CN202975051U - Electric test clamp and system - Google Patents
Electric test clamp and system Download PDFInfo
- Publication number
- CN202975051U CN202975051U CN2012204070349U CN201220407034U CN202975051U CN 202975051 U CN202975051 U CN 202975051U CN 2012204070349 U CN2012204070349 U CN 2012204070349U CN 201220407034 U CN201220407034 U CN 201220407034U CN 202975051 U CN202975051 U CN 202975051U
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- Prior art keywords
- electrical property
- pin
- testing electrical
- upper cover
- chip
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- Expired - Lifetime
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- 238000012360 testing method Methods 0.000 title claims abstract description 89
- 238000009413 insulation Methods 0.000 claims abstract description 8
- 238000006073 displacement reaction Methods 0.000 claims description 22
- 238000004804 winding Methods 0.000 claims description 22
- 238000005538 encapsulation Methods 0.000 claims description 7
- 239000004020 conductor Substances 0.000 claims description 3
- 238000001514 detection method Methods 0.000 abstract description 4
- 238000009434 installation Methods 0.000 abstract 1
- 239000000523 sample Substances 0.000 description 9
- 239000002184 metal Substances 0.000 description 3
- 230000002950 deficient Effects 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- 230000000007 visual effect Effects 0.000 description 2
- 230000009286 beneficial effect Effects 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 230000000295 complement effect Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 239000000284 extract Substances 0.000 description 1
- 239000012467 final product Substances 0.000 description 1
- 238000009863 impact test Methods 0.000 description 1
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Abstract
The utility model discloses an electric test clamp and a system, comprising an insulation body and an insulation top cover. Rotating shaft type foldable connection is formed between the body and the top cover; the body is provided with at least one pin jack, the top cover is provided with at least one pin platen corresponding to the pin jack, and when the body is combined with the top cover, each pin jack is pressed by the corresponding pin platen; a bare guide sheet is arranged in the pin jack, the guide sheet is connected with a lead extending to the body, and a detection point is formed on the outer surface of the body through the tail end of the lead. According to the electric test clamp and the system, the advantages are provided as following: the versatility is strong, the chip installation and adjustment speed is high when a test is carried out, an error is not easy to happen to a test signal, etc.
Description
Technical field
The utility model relates to a kind of fixture and system that tests use, particularly a kind of test chip electrical fixture and system.
Background technology
Chip need to gather electric signal from the pin of chip when carrying out electrically (as resistance, level, frequency etc.) test.A kind of common method is with the pin of the most advanced and sophisticated touching of the probe pen chip of multimeter, then tests.Increasingly to the microminiaturization development, cause the pin of chip increasingly fine and closely woven due to the volume of chip, lead pin pitch is very common with interior chip at 0.5mm on the market.Handle probe pen with manual methods and go to touch the problem that the pin of this chip is easy to form uncoupling, misconnection, the efficient of impact test.
In order to improve when test accuracy of being connected with pin of probe pen, occurred being provided with microscopical probe station with a kind of.When test, the operator observes the pin of chip by microscope, so just easily guarantees the accuracy that probe pen is connected with pin.But in order to prevent the microscopical camera lens of wounding, when changing chip at every turn or adjusting test pin, all need to lift microscope, set chip and again microscope is fallen again afterwards.Such operation is not only loaded down with trivial details, and the serious work efficiency that reduces test.
In order to improve testing efficiency, the interface converter that a kind of special use occurred carries out the testing electrical property of chip.Designed the interface circuit (socket) that the pin with chip is complementary on this interface converter, then by socket, the electric signal on chip pin has been transported on testing tool.Although the interface converter of this special use has very high efficient when test, also have two obvious defectives: (1) interface generality is poor, can only connect the chip of specific model, so long as just can't use with the unmatched chip of socket; (2) cost of socket is high.
The utility model content
The utility model is in order to overcome above-mentioned defective of the prior art, a kind of testing electrical property fixture and system to be provided, and it has advantages of highly versatile, when detecting, the install and adjust speed of chip is fast, detection signal is difficult for makeing mistakes and with low cost.
