CN202033176U - Laser and light emitting diode radiation test system - Google Patents
Laser and light emitting diode radiation test system Download PDFInfo
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- CN202033176U CN202033176U CN2011200602559U CN201120060255U CN202033176U CN 202033176 U CN202033176 U CN 202033176U CN 2011200602559 U CN2011200602559 U CN 2011200602559U CN 201120060255 U CN201120060255 U CN 201120060255U CN 202033176 U CN202033176 U CN 202033176U
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Abstract
A laser and light emitting diode radiation test system comprises a probe, a support and a pedestal, wherein the support includes a probe support (1), a lens support (2) and a support (3) for light source to be tested, the pedestal is a horizontal pedestal (4), and the probe support (1), the lens support (2) and the support (3) for light source to be tested are arranged on the horizontal pedestal (4) equipped with a main guide rail (5) and a branch guide rail (7). According to the test system, the distances between a probe, a lens and a light source to be tested are easy to change, and have wide changing scopes; the probe, the lens and the light source to be tested are respectively fixed on the support, without shaking during the test process, the centers of the probe, the lens and the light source to be tested are ensured to be in a same straight line, the test result is affected little, the test system may provide more than one lenses, the system enables the probe and the light source to be tested to either shift horizontally or rotate reciprocatedly, the test data is accurate, excellent in stability, as well as fast and convenient in operation.
Description
Technical field
The utility model relates to a kind of laser instrument and led radiation test macro.
Background technology
The traditional testing laser device and the method for led radiation, it is to hold measured light and probe respectively with hand that a kind of mode is arranged, there is certain defective in this mode, hand may tremble in test process, if test volume is big, and overlong time, staff is just tired easily, have to substitute and test, its test effect is low; In addition, hand is taken measured light and probe, is difficult to guarantee both centers on same straight line, if both centers not on same straight line, are tested and just can not be carried out, this test mode is influenced too much by human factor, and test result is inaccurate, wastes time and energy.In order to address the above problem, Chinese patent literature CN2138303 discloses a kind of LED test instrument apparatus, comprise probe, support, test desk and measure pedestal, probe has cable can be connected LED test instrument electric box with test desk, exports the electric current of photosignal and acquisition driven for emitting lights diode respectively.As long as photoelectric probe is risen under spring action, can in the socket of test desk, inject pipe to be measured, depress photoelectric probe after, can obtain led radiation, by the photosignal of photodetector conversion.This proving installation is that measured light maintains static, and probe moves up and down, and has the little problem of mobile range; In reality test, various measured light characteristic differences, the part measured light need pop one's head in and measured light between distance very big, and with this instrument support height do very high be unpractical.
The utility model content
The purpose of this utility model is at the problems referred to above, provide a kind of laser instrument and led radiation test macro to society, this system can not only provide the translation of probe and measured light, the space rotation can be provided again, be convenient to various test needs, the native system test data is accurate, and good stability is easy to operate quick.
The technical solution of the utility model is: design a kind of laser instrument and led radiation test macro, comprise probe, support and pedestal, described support comprises probe bracket, described probe is arranged on the top of probe bracket, lens carrier, lens are arranged on the top of lens carrier, and the measured light support is provided with the measured light folder that is used to place measured light on the measured light support; Described pedestal is a horizontal base, described probe bracket, lens carrier and measured light support are arranged on the horizontal base, be provided with first grid door screen between described lens and described measured light, the center line of described probe, lens, first grid door screen and measured light is on same straight line.
As to improvement of the present utility model, described horizontal base comprises a main guide rail and a guide rail, described measured light support is arranged on the described main guide rail by first master slider, described guide rail is arranged on the described main guide rail by second master slider, described probe bracket is arranged on described the guide rail by the first secondary slide block, and described lens carrier is arranged on described the guide rail by the second secondary slide block.
