CN202975472U - Low temperature optics normal temperature adjustment device using phase plate to carry out compensation - Google Patents
Low temperature optics normal temperature adjustment device using phase plate to carry out compensation Download PDFInfo
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- CN202975472U CN202975472U CN 201220572281 CN201220572281U CN202975472U CN 202975472 U CN202975472 U CN 202975472U CN 201220572281 CN201220572281 CN 201220572281 CN 201220572281 U CN201220572281 U CN 201220572281U CN 202975472 U CN202975472 U CN 202975472U
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Abstract
The utility model discloses a low temperature optics normal temperature adjustment device using a phase plate to carry out compensation. The used phase plate is provided with a specially designed diffraction surface. The deformation of the surface of an imaging lens, which is caused by that a low temperature optics system undergoes normal temperature adjustment and then enters the operating temperature, is compensated. Image quality deterioration caused by the change of the environment temperature can be avoided. The system which undergoes normal temperature adjustment can realize the effect of clear imaging in a low temperature environment. By further adjusting the thickness of the phase plate, image plane defocusing, which is caused by that the low temperature optics system undergoes normal temperature adjustment and then enters the operating temperature, is compensated. The imaging quality and the position of a focal plane of the optics system in a low temperature operating condition are consistent with the imaging quality and the position of the focal plane when normal temperature adjustment is carried out, and the problems of image quality deterioration and image plane defocusing of the low temperature optics system are solved at the same time.
Description
Technical field
The utility model relates to optical technical field, particularly relates to a kind of cryogenic optics normal temperature debugging device that adopts the phase-plate compensation.
Background technology
Cryogenic Optical System works under lower temperature environment, when it becomes the low temperature environment of normal operating conditions by normal temperature environment, the expand with heat and contract with cold stress that produces etc. of the refractive index of optical element, radius-of-curvature, asphericity coefficient, physical construction all can change, thereby cause Cryogenic Optical System to produce variety of issue with respect to the normal temperature state, yet Cryogenic Optical System is debug at low temperature environment and also is difficult to realize, therefore need to take certain method to make and still satisfy imaging requirements when entering the low-temperature working environment in the system that normal temperature is debug.Cryogenic Optical System debug main resolution system by normal temperature environment debug complete after, produce after entering low temperature environment work as degradation problem under image planes out of focus, image quality.
The traditional method of adjustment in this area has two classes, and a kind of method is when temperature variation, and by choosing of optical material, structured material, making defocusing amount is zero.The general method that adopts optical mirror and structural framing to select commaterial, thus guarantee that optical element and mechanical component expand equably and shrink, and do not produce out of focus.The method mainly is applicable in full reflected system, and for example European IRAS telescope and the telescopical catoptron of Spitzer and primary structure part all adopt metallic beryllium to make; The ASTRO-F telescope of Japan and the telescopical catoptron of European Herschel and primary structure part all adopt the SiC material to make, and the low-temp. infrared optical system that China Chinese Academy of Sciences Chengdu photoelectricity is developed all adopts aluminum alloy materials.This method is selected to require very strict to material.Another kind method is to utilize focus control to come the position of one or more pieces optical elements of ACTIVE CONTROL, change the optical element interval by motor-driven mechanism and do not eliminate the defocusing amount that temperature variation causes after optical system is reduced to low temperature, this method is suitable for refraction type, reflective or refractive and reflective optical system.Need to adopt complexity and the larger low temperature focusing structure of difficulty, when particularly the Cryogenic Optical System working temperature is lower than 100K, large to the ambient adaptability challenge of focus adjusting mechanism.
At present a kind of method that easily realizes for image planes out of focus problem is to increase the optical flat with suitable thickness in Cryogenic Optical System, debugs at normal temperatures, removes optical flat after entering working temperature, to realize the purpose of compensation defocusing amount.Yet, these class methods have only solved the out of focus problem, complicacy due to space environment, the optical system that normal temperature is debug enters after the space low temperature environment except the image planes out of focus, also can produce the problem that picture element descends, only system is carried out defocusing compensation, be difficult to satisfy high-precision Imaging Clarity by Using requirement.
Summary of the invention
For solve Cryogenic Optical System in prior art normal temperature debug enter working environment in the problem that descends of picture element, the utility model provides a kind of cryogenic optics normal temperature debugging device that adopts the phase-plate compensation.
The cryogenic optics normal temperature debugging device of employing phase-plate of the present utility model compensation comprises machinery mount, imaging lens group and detector focal plane, imaging lens group is arranged on machinery mount, it is characterized in that, also comprise: the phase-plate between imaging lens group and described detector focal plane, one or two surfaces of described phase-plate are provided with diffraction surfaces, and the phase place that described diffraction surfaces is introduced changes and is used for the compensation Cryogenic Optical System and rises to surface deformation after normal temperature is debug environment by working temperature.
