CN202693490U - Panel detecting and defect displaying and cleaning operation system - Google Patents
Panel detecting and defect displaying and cleaning operation system Download PDFInfo
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- CN202693490U CN202693490U CN 201220340236 CN201220340236U CN202693490U CN 202693490 U CN202693490 U CN 202693490U CN 201220340236 CN201220340236 CN 201220340236 CN 201220340236 U CN201220340236 U CN 201220340236U CN 202693490 U CN202693490 U CN 202693490U
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Abstract
The utility model relates to a panel detecting and defect displaying and cleaning operation system. The panel detecting and defect displaying and cleaning operation system comprises an optical automatic detection machine platform and at least one defect displaying and cleaning operation machine platform, wherein the optical automatic detection machine platform is at least provided with a loading stage, an image acquisition device and an image processing device, the loading stage can load at least one panel to be detected, the image pickup device can carry out image acquisition and automatic recognition on the panel to be detected so as to judge whether defects exist on the panel to be detected or not, the image processing device can capture images of the defects, the at least one defect displaying and cleaning operation machine platform is provided with a display, and the display is provided with a user interface and is provided with a block which is formed by at least one transparent retaining block. When the panel to be detected is placed in the block, the positions of the defects can be accurately located and/or displayed by the user interface according to coordinate parameters, so that operating personnel can quickly determine the kinds of the defects and select appropriate manners to carry out operating disposal.
Description
Technical field
The utility model is relevant a kind of panel detection device, especially refer to a kind of can allowing by automatic discrimination panel defective, have clear easily flaw to show the mark mode when being disposed by the operating personnel, and convenient follow-up panel detection, the flaw that the flaw panel is disposed show and the clean operation system.
Background technology
Press, display panel is in producing and when mobile, have unavoidably scratch or dirty (particle) on the surface, but this scratch or the dirty display performance that will affect panel, even cause the unhappy of user and returned goods.Therefore, panel frontly all can carry out scratch or dirty detection usually in dispatching from the factory.
The scratch of known the first panel or dirty pick-up unit mainly are tested panel to be put into automated optical detect (AOI) board, utilize optical lens and camera, automatic inspection system, flaw on the object to be measured is shown on computers, and with dirty and measured object relative position, come as dirty location for one group of parameter.Known another kind of panel scratch or dirty pick-up unit mainly are that tested panel is put in the AOI board, utilize optical lens and camera, automatic inspection system shows the flaw on the object on computers, and flaw is located with ink-jetting style near by the determinand position.
The scratch of known the first panel or dirty pick-up unit are because the personnel of operation A OI board might not be same positions with cleaning dirty personnel, at present dirtyly just show relative position on computers, the operating personnel must be AOI board cleaning (because having relative position), if object to be measured leaves the AOI board, because there is not clear and definite marker location, flaw also is not easy by explication, so easily judged by accident, especially has one when above when flaw.
Please in the lump with reference to Fig. 1 (a)～1 (c), wherein, Fig. 1 (a) illustrates known panel detection device carries out the ink-jet location after detecting scratch or the flaw such as dirty schematic diagram; Fig. 1 (b) illustrates the diagrammatic cross-section of known panel detection device behind the ink-jet location; Fig. 1 (c) illustrates the diagrammatic cross-section of known panel detection device after ink-jet location and polishing.As shown in the figure, the scratch of known the second panel or dirty pick-up unit indicate flaw location (shown in Fig. 1 (a)) because the AOI board has ink-jet of utilizing 110 to be sprayed near object to be measured 100 surfaces of flaw, therefore, flaw can be by explication, so operating personnel easy identification, especially flaw have one when above.But ink-jet 110 itself is again another kind of flaw, and the operating personnel can not absolutely determine under the instrument that does not have to be fit to ink-jet 110 and flaw cleaning totally.Moreover if ink-jet 110 is run into the defective of object 100 to be measured when being scratch 120, the printing ink of ink-jet 110 can flow in the scratch of scratch 120 (shown in Fig. 1 (b) and Fig. 1 (c)), all the better not easy to clean and more prominent flaw location.
