CN202433490U

CN202433490U - Tri-chip LED (light emitting diode) testing device

Info

Publication number: CN202433490U
Application number: CN 201120562260
Authority: CN
Inventors: 李冰; 林开钊; 廖湘涛; 王建江
Original assignee: DONGGUAN ZHONGPU PHOTOELECTRIC EQUIPMENT Co Ltd
Current assignee: DONGGUAN ZHONGPU PHOTOELECTRIC EQUIPMENT Co Ltd
Priority date: 2011-12-29
Filing date: 2011-12-29
Publication date: 2012-09-12
Anticipated expiration: 2021-12-29

Abstract

The utility model discloses a tri-chip LED (light emitting diode) testing device belonging to the technical field of LED. The tri-chip LED testing device mainly aims to solve the technical problems that the tri-chip LED automatic testing system in the prior art cannot test mixed light and cannot automatically identify LED pins. According to the tri-chip LED testing device, the current is automatically converted on each chip, the photoelectric test is performed to each chip one by one, or the three chips are synchronously lightened by equal current so as to perform the mixed-light test, the direction and the pin are unnecessary to distinguish when arranging the LEDs, the accuracy of each driving current is high, so that the measurement veracity is higher, the testing speed is high, the operation is convenient and reliable; the LED testing speed is greatly enhanced, and the technical progress of the LED testing device is developed.

Description

A kind of three brilliant LED proving installations

Technical field

The utility model relates to the LED technical field, is specifically related to a kind of three brilliant LED proving installations.

Background technology

Four pin, the three brilliant LED of prior art, six pin, three brilliant LED Auto-Test Systems are used very extensive; But also imperfection can be tested three brilliant LED though be known as, and much can't carry out three brilliant tests; Though what have can test three wafers one by one, can't test mixing light; Though but the test mixing light that has need sequence direction in advance and confirm LED pin position, can't discern LED pin position automatically, and need three film source table drafting board cards, cost is higher.

Summary of the invention

The technical matters that the utility model will solve provides a kind of three brilliant LED proving installations, and the three brilliant LED Auto-Test Systems that overcome prior art can't test mixing light, and the defective that can't discern LED pin position automatically.

The utility model is to solve the problems of the technologies described above the technical scheme that is adopted to be:

A kind of three brilliant LED proving installations; Comprise source table, said source table comprises that output terminal is high-end, output terminal low side and measuring junction is high-end and the measuring junction low side, and the high-end connection of said output terminal the one No. four SSes are terminal altogether; The high-end connection of said measuring junction the two No. four SSes are terminal altogether; The one No. four SSes comprise first fen terminal, second fen terminal and the 3rd fen terminal, and first fen terminal connects first lead, and second fen terminal connects second lead; Terminal connected privates in the 3rd minute; The two No. four SSes comprise the 4th fen terminal, the 5th fen terminal and the 6th fen terminal, and terminal connected privates in the 4th minute, and the 5th fen terminal connects the 5th lead; Terminal connected the 6th lead in the 6th minute; First lead and said output terminal low side are connected two branch terminals of the first two-way SS respectively, and the common terminal of the first two-way SS connects the first LED wafer to be measured, and second lead and said output terminal low side are connected two branch terminals of the second two-way SS respectively; The common terminal of the second two-way SS connects the second LED wafer to be measured; Privates and said output terminal low side are connected two branch terminals of the 3rd two-way SS respectively, and the common terminal of the 3rd two-way SS connects the 3rd LED wafer to be measured, also comprise the three No. four SSes; Four branch terminals of the 3rd No. four SSes connect said output terminal low side, first lead, second lead and privates respectively; The common terminal of the 3rd No. four SSes connects the public pin of LED to be measured, also comprises the four No. four SSes, and the common terminal of the 4th No. four SSes connects said measuring junction low side; Four branch terminals of the 4th No. four SSes connect the common terminal of the first two-way SS, the common terminal of the second two-way SS, the common terminal of the 3rd two-way SS and the public pin of LED to be measured respectively; Also comprise the 4th two-way SS, the 5th two-way SS and the 6th two-way SS, the common terminal of the 4th two-way SS connects privates, and two branch terminals of the 4th two-way SS connect the common terminal of the first two-way SS and the public pin of LED to be measured respectively; The common terminal of the 5th two-way SS connects the 5th lead; Two branch terminals of the 5th two-way SS connect the common terminal of the second two-way SS and the public pin of LED to be measured respectively, and the common terminal of the 6th two-way SS connects the 6th lead, and two branch terminals of the 6th two-way SS connect the common terminal of the 3rd two-way SS and the public pin of LED to be measured respectively.

Described three brilliant LED proving installations, wherein the one No. four SSes and the two No. four SSes are made up of 2 * No. 4 linked switches.

Described three brilliant LED proving installations wherein also comprise first constant current source and second constant current source, and first constant current source is connected with privates with said source table, first lead, second lead respectively with second constant current source.