Further, described diffraction surfaces is Rotational Symmetry formula diffraction surfaces or non-rotating symmetrical expression diffraction surfaces
Further, the phase place that described diffraction surfaces is introduced changes corresponding with the diffraction parameter of described diffraction surfaces, wherein, obtain described Cryogenic Optical System according to heat analysis and optical analysis and rise to surface deformation amount after normal temperature by working temperature, obtain the diffraction parameter of described diffraction surfaces based on this surface deformation amount
Further, the thickness d of described phase-plate is d=xn/ (n-1), and wherein to be described Cryogenic Optical System rise to defocusing amount after normal temperature by working temperature to x, and n is the material refractive index at normal temperatures of described phase-plate.
The utility model beneficial effect is as follows:
1. the diffraction surfaces of the phase-plate that adopts of the utility model with particular design, the imaging len surface deformation that enters working temperature after Cryogenic Optical System normal temperature is debug and produce compensates, can avoid the picture element that causes due to variation of ambient temperature to worsen, realize the effect that system that normal temperature debugs also can blur-free imaging in low temperature environment.
2. by further adjusting the thickness of phase-plate, the image planes out of focus that enters working temperature after Cryogenic Optical System normal temperature is debug and produce compensates, image quality and focal plane when the image quality of optical system under the low-temperature working condition debug with normal temperature with focal plane are consistent, and the picture element that can solve simultaneously Cryogenic Optical System descends and image planes out of focus problem.
Description of drawings
Fig. 1 is the structural representation of the cryogenic optics normal temperature debugging device of employing phase-plate compensation of the present utility model.
Fig. 2 is optical flat structural representation of the prior art.
Fig. 3 is the phase-plate structural representation with diffraction surfaces in the utility model embodiment.
Fig. 4 is the cryogenic optics normal temperature Method of Adjustment process flow diagram that the utility model adopts the phase-plate compensation.
Wherein, 1-imaging lens group, 2-machinery mount, 3-optical phase plate, 4-detector focal plane.
Embodiment
Below in conjunction with accompanying drawing and embodiment, the utility model is further elaborated.Should be appreciated that specific embodiment described herein only in order to explain the utility model, does not limit the utility model.
Figure 1 shows that the structural representation of the cryogenic optics normal temperature debugging device of employing phase-plate compensation of the present utility model, imaging lens group 1 is installed on machinery mount 2, when normal temperature is debug, introduce optical phase plate 3 in system, be provided with diffraction surfaces on one or two surfaces of phase-plate 3, utilizing diffraction surfaces to introduce phase place changes, come compensation optical system to rise to surface deformation after normal temperature is debug temperature by working temperature, guarantee that with this optical system after normal temperature is debug can blur-free imaging after entering duty.
Wherein, imaging lens group 1 can comprise a slice or multi-disc lens or catoptron, can specifically arrange according to situation, in the present embodiment take two lens as example.
The utility model is introduced phase place by the surface of control phase plate and is changed, need to introduce diffraction surfaces on one or two surfaces of phase-plate, in Fig. 1, dotted line is the image planes of imaging beam when not adding phase-plate, solid line is the image planes position that adds after phase-plate is adjusted, after adding phase-plate, the image planes positions is just on the detector focal plane.Figure 2 shows that the structural representation of common optical flat, Fig. 3 is that the utility model is introduced diffraction surfaces phase-plate structural representation afterwards, and diffraction surfaces can be various forms of diffraction surfaces, such as Rotational Symmetry formula, non-rotating symmetrical expression etc.
By optimizing the diffraction parameter of diffraction surfaces, make its surface deformation that can compensate cryogenic system, thereby guarantee that imaging of optical systems quality that normal temperature debugs is consistent with image quality under low temperature.Calculating about the diffraction parameter of diffraction surfaces, can utilize the methods such as heat analysis and optical analysis to derive calculates, at first calculate optical system by normal temperature after the low temperature with the surface deformation amount that occurs, then calculate the needed diffraction parameter value of this surface deformation amount of compensation and get final product.
Below describe the utility model in detail by specific embodiment, based on cryogenic optics device shown in Figure 1, the present embodiment is take low temperature LONG WAVE INFRARED optical system as example, the bore of optical system is 102.8mm, focal length is that the 308mm(temperature is when being 77K), the visual field is ± 1 °, and service band is 8.0 μ m ~ 12.0 μ m, and the low-temperature working temperature is 77K.