As to further improvement of the utility model, described probe bracket comprises makes probe bracket in directions X travel mechanism that directions X moves, described directions X travel mechanism comprises, following two, described piece is down fixedlyed connected with the first secondary slide block, be provided with screw rodb base and screw mandrel on the piece down described, described screw mandrel is threaded with screw rodb base, outer end at screw mandrel is provided with knob, be provided with pushing block on the piece on described, described screw mandrel and pushing block flexibly connect, and rotate described knob, and pushing block is under the screw mandrel effect, piece moves back and forth at directions X in the drive, thereby described probe bracket is also moved back and forth at directions X.
As to further improvement of the utility model, described probe bracket comprises makes probe bracket in Y direction travel mechanism that the Y direction moves, described Y direction travel mechanism comprises, following two, following piece links to each other with the last piece of directions X travel mechanism, be provided with screw rodb base and screw mandrel on the piece down described, described screw mandrel is threaded with screw rodb base, outer end at screw mandrel is provided with knob, be provided with pushing block on the piece on described, described screw mandrel and pushing block flexibly connect, and rotate described knob, and pushing block is under the screw mandrel effect, piece moves back and forth in the Y direction in the drive, thereby described probe bracket is also moved back and forth in the Y direction.
In the utility model, described probe bracket comprises that the plane rotating mechanism of probe bracket in the plane rotation, described plane rotating mechanism are comprised makes knob, the guide rod of probe bracket in the plane rotation, turns knob, drives guide rod probe bracket is rotated on the plane.
As to further improvement of the utility model, probe bracket 1 comprises makes the directions X rotating mechanism 14 of probe bracket 1 in the directions X rotation, described directions X rotating mechanism 14 comprises directions X rotating mechanism knob, directions X rotating mechanism screw mandrel, the first cambered surface piece 141, the second cambered surface piece 142, going to the bottom of the described first cambered surface piece 141 is cambered surface, the upper base of the described second cambered surface piece 142 for the identical cambered surface of radian of the cambered surface of going to the bottom of the first cambered surface piece 141, the described first cambered surface piece 141 is superimposed upon on the described second cambered surface piece 142, and make the direction of cambered surface be directions X, first spur gear and first spiral gear, described directions X rotating mechanism knob is arranged on the outer end of directions X rotating mechanism screw mandrel, the directions X rotating mechanism screw mandrel other end is connected with first spur gear that is positioned at the first cambered surface piece, 141 belows, first spur gear and first spiral gear engagement that is arranged on the first cambered surface piece, 141 bottom surfaces, turn directions X rotating mechanism knob and drive the rotation of first spur gear and first spiral gear, first spiral gear drives first skewback 141 and back and forth rotates at directions X, back and forth rotates at directions X thereby first skewback 141 drives probe bracket 1.
As to further improvement of the utility model, probe bracket 1 comprises makes the Y direction rotating mechanism 15 of probe bracket 1 in the rotation of Y direction, described Y direction rotating mechanism 15 comprises Y direction rotating mechanism knob, Y direction rotating mechanism screw mandrel, the 3rd cambered surface piece 151, the 4th cambered surface piece 152, going to the bottom of described the 3rd cambered surface piece 151 is cambered surface, the upper base of described the 4th cambered surface piece 152 for the identical cambered surface of radian of the cambered surface of going to the bottom of the 3rd cambered surface piece 151, described the 3rd cambered surface piece 151 is superimposed upon on described the 4th cambered surface piece 142, and the direction that makes cambered surface is the Y direction, second spur gear and second spiral gear, described Y direction rotating mechanism knob is arranged on Y direction rotating mechanism screw mandrel outer end, Y direction rotating mechanism screw mandrel is connected with second spur gear that is positioned at the 3rd cambered surface piece 151 belows, second spur gear and second spiral gear engagement that is arranged on the 3rd cambered surface piece 151 bottom surfaces, turn Y direction rotating mechanism knob and drive second spur gear and the rotation of second spiral gear, second spiral gear drives second skewback 151 back and forth in the rotation of Y direction, back and forth rotates in the Y direction thereby the second oblique skewback 151 drives probe bracket 1.
