CN202615077U - On-off-control COM-and-SEG-arbitrary-placement function testing universal board - Google Patents
On-off-control COM-and-SEG-arbitrary-placement function testing universal board Download PDFInfo
- Publication number
- CN202615077U CN202615077U CN 201220260553 CN201220260553U CN202615077U CN 202615077 U CN202615077 U CN 202615077U CN 201220260553 CN201220260553 CN 201220260553 CN 201220260553 U CN201220260553 U CN 201220260553U CN 202615077 U CN202615077 U CN 202615077U
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Abstract
The utility model relates to an on-off-control COM-and-SEG-arbitrary-placement function testing universal board. The on-off-control COM-and-SEG-arbitrary-placement function testing universal board comprises a board body; interfaces and testing lines are arranged on the board body; and COM switches and SEG switches are arranged between the interfaces and the connection and control testing lines. With the continuous development of a digital liquid crystal display device production technology and a semiconductor processing technology nowadays, the functional defect inspection is an indispensable procedure, and the innovation on a testing tool is realized so as to better save material cost and optimize the testing tool under the condition that the quality of products is ensured. The on-off-control COM-and-SEG-arbitrary-placement function testing universal board has the beneficial effects that the design scheme is innovative, and the arbitrary adjustment of COM and SEG placement is realized in a manner that testers adjust and control the switches according to a logic diagram only; the practical effect is good, and the operation is simple and convenient; the universality is better, and the on-off-control COM-and-SEG-arbitrary-placement function testing universal board can be used for carrying out the universal test on the vast majority of products in the industry nowadays; the material cost of the testing tool is greatly saved; and the service life of the on-off-control COM-and-SEG-arbitrary-placement function testing universal board can be doubled due to a double-sided design mode.
Description
Technical field
Digital lcd manufacturing process, because the singularity of processing procedure, inevitably there is partly dysfunction phenomenon in the product of production.The client requires very high to dysfunction, so in field of semiconductor processing, set up electrical property to detect station specially for this reason.The present invention combines semiconductor processing technology, in conjunction with the digital lcd manufacturing process, is intended to detect the convenient service that provides for electrical property.
Background technology
Digital lcd technology is constantly perfect, and the client requires increasingly high to performance of products.Because LCD quality flaw in process of production has inevitable property, the necessity of making use of momentum is improved the detection means of finished fluid crystal display, and this is necessary program.
Because the specification parameter of LCD; Present stage is in order to test Different products; All be to adopt different model product special test plate (pcb board) test of design plurality of specifications to make, will cause two-sided PCB quantitative requirement higherly like this, make mask plate quantity and increase; Waste a large amount of double face copper and photosensitive material and use, be unfavorable for cost control.
Summary of the invention
The purpose of the utility model provides a kind of switch control COM, SEG arbitrary placement functional test generic disk to remedy the deficiency of prior art.
The utility model is that the technical scheme that adopts that achieves the goal is: switch control COM, SEG arbitrary placement functional test generic disk; It is characterized in that: comprise plate body; Plate body is provided with interface and test features, between interface and connection control test features, is provided with COM switch and SEG switch.
Described switch control COM, SEG arbitrary placement functional test generic disk, it is characterized in that: the plate body pro and con all has test features.
Described switch control COM, SEG arbitrary placement functional test generic disk is characterized in that: the positive descending PITCH value 2.54mm of test features, 2.00mm, 1.80mm, 1.27mm, 1.00mm, 0.80mm, reverse side is ascending.
The beneficial effect of the utility model is: COM and SEG placement position are adjusted arbitrarily, and the tester only need contrast logical diagram, and to the switch of corresponding control, the open and close of selecting property are chosen in implementation just can implement test to product.Versatility aspect: be suitable for conventional PITCH properties of product tests such as PITCH value 2.45,2.0,1.8,1.0,0.8.Two-sided design makes the test board life-span increase by 1 times.
Description of drawings
Fig. 1 is the structural representation of the utility model.
Embodiment
Embodiment:
Product global design and making:
1, unified planning layout universal test plate function scheme and appearance design scheme.
2, according to the conceptual design drawing.
Design proposal is implemented:
Interface 1 is provided with the copper lines 2 of long rectangle, afterbody boring.
COM is provided with 6 groups of switches 3.
SEG is provided with 6 groups of switches 4.
It is 48 groups of test features of meter such as 2.52mm, 2.54mm, 2.00mm, 1.80mm, 1.27mm, 1.00mm, 0.80mm that positive test features is provided with PITCH, is pyramid handstand shape.
It is 48 groups of test features of meter such as 0.80mm, 1.00mm, 1.27mm, 1.80mm, 2.00mm, 2.54mm that the reverse side test features is provided with PITCH, is pyramid shape.
Every group of corresponding pin of lines links to each other, and links to each other with corresponding C OM switch or SEG switch.
Scolding tin test interface, COM, SEG, test features.
Check guarantees that single face all communicates with pros and cons.
Accomplish and make.
Use: the socket power taking with interface 1 inserts the electrical measurement machine makes 48 groups of test features that voltage all arranged.
In parameter according to LCD to be detected; Select corresponding C OM switch 3 to open and close with the SEG4 switch; And select the test features of suitable PITCH value: conductive adhesive tape (vertical conduction, laterally non-conductive) is placed on the test features of having selected 2, and the pin with LCD is placed on the conductive adhesive tape again; Just make LCD obtain WV, the display effect according to LCD just can judge whether specification product again.
Claims (2)
1. switch is controlled COM, SEG arbitrary placement functional test generic disk, and it is characterized in that: comprise plate body, plate body is provided with interface and test features, between interface and connection control test features, is provided with COM switch and SEG switch.
2. switch control COM as claimed in claim 1, SEG arbitrary placement functional test generic disk, it is characterized in that: the plate body pro and con all has test features.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 201220260553 CN202615077U (en) | 2012-06-05 | 2012-06-05 | On-off-control COM-and-SEG-arbitrary-placement function testing universal board |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 201220260553 CN202615077U (en) | 2012-06-05 | 2012-06-05 | On-off-control COM-and-SEG-arbitrary-placement function testing universal board |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN202615077U true CN202615077U (en) | 2012-12-19 |
Family
ID=47348763
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN 201220260553 Expired - Lifetime CN202615077U (en) | 2012-06-05 | 2012-06-05 | On-off-control COM-and-SEG-arbitrary-placement function testing universal board |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN202615077U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106128344A (en) * | 2016-08-17 | 2016-11-16 | 深圳晶华显示器材有限公司 | A kind of generic disk being applied to LCD product test |
-
2012
- 2012-06-05 CN CN 201220260553 patent/CN202615077U/en not_active Expired - Lifetime
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106128344A (en) * | 2016-08-17 | 2016-11-16 | 深圳晶华显示器材有限公司 | A kind of generic disk being applied to LCD product test |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| PE01 | Entry into force of the registration of the contract for pledge of patent right |
Denomination of utility model: On-off-control COM-and-SEG-arbitrary-placement function testing universal board Effective date of registration: 20151229 Granted publication date: 20121219 Pledgee: Yibin commercial bank Limited by Share Ltd science and Technology Branch Pledgor: Yibin Yingtai Photoelectric Co.,Ltd. Registration number: 2015990001182 |
|
| PLDC | Enforcement, change and cancellation of contracts on pledge of patent right or utility model | ||
| CX01 | Expiry of patent term | ||
| CX01 | Expiry of patent term |
Granted publication date: 20121219 |