CN202372613U - 在晶圆级对霍尔器件进行测试的装置 - Google Patents
在晶圆级对霍尔器件进行测试的装置 Download PDFInfo
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CN 201120528040 CN202372613U (zh) | 2011-12-16 | 2011-12-16 | 在晶圆级对霍尔器件进行测试的装置 |
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Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN107102248A (zh) * | 2017-05-09 | 2017-08-29 | 普冉半导体(上海)有限公司 | 一种晶圆加磁测试装置及其测试方法 |
CN111289928A (zh) * | 2020-03-10 | 2020-06-16 | 无锡力芯微电子股份有限公司 | 霍尔器件测试系统和测试方法 |
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Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
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CN107102248A (zh) * | 2017-05-09 | 2017-08-29 | 普冉半导体(上海)有限公司 | 一种晶圆加磁测试装置及其测试方法 |
CN111289928A (zh) * | 2020-03-10 | 2020-06-16 | 无锡力芯微电子股份有限公司 | 霍尔器件测试系统和测试方法 |
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Owner name: SHANGHAI HUAHONG GRACE SEMICONDUCTOR MANUFACTURING Free format text: FORMER OWNER: HUAHONG NEC ELECTRONICS CO LTD, SHANGHAI Effective date: 20131231 |
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Effective date of registration: 20131231 Address after: 201203 Shanghai city Zuchongzhi road Pudong New Area Zhangjiang hi tech Park No. 1399 Patentee after: Shanghai Huahong Grace Semiconductor Manufacturing Corporation Address before: 201206, Shanghai, Pudong New Area, Sichuan Road, No. 1188 Bridge Patentee before: Shanghai Huahong NEC Electronics Co., Ltd. |
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