For achieving the above object, the utility model provides following technical scheme:
A kind of testing electrical property fixture, it is characterized in that, comprise the body of an insulation and the upper cover of an insulation, but forming the rotary shaft folding between described body and described upper cover connects, wherein: described body is provided with at least one pin slot, covers on described to be provided with at least one pin and to present a theatrical performance as the last item on a programme, and the position that described pin slot and described pin are presented a theatrical performance as the last item on a programme is mutually corresponding, when described body and described upper cover were combined, each described pin slot was just in time presented a theatrical performance as the last item on a programme by a described pin and is pushed down; Be provided with an exposed guide card in described pin slot, be connected with a wire that extends to described body on described guide card, and the end of described wire forms a check point on the outside surface of described body.
Further, described pin slot can be a plurality of, and the width of described pin slot and mutual spacing are according to the encapsulation standard arrangement of chip pin.
Further, can be provided with a standard winding displacement socket on described body, each described check point all forms a conductor wire end in this standard winding displacement socket.
Further, can be provided with a spring that the power of backing down is provided between described body and described upper cover.
Further, described body and described upper cover can buckle and the mode that coordinates of draw-in groove fasten.
Further, can be provided with a spring that the power of backing down is provided between described body and described upper cover.
Further, described body and described upper cover can buckle and the mode that coordinates of draw-in groove fasten.
A kind of testing electrical property system comprises two any above-mentioned testing electrical property fixtures, also comprises chip to be measured, and wherein: the pin of described core to be measured flat both sides is the corresponding pin slot that is placed in two described testing electrical property fixtures respectively.
Further, the standard winding displacement socket of the body of two described testing electrical property fixtures is connected with test component respectively, and described test component comprises test pen, and described test pen is positioned on the different check points of two described testing electrical property fixtures and tests.
Further, the standard winding displacement socket on two described electric characteristic detecting apparatus bodies inserts on pcb board respectively.
Compared with prior art, one or more embodiment of the present utility model can have following beneficial effect:
1, the pin of the chip non-chip testing object of pin (or a have) side can be plugged in the pin slot easily, electric signal on pin is drawn out on check point on this external surface by wire, just just can detect easily under the range estimation condition, not worry occurring uncoupling and misconnection.So, can be so that design of the present utility model be only applicable to chip, also be applicable to carry out corresponding testing electrical property to having comprised system module of being formed by chip etc.
2, the pin slot according to the encapsulation standard arrangement of chip pin can guarantee that the chip with same encapsulation can be inserted on test fixture, and needn't consider the concrete model of chip and number of pin what, highly versatile.
3, due to the split-type structural of uniqueness, can conveniently satisfy the test request of the positive and negative placement of chip, and not limit the package dimension of chip to be measured, thereby effectively reduce operating personnel's work difficulty, reduce the test duration, improve testing efficiency.
4, the structure of body and upper cover is very simple, and does not need to use the special-purpose socket module of high price, has reduced the cost of test fixture.
5, standard winding displacement socket can conveniently be connected the utility model with the chip testing instrument formation signal of special use, adapts to more neatly different detection demands.And after standard winding displacement socket of the present utility model is connected, go for various test, such as: the metal probe of the test components such as (1) test pen directly contact detection point is tested, and overcomes the situation that too closely causes the test short circuit due to chip pin; (2) the standard winding displacement socket that connects can be inserted into and carry out the modular testing electrical property on pcb board.
Description of drawings
Fig. 1 is the embodiment schematic diagram at the utility model the first visual angle;
Fig. 2 is the embodiment schematic diagram at the utility model the first visual angle.
Mark the following drawings mark thereon by reference to the accompanying drawings:
The 1-body, the 2-upper cover, the 3-rotating shaft, the 4-spring, 5-pin slot, the 6-pin is presented a theatrical performance as the last item on a programme, 7-draw-in groove, 8-buckle, 9-standard winding displacement socket.
Embodiment
Below in conjunction with accompanying drawing, preferred embodiment of the present utility model is described in detail, but is to be understood that protection domain of the present utility model is not subjected to the restriction of embodiment.
