CN202404163U - Semiconductor integrated block automatic test equipment - Google Patents

Semiconductor integrated block automatic test equipment Download PDF

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Publication number
CN202404163U
CN202404163U CN2011204585514U CN201120458551U CN202404163U CN 202404163 U CN202404163 U CN 202404163U CN 2011204585514 U CN2011204585514 U CN 2011204585514U CN 201120458551 U CN201120458551 U CN 201120458551U CN 202404163 U CN202404163 U CN 202404163U
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CN
China
Prior art keywords
cylinder
test
guide rail
fixed
testing
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Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
CN2011204585514U
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Chinese (zh)
Inventor
张世勇
陈浦晟
杜培阳
林绍芳
陈帽龙
常勇
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Individual
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Individual
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Publication date
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Priority to CN2011204585514U priority Critical patent/CN202404163U/en
Application granted granted Critical
Publication of CN202404163U publication Critical patent/CN202404163U/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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Abstract

The present utility model discloses semiconductor integrated block automatic test equipment. A control panel is fixed on a rack, a testing guide rail is fixed on the rack in an inclined way, a tube-placing box is fixedly connected with the upper end of the testing guide rail, a left testing cylinder and a right testing cylinder which are provided with solenoid valves are horizontally, symmetrically and fixedly connected on the middle and upper position of the testing guide rail, a left testing pin pedestal and a right testing pin pedestal are respectively fixed on push-out parts of the testing cylinders, a waste feed-blocking cylinder and a waster cylinder which are provided with solenoid valves are horizontally and fixedly connected with the testing cylinder, a discharging platen is fixedly connected with the lower end of the surface of a testing rail, outlet is divided into a quality product discharging hole and a waste discharging hole by the discharging platen, a guide rail platen is fixedly connected between the discharging platen and the tube-placing box, an air pressure decompressor is fixedly connected outside the rack, an air inlet is connected with an air source, the outlet is connected with the cylinders through air pipes, and a program control system PLC is fixed inside the rack and connected with a power supply and execution components through conducting wires.

