CN201945651U - Clamp for electrostatic discharge test - Google Patents
Clamp for electrostatic discharge test Download PDFInfo
- Publication number
- CN201945651U CN201945651U CN2011200022394U CN201120002239U CN201945651U CN 201945651 U CN201945651 U CN 201945651U CN 2011200022394 U CN2011200022394 U CN 2011200022394U CN 201120002239 U CN201120002239 U CN 201120002239U CN 201945651 U CN201945651 U CN 201945651U
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- CN
- China
- Prior art keywords
- electrostatic discharge
- plummer
- clamp
- main body
- jig main
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
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Abstract
The utility model discloses a clamp for an electrostatic discharge test, which comprises an insulating bearing platform and one or more clamp body/bodies. The bottom(s) of the clamp body/bodies is/are hinged with the insulating bearing platform, the clamp body/bodies is/are provided with a spring probe contacted with a piece to be tested, and the spring probe(s) is/are connected with a ground wire; and the insulating bearing platform is provided with one or more groove(s), and the shape of the groove(s) is consistent with the shape of the piece to be tested. By adopting the clamp, various clamp type products can be fixed well, the ground wire can be controlled well, one person can complete the ESD (electro-static discharge) test for E-guns, the working time and labor are saved, and the working efficiency is increased.
Description
Technical field
The utility model relates to a kind of anchor clamps that are used for electrostatic discharge testing.
Background technology
Static discharge (Electrostatic Discharge, be called for short ESD) be to cause electronic package or electronic system to be subjected to excessively electrically stress (Electrical Overstress, abbreviation EOS) principal element of destroying, this destruction can cause semiconductor subassembly to form nonvolatil breaking-up, thereby influence integrated circuit (Integrated Circuits, abbreviation ICs) circuit function makes that electronic product work is undesired.
The reason that ESD produces and the mode of integrated circuit discharge is had a variety of, corresponding research and test pattern are also a lot, wherein just comprise ESD gun (ESD-gun is called for short E-gun) pattern.The ESD gun pattern is meant by an electro-static discharging generator (ESD Generator) and produces a time-varying current waveform that meets international and national standard, again this electric current is touched IC, electric current enters in the IC via the pin (pin) of IC, discharges into ground via IC again.
In the past, in the E-gun test of card series products, for example in the test process to SIMCARD, control ESD gun by a people usually, a people controls ground wire and fixing test card, and test process is wasted time and energy, and work efficiency is low.
The utility model content
The technical problems to be solved in the utility model provides a kind of anchor clamps that are used for electrostatic discharge testing, and having solved needs a people specially to the fixing problem that reaches the ground connection aptitude test of measured object in the ESD gun test of card series products.
For solving the problems of the technologies described above, the utility model is used for the anchor clamps of electrostatic discharge testing, comprise insulation plummer, one or more jig main body, the bottom of described jig main body is hinged with the insulation plummer, jig main body is provided with the spring probe that contacts with measured piece, and spring probe links to each other with ground wire.
Preferably, described insulation plummer is provided with one or more fixedly grooves of measured piece that hold, and the shape of described groove is consistent with the shape of measured piece.
Preferably, described jig main body is the L type, and the free end of its bottom is hinged by hinge and plummer, and another free end one side is equipped with spring probe.
The utility model can be fixed various card series products and control ground wire well, can be applied to the ESD test of E-gun, has saved working time and manpower, has improved work efficiency.
Description of drawings
Below in conjunction with accompanying drawing and embodiment the utility model is described in further detail:
Fig. 1 is the front view that the utility model is used for the anchor clamps of electrostatic discharge testing;
Fig. 2 is the vertical view that the utility model is used for the anchor clamps of electrostatic discharge testing;
Fig. 3 is the action synoptic diagram of the utility model anchor clamps of being used for electrostatic discharge testing.
Wherein description of reference numerals is as follows:
1 is the insulation plummer; 2 is jig main body; 3 is spring probe; 4 is ground wire; 5 is measured piece.
