CN102401865A - Automatic test equipment for semiconductor integrated block - Google Patents
Automatic test equipment for semiconductor integrated block Download PDFInfo
- Publication number
- CN102401865A CN102401865A CN2011103666167A CN201110366616A CN102401865A CN 102401865 A CN102401865 A CN 102401865A CN 2011103666167 A CN2011103666167 A CN 2011103666167A CN 201110366616 A CN201110366616 A CN 201110366616A CN 102401865 A CN102401865 A CN 102401865A
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- cylinder
- test
- guide rail
- fixed
- pressing plate
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- 238000012360 testing method Methods 0.000 title claims abstract description 78
- 239000004065 semiconductor Substances 0.000 title claims abstract description 22
- 239000002699 waste material Substances 0.000 claims abstract description 23
- 238000007599 discharging Methods 0.000 claims description 26
- 230000006698 induction Effects 0.000 claims description 6
- 238000001514 detection method Methods 0.000 claims description 4
- 239000000463 material Substances 0.000 claims description 4
- 238000007664 blowing Methods 0.000 claims description 3
- 239000003638 chemical reducing agent Substances 0.000 claims description 3
- 230000000903 blocking effect Effects 0.000 abstract 1
- 238000004519 manufacturing process Methods 0.000 description 3
- 238000010586 diagram Methods 0.000 description 2
- 230000005540 biological transmission Effects 0.000 description 1
- 230000007812 deficiency Effects 0.000 description 1
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- Testing Of Individual Semiconductor Devices (AREA)
Abstract
The invention discloses an automatic testing device for semiconductor integrated blocks, a control panel is fixed on a frame, a testing guide rail is obliquely fixed on the frame, a discharge box is fixedly connected at the upper end of the testing guide rail, a left testing cylinder and a right testing cylinder with electromagnetic valves are horizontally and symmetrically fixedly connected at the upper middle position of the testing guide rail, a pushing part of the testing cylinder is respectively fixed with a left testing needle seat and a right testing needle seat, a waste material blocking cylinder with an electromagnetic valve and a waste material cylinder are horizontally and fixedly connected under the testing cylinder, a discharge pressing plate is fixedly connected at the lower end of the surface of a testing track, an outlet is divided into a positive product discharge port and a waste product discharge port by the discharge pressing plate, a guide rail pressing plate is fixedly connected between the discharge pressing plate and the discharge box, the air inlet is connected with an air source, the outlet is connected with each air cylinder through an air pipe, and the program control system PLC is fixed in the rack and is connected with the power supply and each execution element through a lead.
Description
Technical field
The present invention relates to a kind of testing apparatus, relate in particular to a kind of semiconductor integrated package ATE.
Technical background
As everyone knows, the semiconductor integrated package all is to be come out by the automated production of professional production producer, though also passed through some detections, has a spot of waste product in the middle of the inevitable product.This has certain rejection rate concerning semiconductor integrated package manufacturer be normal, but concerning the producer that uses semiconductor integrated package production miscellaneous equipment, a useless integrated package load facility has just quite been produced a useless equipment.So, use the producer of semiconductor integrated package all will test, can use after the test passes the semiconductor integrated package of buying.And generally be to adopt semiconductor integrated package dedicated tester at present, from the pipe of dress integrated package, take out integrated package, remove to survey integrated package one by one with manual work; Time one is long; Fatigue will take place in the workman, thereby causes test errors, again waste product has been placed in the certified products probably.There are not at present the report and the list marketing of special test equipment yet.
Summary of the invention
The objective of the invention is to provide for the deficiency that overcomes prior art a kind of automatically, semiconductor integrated package ATE accurately and efficiently.Its technical scheme is: design a frame, fixed a control panel on the frame, be separately installed with start key, blowing key, alarm lamp, feeler switch, waste product key, certified products key, switch, power switch on the control panel; Guide rail is tilting is fixed on the frame in test, and test guide rail upper end is connected with one and puts bobbin carriage, and test guide rail middle and upper part position level symmetry is connected with the left tested cylinder and the right tested cylinder of charged magnet valve; Tested cylinder release portion fixing respectively left side test needle stand, right test needle stand; Level is connected with the waste product backgauge cylinder and the waste product cylinder of a charged magnet valve under the tested cylinder, and lower end, test tracks surface is connected with a discharging pressing plate, and the discharging pressing plate is divided into certified products discharging opening and waste product discharging opening with outlet; Discharging pressing plate and put and be connected with a guide rail clip between the bobbin carriage; Air reducer is fixed in outside the frame, and its air intake opening is connected with source of the gas, and outlet links to each other with each cylinder through tracheae; Program control system PLC is fixed in the frame, links to each other with power supply and each executive component through lead.
