CN202494737U - Automatic test device for multipoint touch screen - Google Patents
Automatic test device for multipoint touch screen Download PDFInfo
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Abstract
本实用新型揭示一种多点触屏自动测试装置,所述多点触屏包括分布于网格矩阵各边缘的若干个信号触点以及与各该信号触点一一对应的若干个触屏引脚,该测试装置包括:测试转接头,其一端包括与所述若干个触屏引脚对应的第一引脚,其另一端包括若干个第二引脚,各所述第一引脚对应于一第二引脚;测试电路,其包括若干个分支电路,各该分支电路包括第一、第二信号接入点,各所述信号接入点分别一一对应于所述测试转接头的第二引脚,各所述分支电路测试位置相对的信号触点间是否断开。从而可以无需使用昂贵设备,又不会因使用万用表表针无法对触屏引脚准确触碰而造成测试困难。
The utility model discloses an automatic test device for a multi-point touch screen. The multi-point touch screen includes a plurality of signal contacts distributed on each edge of a grid matrix and a plurality of touch screen leads corresponding to each of the signal contacts. The test device includes: a test adapter, one end of which includes a first pin corresponding to the plurality of touch screen pins, and the other end includes a plurality of second pins, and each of the first pins corresponds to A second pin; a test circuit, which includes several branch circuits, each of which includes first and second signal access points, and each of the signal access points corresponds to the first one of the test adapter respectively. Two pins, each branch circuit test whether the signal contacts opposite to each other are disconnected. Therefore, it is unnecessary to use expensive equipment, and it will not cause testing difficulties due to the inability to accurately touch the pins of the touch screen with the needle of a multimeter.
Description
【技术领域】 【Technical field】
本实用新型涉及一种自动测试装置,特别是涉及一种多点触屏自动测试装置。 The utility model relates to an automatic test device, in particular to a multi-point touch screen automatic test device. the
【背景技术】 【Background technique】
随着科技日新月异的发展,触屏显示器越来越广泛地被人们日常生活应用,也越来越受到人们的青睐。同时,多点触屏技术也在当下非常流行。 With the rapid development of science and technology, touch screen displays are more and more widely used in people's daily life, and are also more and more favored by people. At the same time, multi-touch screen technology is also very popular at the moment. the
对于多点触屏功能的实现,依赖于多pin(引脚)的控制,测试和分析时需要检查每组的状况,以确认每组。请结合参阅图1、图2,图1绘示为一种多点触屏的结构示意图、图2绘示为图1中各引脚与信号触点的对照表。需要对图1中多多点触屏10所划分的网格矩阵11做每一行和每一列的测试,以图中14行、16列为例,则需要做30次测试,以确定每一行和每一列所形成的组是断路还是正常。以其中第一列为例,则需要测试YU01信号触点12与YD01信号触点12所形成的回路是否正常,而对应的引脚即为第21引脚和第22引脚。
For the realization of the multi-touch screen function, depending on the control of multiple pins (pins), it is necessary to check the status of each group during testing and analysis to confirm each group. Please refer to FIG. 1 and FIG. 2 together. FIG. 1 is a schematic structural diagram of a multi-point touch screen, and FIG. 2 is a comparison table of pins and signal contacts in FIG. 1 . It is necessary to test each row and each column of the
在进行生产测试时,通常需要线测等价格昂贵的设备进行验证;而在进行分析时,通常状况需要使用万用表对网格矩阵11进行确认,由于pin较密集,很难准确触碰。
In production testing, expensive equipment such as line testing is usually required for verification; and in analysis, it is usually necessary to use a multimeter to confirm the
有鉴于此,实有必要开发一种多点触屏自动测试装置,以解决上述问题。 In view of this, it is necessary to develop a multi-touch screen automatic testing device to solve the above problems. the
【发明内容】 【Content of invention】