As to further improvement of the utility model, described lens carrier comprises the lens carrier elevating mechanism, described lens carrier elevating mechanism comprises first sleeve and first loop bar, described first sleeve is connected on the second secondary slide block, described first loop bar assigns in first sleeve, is provided with the knob that is used to locate first loop bar on sleeve.
As to further improvement of the utility model, described lens carrier comprises the micro-adjusting mechanism of lens, described micro-adjusting mechanism comprises first screw mandrel, Connection Block, micro-adjusting mechanism knob, a pair of sidespin button and a pair of montant, Connection Block is provided with two through holes, described montant passes two through holes respectively and is connected on the lens mount, described knob is arranged on the relative two sides of Connection Block, the micro-adjusting mechanism knob is arranged on the top of screw mandrel, the lower end of screw mandrel is connected with lens, turn the micro-adjusting mechanism knob, first screw mandrel moves up and down, the fine setting lens position.
As to further improvement of the utility model, described measured light support comprises the telescoping mechanism of adjusting the measured light height, the top of described telescoping mechanism be connected dull and stereotyped linking to each other, the telescoping mechanism bottom links to each other with first master slider, telescoping mechanism comprises second screw mandrel, is connected the rocking handle of the second screw mandrel outer end, four contiguous blocks and four telescopic units, each telescopic unit comprises four stretchable sheets, per two stretchable sheets constitute a fork, the lower end of one of them fork is connected with the upper end of another fork, constitutes a parallelogram in the middle part; Two telescoping member about per two telescopic units keep at a certain distance away and are connected to by two contiguous blocks, two telescoping member link to each other with second screw mandrel and are distributed on first master slider, rotation crank, second screw mandrel drives the telescoping mechanism lifting.
As to further improvement of the utility model, described measured light support comprises rotating disk, fixed flat planar, second sleeve and second loop bar of adjusting the measured light angle, rotating disk is located at second loop bar upper end, second loop bar assigns in second sleeve, and second sleeve is arranged on the fixed flat planar, and fixed flat planar is fixed on and connects on the flat board, described measured light folder is arranged on the rotating disk, rotate rotating disk, drive the measured light folder, adjust the angle of measured light.
A kind of laser instrument that the utility model provides and led radiation test macro, it can change the distance between probe, lens and the measured light three easily, and the variable in distance scope is big between the three; Probe, lens and measured light are separately fixed on the support, in test process, can not produce and rock, probe, lens and measured light three's center also can guarantee on same straight line, and is little to the test result influence, and above lens can be provided in the test process, system can not only provide the translation of probe and measured light, the space rotation can be provided again, be convenient to various test needs, the native system test data is accurate, good stability, easy to operate quick.
Description of drawings
Fig. 1 is the perspective view of a kind of embodiment of the utility model;
Fig. 2 is the planar structure synoptic diagram of lens fine regulation mechanism among Fig. 1.
Fig. 3 is the planar structure synoptic diagram of measured light support contraction state among Fig. 1.
Fig. 4 is the planar structure synoptic diagram of measured light support stretched condition among Fig. 1.
Embodiment
See also Fig. 1, Fig. 1 is a kind of laser instrument and led radiation test macro with disclosing, comprise probe, support and pedestal, described support comprises probe bracket 1, and described probe is arranged on the top 11 of probe bracket 1, lens carrier 2, lens 21 are arranged on the top 22 of lens carrier 2, measured light support 3 is provided with the measured light folder 31 that is used to place measured light on measured light support 3, measured light can be laser instrument, light emitting diode in the present embodiment; Described pedestal is a horizontal base 4,, described probe bracket 1, lens carrier 2 and measured light support 3 are arranged on the horizontal base 4, and the base construction in the present embodiment also can adopt three above draw-in grooves are set on horizontal table top, and three supports are arranged on the draw-in groove; Be provided with first grid door screen 26 between described lens 21 and described measured light, the grid door screen is placed in the grid door screen seat, can change the grid door screen of different size according to the difference of test product; The center line of described probe, lens 21, first grid door screen 26 and measured light is on same straight line.