Embodiment
The utility model is used for the anchor clamps of electrostatic discharge testing, as shown in Figure 1, 2, comprise insulation plummer 1, four jig main bodies 2, the bottom of described jig main body 2 is hinged with insulation plummer 1, jig main body 2 is provided with spring probe 3, and described spring probe 3 links to each other with ground wire 4.
Described insulation plummer 1 be provided with four with jig main body 2 corresponding grooves, the shape of described groove is consistent with the shape of measured piece 5, will block the class measured piece and put into groove and be convenient to spacing fix in test process.
Described jig main body 2 is the L type, the free end of its bottom is hinged with insulation plummer 1 by hinge, as shown in Figure 3, the placement of being convenient to measured piece 5 with take off, another free end one side is equipped with spring probe 3, has reduced mechanical damage to measured piece 5 own in the time of ground connection.
Described insulation plummer 1 is made by duroplasts.The material of described jig main body 2 is metal or duroplasts, and the material of spring probe 3 is that copper is gold-plated preferably for electric conductivity.Ground wire 4 is conventional ground wire materials such as copper cash, the protection of insulating material such as external application rubber.
In said structure, the groove quantity of insulation plummer 1 and quantity, the position of jig main body 2 can be set according to the needs of reality test.The utility model is not only applicable to the electrostatic discharge testing of standard SIM CARD, also be applicable to the test of other card series products of the same type, solved card series products fixing problem that reaches ground connection in the E-gun test, have only a people also can block the E-gun test of series products easily, save the test duration, improved work efficiency.
More than by specific embodiment the utility model is had been described in detail, formation is to restriction of the present utility model but these are not.Under the situation that does not break away from the utility model principle, those skilled in the art also can make many distortion and equivalent replacement to structure of shape, quantity or the plummer of jig main body etc., and these also should be considered as protection domain of the present utility model.
Claims (5)
1. anchor clamps that are used for electrostatic discharge testing, it is characterized in that: comprise insulation plummer, one or more jig main body, the bottom of described jig main body is hinged with the insulation plummer, and jig main body is provided with spring probe, and described spring probe links to each other with ground wire.
2. the anchor clamps that are used for electrostatic discharge testing according to claim 1 is characterized in that: described insulation plummer is provided with one or more fixedly grooves of measured piece that hold.
3. the anchor clamps that are used for electrostatic discharge testing according to claim 1 is characterized in that: described jig main body is the L type, and the free end of its bottom is hinged with the insulation plummer by hinge, and another free end one side is equipped with spring probe.
4. the anchor clamps that are used for electrostatic discharge testing according to claim 2 is characterized in that: described insulation plummer is made by duroplasts.
5. the anchor clamps that are used for electrostatic discharge testing according to claim 3 is characterized in that: the material of described jig main body is metal or duroplasts, and the material of spring probe is that copper is gold-plated.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2011200022394U CN201945651U (en) | 2011-01-06 | 2011-01-06 | Clamp for electrostatic discharge test |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2011200022394U CN201945651U (en) | 2011-01-06 | 2011-01-06 | Clamp for electrostatic discharge test |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN201945651U true CN201945651U (en) | 2011-08-24 |
Family
ID=44472991
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN2011200022394U Expired - Fee Related CN201945651U (en) | 2011-01-06 | 2011-01-06 | Clamp for electrostatic discharge test |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN201945651U (en) |