For not because of there not being test products to influence the ATE continuous working; Guide rail clip top is equipped with a blank pipe and detects infrared inductor, puts the bobbin carriage affixed replace tubes cylinder on the frame of a side of feeding, an affixed charging replace tubes location-plate in the replace tubes cylinder release portion; Test tracks leans on replace tubes cylinder place to be connected with the pan feeding retaining goods cylinder of a charged magnet valve at the back; Put and be provided with charging in the bobbin carriage and move back the pipe locating slot, putting bobbin carriage one side is the blank pipe case, is connected with a retaining hungry area pipe pressing plate on the blank pipe case.
For test products is accurately located; Be fixed with left test position fix plate and right test position fix plate on the test guide rail; There is material to detect infrared inductor facing to being fixed with one on the test bit position on the guide rail clip; Also be provided with feeding mouth product orientation groove and test position product orientation groove on the test guide rail, test position product orientation groove has the certified products lead-in groove, and the lower end of test tracks test position is connected with a charged magnet valve test retaining goods cylinder.
Influence the ATE continuous working in order not fill sebific duct because of product after testing; Be fixed with a discharging cylinder on the frame of discharging pressing plate one side, discharging pressing plate upper surface also is fixed with the waste product passage respectively and detects infrared inductor and certified products passage detection infrared inductor.
For the induced signal with each infrared inductor amplifies, also be fixed with an induction amplifier in the frame, induction amplifier links to each other with each infrared inductor and program control system PLC respectively through lead.
When using semiconductor integrated package ATE of the present invention, the integrated package dedicated tester is linked to each other with this equipment, connect pressure gas source; Turn on the power switch, switch is switched on the automatic transmission, in putting bobbin carriage, load onto the sebific duct that integrated package is housed; Integrated package in the sebific duct will glide along the inclined-plane automatically, enters into the test position, and tested cylinder push to test needle stand is tested integrated package; The certified products or the waste product signal that send according to the integrated package dedicated tester; Program control system PLC sends appointment to corresponding topworks, commands each cylinder operation, and the product after the test is put into certified products sebific duct or the waste product sebific duct that is inserted in certified products discharging opening and waste product discharging opening respectively.And, carry out the replacing of sebific duct according to the instruction that the situation of input and output material sebific duct is sent the replacing sebific duct.When carrying out manual operation, with switch switch to manual on, progressively use according to the function of each operating key on the control panel and just can.
Can find out from technical scheme of the present invention; Because semiconductor integrated package ATE of the present invention has adopted combining of solenoid valve and cylinder; Simultaneously program control system PLC and pneumatic control have been carried out perfect combination, everything all is under programming controller control, to carry out work, has not only avoided artificial error; And one the people can keep an eye on many checkout equipments, improved work efficiency and degree of accuracy.Reached fully the present invention automatically, goal of the invention accurately and efficiently.
Description of drawings
Fig. 1 is the perspective view of semiconductor integrated package ATE of the present invention;
Fig. 2 is the cross-sectional schematic of semiconductor integrated package ATE of the present invention;
Fig. 3 is the test guide rail synoptic diagram partly of semiconductor integrated package ATE of the present invention;
Fig. 4 is the circuit diagram of semiconductor integrated package ATE of the present invention.
Embodiment
Below in conjunction with accompanying drawing the present invention is made further detailed description.