In the utility model, described horizontal base 4 comprises a main guide rail 5 and a guide rail 7, prop up guide rail 7 and be provided with a rule, can read the distance between probe and the lens, described measured light support 3 is arranged on the described main guide rail 5 by first master slider 6, described guide rail 7 is arranged on the described main guide rail 5 by second master slider 8, and described probe bracket 1 is arranged on described the guide rail 7 by the first secondary slide block 9, and described lens carrier 2 is arranged on described the guide rail 7 by the second secondary slide block 10.
In the utility model, described probe bracket 1 comprises makes probe bracket 1 in directions X travel mechanism 12 that directions X moves, described directions X travel mechanism 12 comprises, following two 121,122, described piece 121 is down fixedlyed connected with the first secondary slide block 9, be provided with screw rodb base on the piece 121 down described, screw mandrel is threaded with described screw rodb base, is provided with knob in the outer end of screw mandrel, is provided with pushing block on the piece 122 on described, described screw mandrel and pushing block flexibly connect, rotate described knob, pushing block is under the screw mandrel effect, and piece 122 moves back and forth at directions X in the drive, thereby described probe bracket 1 is also moved back and forth at directions X, reach purpose at directions X fine setting probe.
In the utility model, described probe bracket 1 comprises makes probe bracket 1 in Y direction travel mechanism 13 that the Y direction moves, described Y direction travel mechanism 13 comprises, following two 131,132, following piece 131 links to each other with the last piece 122 of directions X travel mechanism 12, be provided with screw rodb base on the piece 131 down described, screw mandrel is threaded with described screw rodb base, is provided with knob in the outer end of screw mandrel, is provided with pushing block on the piece 132 on described, described screw mandrel and pushing block flexibly connect, rotate described knob, pushing block is under the screw mandrel effect, and piece moves back and forth in the Y direction in the drive, thereby described probe bracket 1 is also moved back and forth in the Y direction, reach purpose at Y directional trim probe.
In the utility model, described probe bracket 1 comprises the lift drive mechanism 16 that probe bracket 1 is moved in the Z direction, described Z direction moves lift drive mechanism 16 and comprises rack and pinion, described gear rolls clockwise, tooth bar moves down relatively, and probe bracket 1 is directed downwards mobile at Z, and described gear rolls counterclockwise, tooth bar moves up relatively, and probe bracket 1 moves up in the Z direction.The Z direction moves lift drive mechanism 16 and also can adopt the turbine and worm mode in the present embodiment, the Z direction moves lift drive mechanism 16 can adopt the turbine and worm form, described turbine clockwise rotates, worm screw moves down relatively, probe bracket 1 is directed downwards mobile at Z, described turbine rotates counterclockwise, and worm screw moves up relatively, probe bracket 1 moves up in the Z direction, reaches the purpose at Z directional trim probe.
In the utility model, described probe bracket 1 comprises makes the plane rotating mechanism 17 of probe bracket 1 in the plane rotation, described plane rotating mechanism 17 comprises two spill spin blocks, wherein descend spill spin block to be connected with the upper bottom surface that the Z direction moves lift drive mechanism 16, last spill spin block is connected with the 4th cambered surface piece 152 bottom surfaces, described upward spill spin block is enclosed within the mesopore of described spill spin block down by the sleeve of its bottom surface, and spill spin block can make probe bracket 1 rotate in surface level in the rotation.