The spherical lens 1 of the present embodiment and the material of spherical lens 2 are germanium, and machinery mount 3 adopts the duralumin material.When working temperature 77K, the front surface radius-of-curvature of lens 1 is 299.5mm, and the rear surface radius-of-curvature is 490.1mm, and thickness is 6mm; The front surface radius-of-curvature of lens 2 is 1296.6mm, and the rear surface radius-of-curvature is 983.1mm, and thickness is 6mm; The spacing distance of lens 1 and lens 2 is 11.9mm.
Other relevant systematic parameter also has: during working temperature 77K, germanium material is in 10 μ m place refractive index n=3.916860; During normal temperature 293K, germanium material is at 10 μ m place refractive index ns '=4.003263.The germanium material thermal expansivity is 5.7 * 10
-6/ K, the thermal expansivity of duralumin, hard alumin ium alloy are 23.6 * 10
-6/ K.
The coupling system parameter, by heat analysis and optical analysis software calculate this optical system by normal temperature after the low temperature with the surface deformation that occurs, calculate the diffraction parameter of phase-plate 3 diffracting surface faces, the diffraction surfaces in the present embodiment is the Rotational Symmetry diffraction surfaces, and the diffraction calculation of parameter the results are shown in Table 1.
Table 1
| The order of diffraction is inferior | C1 First order diffraction parameter | C2 Second order diffraction parameter | |
| Front surface | ?1 | ?1.283618e-4 | ?-5.543649e-8 |
| The rear surface | ?1 | ?-1.311441e-4 | ?5.902790e-8 |
Wherein, C1, C2 ..., C10 is that single order is to ten rank diffraction parameters.For convenience of processing, usually select 2 to 3 rank diffraction parameters, the present embodiment is selected First order diffraction parameters C 1 and Second order diffraction parameters C 2 these two diffraction parameters, and the order of diffraction is inferior is 1.As calculated, for the front surface of phase-plate, C1=1.283618e-4, C2=-5.543649e-8, for the rear surface of phase-plate, C1=-1.311441e-4, C2=5.902790e-8, C3 is 0 to C10 diffraction parameter.Here C1, C2 ..., C10 is the method for expressing of the Rotational Symmetry diffraction surfaces diffraction parameter of the present embodiment, and the method for expressing of other kinds can also be arranged.
When this optical system was debug, process flow diagram, at first debug under normal temperature 293K as shown in Figure 4, inserts the phase-plate 3 with table 1 diffraction parameter before optical system detector focal plane, and detector focal plane 4 is debug to the position of focal plane.
Then, optical system is cooled to working temperature 77K, takes out phase-plate 3, the compensating action of phase-plate 3 during due to normal temperature, on low temperature focal plane when detector this moment focal plane 4 will be positioned at 77K automatically, thereby image quality is compensated automatically, and cryogenic optics is debug and completed.
Further, for above-described embodiment, also can by the further setting to phase-plate 3, image planes out of focus under the low temperature of system be compensated.
Particularly, by adjusting the thickness compensation image planes out of focus of phase-plate 3, the thickness d of phase-plate 3 is set to:
The defocusing amount of x when to be Cryogenic Optical System risen to normal temperature and debug temperature by working temperature wherein, n is the material refractive index at normal temperatures of phase-plate 4.
In application, utilizing conventional optical design software to carry out heat analyzes and optical analysis, first determine position of focal plane and the position of focal plane when working temperature 77K of system when normal temperature 293K, the system that obtains is down to defocusing amount x=9.94mm after working temperature by normal temperature, recycling formula (1) calculates the phase-plate thickness d=13.25mm that is fit to that compensates this defocusing amount.
When optical system is debug, add the phase-plate with the parameter of diffraction shown in table 1 and thickness d=13.25mm, at normal temperatures detector focal plane 4 is debug to the optimal focal plane position, after optical system is cooled to working temperature, remove phase-plate, low temperature image quality and position of focal plane due to the consistance that the phase-plate compensation realizes automatically and normal temperature is debug, are completed cryogenic optics and are debug, optical system is imaging clearly after entering duty, and the position of focal plane meets the requirements.
The utility model by normal temperature environment debug light path in introduce the phase-plate of particular design, image quality and focal plane when making the image quality of optical system under the low-temperature working condition debug with normal temperature with focal plane are consistent, and the picture element that general normal temperature is debug cause Cryogenic Optical System descends and image planes out of focus problem is resolved simultaneously.
Although be the example purpose, preferred embodiment of the present utility model is disclosed, it is also possible those skilled in the art will recognize various improvement, increase and replacement, therefore, scope of the present utility model should be not limited to above-described embodiment.