因此,本实用新型的目的是提供一种多点触屏自动测试装置,从而可以无需使用昂贵设备,又不会因使用万用表表针无法对触屏引脚准确触碰而造成测试困难。 Therefore, the purpose of this utility model is to provide a multi-point touch screen automatic testing device, thereby eliminating the need to use expensive equipment, and will not cause testing difficulties due to the inability to accurately touch the touch screen pins with the multimeter needle. the
为了达到上述目的,本实用新型提供的多点触屏自动测试装置,所述多点触屏包括分布于网格矩阵各边缘的若干个信号触点以及与各该信号触点一一对应的若干个触屏引脚,该测试装置包括: In order to achieve the above purpose, the multi-point touch screen automatic test device provided by the utility model, the multi-point touch screen includes several signal contacts distributed on each edge of the grid matrix and a number of one-to-one corresponding to each of the signal contacts touch screen pins, the test setup includes:
测试转接头,其一端包括与所述若干个触屏引脚对应的第一引脚,其另一端包括若干个第二引脚,各所述第一引脚对应于一第二引脚; A test adapter, one end of which includes a first pin corresponding to the plurality of touch screen pins, and the other end includes a plurality of second pins, and each of the first pins corresponds to a second pin;
测试电路,其包括若干个分支电路,各该分支电路包括第一、第二信号接入点,各所述信号接入点分别一一对应于所述测试转接头的第二引脚,各所述分支电路测试位置相对的信号触点间是否断开。 The test circuit includes several branch circuits, each of which includes first and second signal access points, and each of the signal access points corresponds to the second pin of the test adapter one by one, each of which Whether the signal contacts opposite to the above branch circuit test position are disconnected. the
可选的,所述信号转接头与所述测试电路整合为一体。 Optionally, the signal adapter is integrated with the test circuit. the
可选的,所述信号转接头与所述测试电路为相互独立的元件。 Optionally, the signal adapter and the test circuit are independent components. the
可选的,所述分支电路还包括判断支路和显示支路;所述判断支路的输入端为所述第一、第二信号接入点,输出端输出致能信号;所述显示支路接收所 述致能信号而显示测试结果。 Optionally, the branch circuit further includes a judgment branch and a display branch; the input end of the judgment branch is the first and second signal access points, and the output end outputs an enabling signal; the display branch The path receives the enable signal and displays the test result. the
可选的,所述判断支路包括电源、第一电阻、第二电阻、第三电阻、N-MOS管;所述第一电阻一端接所述电源,所述第一电阻另一端接所述第二电阻的一端,所述第二电阻另一端接地,所述第一电阻与所述第二电阻间接入所述第一信号接入点,所述第二电阻与地间接入所述第二信号接入点;所述第三电阻一端接所述电源,所述第三电阻的另一端接所述N-MOS管的漏极,所述N-MOS管的栅极接于所述第二信号接入点与地之间,所述N-MOS管的源极接地。 Optionally, the judging branch includes a power supply, a first resistor, a second resistor, a third resistor, and an N-MOS transistor; one end of the first resistor is connected to the power supply, and the other end of the first resistor is connected to the One end of the second resistor, the other end of the second resistor is grounded, the first resistor and the second resistor are connected to the first signal access point, and the second resistor and the ground are connected to the second Signal access point; one end of the third resistor is connected to the power supply, the other end of the third resistor is connected to the drain of the N-MOS transistor, and the gate of the N-MOS transistor is connected to the second Between the signal access point and the ground, the source of the N-MOS transistor is grounded. the
可选的,所述第一电阻阻值为1000欧姆,所述第二电阻阻值为5000~10000欧姆,所述第三电阻的阻值为1000欧姆; Optionally, the resistance of the first resistor is 1000 ohms, the resistance of the second resistor is 5000-10000 ohms, and the resistance of the third resistor is 1000 ohms;