Description

Semiconductor integrated package ATE
Technical field
The utility model relates to a kind of testing apparatus, relates in particular to a kind of semiconductor integrated package ATE.
Technical background
As everyone knows, the semiconductor integrated package all is to be come out by the automated production of professional production producer, though also passed through some detections, has a spot of waste product in the middle of the inevitable product.This has certain rejection rate concerning semiconductor integrated package manufacturer be normal, but concerning using the semiconductor integrated package to produce the producer of miscellaneous equipment, and the useless integrated package equipment of producing of packing into just is equivalent to produce a useless equipment.So, use the producer of semiconductor integrated package all will test, can use after the test passes the semiconductor integrated package of buying.And generally be to adopt semiconductor integrated package dedicated tester at present, from the pipe of dress integrated package, take out integrated package, remove to survey integrated package one by one with manual work; Time one is long; Fatigue will take place in the workman, thereby causes test errors, again waste product has been placed in the certified products probably.There are not at present the report and the list marketing of special test equipment yet.
The utility model content
The purpose of the utility model be to provide for the deficiency that overcomes prior art a kind of automatically, semiconductor integrated package ATE accurately and efficiently.Its technical scheme is: design a frame, fixed a control panel on the frame, be separately installed with start key, blowing key, alarm lamp, feeler switch, waste product key, certified products key, switch, power switch on the control panel; Guide rail is tilting is fixed on the frame in test, and test guide rail upper end is connected with one and puts bobbin carriage, and test guide rail middle and upper part position level symmetry is connected with the left tested cylinder and the right tested cylinder of charged magnet valve; Tested cylinder release portion fixing respectively left side test needle stand, right test needle stand; Level is connected with the waste product backgauge cylinder and the waste product cylinder of a charged magnet valve under the tested cylinder, and lower end, test tracks surface is connected with a discharging pressing plate, and the discharging pressing plate is divided into certified products discharging opening and waste product discharging opening with outlet; Discharging pressing plate and put and be connected with a guide rail clip between the bobbin carriage; Air reducer is fixed in outside the frame, and its air intake opening is connected with source of the gas, and outlet links to each other with each cylinder through tracheae; Program control system PLC is fixed in the frame, links to each other with power supply and each executive component through lead.
For not because of there not being test products to influence the ATE continuous working; Guide rail clip top is equipped with a blank pipe and detects infrared inductor, puts the bobbin carriage affixed replace tubes cylinder on the frame of a side of feeding, an affixed charging replace tubes location-plate in the replace tubes cylinder release portion; Test tracks leans on replace tubes cylinder place to be connected with the pan feeding retaining goods cylinder of a charged magnet valve at the back; Put and be provided with charging in the bobbin carriage and move back the pipe locating slot, putting bobbin carriage one side is the blank pipe case, is connected with a retaining hungry area pipe pressing plate on the blank pipe case.
For test products is accurately located; Be fixed with left test position fix plate and right test position fix plate on the test guide rail; There is material to detect infrared inductor facing to being fixed with one on the test bit position on the guide rail clip; Also be provided with feeding mouth product orientation groove and test position product orientation groove on the test guide rail, test position product orientation groove has the certified products lead-in groove, and the lower end of test tracks test position is connected with a charged magnet valve test retaining goods cylinder.
Influence the ATE continuous working in order not fill sebific duct because of product after testing; Be fixed with a discharging cylinder on the frame of discharging pressing plate one side, discharging pressing plate upper surface also is fixed with the waste product passage respectively and detects infrared inductor and certified products passage detection infrared inductor.
For the induced signal with each infrared inductor amplifies, also be fixed with an induction amplifier in the frame, induction amplifier links to each other with infrared inductor and program control system PLC respectively through lead.
When using the utility model semiconductor integrated package ATE, the integrated package dedicated tester is linked to each other with this equipment, connect pressure gas source; Turn on the power switch; Switch is switched on the automatic transmission, in putting bobbin carriage, load onto the sebific duct that integrated package is housed, the integrated package in the sebific duct will glide along the inclined-plane automatically; Enter into the test position; Tested cylinder push to test needle stand is tested integrated package, and according to certified products or waste product signal that the integrated package dedicated tester sends, program control system PLC sends appointment to corresponding topworks; Command each cylinder operation, the product after the test is put into certified products sebific duct or the waste product sebific duct that is inserted in certified products discharging opening and waste product discharging opening respectively.And, carry out the replacing of sebific duct according to the instruction that the situation of input and output material sebific duct is sent the replacing sebific duct.When carrying out manual operation, with switch switch to manual on, progressively use according to the function of each operating key on the control panel and just can.
Can find out from the technical scheme of the utility model; Because the utility model semiconductor integrated package ATE has adopted combining of solenoid valve and cylinder; Simultaneously program control system PLC and pneumatic control have been carried out perfect combination, everything all is under programming controller control, to carry out work, has not only avoided artificial error; And one the people can keep an eye on many checkout equipments, improved work efficiency and degree of accuracy.Reached fully the utility model automatically, goal of the invention accurately and efficiently.
Description of drawings
Fig. 1 is the perspective view of the utility model semiconductor integrated package ATE;
Fig. 2 is the cross-sectional schematic of the utility model semiconductor integrated package ATE;
Fig. 3 is the test guide rail synoptic diagram partly of the utility model semiconductor integrated package ATE;
Fig. 4 is the circuit diagram of the utility model semiconductor integrated package ATE.
Embodiment
Below in conjunction with accompanying drawing the utility model is done further to detail.
Embodiment 1, referring to accompanying drawing 1, accompanying drawing 2, accompanying drawing 3, accompanying drawing 4, designs a frame 24; Fixed a control panel 33 on the frame, be separately installed with start key 1, blowing key 2, alarm lamp 3, feeler switch 4, waste product key 5, certified products key 6, switch 7, power switch 8 on the control panel, test guide rail 32 tilting being fixed on the frame; Test guide rail upper end is connected with one and puts bobbin carriage 10; Test guide rail middle and upper part position level symmetry is connected with the left tested cylinder 14 and right tested cylinder 15 of charged magnet valve, tested cylinder release portion fixing respectively left side test needle stand 22, right test needle stand 23, and level is connected with the waste product backgauge cylinder 16 and waste product cylinder 17 of a charged magnet valve under the tested cylinder; Lower end, test tracks surface is connected with a discharging pressing plate 18; The discharging pressing plate is divided into certified products discharging opening 25 and waste product discharging opening 26 with outlet, discharging pressing plate and put and be connected with a guide rail clip 13 between the bobbin carriage, and air reducer 9 is fixed in outside the frame; Its air intake opening is connected with source of the gas; Outlet links to each other with each cylinder through tracheae, and program control system PLC38 is fixed in the frame, links to each other with power supply and each executive component through lead.For not because of there not being test products to influence the ATE continuous working; Guide rail clip top is equipped with a blank pipe and detects infrared inductor 39; Put the bobbin carriage affixed replace tubes cylinder 11 on the frame of a side of feeding; An affixed charging replace tubes location-plate 27 in the replace tubes cylinder release portion, test tracks lean on replace tubes cylinder place to be connected with the pan feeding retaining goods cylinder 35 of a charged magnet valve at the back, put to be provided with charging in the bobbin carriage and to move back pipe locating slot 29; Putting bobbin carriage one side is blank pipe case 28, is connected with a retaining hungry area pipe pressing plate 12 on the blank pipe case.For test products is accurately located; Be fixed with left test position fix plate 20 and right test position fix plate 21 on the test guide rail; There is material to detect infrared inductor 40 facing to being fixed with one on the test bit position on the guide rail clip; Also be provided with feeding mouth product orientation groove 30 and test position product orientation groove 31 on the test guide rail, test position product orientation groove has certified products lead-in groove 34, and the lower end of test tracks test position is connected with a charged magnet valve test retaining goods cylinder 36.Influence the ATE continuous working in order not fill sebific duct because of product after testing; Be fixed with a discharging cylinder 19 on the frame of discharging pressing plate one side, discharging pressing plate upper surface also is fixed with the waste product passage respectively and detects infrared inductor 41 and certified products passage detection infrared inductor 42.For the induced signal with each infrared inductor amplifies, also be fixed with an induction amplifier 37 in the frame, induction amplifier links to each other with infrared inductor and program control system PLC respectively through lead.