Embodiment one
To shown in Figure 2, testing electrical property fixture of the present utility model comprises the body 1 of an insulation and the upper cover 2 of an insulation as Fig. 1, connects but both form folding by a rotating shaft 3.Can be arranged with a spring 4 in rotating shaft 3, a hook is respectively stretched out at the two ends of this spring 4, withstands on respectively on body 1 and upper cover 2.When upper cover 2 was pressed together on body 1, two hooks were held down, make spring 4 provide one can jack-up upper cover 2 power.Such jack-up power can guarantee upper cover 2 not jammed the time and body 1 keeps released state, and the handled easily person loads and unloads chip.Body 1 is provided with a draw-in groove 7, and upper cover 2 is provided with the buckle 8 of a correspondence, when test fixture needs closure, buckle 8 is buckled in draw-in groove 7, just can guarantee that upper cover 2 can not upspring.
In Fig. 1, body 1 is provided with a plurality of pin slots 5, is used for making chip can be plugged on body 1.The corresponding pin of each pin slot 5, and be provided with an exposed guide card (not shown) in pin slot 5, for example sheet metal, be connected with a wire that extends to body 1 on described guide card, and the end of described wire forms a check point on the outside surface of body 1.Like this, just do not need to remove to touch pin with probe pen again when detecting, get final product but only need to touch easily check point.For the ease of detecting under the range estimation state, the area of check point and spacing can design largerly, in order to avoid uncoupling and misconnection occur.The width of pin slot 5 and mutual spacing need to be according to the encapsulation standard arrangement of chip pin.Although the concrete model of chip has difference, having adopted the size of pin on the chip of same encapsulation standard is the same with spacing, so, has adopted the different chips of same encapsulation standard just can use same test fixture.In order to guarantee versatility, the number of pin slot 5 need to have enough having more than needed, and concrete number can be grasped flexibly according to the test needs.
In Fig. 1, upper cover 2 is provided with corresponding to a plurality of pins of pin slot 5 and presents a theatrical performance as the last item on a programme 6, and when body 1 and upper cover 2 were combined, each pin slot 5 was just in time presented a theatrical performance as the last item on a programme by a pin and 6 pushed down.When test, this structure can guarantee that each pin on chip can both form reliable electrical connection with exposed sheet metal in pin slot 5.
In Fig. 2, also be provided with a standard winding displacement socket 9 on body 1, each the described check point that extracts in each pin slot 5 all forms a conductor wire end this standard winding displacement socket 9.Such design can conveniently form signal with the utility model with the chip testing instrument of special use and be connected.In addition, the nib of probe pen can also obtain certain fixing when being inserted in some mouthful in standard winding displacement socket 9, so just can handled easily person relieving probe pen when testing.
Embodiment two
The present embodiment provides a kind of testing electrical property system, and it comprises two testing electrical property fixtures described in embodiment one, also comprises object to be measured (for example chip to be measured) and test component with pin.Wherein, the standard winding displacement socket 9 on the body 1 of two testing electrical property fixtures is connected with test component respectively.Test component herein preferably includes test pen, and described test pen is positioned on the different check points of two described testing electrical property fixtures and tests.Further, the standard winding displacement socket 9 on two bodies 1 inserts on pcb board respectively.Because the chip to be measured that adopts in this system is connected circuit and is connected and all to adopt conventional means with test component, for the easy imagination of those skilled in the art institute, so no longer describe with accompanying drawing.
When the electric characteristic detecting apparatus that uses the present embodiment carries out testing electrical property, at first, the both sides that will have the chip of some pins are placed in respectively two testing electrical property fixtures, each pin of chip is contacted with pin slot 5 interior guide cards, then upper cover 2 is detained, make buckle 8 complete with draw-in groove 7 interlocks on body 1, contact well with the guide card in fixing chip to be measured and assurance chip pin and pin slot 5.The standard winding displacement is inserted in standard winding displacement socket 9, just the testing electrical property signal that detects can be drawn.At last according to test request, and the pin distribution situation, use test component (as multimeter) the contact standard winding displacement with test pen to test.
The standard winding displacement socket 9 that the present embodiment has, it is connected with the standard winding displacement, chip to be measured can be placed in to carry out the modular testing electrical property on some pcb board, does not so just need to adopt special-purpose socket breakout box, saves testing cost.
