CN202218259U - 直流偏移消除系统 - Google Patents
直流偏移消除系统 Download PDFInfo
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- CN202218259U CN202218259U CN2011203013310U CN201120301331U CN202218259U CN 202218259 U CN202218259 U CN 202218259U CN 2011203013310 U CN2011203013310 U CN 2011203013310U CN 201120301331 U CN201120301331 U CN 201120301331U CN 202218259 U CN202218259 U CN 202218259U
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CN2011203013310U CN202218259U (zh) | 2011-08-18 | 2011-08-18 | 直流偏移消除系统 |
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CN2011203013310U CN202218259U (zh) | 2011-08-18 | 2011-08-18 | 直流偏移消除系统 |
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CN202218259U true CN202218259U (zh) | 2012-05-09 |
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CN2011203013310U Expired - Lifetime CN202218259U (zh) | 2011-08-18 | 2011-08-18 | 直流偏移消除系统 |
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Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN102281218A (zh) * | 2011-08-18 | 2011-12-14 | 泰凌微电子(上海)有限公司 | 直流偏移消除系统及其方法 |
CN112311707A (zh) * | 2021-01-02 | 2021-02-02 | 杭州优智联科技有限公司 | 基于uwb系统的直流偏移估计方法、装置、设备及存储介质 |
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2011
- 2011-08-18 CN CN2011203013310U patent/CN202218259U/zh not_active Expired - Lifetime
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN102281218A (zh) * | 2011-08-18 | 2011-12-14 | 泰凌微电子(上海)有限公司 | 直流偏移消除系统及其方法 |
CN102281218B (zh) * | 2011-08-18 | 2017-07-28 | 泰凌微电子(上海)有限公司 | 直流偏移消除系统及其方法 |
CN112311707A (zh) * | 2021-01-02 | 2021-02-02 | 杭州优智联科技有限公司 | 基于uwb系统的直流偏移估计方法、装置、设备及存储介质 |
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Legal Events
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C14 | Grant of patent or utility model | ||
GR01 | Patent grant | ||
C53 | Correction of patent for invention or patent application | ||
CB03 | Change of inventor or designer information |
Inventor after: Sheng Wenjun Inventor after: Jin Haipeng Inventor after: Nie Hong Inventor before: Nie Hong |
|
COR | Change of bibliographic data |
Free format text: CORRECT: INVENTOR; FROM: NIE HONG TO: SHENG WENJUN JIN HAIPENG NIE HONG |
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CP03 | Change of name, title or address |
Address after: 201203 building 3, no.1500 Zuchongzhi Road, Pudong New Area, Shanghai Patentee after: Tailing Microelectronics (Shanghai) Co.,Ltd. Address before: 201203 3rd floor, building 21, 88 Darwin Road, Zhangjiang High Tech Park, Pudong New Area, Shanghai Patentee before: TELINK SEMICONDUCTOR (SHANGHAI) Co.,Ltd. |
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CP03 | Change of name, title or address | ||
CX01 | Expiry of patent term |
Granted publication date: 20120509 |
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CX01 | Expiry of patent term |