CN202512087U - Sensing test piece structure - Google Patents
Sensing test piece structure Download PDFInfo
- Publication number
- CN202512087U CN202512087U CN2012201078315U CN201220107831U CN202512087U CN 202512087 U CN202512087 U CN 202512087U CN 2012201078315 U CN2012201078315 U CN 2012201078315U CN 201220107831 U CN201220107831 U CN 201220107831U CN 202512087 U CN202512087 U CN 202512087U
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- metal pattern
- pattern layer
- test piece
- layer
- metal
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Abstract
The utility model provides a sensing test piece structure. The sensing test piece structure comprises an insulating substrate and a circuit metal pattern assembly, wherein as a testing electrode, the circuit metal pattern assembly comprises a first metal pattern layer, a second metal pattern layer, a third metal pattern layer, a fourth metal pattern layer and a fifth pattern layer, which are overlaid from bottom to top, wherein graphics and positions of the first metal pattern layer, the second metal pattern layer, the third metal pattern layer, the fourth metal pattern layer and the fifth pattern layer are completely coincided with each other; and the first metal pattern layer and the second pattern layer are nanoscale metal membranes with perfect uniformity and low resistance; therefore, current during the follow-up testing is stable, false data judgement can be avoided, and higher testing speed can be provided.
Description
Technical field
The utility model relates to a kind of sensing test piece structure, is mainly used in blood sugar test, and in the metal pattern assembly as electrode, comprises the nano level metal pattern layer of one deck at least.
Background technology
The chemical sensing sheet is applied in the detection of various fluids by maturation recent decades.Common chemical sensing sheet comprises reference electrode and working electrode usually, on the method for making of electrode or the material of selecting for use, and the degree of accuracy of the numerical value that all can influence in the detection to be obtained, at the material current-carrying part, conductive resistance is low, and conductive stability is high more good more.
In situation commonly used at present, be with the pattern of test with reference electrode and working electrode, be made as on the insulated substrate to paste mode, yet; The use of sticker causes resistance increase, conductance to reduce easily, and causes the erroneous judgement of test data easily, in addition, though the structure that also changes; Mode to electroplate is carried out, yet, because coating also needs follow-up etch processes; Cause the phenomenon of stripping electrode easily, therefore, need a kind of structure and method that solves the located by prior art problem.
The utility model content
The fundamental purpose of the utility model is to provide a kind of sensing test piece structure, comprises: an insulated substrate; An and circuit metal pattern assembly; This circuit metal pattern assembly is formed on the insulated substrate; As test electrode; And comprise one first metal pattern layer, one second metal pattern layer, one the 3rd metal pattern layer, one the 4th metal pattern layer of from bottom to top piling up in regular turn; An and five metals metal patterns layer; Wherein the figure and the position of this first metal pattern layer, this second metal pattern layer, the 3rd metal pattern layer, the 4th metal pattern layer and the 5th patterned layer are overlapping fully; And the thickness range of this first metal pattern layer is in 20～50 nanometers; Be with chromium (Cr), nickel (Ni), titanium (Ti), aluminium (Al), tin (Sn), indium (In), palladium (Pd), tungsten (W), iron (Fe), gold (Au), silver (Ag), platinum (Pt), steel one of them is made at least, and the thickness range of this second metal pattern layer is in 40～90 nanometers, be with copper (Cu), nickel (Ni), titanium (Ti), aluminium (Al), tin (Sn), indium (In), palladium (Pd), tungsten (W), iron (Fe), gold (Au), silver (Ag), platinum (Pt), steel one of them is made at least.
The characteristics of the utility model are; First metal pattern layer in the circuit metal pattern assembly and second metal pattern layer are the metal level of nano-scale; Preferable on uniformity coefficient, have low resistance simultaneously, and then make the follow-up test current stabilization; And can avoid unsettled electric current to cause the test data erroneous judgement, test speed faster is provided simultaneously.
Description of drawings
Fig. 1 is the diagrammatic cross-section of the utility model sensing test piece structure.
The primary clustering symbol description
1 sensing test piece structure
10 insulated substrates
30 circuit metal pattern assemblies
31 first metal pattern layer
33 second metal pattern layer
35 the 3rd metal pattern layer
37 the 4th metal pattern layer
39 five metals metal patterns layers
Embodiment
Those skilled in the art below cooperate graphic and element numbers is done more detailed explanation to the embodiment of the utility model, so that can implement after studying this instructions carefully according to this.