Embodiment 1, referring to accompanying drawing 1, accompanying drawing 2, accompanying drawing 3, accompanying drawing 4, designs a frame 24; Fixed a control panel 33 on the frame, be separately installed with start key 1, blowing key 2, alarm lamp 3, feeler switch 4, waste product key 5, certified products key 6, switch 7, power switch 8 on the control panel, test guide rail 32 tilting being fixed on the frame; Test guide rail upper end is connected with one and puts bobbin carriage 10; Test guide rail middle and upper part position level symmetry is connected with the left tested cylinder 14 and right tested cylinder 15 of charged magnet valve, tested cylinder release portion fixing respectively left side test needle stand 22, right test needle stand 23, and level is connected with the waste product backgauge cylinder 16 and waste product cylinder 17 of a charged magnet valve under the tested cylinder; Lower end, test tracks surface is connected with a discharging pressing plate 18; The discharging pressing plate is divided into certified products discharging opening 25 and waste product discharging opening 26 with outlet, discharging pressing plate and put and be connected with a guide rail clip 13 between the bobbin carriage, and air reducer 9 is fixed in outside the frame; Its air intake opening is connected with source of the gas; Outlet links to each other with each cylinder through tracheae, and program control system PLC38 is fixed in the frame, links to each other with power supply and each executive component through lead.For not because of there not being test products to influence the ATE continuous working; Guide rail clip top is equipped with a blank pipe and detects infrared inductor 39; Put the bobbin carriage affixed replace tubes cylinder 11 on the frame of a side of feeding; An affixed charging replace tubes location-plate 27 in the replace tubes cylinder release portion, test tracks lean on replace tubes cylinder place to be connected with the pan feeding retaining goods cylinder 35 of a charged magnet valve at the back, put to be provided with charging in the bobbin carriage and to move back pipe locating slot 29; Putting bobbin carriage one side is blank pipe case 28, is connected with a retaining hungry area pipe pressing plate 12 on the blank pipe case.For test products is accurately located; Be fixed with left test position fix plate 20 and right test position fix plate 21 on the test guide rail; There is material to detect infrared inductor 40 facing to being fixed with one on the test bit position on the guide rail clip; Also be provided with feeding mouth product orientation groove 30 and test position product orientation groove 31 on the test guide rail, test position product orientation groove has certified products lead-in groove 34, and the lower end of test tracks test position is connected with a charged magnet valve test retaining goods cylinder 36.Influence the ATE continuous working in order not fill sebific duct because of product after testing; Be fixed with a discharging cylinder 19 on the frame of discharging pressing plate one side, discharging pressing plate upper surface also is fixed with the waste product passage respectively and detects infrared inductor 41 and certified products passage detection infrared inductor 42.For the induced signal with each infrared inductor amplifies, also be fixed with an induction amplifier 37 in the frame, induction amplifier links to each other with each infrared inductor and program control system PLC respectively through lead.
Claims (5)
1. semiconductor integrated package ATE; It is characterized in that: design a frame (24); Fixed a control panel (33) on the frame, be separately installed with start key (1), blowing key (2), alarm lamp (3), feeler switch (4), waste product key (5), certified products key (6), switch (7), power switch (8) on the control panel, tilting being fixed on the frame of test guide rail (32); Test guide rail upper end is connected with one and puts bobbin carriage (10); Test guide rail middle and upper part position level symmetry is connected with the left tested cylinder (14) and the right tested cylinder (15) of charged magnet valve, tested cylinder release portion fixing respectively left side test needle stand (22), right test needle stand (23), and level is connected with the waste product backgauge cylinder (16) and the waste product cylinder (17) of a charged magnet valve under the tested cylinder; Lower end, test tracks surface is connected with a discharging pressing plate (18); The discharging pressing plate is divided into certified products discharging opening (25) and waste product discharging opening (26) with outlet, discharging pressing plate and put and be connected with a guide rail clip (13) between the case, and air reducer (9) is fixed in outside the frame; Its air intake opening is connected with source of the gas; Outlet links to each other with each cylinder through tracheae, and program control system PLC (38) is fixed in the frame, links to each other with power supply and each executive component through lead.
2. a kind of semiconductor integrated package ATE according to claim 1; It is characterized in that: guide rail clip top is equipped with a blank pipe and detects infrared inductor (39); Put the bobbin carriage affixed replace tubes cylinder (11) on the frame of a side of feeding; An affixed charging replace tubes location-plate (27) in the replace tubes cylinder release portion, test tracks lean on replace tubes cylinder place to be connected with the pan feeding retaining goods cylinder (35) of a charged magnet valve at the back, put to be provided with charging in the bobbin carriage and to move back pipe locating slot (29); Putting bobbin carriage one side is blank pipe case (28), is connected with a retaining hungry area pipe pressing plate (12) on the blank pipe case.