In the utility model, described probe bracket 1 comprises makes the Y direction rotating mechanism 15 of probe bracket 1 in the rotation of Y direction, described Y direction rotating mechanism 15 comprises Y direction rotating mechanism knob, Y direction rotating mechanism screw mandrel, the 3rd cambered surface piece 151, the 4th cambered surface piece 152, going to the bottom of described the 3rd cambered surface piece 151 is cambered surface, the upper base of described the 4th cambered surface piece 152 for the identical cambered surface of radian of the cambered surface of going to the bottom of the 3rd cambered surface piece 151, described the 3rd cambered surface piece 151 is superimposed upon on described the 4th cambered surface piece 142, and the direction that makes cambered surface is the Y direction, second spur gear and second spiral gear, described Y direction rotating mechanism knob is arranged on Y direction rotating mechanism screw mandrel outer end, Y direction rotating mechanism screw mandrel is connected with second spur gear that is positioned at the 3rd cambered surface piece 151 belows, second spur gear and second spiral gear engagement that is arranged on the 3rd cambered surface piece 151 bottom surfaces, turn Y direction rotating mechanism knob and drive second spur gear and the rotation of second spiral gear, second spiral gear drives second skewback 151 back and forth in the rotation of Y direction, back and forth rotates in the Y direction thereby the second oblique skewback 151 drives probe bracket 1.
In the utility model, described probe bracket 1 comprises makes the directions X rotating mechanism 14 of probe bracket 1 in the directions X rotation, described directions X rotating mechanism 14 comprises directions X rotating mechanism knob, directions X rotating mechanism screw mandrel, the first cambered surface piece 141, the second cambered surface piece 142, going to the bottom of the described first cambered surface piece 141 is cambered surface, the upper base of the described second cambered surface piece 142 for the identical cambered surface of radian of the cambered surface of going to the bottom of the first cambered surface piece 141, the described first cambered surface piece 141 is superimposed upon on the described second cambered surface piece 142, and make the direction of cambered surface be directions X, first spur gear and first spiral gear, described directions X rotating mechanism knob is arranged on the outer end of directions X rotating mechanism screw mandrel, the directions X rotating mechanism screw mandrel other end is connected with first spur gear that is positioned at the first cambered surface piece, 141 belows, first spur gear and first spiral gear engagement that is arranged on the first cambered surface piece, 141 bottom surfaces, turn directions X rotating mechanism knob and drive the rotation of first spur gear and first spiral gear, first spiral gear drives first skewback 141 and back and forth rotates at directions X, back and forth rotates at directions X thereby first skewback 141 drives probe bracket 1.
In the utility model, described lens carrier 2 comprises lens carrier elevating mechanism 23, described lens carrier elevating mechanism 23 comprises first sleeve 231 and first loop bar 232, described first sleeve 231 is connected on the second secondary slide block 10, described first loop bar 232 assigns in first sleeve 231, is provided with the knob that is used to locate first loop bar 232 on sleeve 231, when first loop bar 232 is adjusted to a height, tighten knob 234, make first loop bar 232 be fixed on that this is highly motionless; The mode of location first loop bar 232 also can adopt to keep at a certain distance away on first loop bar 232 and first sleeve 231 through hole is set in the present embodiment, when first loop bar 232 is adjusted to a height, pass through hole on first loop bar 232 and first sleeve 231 with latch, make first loop bar 232 be fixed on that this is highly motionless.
See also Fig. 2, Fig. 2 is a kind of micro-adjusting mechanism with disclosing, described lens carrier 2 comprises the micro-adjusting mechanism 24 of lens 21, described micro-adjusting mechanism 24 comprises first screw mandrel 243, Connection Block 244, micro-adjusting mechanism knob 245, a pair of sidespin button 241,241 ' and a pair of montant 242,242 ', Connection Block 244 is provided with two through holes, described montant 242,242 ' passes two through holes respectively is connected on the lens mount 25, described knob 241,241 ' is arranged on the Connection Block 244 relative two sides, and micro-adjusting mechanism knob 245 is arranged on the top of screw mandrel 243, the lower end of screw mandrel 243 is connected with lens, turn micro-adjusting mechanism knob 245, the first screw mandrels 243 and move up and down, fine setting lens 21 positions.