With reference to figure 1, Fig. 1 is the diagrammatic cross-section of the utility model sensing test piece structure.As shown in Figure 1; The sensing test piece structure 1 of the utility model comprises an insulated substrate 10 and circuit metal pattern assembly 30; Circuit metal pattern layer assembly 30 is formed on the insulated substrate 10, and this circuit metal pattern assembly 30 comprises one first metal pattern layer 31 of from bottom to top piling up in regular turn, one second metal pattern layer 33, one the 3rd metal pattern layer 35, one the 4th metal pattern layer 37 and a five metals metal patterns layer 39.The figure and the position of this first metal pattern layer 31, this second metal pattern layer 33, the 3rd metal pattern layer 35, the 4th metal pattern layer 37 and the 5th patterned layer 39 are overlapping fully.
The thickness range of first metal pattern layer 31 is in 20～50 nanometers; Be with chromium (Cr), nickel (Ni), titanium (Ti), aluminium (Al), tin (Sn), indium (In), palladium (Pd), tungsten (W), iron (Fe), gold (Au), silver (Ag), platinum (Pt), steel one of them is made at least, be preferably chromium (Cr); The thickness range of second metal pattern layer 33 is in 40～90 nanometers; Be with copper (Cu), nickel (Ni), titanium (Ti), aluminium (Al), tin (Sn), indium (In), palladium (Pd), tungsten (W), iron (Fe), gold (Au), silver (Ag), platinum (Pt), steel one of them is made at least, be preferably copper (Cu); The thickness range of the 3rd metal pattern layer 35 is made with palladium (Pd) at 20～30 microns; The thickness range of the 4th metal pattern layer 37 is made with nickel (Ni) at 20～30 microns; And the thickness range of five metals metal patterns layer 39 is at 2～5 microns, be with gold (Au), silver (Ag), copper (Cu), nickel (Ni), titanium (Ti), palladium (Pd) one of them is made at least, be preferably gold (Cu).
The characteristics of the utility model are; First metal pattern layer in the circuit metal pattern assembly and second metal pattern layer are the metal level of nano-scale; Preferable on uniformity coefficient, have low resistance simultaneously, and then make the follow-up test current stabilization; And can avoid unsettled electric current to cause the test data erroneous judgement, test speed faster is provided simultaneously.
The above person is merely in order to explain the preferred embodiment of the utility model; Be not that attempt is done any pro forma restriction to the utility model according to this; Be with; All have in following any modification or change of making relevant the utility model of identical creation spirit, all must be included in the category of the utility model intention protection.
Claims (3)
1. a sensing test piece structure is characterized in that, comprises:
One insulated substrate; And
One circuit metal pattern assembly is formed on the insulated substrate, comprises one first metal pattern layer, one second metal pattern layer, one the 3rd metal pattern layer, one the 4th metal pattern layer of from bottom to top piling up in regular turn, and a five metals metal patterns layer,
Wherein the figure and the position of this first metal pattern layer, this second metal pattern layer, the 3rd metal pattern layer, the 4th metal pattern layer and the 5th patterned layer are overlapping fully; And the thickness range of this first metal pattern layer is in 20～50 nanometers; Be with chromium, nickel, titanium, aluminium, tin, indium, palladium, tungsten, iron, gold, silver, platinum, steel one of them is made at least; And the thickness range of this second metal pattern layer is in 40～90 nanometers, be with copper, nickel, titanium, aluminium, tin, indium, palladium, tungsten, iron, gold, silver, platinum, steel one of them is made at least.
2. sensing test piece structure as claimed in claim 1 is characterized in that, this insulated substrate is made with polyethylene terephthalate, high density polyethylene, polypropylene, polyimide, and its thickness range is 25～250 microns.
3. sensing test piece structure as claimed in claim 1 is characterized in that, the thickness range of the 3rd metal pattern layer is made with palladium at 20～30 microns, and the thickness range of the 4th metal pattern layer is made with nickel at 20～30 microns; And the thickness range of five metals metal patterns layer is at 2～5 microns, be with gold, silver, copper, nickel, titanium, palladium one of them is made at least.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2012201078315U CN202512087U (en) | 2012-03-21 | 2012-03-21 | Sensing test piece structure |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2012201078315U CN202512087U (en) | 2012-03-21 | 2012-03-21 | Sensing test piece structure |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN202512087U true CN202512087U (en) | 2012-10-31 |
Family
ID=47064565
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN2012201078315U Expired - Fee Related CN202512087U (en) | 2012-03-21 | 2012-03-21 | Sensing test piece structure |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN202512087U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105277400A (en) * | 2014-07-07 | 2016-01-27 | 闳伟科技股份有限公司 | Electrochemical biosensing test piece and batch manufacture method thereof |
-
2012
- 2012-03-21 CN CN2012201078315U patent/CN202512087U/en not_active Expired - Fee Related
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105277400A (en) * | 2014-07-07 | 2016-01-27 | 闳伟科技股份有限公司 | Electrochemical biosensing test piece and batch manufacture method thereof |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20121031 Termination date: 20190321 |
|
| CF01 | Termination of patent right due to non-payment of annual fee |