3. a kind of semiconductor integrated package ATE according to claim 1; It is characterized in that: be fixed with left test position fix plate (20) and right test position fix plate (21) on the test guide rail; There is material to detect infrared inductor (40) facing to being fixed with one on the test bit position on the guide rail clip; Also be provided with feeding mouth product orientation groove (30) and test position product orientation groove (31) on the test guide rail; Test position product orientation groove has certified products lead-in groove (34), and the lower end of test tracks test position is connected with a charged magnet valve test retaining goods cylinder (36).
4. a kind of semiconductor integrated package ATE according to claim 1; It is characterized in that: be fixed with a discharging cylinder (19) on the frame of discharging pressing plate one side, discharging pressing plate upper surface also is fixed with the waste product passage respectively and detects infrared inductor (41) and certified products passage detection infrared inductor (42).
5. a kind of semiconductor integrated package ATE according to claim 1, it is characterized in that: the frame internal fixation has an induction amplifier (37), and induction amplifier links to each other with each infrared inductor and program control system PLC respectively through lead.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2011103666167A CN102401865A (en) | 2011-11-18 | 2011-11-18 | Automatic test equipment for semiconductor integrated block |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2011103666167A CN102401865A (en) | 2011-11-18 | 2011-11-18 | Automatic test equipment for semiconductor integrated block |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN102401865A true CN102401865A (en) | 2012-04-04 |
Family
ID=45884279
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN2011103666167A Pending CN102401865A (en) | 2011-11-18 | 2011-11-18 | Automatic test equipment for semiconductor integrated block |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN102401865A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108548981A (en) * | 2018-03-07 | 2018-09-18 | 柏吉成智能科技（深圳）有限公司 | A kind of data line connector tester |
Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| FR2605744A1 (en) * | 1986-10-22 | 1988-04-29 | Gacha Roger | New unit for the automatic checking of electronic components (resistors, capacitors, diodes) to be installed in a sequencer; the checking unit and the sequencer being controlled by a microcomputer and an industrial programmable logic controller using control software |
| JP2697372B2 (en) * | 1991-06-25 | 1998-01-14 | 日本電気株式会社 | High power semiconductor integrated circuit cooling test jig |
| CN101186012A (en) * | 2006-11-17 | 2008-05-28 | 沈阳新松机器人自动化股份有限公司 | IC shearing bending forming machine |
| CN201352238Y (en) * | 2008-12-24 | 2009-11-25 | 天津雷沃动力股份有限公司 | Automatic test system for reliability of resistance heater |
| CN101782612A (en) * | 2009-11-26 | 2010-07-21 | 中国电子科技集团公司第二十六研究所 | Automatic test system for surface acoustic wave (SAW) filter |
| CN202404163U (en) * | 2011-11-18 | 2012-08-29 | 张世勇 | Semiconductor integrated block automatic test equipment |
-
2011
- 2011-11-18 CN CN2011103666167A patent/CN102401865A/en active Pending
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| FR2605744A1 (en) * | 1986-10-22 | 1988-04-29 | Gacha Roger | New unit for the automatic checking of electronic components (resistors, capacitors, diodes) to be installed in a sequencer; the checking unit and the sequencer being controlled by a microcomputer and an industrial programmable logic controller using control software |
| JP2697372B2 (en) * | 1991-06-25 | 1998-01-14 | 日本電気株式会社 | High power semiconductor integrated circuit cooling test jig |
| CN101186012A (en) * | 2006-11-17 | 2008-05-28 | 沈阳新松机器人自动化股份有限公司 | IC shearing bending forming machine |
| CN201352238Y (en) * | 2008-12-24 | 2009-11-25 | 天津雷沃动力股份有限公司 | Automatic test system for reliability of resistance heater |
| CN101782612A (en) * | 2009-11-26 | 2010-07-21 | 中国电子科技集团公司第二十六研究所 | Automatic test system for surface acoustic wave (SAW) filter |
| CN202404163U (en) * | 2011-11-18 | 2012-08-29 | 张世勇 | Semiconductor integrated block automatic test equipment |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108548981A (en) * | 2018-03-07 | 2018-09-18 | 柏吉成智能科技（深圳）有限公司 | A kind of data line connector tester |
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| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
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| AD01 | Patent right deemed abandoned |
Effective date of abandoning: 20120404 |
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| C20 | Patent right or utility model deemed to be abandoned or is abandoned |