In addition; if to be measured to liking cover glass (cover glass) or a slice glass type technical solution (One Glass Solution; be called for short OGS) time; can appliedly there be one deck arsenic (As) on its surface; this layer arsenic meeting anti-soil; therefore, general ink-jet is difficult for being attached on the object surface to be measured, the real a fly in the ointment that belongs to.
The utility model content
The purpose of this utility model is to provide a kind of panel detection, flaw to show and the clean operation system, to overcome the shortcoming of above-mentioned known panel detection device.
For achieving the above object, the panel detection that the utility model provides, flaw demonstration and clean operation system, it comprises:
One optics automatic detecting machine platform, it has a microscope carrier, an image-taking device and an image processing apparatus at least, wherein, this microscope carrier can carry at least one measured panel, this image-taking device can be to whether defectiveness carries out capture and automatic Identification on this measured panel, the image of this this defective of image processing apparatus fechtable, and the coordinate parameters of this defective is provided: and
At least one flaw shows and the cleaning operation board, be coupled to this optics automatic detecting machine platform, has a display on this flaw demonstration and the cleaning operation board, has a user interface on this display, and have on this display by the formed block of at least one block, when this measured panel is positioned in this block, this user interface can accurately locate and/or demonstrate the position of this defective according to this coordinate parameters, allow the operating personnel can judge fast the kind of this defective, and select to carry out in a suitable manner operation and dispose.
Described panel detection, flaw show and the clean operation system; wherein, this measured panel is a touch sensing (Touch Sensor), cover glass (Cover Glass), tft liquid crystal panel (TFT LCD), active matrix organic LED panel (AMOLED) or low tempterature poly silicon (LTPS).
Described panel detection, flaw demonstration and clean operation system, wherein, this block is transparent or semitransparent block, is used for this measured panel of carrying, prevents that this measured panel from contacting with this display, causes the secondary scratch.
Described panel detection, flaw show and the clean operation system, wherein, this image-taking device is a CMOS line scan camera (CMOS line scan camera), CMOS sector scanning camera (CMOSarea scan camera) or CCD (Charge Coupled Device) line scan camera.
Described panel detection, flaw demonstration and clean operation system, wherein, this image processing apparatus is a camera or electric characteristic detecting apparatus, wherein this electric characteristic detecting apparatus is one group of probe.
Described panel detection, flaw show and the clean operation system, and wherein this defective is one dirty, scratch or kenel flaw (pattern defect).
Described panel detection, flaw demonstration and clean operation system, wherein, this display is a flat-panel screens.
Described panel detection, flaw show and the clean operation system, and wherein, this block is more than or equal to this measured panel, and can adjust according to the size of this measured panel.
Described panel detection, flaw show and the clean operation system, wherein, can show the image data of this defective and the coordinate data of this defective on this user interface.
Described panel detection, flaw demonstration and clean operation system, wherein, this display can be adjusted its brightness.
Panel detection of the present utility model, flaw show and the enforcement of clean operation system, and it has: whether optics automatic detecting machine platform can scan on this measured panel defectiveness, and behind the image of this defective of acquisition, provides the coordinate parameters of this defective; With and at least one flaw shows and the cleaning operation board on have a display, have on this display by two formed blocks of transparent block, when this measured panel is positioned in this block, this user interface can accurately locate and/or demonstrate the position of this defective according to this coordinate parameters, allow the operating personnel can judge fast the kind of this defective, and select to carry out in a suitable manner the advantage such as operation disposal.
Description of drawings
Fig. 1 (a) is a schematic diagram, and it illustrates known panel detection device carries out the ink-jet location after detecting scratch or the flaw such as dirty schematic diagram.
Fig. 1 (b) is a schematic diagram, and it illustrates the diagrammatic cross-section of known panel detection device behind the ink-jet location.
Fig. 1 (c) is a schematic diagram, and it illustrates the diagrammatic cross-section of known panel detection device after ink-jet location and polishing.
Fig. 2 is a schematic diagram, and it illustrates the block schematic diagram of panel detection, flaw demonstration and the clean operation system of the utility model one preferred embodiment.
Fig. 3 is a schematic diagram, and it illustrates the schematic diagram that further can show the image data of this defective on the user interface of the utility model one preferred embodiment.