Described three brilliant LED proving installations, wherein said source table is made as KEITHLEY2400.

The beneficial effect of the utility model: the utility model automatically with current switching to each wafer, single wafer is carried out photoelectricity test one by one, also can let three wafers light simultaneously with the electric current that equates, carry out the mixed light test; When placing LED, need not to take one's bearings and the pin position, each road drive current consistance is high; It is higher to measure accuracy, and test speed is fast, and is easy to operate; Reliably, the utility model has improved the test speed of LED greatly, has advanced the technical progress of LED proving installation.

Description of drawings

The utility model comprises following accompanying drawing:

Fig. 1 is the utility model synoptic diagram;

Fig. 2 is total to anode test synoptic diagram for the utility model wafer;

Fig. 3 is the utility model wafer common cathode test synoptic diagram;

Fig. 4 is the altogether positive mixed light test of the utility model wafer synoptic diagram;

Fig. 5 is the utility model wafer pin position evolution test synoptic diagram.

Embodiment

According to accompanying drawing and embodiment the utility model is done further explain below:

As shown in Figure 1; The utility model three brilliant LED proving installations comprise the source table; The source table comprises the high-end FH of output terminal, output terminal low side FL and the high-end SH of measuring junction and measuring junction low side SL; The high-end FH of output terminal connects the one No. four SSes terminal altogether, and the high-end SH of measuring junction connects the two No. four SSes terminal altogether, and the one No. four SSes comprise first fen terminal FH1, second fen terminal FH2 and the 3rd fen terminal FH3; Terminal FH1 connected first lead in first minute; Terminal FH2 connected second lead in second minute, and the 3rd fen terminal FH3 connects privates, and the two No. four SSes comprise the 4th fen terminal SH1, the 5th fen terminal SH2 and the 6th fen terminal SH3; Terminal SH1 connected privates in the 4th minute; Terminal SH2 connected the 5th lead in the 5th minute, and terminal SH3 connected the 6th lead in the 6th minute, and first lead and output terminal low side FL are connected two branch terminals of the first two-way SS J3 respectively; The common terminal of the first two-way SS J3 connects the first LED wafer to be measured; Second lead and output terminal low side FL are connected two branch terminals of the second two-way SS J4 respectively, and the common terminal of the second two-way SS J4 connects the second LED wafer to be measured, and privates and output terminal low side FL are connected two branch terminals of the 3rd two-way SS J5 respectively; The common terminal of the 3rd two-way SS J5 connects the 3rd LED wafer to be measured; Also comprise the three No. four SS J6, four branch terminals of the 3rd No. four SS J6 connect output terminal low side FL, first lead, second lead and privates respectively, and the common terminal of the 3rd No. four SS J6 connects the public pin of LED to be measured; Also comprise the four No. four SS J10; The common terminal of the 4th No. four SS J10 connects measuring junction low side SL, and four branch terminals of the 4th No. four SS J10 connect the common terminal of the common terminal of the first two-way SS J3, the second two-way SS J4, the common terminal of the 3rd two-way SS J5 and the public pin of LED to be measured respectively, also comprise the 4th two-way SS J7, the 5th two-way SS J8 and the 6th two-way SS J9; The common terminal of the 4th two-way SS J7 connects privates; Two branch terminals of the 4th two-way SS J7 connect the common terminal of the first two-way SS J3 and the public pin of LED to be measured respectively, and the common terminal of the 5th two-way SS J8 connects the 5th lead, and two branch terminals of the 5th two-way SS J8 connect the common terminal of the second two-way SS J4 and the public pin of LED to be measured respectively; The common terminal of the 6th two-way SS J9 connects the 6th lead, and two branch terminals of the 6th two-way SS J9 connect the common terminal of the 3rd two-way SS J5 and the public pin of LED to be measured respectively.The one No. four SSes and the two No. four SSes are made up of 2 * No. 4 linked switch J1.Also comprise the first constant current source SC1 and the second constant current source SC2, the first constant current source SC1 is connected with privates with source table, first lead, second lead respectively with the second constant current source SC2.The source table is made as KEITHLEY2400.

Wafer anode test altogether one by one:

As shown in Figure 2; Three brilliant sun altogether are when the wafer utmost point is surveyed one by one; The J1 linked switch is got to FH1, SH1 can test chip 3, gets to FH2, SH2 can light test to chip 2, gets to FH3, SH3 can light test to chip 1; Electric current from FL end through the J6 switch to chip, get back to FH through J3/J4/J5 and J1 again and hold.

Wafer common cathode test one by one:

As shown in Figure 3; Three brilliant the moon altogether are when the wafer utmost point is surveyed one by one; The J1 linked switch is got to FH1, SH1 can test chip 3, gets to FH2, SH2 can light test to chip 2, gets to FH3, SH3 can light test to chip 1; Electric current from FH end through J1 and J3/J4/J5 to chip, get back to FL through J6 again and hold.