See also Fig. 3 to Fig. 4, described measured light support 3 comprises the telescoping mechanism 32 of adjusting the measured light height, the top of described telescoping mechanism 32 be connected dull and stereotyped 34 and link to each other, telescoping mechanism 32 bottoms link to each other with first master slider 6, telescoping mechanism 32 comprises second screw mandrel 321, be connected the rocking handle 322 of second screw mandrel, 321 outer ends, four contiguous blocks 323 and four telescopic units 324, each telescopic unit 324 comprises four stretchable sheets, stretchable sheet 32411 and stretchable sheet 32412 connect into fork 3241 by pin in the middle part, stretchable sheet 32421 and stretchable sheet 32422 connect into fork 3242 by pin in the middle part, the lower end of fork 3242 is connected with the upper end of fork 3241, constitutes a parallelogram in the middle part; Two telescoping member about per two telescopic units keep at a certain distance away and are connected to by two contiguous blocks, two telescoping member link to each other with second screw mandrel 321 and are distributed on first master slider 6, and rotation crank 322, the second screw mandrels 321 drive telescoping mechanisms 3 liftings.The telescoping mechanism 32 of adjusting the measured light height in the present embodiment also can adopt the structure of sleeve, loop bar to replace, and loop bar is connected on first master slider 6, and loop bar assigns in the sleeve, adjusts to certain altitude when loop bar, locatees with positioning knob.
Claims (10)
1. laser instrument and led radiation test macro, comprise probe, support and pedestal, it is characterized in that: described support comprises probe bracket (1), described probe is arranged on the top (11) of probe bracket (1), lens carrier (2), lens (21) are arranged on the top (22) of lens carrier (2), and measured light support (3) is provided with the measured light folder (31) that is used to place measured light on measured light support (3); Described pedestal is horizontal base (4), described probe bracket (1), lens carrier (2) and measured light support (3) are arranged on the horizontal base (4), be provided with first grid door screen (26) between described lens (21) and described measured light, the center line of described probe, lens (21), first grid door screen (26) and measured light is on same straight line.
2. laser instrument according to claim 1 and led radiation test macro, it is characterized in that: described horizontal base (4) comprises a main guide rail (5) and a guide rail (7), described measured light support (3) is arranged on the described main guide rail (5) by first master slider (6), described guide rail (7) is arranged on the described main guide rail (5) by second master slider (8), described probe bracket (1) is arranged on described the guide rail (7) by the first secondary slide block (9), and described lens carrier (2) is arranged on described the guide rail (7) by the second secondary slide block (10).
3. laser instrument according to claim 1 and 2 and led radiation test macro, it is characterized in that: described probe bracket (1) comprises makes probe bracket (1) in directions X travel mechanism (12) that directions X moves, described directions X travel mechanism (12) comprises, following two (121,122), described piece (121) is down fixedlyed connected with the first secondary slide block (9), be provided with screw rodb base and screw mandrel on the piece (121) down described, described screw mandrel is threaded with screw rodb base, outer end at screw mandrel is provided with knob, be provided with pushing block on the piece (122) on described, described screw mandrel and pushing block flexibly connect, rotate described knob, pushing block is under the screw mandrel effect, and piece in the drive (122) moves back and forth at directions X, thereby described probe bracket (1) is also moved back and forth at directions X.
4. laser instrument according to claim 3 and led radiation test macro, it is characterized in that: described probe bracket (1) comprises makes probe bracket (1) in Y direction travel mechanism (13) that the Y direction moves, described Y direction travel mechanism (13) comprises, following two (131,132), following piece (131) links to each other with the last piece (122) of directions X travel mechanism (12), be provided with screw rodb base and screw mandrel on the piece (131) down described, described screw mandrel is threaded with screw rodb base, outer end at screw mandrel is provided with knob, be provided with pushing block on the piece (132) on described, described screw mandrel and pushing block flexibly connect, rotate described knob, pushing block is under the screw mandrel effect, and piece in the drive (132) moves back and forth in the Y direction, thereby described probe bracket (1) is also moved back and forth in the Y direction.