可选的,所述显示支路包括发光二极管、第四电阻,所述第四电阻一端接电源,另一端接所述发光二极管的正极,所述发光二极管的负极接所述N-MOS管的漏极。 Optionally, the display branch circuit includes a light-emitting diode and a fourth resistor, one end of the fourth resistor is connected to a power supply, the other end is connected to the anode of the light-emitting diode, and the cathode of the light-emitting diode is connected to the N-MOS transistor. drain. the
可选的,所述第四电阻阻值为100欧姆。 Optionally, the resistance of the fourth resistor is 100 ohms. the
可选的,所述第二信号接入点与地之间还接有第五电阻。 Optionally, a fifth resistor is further connected between the second signal access point and the ground. the
可选的,所述第五电阻阻值为十万欧姆。 Optionally, the fifth resistor has a resistance of 100,000 ohms. the
相较于现有技术,利用本实用新型的目的多点触屏自动测试装置,由于采用测试转接头与所述触屏引脚相连,再通过所述测试电路对所述多点触屏进行自动测试并最终显示结果。从而可以无需使用昂贵设备,又不会因使用万用表表针无法对触屏引脚准确触碰而造成测试困难。 Compared with the prior art, utilizing the purpose multi-point touch screen automatic test device of the present utility model, since the test adapter is used to connect with the touch screen pins, the multi-point touch screen is automatically tested by the test circuit. Test and finally display the results. Therefore, it is unnecessary to use expensive equipment, and it will not cause testing difficulties due to the inability to accurately touch the pins of the touch screen with the needle of a multimeter. the
【附图说明】 【Description of drawings】
图1绘示为一种多点触屏的结构示意图。 FIG. 1 is a schematic structural diagram of a multi-point touch screen. the
图2绘示为图1中各引脚与信号触点的对照表。 FIG. 2 is a comparison table of pins and signal contacts in FIG. 1 . the
图3绘示为本实用新型多点触屏自动测试装置方框模块图。 FIG. 3 is a block block diagram of the multi-point touch screen automatic testing device of the present invention. the
图4绘示为本实用新型多点触屏自动测试装置一较佳实施例的分支电路结构示意图。 FIG. 4 is a schematic diagram of a branch circuit structure of a preferred embodiment of the multi-point touch screen automatic testing device of the present invention. the
【具体实施方式】 【Detailed ways】
请继续参阅图1、图2,再结合参阅图3,图3绘示为本实用新型多点触屏自动测试装置方框模块图。 Please continue to refer to FIG. 1 and FIG. 2 , and refer to FIG. 3 together. FIG. 3 is a block diagram of a multi-touch screen automatic testing device of the present invention. the
为了达到上述目的,本实用新型提供的多点触屏自动测试装置,所述多点触屏10包括分布于网格矩阵11各边缘的若干个信号触点12以及与各该信号触点12一一对应的若干个触屏引脚14(该若干个触屏引脚14组成信号接头13),该测试装置20包括:
In order to achieve the above object, the multi-point touch screen automatic test device provided by the utility model, the
测试转接头21,其一端包括与所述若干个触屏引脚14对应的第一引脚22,其另一端包括若干个第二引脚23,各所述第一引脚22对应于一第二引脚23;
A
测试电路24,其包括若干个分支电路25,各该分支电路25包括第一信号接入点26、第二信号接入点27,各所述信号接入点分别一一对应于所述测试转 接头21的第二引脚23,各所述分支电路25测试位置相对的信号触点12间是否断开。
其中,所述信号转接头21与所述测试电路24为相互独立的元件,如此可以方便依据不同尺寸的多点触屏10更换所述信号转接头21,进而可以达到所述测试电路24能够有更好的通用性。当然,所述信号转接头21还可以与所述测试电路24整合为一体。
Wherein, the
其中,所述测试电路24包括26个、30个或35个分支电路25(分支电路25的个数依据不同尺寸的多点触屏10所需要测试的信号触点12而定)。
Wherein, the
请继续参阅图3,再结合参阅图4,图4绘示为本实用新型多点触屏自动测试装置一较佳实施例的分支电路结构示意图。 Please continue to refer to FIG. 3 , and refer to FIG. 4 again. FIG. 4 is a schematic diagram of a branch circuit structure of a preferred embodiment of the multi-touch screen automatic testing device of the present invention. the
其中,所述分支电路25还包括判断支路28和显示支路29;所述判断支路28的输入端为所述第一信号接入点26、第二信号接入点27,输出端输出致能信号;所述显示支路29接收所述致能信号而显示测试结果。