Claims (5)
1. cryogenic optics normal temperature debugging device that adopts phase-plate compensation, comprise machinery mount, imaging lens group and detector focal plane, imaging lens group is arranged on machinery mount, it is characterized in that, also comprise: the phase-plate between imaging lens group and described detector focal plane, one or two surfaces of described phase-plate are provided with diffraction surfaces, and the phase place that described diffraction surfaces is introduced changes and is used for the compensation Cryogenic Optical System and rises to surface deformation after normal temperature is debug environment by working temperature.
2. the cryogenic optics normal temperature debugging device of employing phase-plate compensation as claimed in claim 1, is characterized in that, described diffraction surfaces is Rotational Symmetry formula diffraction surfaces or non-rotating symmetrical expression diffraction surfaces.
3. the cryogenic optics normal temperature debugging device of employing phase-plate as claimed in claim 1 compensation, it is characterized in that, the phase place that described diffraction surfaces is introduced changes corresponding with the diffraction parameter of described diffraction surfaces, wherein, obtain described Cryogenic Optical System according to heat analysis and optical analysis and rise to surface deformation amount after normal temperature by working temperature, obtain the diffraction parameter of described diffraction surfaces based on this surface deformation amount.
4. the cryogenic optics normal temperature debugging device of employing phase-plate as claimed in claim 1 compensation, it is characterized in that, the thickness d of described phase-plate is d=xn/ (n-1), wherein to be described Cryogenic Optical System rise to defocusing amount after normal temperature by working temperature to x, and n is the material refractive index at normal temperatures of described phase-plate.
5. the cryogenic optics normal temperature debugging device of employing phase-plate as claimed in claim 4 compensation, it is characterized in that, described imaging lens group is comprised of two lens, be positioned at the same side of described phase-plate, wherein, front surface radius-of-curvature near the spherical lens of described phase-plate is 299.5mm, and the rear surface radius-of-curvature is 490.1mm, and thickness is 6mm; Front surface radius-of-curvature away from the spherical lens of described phase-plate is 1296.6mm, and the rear surface radius-of-curvature is 983.1mm, and thickness is 6mm; Be germanium near the spherical lens of described phase-plate with away from the material of the spherical lens of described phase-plate, spacing distance is 11.9mm; Working temperature is 77K; D=13.25mm; The diffraction parameter of described phase-plate is: for the front surface of phase-plate, First order diffraction parameters C 1=1.283618e-4, Second order diffraction parameters C 2=-5.543649e-8, rear surface for phase-plate, C1=-1.311441e-4, C2=5.902790e-8, each rank diffraction parameter of all the other of phase-plate is 0.
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| CN 201220572281 CN202975472U (en) | 2012-11-01 | 2012-11-01 | Low temperature optics normal temperature adjustment device using phase plate to carry out compensation |
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| CN 201220572281 CN202975472U (en) | 2012-11-01 | 2012-11-01 | Low temperature optics normal temperature adjustment device using phase plate to carry out compensation |
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Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102902063A (en) * | 2012-11-01 | 2013-01-30 | 中国电子科技集团公司第十一研究所 | Phase plate compensated low-temperature optics normal-temperature installation and adjustment method and device |
| CN113176695A (en) * | 2020-01-27 | 2021-07-27 | 安波福技术有限公司 | Camera with phase-controlled superlens |
| US11638067B2 (en) | 2020-11-02 | 2023-04-25 | Aptiv Technologies Limited | Phased metalens for adjusting a focus of an image |
-
2012
- 2012-11-01 CN CN 201220572281 patent/CN202975472U/en not_active Expired - Lifetime
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102902063A (en) * | 2012-11-01 | 2013-01-30 | 中国电子科技集团公司第十一研究所 | Phase plate compensated low-temperature optics normal-temperature installation and adjustment method and device |
| CN102902063B (en) * | 2012-11-01 | 2016-04-27 | 中国电子科技集团公司第十一研究所 | The cryogenic optics normal temperature Method of Adjustment adopting phase-plate to compensate and device |
| CN113176695A (en) * | 2020-01-27 | 2021-07-27 | 安波福技术有限公司 | Camera with phase-controlled superlens |
| CN113176695B (en) * | 2020-01-27 | 2023-09-19 | 安波福技术有限公司 | Camera with phase control superlens |
| US11818452B2 (en) | 2020-01-27 | 2023-11-14 | Aptiv Technologies Limited | Camera with phased metalens |
| US11638067B2 (en) | 2020-11-02 | 2023-04-25 | Aptiv Technologies Limited | Phased metalens for adjusting a focus of an image |
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Granted publication date: 20130605 |