CN202155654U - Improved weldability tester - Google Patents
Improved weldability tester Download PDFInfo
- Publication number
- CN202155654U CN202155654U CN2011202626399U CN201120262639U CN202155654U CN 202155654 U CN202155654 U CN 202155654U CN 2011202626399 U CN2011202626399 U CN 2011202626399U CN 201120262639 U CN201120262639 U CN 201120262639U CN 202155654 U CN202155654 U CN 202155654U
- Authority
- CN
- China
- Prior art keywords
- control panel
- tin stove
- pcb
- timer
- infrared
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
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- Investigating Or Analyzing Materials Using Thermal Means (AREA)
Abstract
Description
Claims (2)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN2011202626399U CN202155654U (en) | 2011-07-22 | 2011-07-22 | Improved weldability tester |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN2011202626399U CN202155654U (en) | 2011-07-22 | 2011-07-22 | Improved weldability tester |
Publications (1)
Publication Number | Publication Date |
---|---|
CN202155654U true CN202155654U (en) | 2012-03-07 |
Family
ID=45763303
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN2011202626399U Expired - Lifetime CN202155654U (en) | 2011-07-22 | 2011-07-22 | Improved weldability tester |
Country Status (1)
Country | Link |
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CN (1) | CN202155654U (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN113514670A (en) * | 2021-04-21 | 2021-10-19 | 芜湖雅葆轩电子科技股份有限公司 | PCB thermal stress test method |
-
2011
- 2011-07-22 CN CN2011202626399U patent/CN202155654U/en not_active Expired - Lifetime
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN113514670A (en) * | 2021-04-21 | 2021-10-19 | 芜湖雅葆轩电子科技股份有限公司 | PCB thermal stress test method |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
C14 | Grant of patent or utility model | ||
GR01 | Patent grant | ||
C56 | Change in the name or address of the patentee | ||
CP01 | Change in the name or title of a patent holder |
Address after: Baoan District manhole Street Ho 518000 Shenzhen city Guangdong Province four West Industrial Park second building Patentee after: Shenzhen Xinghe circuit Limited by Share Ltd Address before: Baoan District manhole Street Ho 518000 Shenzhen city Guangdong Province four West Industrial Park second building Patentee before: Galaxy Circuit Co., Ltd. |
|
TR01 | Transfer of patent right | ||
TR01 | Transfer of patent right |
Effective date of registration: 20170626 Address after: 435000, Hubei province Huangshi economic and Technological Development Zone Jinshan Road 189 B building R & D office 101 Patentee after: Huangshi Xinghe circuit Co., Ltd. Address before: Baoan District manhole Street Ho 518000 Shenzhen city Guangdong Province four West Industrial Park second building Patentee before: Shenzhen Xinghe circuit Limited by Share Ltd |
|
CX01 | Expiry of patent term | ||
CX01 | Expiry of patent term |
Granted publication date: 20120307 |