Claims (5)

1. semiconductor integrated package ATE; It is characterized in that: design a frame (24); Fixed a control panel (33) on the frame, be separately installed with start key (1), blowing key (2), alarm lamp (3), feeler switch (4), waste product key (5), certified products key (6), switch (7), power switch (8) on the control panel, tilting being fixed on the frame of test guide rail (32); Test guide rail upper end is connected with one and puts bobbin carriage (10); Test guide rail middle and upper part position level symmetry is connected with the left tested cylinder (14) and the right tested cylinder (15) of charged magnet valve, tested cylinder release portion fixing respectively left side test needle stand (22), right test needle stand (23), and level is connected with the waste product backgauge cylinder (16) and the waste product cylinder (17) of a charged magnet valve under the tested cylinder; Lower end, test tracks surface is connected with a discharging pressing plate (18); The discharging pressing plate is divided into certified products discharging opening (25) and waste product discharging opening (26) with outlet, discharging pressing plate and put and be connected with a guide rail clip (13) between the bobbin carriage, and air reducer (9) is fixed in outside the frame; Its air intake opening is connected with source of the gas; Outlet links to each other with each cylinder through tracheae, and program control system PLC (38) is fixed in the frame, links to each other with power supply and each executive component through lead.
2. a kind of semiconductor integrated package ATE according to claim 1; It is characterized in that: guide rail clip top is equipped with a blank pipe and detects infrared inductor (39); Put the bobbin carriage affixed replace tubes cylinder (11) on the frame of a side of feeding; An affixed charging replace tubes location-plate (27) in the replace tubes cylinder release portion, test tracks lean on replace tubes cylinder place to be connected with the pan feeding retaining goods cylinder (35) of a charged magnet valve at the back, put to be provided with charging in the bobbin carriage and to move back pipe locating slot (29); Putting bobbin carriage one side is blank pipe case (28), is connected with a retaining hungry area pipe pressing plate (12) on the blank pipe case.
3. a kind of semiconductor integrated package ATE according to claim 1; It is characterized in that: be fixed with left test position fix plate (20) and right test position fix plate (21) on the test guide rail; There is material to detect infrared inductor (40) facing to being fixed with one on the test bit position on the guide rail clip; Also be provided with feeding mouth product orientation groove (30) and test position product orientation groove (31) on the test guide rail; Test position product orientation groove has certified products lead-in groove (34), and the lower end of test tracks test position is connected with a charged magnet valve test retaining goods cylinder (36).
4. a kind of semiconductor integrated package ATE according to claim 1; It is characterized in that: be fixed with a discharging cylinder (19) on the frame of discharging pressing plate one side, discharging pressing plate upper surface also is fixed with the waste product passage respectively and detects infrared inductor (41) and certified products passage detection infrared inductor (42).
5. according to claim 2 or 3 or 4 described a kind of semiconductor integrated package ATEs, it is characterized in that: the frame internal fixation has an induction amplifier (37), and induction amplifier links to each other with infrared inductor and program control system PLC respectively through lead.
CN2011204585514U 2011-11-18 2011-11-18 Semiconductor integrated block automatic test equipment Expired - Fee Related CN202404163U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN2011204585514U CN202404163U (en) 2011-11-18 2011-11-18 Semiconductor integrated block automatic test equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN2011204585514U CN202404163U (en) 2011-11-18 2011-11-18 Semiconductor integrated block automatic test equipment

Publications (1)

Publication Number Publication Date
CN202404163U true CN202404163U (en) 2012-08-29

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ID=46701803

Family Applications (1)

Application Number Title Priority Date Filing Date
CN2011204585514U Expired - Fee Related CN202404163U (en) 2011-11-18 2011-11-18 Semiconductor integrated block automatic test equipment

Country Status (1)

Country Link
CN (1) CN202404163U (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102401865A (en) * 2011-11-18 2012-04-04 张世勇 Automatic test equipment for semiconductor integrated block

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102401865A (en) * 2011-11-18 2012-04-04 张世勇 Automatic test equipment for semiconductor integrated block

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C14 Grant of patent or utility model
GR01 Patent grant
CF01 Termination of patent right due to non-payment of annual fee

Granted publication date: 20120829

Termination date: 20141118

EXPY Termination of patent right or utility model