Above disclosed be only more excellent specific embodiment of the present utility model, still, the utility model is not limited thereto, the changes that any person skilled in the art can think of all should fall into protection domain of the present utility model.
Claims (10)
1. a testing electrical property fixture, is characterized in that, comprises the body of an insulation and the upper cover of an insulation, connect but form the rotary shaft folding between described body and described upper cover, wherein:
Described body is provided with at least one pin slot, cover on described and be provided with at least one pin and present a theatrical performance as the last item on a programme, the position that described pin slot and described pin are presented a theatrical performance as the last item on a programme is mutually corresponding, when described body and described upper cover were combined, each described pin slot was just in time presented a theatrical performance as the last item on a programme by a described pin and is pushed down;
Be provided with an exposed guide card in described pin slot, be connected with a wire that extends to described body on described guide card, and the end of described wire forms a check point on the outside surface of described body.
2. testing electrical property fixture according to claim 1, is characterized in that, described pin slot is a plurality of, and the width of described pin slot and mutual spacing are according to the encapsulation standard arrangement of chip pin.
3. testing electrical property fixture according to claim 1 and 2, is characterized in that, described body is provided with a standard winding displacement socket, and each described check point all forms a conductor wire end in this standard winding displacement socket.
4. testing electrical property fixture according to claim 1, is characterized in that, is provided with a spring that the power of backing down is provided between described body and described upper cover.
5. testing electrical property fixture according to claim 1, is characterized in that, described body and described upper cover fasten in the mode that buckle and draw-in groove coordinate.
6. testing electrical property fixture according to claim 3, is characterized in that, is provided with a spring that the power of backing down is provided between described body and described upper cover.
7. testing electrical property fixture according to claim 3, is characterized in that, described body and described upper cover fasten in the mode that buckle and draw-in groove coordinate.
8. a testing electrical property system, is characterized in that, comprises the described testing electrical property fixture of any one in two the claims 1-7, also comprises chip to be measured, wherein:
The pin of the flat both sides of described core to be measured is the corresponding pin slot that is placed in two described testing electrical property fixtures respectively.
9. testing electrical property according to claim 8 system, it is characterized in that, the standard winding displacement socket of the body of two described testing electrical property fixtures is connected with test component respectively, described test component comprises test pen, and described test pen is positioned on the different check points of two described testing electrical property fixtures and tests.
10. according to claim 8 or 9 described testing electrical property systems, is characterized in that, the standard winding displacement socket on two described electric characteristic detecting apparatus bodies inserts on pcb board respectively.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2012204070349U CN202975051U (en) | 2012-08-16 | 2012-08-16 | Electric test clamp and system |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2012204070349U CN202975051U (en) | 2012-08-16 | 2012-08-16 | Electric test clamp and system |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN202975051U true CN202975051U (en) | 2013-06-05 |
Family
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN2012204070349U Expired - Lifetime CN202975051U (en) | 2012-08-16 | 2012-08-16 | Electric test clamp and system |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN202975051U (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104505125A (en) * | 2014-12-04 | 2015-04-08 | 中国科学院微电子研究所 | Multichannel SRAM single-event test method and device |
| CN108254704A (en) * | 2018-03-09 | 2018-07-06 | 厦门强力巨彩光电科技有限公司 | A kind of magnetic-type fast signal test restocking tooling of integration |
| CN108459179A (en) * | 2018-03-26 | 2018-08-28 | 长江存储科技有限责任公司 | Apparatus for testing chip |
-
2012
- 2012-08-16 CN CN2012204070349U patent/CN202975051U/en not_active Expired - Lifetime
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104505125A (en) * | 2014-12-04 | 2015-04-08 | 中国科学院微电子研究所 | Multichannel SRAM single-event test method and device |
| CN108254704A (en) * | 2018-03-09 | 2018-07-06 | 厦门强力巨彩光电科技有限公司 | A kind of magnetic-type fast signal test restocking tooling of integration |
| CN108459179A (en) * | 2018-03-26 | 2018-08-28 | 长江存储科技有限责任公司 | Apparatus for testing chip |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| CX01 | Expiry of patent term |
Granted publication date: 20130605 |
|
| CX01 | Expiry of patent term |