Fig. 4 is a schematic diagram, and it illustrates the enlarged diagram of the image data of this defective as shown in Figure 3.
Embodiment
A kind of panel detection of the present utility model, flaw shows and the clean operation system: it comprises: an optics automatic detecting machine platform, it has a microscope carrier at least, one image-taking device and an image processing apparatus, wherein, this microscope carrier can carry at least one measured panel, this image-taking device can be to whether defectiveness carries out capture and automatic Identification on this measured panel, the image of this this defective of image processing apparatus fechtable, and provide the coordinate parameters of this defective: and at least one flaw shows and the cleaning operation board, be coupled to this optics automatic detecting machine platform, it has a display, has a user interface on this display, and have on this display by the formed block of at least one block, when this measured panel is positioned in this block, this user interface can accurately locate and/or demonstrate the position of this defective according to this coordinate parameters, allow the operating personnel can judge fast the kind of this defective, and select to carry out in a suitable manner operation and dispose.
Whether optics automatic detecting machine platform of the present utility model can scan on this measured panel defectiveness, and behind the image of this defective of acquisition, provides the coordinate parameters of this defective.
At least one flaw of the present utility model shows and cleans on the board to have a display, have on this display by the formed block of at least one transparent block, when this measured panel is positioned in this block, this user interface can accurately locate and/or demonstrate the position of this defective according to this coordinate parameters, allow the operating personnel can judge fast the kind of this defective, and select to carry out in a suitable manner operation and dispose.
For further understanding this novel structure, feature and purpose thereof, reach by reference to the accompanying drawings preferred embodiment and elaborate.
Please in the lump with reference to Fig. 2 to Fig. 4, wherein Fig. 2 illustrates the block schematic diagram of panel detection, flaw demonstration and the clean operation system of the utility model one preferred embodiment; Fig. 3 illustrates the schematic diagram that further can show the image data of this defective on the user interface of the utility model one preferred embodiment; Fig. 4 illustrates the enlarged diagram of the image data of this defective as shown in Figure 3.
As shown in the figure, the panel detection of the utility model one preferred embodiment, flaw demonstration and clean operation system, it comprises: an optics automatic detecting machine platform 10; And at least one flaw shows and cleaning operation board 20 combines.
Wherein, it has a microscope carrier 11 at least this optics automatic detecting machine platform 10, one image-taking device 12 and an image processing apparatus 13, wherein, this microscope carrier 11 can carry at least one measured panel 14, this image-taking device 12 is for example and without limitation to a CMOS line scan camera (CMOS line scan camera), CMO S sector scanning camera (CMO S area scan camera) or CCD (Charge Coupled Device) line scan camera, can to whether defectiveness (defect) 15 carry out capture and automatic Identification on this measured panel 14, wherein this defective 15 is for example and without limitation to one dirty, scratch or kenel flaw (pattern defect); This image processing apparatus 13 is for example and without limitation to a camera or electric characteristic detecting apparatus, wherein this electric characteristic detecting apparatus is for example and without limitation to one group of probe, the image of this defective 15 of fechtable, and the coordinate parameters of this defective 15 is provided, be for example and without limitation to X, Y-axis coordinate parameters.Wherein, further by an air floating platform, a conveying belt or slide unit (all figure does not show), the known technology take mobile this measured panel 14 as general optics automatic detecting machine platform, and non-emphasis of the present utility model be not therefore intend giving unnecessary details at this for this microscope carrier 11.
Wherein, this measured panel 11 is for example and without limitation to a touch sensing (Touch Sensor), cover glass (Cover Glass), tft liquid crystal panel (TFT LCD), active matrix organic LED panel (AMOLED) or low tempterature poly silicon (LTPS).
This at least one flaw shows and cleaning operation board 20 is coupled to this optics automatic detecting machine platform 10, it has a display 21, has a user interface 22 on this display, and have on this display 21 by two blocks, 23 formed blocks 24, when this measured panel 14 is positioned in this block 24, this user interface 22 can accurately locate and/or demonstrate the position of this defective 15 according to this coordinate parameters, allow the operating personnel can judge fast the kind of this defective 15, and select to carry out in a suitable manner operation and dispose.In the present embodiment, be to show and cleaning operation board 20 is illustrated as example take three flaws, but not as limit.Wherein, this block 24 is for example and without limitation to more identical or bigger than this measured panel 14, and the large I of this block 24 is adjusted according to the size of this measured panel 14, and this display 21 is a flat-panel screens, is for example and without limitation to a LCD, CRT, PDP or AMOLED display.