Altogether positive mixed light test:

As shown in Figure 4, in the time of the mixed light test, the accident electrical parameter; Photometry parameter need not used accurate source and show to measure, as long as each led chip is lighted with identical rated current; Power supply-the V of three tunnel accurate controlled constant flow modules is inner from the source table among the figure, and when lighting LED, J1 beats the shelves at FM; Electric current from FL end through J6 to chip, get back to the SC2 constant flow module through J3/J4/J5 and J12 again.

Altogether cloudy mixed light test:

The positive together test class of altogether cloudy test seemingly, just electric current be from the SC1 constant flow module through J11 and J3/J4/J5 to LED, get back to FL through J6 again.

The evolution test of pin position:

Because in the time of production test, the public pin welding of LED maybe be different, when perhaps testing, LED has turned direction, will cause the position of public pin to change, and the position of test probe is constant, and present design can be carried out public pin conversion easily.

Public pin and FH1 exchange:

As shown in Figure 5; J3, J7 get to the COM end, and J6 gets to the FH1 end, and J10 gets to the SH1 end; J4/J5/J8/J9 is constant for other switches; So just realized that the pin position exchanges, no matter be common the moon sun altogether, by the method for front just can carry out wafer sort or mixed light test one by one, the method that accordings to the front just can realize.

Public pin and FH2 exchange:

J4, J8 get to the COM end, and J6 gets to the FH2 end, and J10 gets to the SH2 end, and J3/J5/J7/J9 is constant for other switches, have so just realized that the pin position exchanges.

Public pin and FH3 exchange:

J5, J9 get to the COM end, and J6 gets to the FH3 end, and J10 gets to the SH3 end, and J3/J4/J7/J8 is constant for other switches, have so just realized that the pin position exchanges.

Those skilled in the art do not break away from the essence and the spirit of the utility model; Can there be the various deformation scheme to realize the utility model; The above is merely the preferable feasible embodiment of the utility model; The interest field that is not so limits to the utility model, the equivalent structure that all utilization the utility model instructionss and accompanying drawing content are done changes, and all is contained within the interest field of the utility model.

Claims

1. brilliant LED proving installation; It is characterized in that: comprise source table, said source table comprises that output terminal is high-end, output terminal low side and measuring junction is high-end and the measuring junction low side, and the high-end connection of said output terminal the one No. four SSes are terminal altogether; The high-end connection of said measuring junction the two No. four SSes are terminal altogether; The one No. four SSes comprise first fen terminal, second fen terminal and the 3rd fen terminal, and first fen terminal connects first lead, and second fen terminal connects second lead; Terminal connected privates in the 3rd minute; The two No. four SSes comprise the 4th fen terminal, the 5th fen terminal and the 6th fen terminal, and terminal connected privates in the 4th minute, and the 5th fen terminal connects the 5th lead; Terminal connected the 6th lead in the 6th minute; First lead and said output terminal low side are connected two branch terminals of the first two-way SS respectively, and the common terminal of the first two-way SS connects the first LED wafer to be measured, and second lead and said output terminal low side are connected two branch terminals of the second two-way SS respectively; The common terminal of the second two-way SS connects the second LED wafer to be measured; Privates and said output terminal low side are connected two branch terminals of the 3rd two-way SS respectively, and the common terminal of the 3rd two-way SS connects the 3rd LED wafer to be measured, also comprise the three No. four SSes; Four branch terminals of the 3rd No. four SSes connect said output terminal low side, first lead, second lead and privates respectively; The common terminal of the 3rd No. four SSes connects the public pin of LED to be measured, also comprises the four No. four SSes, and the common terminal of the 4th No. four SSes connects said measuring junction low side; Four branch terminals of the 4th No. four SSes connect the common terminal of the first two-way SS, the common terminal of the second two-way SS, the common terminal of the 3rd two-way SS and the public pin of LED to be measured respectively; Also comprise the 4th two-way SS, the 5th two-way SS and the 6th two-way SS, the common terminal of the 4th two-way SS connects privates, and two branch terminals of the 4th two-way SS connect the common terminal of the first two-way SS and the public pin of LED to be measured respectively; The common terminal of the 5th two-way SS connects the 5th lead; Two branch terminals of the 5th two-way SS connect the common terminal of the second two-way SS and the public pin of LED to be measured respectively, and the common terminal of the 6th two-way SS connects the 6th lead, and two branch terminals of the 6th two-way SS connect the common terminal of the 3rd two-way SS and the public pin of LED to be measured respectively.

2. according to claim 1 three brilliant LED proving installations is characterized in that: the one No. four SSes and the two No. four SSes are made up of 2 * No. 4 linked switches.

3. according to claim 2 three brilliant LED proving installations is characterized in that: also comprise first constant current source and second constant current source, first constant current source is connected with privates with said source table, first lead, second lead respectively with second constant current source.

4. according to claim 3 three brilliant LED proving installations is characterized in that: said source table is made as KEITHLEY2400.