5. laser instrument according to claim 4 and led radiation test macro, it is characterized in that: probe bracket (1) comprises makes the directions X rotating mechanism (14) of probe bracket (1) in the directions X rotation, described directions X rotating mechanism (14) comprises directions X rotating mechanism knob, directions X rotating mechanism screw mandrel, the first cambered surface piece (141), the second cambered surface piece (142), going to the bottom of the described first cambered surface piece (141) is cambered surface, the upper base of the described second cambered surface piece (142) for the identical cambered surface of radian of the cambered surface of going to the bottom of the first cambered surface piece (141), the described first cambered surface piece (141) is superimposed upon on the described second cambered surface piece (142), and make the direction of cambered surface be directions X, first spur gear and first spiral gear, described directions X rotating mechanism knob is arranged on the outer end of directions X rotating mechanism screw mandrel, the directions X rotating mechanism screw mandrel other end is connected with first spur gear that is positioned at the first cambered surface piece (141) below, first spur gear and first spiral gear engagement that is arranged on first cambered surface piece (141) bottom surface, turn directions X rotating mechanism knob and drive the rotation of first spur gear and first spiral gear, first spiral gear drives first skewback (141) and back and forth rotates at directions X, back and forth rotates at directions X thereby first skewback (141) drives probe bracket (1).
6. laser instrument according to claim 5 and led radiation test macro, it is characterized in that: probe bracket (1) comprises makes the Y direction rotating mechanism (15) of probe bracket (1) in the rotation of Y direction, described Y direction rotating mechanism (15) comprises Y direction rotating mechanism knob, Y direction rotating mechanism screw mandrel, the 3rd cambered surface piece (151), the 4th cambered surface piece (152), going to the bottom of described the 3rd cambered surface piece (151) is cambered surface, the upper base of described the 4th cambered surface piece (152) for the identical cambered surface of radian of the cambered surface of going to the bottom of the 3rd cambered surface piece (151), described the 3rd cambered surface piece (151) is superimposed upon on described the 4th cambered surface piece (142), and the direction that makes cambered surface is the Y direction, second spur gear and second spiral gear, described Y direction rotating mechanism knob is arranged on Y direction rotating mechanism screw mandrel outer end, Y direction rotating mechanism screw mandrel is connected with second spur gear that is positioned at the 3rd cambered surface piece (151) below, second spur gear and second spiral gear engagement that is arranged on the 3rd cambered surface piece (151) bottom surface, turn Y direction rotating mechanism knob and drive second spur gear and the rotation of second spiral gear, second spiral gear drives second skewback (151) back and forth in the rotation of Y direction, back and forth rotates in the Y direction thereby the second oblique skewback (151) drives probe bracket (1).
7. laser instrument according to claim 6 and led radiation test macro, it is characterized in that: described lens carrier (2) comprises lens carrier elevating mechanism (23), described lens carrier elevating mechanism (23) comprises first sleeve (231) and first loop bar (232), (231 are connected on the second secondary slide block (10) described first sleeve, described first loop bar (232) assigns in first sleeve (231), is provided with the knob (234) that is used to locate first loop bar (232) on sleeve (231).
8. laser instrument according to claim 7 and led radiation test macro, it is characterized in that: described lens carrier (2) comprises the micro-adjusting mechanism (24) of lens (21), described micro-adjusting mechanism (24) comprises first screw mandrel (243), Connection Block (244), micro-adjusting mechanism knob (245), a pair of sidespin button (241,241 ') and a pair of montant (242,242 '), Connection Block (244) is provided with two through holes, described montant (242,242 ') passing two through holes respectively is connected on the lens mount (25), described knob (241,241 ') be arranged on the relative two sides of Connection Block (244), micro-adjusting mechanism knob (245) is arranged on the top of screw mandrel (243), and the lower end of screw mandrel (243) is connected with lens (21), turns micro-adjusting mechanism knob (245), first screw mandrel (243) moves up and down, fine setting lens (21) position.