Wherein, the
其中,所述判断支路可以包括电源30、第一电阻31、第二电阻32、第三电阻33、N-MOS管34;所述第一电阻31一端接所述电源30,所述第一电阻31另一端接所述第二电阻32的一端,所述第二电阻32另一端接地,所述第一电阻31与所述第二电阻33间接入所述第一信号接入点26,所述第二电阻32与地间接入所述第二信号接入点27;所述第三电阻33一端接所述电源30,所述第三电阻33的另一端接所述N-MOS管34的漏极,所述N-MOS管34的栅极接于所述第二信号接入点27与地之间,所述N-MOS管34的源极接地。
Wherein, the judging branch may include a power supply 30, a first resistor 31, a second resistor 32, a third resistor 33, and an N-MOS transistor 34; one end of the first resistor 31 is connected to the power supply 30, and the first The other end of the resistor 31 is connected to one end of the second resistor 32, the other end of the second resistor 32 is grounded, and the first
其中,所述第一电阻31阻值可以为1000欧姆,所述第二电阻32阻值相应可以为5000~10000欧姆,所述第三电阻33的阻值相应可以为1000欧姆。 Wherein, the resistance value of the first resistor 31 may be 1000 ohms, the resistance value of the second resistor 32 may be 5000-10000 ohms, and the resistance value of the third resistor 33 may be 1000 ohms. the
其中,所述显示支路29还可以包括发光二极管35、第四电阻36,所述第四电阻36一端接电源30,另一端接所述发光二极管35的正极,所述发光二极管35的负极接所述N-MOS管34的漏极。 Wherein, the display branch 29 may also include a light emitting diode 35 and a fourth resistor 36, one end of the fourth resistor 36 is connected to the power supply 30, the other end is connected to the positive pole of the light emitting diode 35, and the negative pole of the light emitting diode 35 is connected to The drain of the N-MOS transistor 34 . the
其中,所述第四电阻36阻值相应可以为100欧姆。 Wherein, the resistance value of the fourth resistor 36 can be 100 ohms. the
于测试时,所述第一信号接入点26与所述第二信号接入点27接收所述信号触点12所产生的触碰信号,以YU01与YD01为例,所述第一信号接入点26对应YU01,所述第二信号接入点27对应YD01。当YU01与YD01间为通路时,所述N-MOS管34的栅极为高电平,所述N-MOS管34的漏极输出低电平,所述发光二极管35导通并发光。因此,当所述发光二极管35发光,则测试结果为所对应的位置相对的二信号触点12间位通路;当所述发光二极管35不发光,则测试结果为所对应的位置相对的二信号触点12间位断路。
During testing, the first
其中,所述第二信号接入点27与地之间还可以接有第五电阻37(pull low电阻),从而在所述第一信号接入点26与所述第二信号接入点27间短路时,直接将所述N-MOS管34的栅极拉为低电平,避免漂移。其中,所述第五电阻37 阻值可以为十万欧姆。
Wherein, the fifth resistor 37 (pull low resistor) can also be connected between the second signal access point 27 and the ground, so that the first
相较于现有技术,利用本实用新型的目的多点触屏自动测试装置,由于采用测试转接头21与所述触屏引脚14相连,再通过所述测试电路24对所述多点触屏10进行自动测试并最终显示结果。从而可以无需使用昂贵设备,又不会因使用万用表表针无法对触屏引脚14准确触碰而造成测试困难。
Compared with the prior art, utilizing the purpose multi-touch screen automatic test device of the present utility model, since the
Claims (10)
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103257300A (en) * | 2012-02-16 | 2013-08-21 | 神讯电脑(昆山)有限公司 | Automatic testing device for multipoint touch screen |
| WO2020048381A1 (en) * | 2018-09-03 | 2020-03-12 | Changxin Memory Technologies, Inc. | Chip test device and method |
-
2012
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Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103257300A (en) * | 2012-02-16 | 2013-08-21 | 神讯电脑(昆山)有限公司 | Automatic testing device for multipoint touch screen |
| CN103257300B (en) * | 2012-02-16 | 2016-01-20 | 神讯电脑(昆山)有限公司 | Multipoint touch screen automatic testing equipment |
| WO2020048381A1 (en) * | 2018-09-03 | 2020-03-12 | Changxin Memory Technologies, Inc. | Chip test device and method |
| US11385279B2 (en) | 2018-09-03 | 2022-07-12 | Changxin Memory Technologies, Inc. | Chip test device and method |
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