of top crown (10).
2. clamp the top electrode assembly according to the described capacitor ageing test of claim 1, it is characterized in that: described capacitor inner core backstay (20) adopts the screw rod with external screw thread (201), conduction top crown (10) is provided with screwed hole (12), and conduction top crown (10) is connected by the external screw thread of screwed hole (12) with capacitor inner core backstay (20).
3. clamp the top electrode assembly according to the described capacitor ageing test of claim 1, it is characterized in that: described pressure utmost point piece (11) is provided with at least 1 electrode crimping face (111).
4. clamp the top electrode assembly according to claim 1 or 2 described capacitor ageing tests, it is characterized in that: described conduction top crown (10) is connected with the external circuits of capacitor ageing test.
5. clamp the top electrode assembly according to claim 1 or 2 described capacitor ageing tests, it is characterized in that: described capacitor inner core backstay (20) inner core external diameter is less than the inner core internal diameter size of ageing test capacitor.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2010206932435U CN201956207U (en) | 2010-12-31 | 2010-12-31 | Top electrode clamping component for capacitor aging test |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2010206932435U CN201956207U (en) | 2010-12-31 | 2010-12-31 | Top electrode clamping component for capacitor aging test |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN201956207U true CN201956207U (en) | 2011-08-31 |
Family
ID=44500311
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN2010206932435U Expired - Fee Related CN201956207U (en) | 2010-12-31 | 2010-12-31 | Top electrode clamping component for capacitor aging test |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN201956207U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102135592A (en) * | 2010-12-13 | 2011-07-27 | 宁波高云电气有限公司 | Interpolar withstand voltage test device of metallized power capacitor |
-
2010
- 2010-12-31 CN CN2010206932435U patent/CN201956207U/en not_active Expired - Fee Related
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102135592A (en) * | 2010-12-13 | 2011-07-27 | 宁波高云电气有限公司 | Interpolar withstand voltage test device of metallized power capacitor |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN201654074U (en) | Testing clamp | |
| CN205157731U (en) | Automatic test module that snatchs of CPU | |
| CN202794237U (en) | Clamp for aging test of pasting capacitor element | |
| CN107153129B (en) | Automatic press-fit test fixture for bolt type power semiconductor device | |
| CN204271196U (en) | Battery shaping and test machine | |
| CN201927496U (en) | Aging test fixture for inner core of capacitor | |
| CN201956207U (en) | Top electrode clamping component for capacitor aging test | |
| CN201682300U (en) | Simulated cell jig | |
| CN207636630U (en) | Battery clamp | |
| CN202206585U (en) | Hydraulic electrode clamping device | |
| CN106654629B (en) | A kind of electric substation's falling-proof type earthing or grounding means | |
| CN202957214U (en) | Fuse installing base | |
| CN203658494U (en) | Chip tantalum capacitor independent current limiting aging plate | |
| CN201904224U (en) | Bottom electrode for aging test clamp of capacitor inner core | |
| CN104029146B (en) | The pressing clamp of Short Axis Kind pipe fitting | |
| CN202846472U (en) | Adjustable holddown device | |
| CN210805940U (en) | Lithium cell pressure becomes cabinet battery tray and rack clip contact circular telegram structure | |
| CN210803148U (en) | Porcelain insulator bending resistance tolerance test device | |
| CN112072753A (en) | Ox horn capacitor charging jig | |
| CN209380037U (en) | A kind of electric spark Compound Machining processing groove | |
| CN202917285U (en) | Active part pressing block structure | |
| AU2015101366A4 (en) | A Conductive seat for testing motor | |
| CN202332584U (en) | Clamp for feedthrough capacitor aging | |
| CN104964777B (en) | Electrode group pressure detection stop device | |
| CN218734202U (en) | Test fixture of super wide size solar photovoltaic board |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20110831 Termination date: 20141231 |
|
| EXPY | Termination of patent right or utility model |