Wherein, this at least one block 23 is for example and without limitation to transparent or semitransparent block, and to form this block 24, this block 23 is used for this measured panel 14 of carrying, contacts with display 21 to prevent this measured panel 14, causes the secondary scratch.With two blocks 23 and with parallel or diagonal manner configuration in the present embodiment, but not as limit.In addition, the utility model can also three or four blocks 23 form these blocks 24, but not as limit.In addition, this display 21 can also be adjusted its brightness, required backlight when providing this measured panel 11 in this block 24.
When these 11 last times of microscope carrier are only carried a measured panel 14, finish when detecting in this image-taking device 12 and image processing apparatus 13, this optics automatic detecting machine platform 10 can be sequentially be sent to this measured panel 14 and corresponding coordinate parameters thereof and image data that the First flaw shows and cleaning operation board 20, second flaw shows and cleaning operation board 20 and the 3rd flaw show and cleaning operation board 20, allow the operating personnel can judge fast the kind of this defective 15, and select to carry out in a suitable manner operation and dispose.
When a plurality of measured panel 14 of these microscope carrier 11 last carryings, in this image-taking device 12 and image processing apparatus 13 in finishing when detecting, this optics automatic detecting machine platform 10 will record its corresponding coordinate parameters and image data simultaneously, then sequentially first measured panel 14 and corresponding coordinate parameters and image data thereof are sent to the demonstration of First flaw and cleaning operation board 20, second measured panel 14 and corresponding coordinate parameters and image data thereof are sent to second clear flaw demonstration and cleaning operation board 20, the 3rd measured panel 14 and corresponding coordinate parameters and image data thereof are sent to the 3rd flaw demonstration and cleaning operation board 20, allow the operating personnel can judge fast the kind of this defective 15, and select to carry out in a suitable manner operation and dispose, and can accelerate the speed of operation.
As shown in Figure 2, when this measured panel 14 be placed on respectively that this flaw shows and the block 24 of cleaning operation board 20 in the time, the position of this defective 15 will accurately locate and/or demonstrate according to this coordinate parameters to this user interface 22, for example from left to right, show respectively the dirty position on the first measured panel 14, dirty position around on second measured panel 14 in the black surround (Black Matrix), and the scratch position on the 3rd measured panel 14, allow the operating personnel of each flaw demonstration and cleaning operation board 20 can judge fast the kind of this defective, and select to carry out in a suitable manner operation and dispose.
As shown in Figure 3, the coordinate data that further can show the image data of this defective 15 and X thereof, Y-axis on the user interface 22 of the present utility model, allow each flaw show and the operating personnel of cleaning operation 20 can judge the kind of this defective fast by the coordinate data of this image data and X, Y-axis, and select to carry out in a suitable manner operation and dispose.
As shown in Figure 4, by the image data of shown this defective 15 on this user interface 22, allow the operating personnel of each flaw demonstration and cleaning operation 20 can be judged fast the kind of this defective 15 by this image data, and select to carry out in a suitable manner operation and dispose.
What the utility model disclosed is preferred embodiment, such as local change or modification and come from technological thought of the present utility model and be have the knack of this skill the people was easy to know by inference, all do not take off claim category of the present utility model.
Claims (10)
1. a panel detection, flaw show and the clean operation system, it is characterized in that, comprising:
One optics automatic detecting machine platform, it has a microscope carrier, an image-taking device and an image processing apparatus at least, wherein, this microscope carrier can carry at least one measured panel, this image-taking device can be to whether defectiveness carries out capture and automatic Identification on this measured panel, the image of this this defective of image processing apparatus fechtable, and the coordinate parameters of this defective is provided: and
At least one flaw shows and the cleaning operation board, be coupled to this optics automatic detecting machine platform, have a display on this flaw demonstration and the cleaning operation board, have a user interface on this display, and have on this display by the formed block of at least one block, place this measured panel.