Cited By (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102393353A (en) * | 2011-11-23 | 2012-03-28 | 苏州市新的电工有限公司 | Enameled wire granularity detector |
| CN104752248A (en) * | 2013-12-26 | 2015-07-01 | 东莞新科技术研究开发有限公司 | Semiconductor testing clamp and device |
| CN105467167A (en) * | 2015-12-10 | 2016-04-06 | 苏州世纪福智能装备股份有限公司 | An ESD raw material radio frequency performance inspection clamp |
| CN107024646A (en) * | 2016-02-01 | 2017-08-08 | 致茂电子(苏州)有限公司 | Detection components for electrostatic discharge testing |
| CN107436382A (en) * | 2016-05-27 | 2017-12-05 | 上海北京大学微电子研究院 | Static discharge current waveforms detection system and method for testing |
| CN107505567A (en) * | 2017-10-11 | 2017-12-22 | 李贺满 | A kind of electronic circuit board high speed signal detection means |
| CN108535567A (en) * | 2018-04-17 | 2018-09-14 | 京东方科技集团股份有限公司 | A kind of Characterization of Air Electrostatic Discharge test device and test method |
| CN109951700A (en) * | 2019-02-15 | 2019-06-28 | 信利光电股份有限公司 | A kind of the ESD testing tool and test method of camera module |
| CN110058060A (en) * | 2019-05-15 | 2019-07-26 | 宁波绵长电子科技有限公司 | A kind of electric appliance automatic protection ground connection operating system |
-
2011
- 2011-01-06 CN CN2011200022394U patent/CN201945651U/en not_active Expired - Fee Related
Cited By (14)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102393353A (en) * | 2011-11-23 | 2012-03-28 | 苏州市新的电工有限公司 | Enameled wire granularity detector |
| CN104752248B (en) * | 2013-12-26 | 2018-06-05 | 东莞新科技术研究开发有限公司 | The test fixture and test device of semiconductor |
| CN104752248A (en) * | 2013-12-26 | 2015-07-01 | 东莞新科技术研究开发有限公司 | Semiconductor testing clamp and device |
| CN105467167A (en) * | 2015-12-10 | 2016-04-06 | 苏州世纪福智能装备股份有限公司 | An ESD raw material radio frequency performance inspection clamp |
| CN107024646A (en) * | 2016-02-01 | 2017-08-08 | 致茂电子(苏州)有限公司 | Detection components for electrostatic discharge testing |
| CN107024646B (en) * | 2016-02-01 | 2019-10-11 | 致茂电子(苏州)有限公司 | Detection components for electrostatic discharge testing |
| CN107436382A (en) * | 2016-05-27 | 2017-12-05 | 上海北京大学微电子研究院 | Static discharge current waveforms detection system and method for testing |
| CN107505567A (en) * | 2017-10-11 | 2017-12-22 | 李贺满 | A kind of electronic circuit board high speed signal detection means |
| CN107505567B (en) * | 2017-10-11 | 2019-12-17 | 湖南维胜科技电路板有限公司 | High-speed signal detection device for electronic circuit board |
| CN108535567A (en) * | 2018-04-17 | 2018-09-14 | 京东方科技集团股份有限公司 | A kind of Characterization of Air Electrostatic Discharge test device and test method |
| CN109951700A (en) * | 2019-02-15 | 2019-06-28 | 信利光电股份有限公司 | A kind of the ESD testing tool and test method of camera module |
| CN109951700B (en) * | 2019-02-15 | 2020-09-04 | 信利光电股份有限公司 | ESD (electro-static discharge) testing tool and testing method for camera module |
| CN110058060A (en) * | 2019-05-15 | 2019-07-26 | 宁波绵长电子科技有限公司 | A kind of electric appliance automatic protection ground connection operating system |
| CN110058060B (en) * | 2019-05-15 | 2019-11-19 | 东阳东进电子科技有限公司 | A kind of electric appliance automatic protection ground connection operating system |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| ASS | Succession or assignment of patent right |
Owner name: SHANGHAI HUAHONG GRACE SEMICONDUCTOR MANUFACTURING Free format text: FORMER OWNER: HUAHONG NEC ELECTRONICS CO LTD, SHANGHAI Effective date: 20140103 |
|
| C41 | Transfer of patent application or patent right or utility model | ||
| COR | Change of bibliographic data |
Free format text: CORRECT: ADDRESS; FROM: 201206 PUDONG NEW AREA, SHANGHAI TO: 201203 PUDONG NEW AREA, SHANGHAI |
|
| TR01 | Transfer of patent right |
Effective date of registration: 20140103 Address after: 201203 Shanghai city Zuchongzhi road Pudong New Area Zhangjiang hi tech Park No. 1399 Patentee after: Shanghai Huahong Grace Semiconductor Manufacturing Corporation Address before: 201206, Shanghai, Pudong New Area, Sichuan Road, No. 1188 Bridge Patentee before: Shanghai Huahong NEC Electronics Co., Ltd. |
|
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20110824 Termination date: 20150106 |
|
| EXPY | Termination of patent right or utility model |