9. laser instrument according to claim 8 and led radiation test macro, it is characterized in that: described measured light support (3) comprises the telescoping mechanism (32) of adjusting the measured light height, the top of described telescoping mechanism (32) be connected dull and stereotyped (34) and link to each other, telescoping mechanism (32) bottom links to each other with first master slider (6), telescoping mechanism (32) comprises second screw mandrel (321), be connected the rocking handle (322) of second screw mandrel (321) outer end, four contiguous blocks (323) and four telescopic units (324), each telescopic unit comprises four stretchable sheets, four stretchable sheets constitute two forks (3241 respectively, 3242), the lower end of one of them fork (3242) is connected with the upper end of another fork (3241), constitutes a parallelogram in the middle part; Two telescoping member about per two telescopic units keep at a certain distance away and are connected to by two contiguous blocks, two telescoping member link to each other with second screw mandrel (321) and are distributed on first master slider (6), rotation crank (322), second screw mandrel (321) drives telescoping mechanism (3) lifting.
10. according to described laser instrument of claim 9 and led radiation test macro, it is characterized in that: described measured light support (3) comprises the rotating disk (33) of adjusting the measured light angle, fixed flat planar (36), second sleeve (37) and second loop bar (35), rotating disk (33) is located at second loop bar (35) upper end, second loop bar (35) assigns in second sleeve (37), second sleeve (37) is arranged on the fixed flat planar (36), fixed flat planar (36) is fixed on and connects on dull and stereotyped (34), described measured light folder (31) is arranged on the rotating disk (33), rotate rotating disk (33), drive measured light folder (31), adjust the angle of measured light.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2011200602559U CN202033176U (en) | 2011-03-09 | 2011-03-09 | Laser and light emitting diode radiation test system |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2011200602559U CN202033176U (en) | 2011-03-09 | 2011-03-09 | Laser and light emitting diode radiation test system |
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| CN202033176U true CN202033176U (en) | 2011-11-09 |
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| CN2011200602559U Expired - Fee Related CN202033176U (en) | 2011-03-09 | 2011-03-09 | Laser and light emitting diode radiation test system |
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Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN105067228A (en) * | 2015-08-25 | 2015-11-18 | 公安部上海消防研究所 | Device and method for continuous detection of illuminance of fire illumination lamp |
| CN107643124A (en) * | 2017-09-11 | 2018-01-30 | 广东工业大学 | A kind of spectrometer support suitable for MIG welding processes |
| CN114061915A (en) * | 2021-11-19 | 2022-02-18 | 肇庆学院 | LED illumination light source control system and light source testing device thereof |
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2011
- 2011-03-09 CN CN2011200602559U patent/CN202033176U/en not_active Expired - Fee Related
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105067228A (en) * | 2015-08-25 | 2015-11-18 | 公安部上海消防研究所 | Device and method for continuous detection of illuminance of fire illumination lamp |
| CN105067228B (en) * | 2015-08-25 | 2019-01-04 | 公安部上海消防研究所 | Lighting lamp for fire service has continuous illumination testing apparatus and detection method |
| CN107643124A (en) * | 2017-09-11 | 2018-01-30 | 广东工业大学 | A kind of spectrometer support suitable for MIG welding processes |
| CN107643124B (en) * | 2017-09-11 | 2023-06-16 | 广东工业大学 | Spectrometer support suitable for MIG welding process |
| CN114061915A (en) * | 2021-11-19 | 2022-02-18 | 肇庆学院 | LED illumination light source control system and light source testing device thereof |
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