2. panel detection according to claim 1, flaw show and the clean operation system, and wherein, this measured panel is a touch sensing, cover glass, tft liquid crystal panel, active matrix organic LED panel or low tempterature poly silicon.
3. panel detection according to claim 1, flaw show and the clean operation system, and wherein, this block is transparent or semitransparent block.
4. panel detection according to claim 1, flaw show and the clean operation system, and wherein, this image-taking device is a CMOS line scan camera, CMOS sector scanning camera or CCD line scan camera.
5. panel detection according to claim 1, flaw show and the clean operation system, and wherein, this image processing apparatus is a camera or electric characteristic detecting apparatus, and wherein this electric characteristic detecting apparatus is one group of probe.
6. panel detection according to claim 1, flaw show and the clean operation system, and wherein this defective is one dirty, scratch or kenel flaw.
7. panel detection according to claim 1, flaw show and the clean operation system, and wherein, this display is a flat-panel screens.
8. panel detection according to claim 1, flaw show and the clean operation system, and wherein, this block is more than or equal to this measured panel, and can adjust according to the size of this measured panel.
9. panel detection according to claim 1, flaw show and the clean operation system, wherein, can show the image data of this defective and the coordinate data of this defective on this user interface.
10. panel detection according to claim 1, flaw show and the clean operation system, and wherein, this display can be adjusted its brightness.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 201220340236 CN202693490U (en) | 2012-07-13 | 2012-07-13 | Panel detecting and defect displaying and cleaning operation system |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 201220340236 CN202693490U (en) | 2012-07-13 | 2012-07-13 | Panel detecting and defect displaying and cleaning operation system |
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| Publication Number | Publication Date |
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| CN202693490U true CN202693490U (en) | 2013-01-23 |
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| CN 201220340236 Expired - Fee Related CN202693490U (en) | 2012-07-13 | 2012-07-13 | Panel detecting and defect displaying and cleaning operation system |
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Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103323468A (en) * | 2013-05-20 | 2013-09-25 | 晟光科技股份有限公司 | Single-surface multi-point non-contact pattern test method |
| CN107064171A (en) * | 2017-01-26 | 2017-08-18 | 江苏东旭亿泰智能装备有限公司 | Check the inspection method of assembly, macro -graph system and correlation |
| CN107894859A (en) * | 2016-10-04 | 2018-04-10 | 禾瑞亚科技股份有限公司 | Touch-control processing unit, electronic system and its touch-control processing method |
| CN109031099A (en) * | 2018-08-01 | 2018-12-18 | 深圳市阿拉玎光电自动化有限公司 | A kind of circuit board defect detection system and circuit board defect method for maintaining |
| CN111474180A (en) * | 2019-01-24 | 2020-07-31 | 联策科技股份有限公司 | Detection data concatenation system and method |
-
2012
- 2012-07-13 CN CN 201220340236 patent/CN202693490U/en not_active Expired - Fee Related
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103323468A (en) * | 2013-05-20 | 2013-09-25 | 晟光科技股份有限公司 | Single-surface multi-point non-contact pattern test method |
| CN107894859A (en) * | 2016-10-04 | 2018-04-10 | 禾瑞亚科技股份有限公司 | Touch-control processing unit, electronic system and its touch-control processing method |
| CN107894859B (en) * | 2016-10-04 | 2021-02-19 | 禾瑞亚科技股份有限公司 | Touch processing device, electronic system and touch processing method thereof |
| CN107064171A (en) * | 2017-01-26 | 2017-08-18 | 江苏东旭亿泰智能装备有限公司 | Check the inspection method of assembly, macro -graph system and correlation |
| CN109031099A (en) * | 2018-08-01 | 2018-12-18 | 深圳市阿拉玎光电自动化有限公司 | A kind of circuit board defect detection system and circuit board defect method for maintaining |
| CN111474180A (en) * | 2019-01-24 | 2020-07-31 | 联策科技股份有限公司 | Detection data concatenation system and method |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20130123 Termination date: 20150713 |
|
| EXPY | Termination of patent right or utility model |