CN201897586U - P-type/N-type semiconductor particle tester - Google Patents

P-type/N-type semiconductor particle tester Download PDF

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Publication number
CN201897586U
CN201897586U CN2010206481784U CN201020648178U CN201897586U CN 201897586 U CN201897586 U CN 201897586U CN 2010206481784 U CN2010206481784 U CN 2010206481784U CN 201020648178 U CN201020648178 U CN 201020648178U CN 201897586 U CN201897586 U CN 201897586U
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China
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links
temperature controller
type semiconductor
semiconductor particle
heating
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Expired - Fee Related
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CN2010206481784U
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Chinese (zh)
Inventor
温汉军
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CHANGSHAN WANGU ELECTRONIC TECHONLOGY Co Ltd
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CHANGSHAN WANGU ELECTRONIC TECHONLOGY Co Ltd
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Priority to CN2010206481784U priority Critical patent/CN201897586U/en
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Publication of CN201897586U publication Critical patent/CN201897586U/en
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Abstract

The utility model relates to a P-type/N-type semiconductor particle tester, which comprises an alternating-current contactor, a power transformation module, a temperature controller, an audio alarm and a voltmeter, the alternating-current contactor, the power transformation module and the temperature controller are arranged in a case, the audio alarm and the voltmeter are arranged on the case, and a conductive base plate and a heating test rod are placed on a test platform. An alternating-current input signal is connected with the power transformation module through the alternating-current contactor, the power transformation module is connected with the temperature controller and the heating test rod, the heating test rod is connected with the temperature signal input end of the temperature controller, and the control signal output end of the temperature controller is connected with the control end of the alternating-current contactor. The conductive base plate and the heating test rod are respectively connected with the voltage input ends of the audio alarm through wires, and the voltmeter is oppositely connected in parallel with the audio alarm. N-type semiconductor particles or P-type semiconductor particles can be easily distinguished as long as the heating test rod touches the tested semiconductor particles and alarm sound is heard or the voltmeter is observed, testing is convenient and quick, the testing efficiency is extremely high, and the cost is low.

Description

P type, N-type semiconductor particle tester
Technical field
The utility model relates to a kind of testing apparatus of distinguishing semiconductor material, relates in particular to a kind of convenient test, testing efficiency height, lower-cost P type, N-type semiconductor particle tester.
Background technology
Semi-conductor thermoelectric material is a kind of specific function material that can realize direct conversion between heat energy and the electric energy, and it has Seebeck effect, peltier effect and Thomson effect.Thomson effect is the phenomenon that the conductor two ends produce electromotive force when the temperature difference is arranged.Semi-conductor thermoelectric material has the branch of P type and N type, and both Thomson effects are just in time opposite, promptly under the identical temperature difference, and a kind of generation positive voltage, the another kind of negative voltage that produces.And when making refrigerating sheet, need use and much be particulate N type and P-type semiconductor particle, in case in the P-type semiconductor particle, sneak into the N-type semiconductor particle or in the N-type semiconductor particle, sneak into the P-type semiconductor particle and all can cause the defective of refrigerating sheet, influence the performance and the quality of refrigerating sheet.But because used N type and P-type semiconductor particle volume are all very little, test and distinguish very difficulty of model, influence production efficiency.
Summary of the invention
The utility model mainly solve refrigerating sheet produce in used N type and P-type semiconductor particle volume little, test and distinguish very difficulty of model influences the technical matters of production efficiency; Providing a kind of can test N type and P-type semiconductor particle easily, the testing efficiency height, and test is accurate, lower-cost P type, N-type semiconductor particle tester.
Above-mentioned technical matters of the present utility model is mainly solved by following technical proposals: the utility model comprises cabinet, A.C. contactor, the power conversion module, temperature controller, voice guard, the conductive soleplate and the prod of heating, A.C. contactor, power conversion module and temperature controller are located in the cabinet, voice guard is located on the cabinet, conductive soleplate is positioned on the test table, the input end of described A.C. contactor links to each other with alternating current input signal, the output terminal of A.C. contactor links to each other with described power conversion module, described power conversion module again with described temperature controller, the prod of heating links to each other, the prod of heating links to each other with the temperature signal input end of described temperature controller again, and the control signal output ends of temperature controller links to each other with the control end of described A.C. contactor; Described conductive soleplate, the prod of heating link to each other by the voltage input end of lead and described voice guard respectively.Alternating current is put forward the arch operating voltage to the temperature controller and the prod of heating after by A.C. contactor, power conversion module, begins heat temperature raising after the prod of the heating energising.Set the working temperature of the prod of heating by temperature controller, when arriving design temperature, temperature controller output control signal disconnects A.C. contactor, and the prod of heating this moment is in off-position, thereby avoids damaging when Yin Jiawen prod temperature is too high to cause test semiconductor particle.The voltage that its two ends produce during the refrigerating sheet heating is transferred to voice guard by the prod of heating, conductive soleplate respectively.Put some tested semiconductor particles on conductive soleplate, the operator presses semiconductor particle with the prod of heating, if voice guard is not reported to the police, then this semiconductor particle is the P-type semiconductor particle, otherwise then is the N-type semiconductor particle.Test very convenient, the testing efficiency height, test accurately enhance productivity greatly, and cost is also lower.
As preferably, the described prod of heating adopts the structure of electric soldering iron formula, comprise continuous hollow iron staff body and handle body, be provided with electrical heating elements and temperature-sensing element in the iron staff body, the output terminal of described power conversion module links to each other with electrical heating elements, the temperature signal input end of the output terminal of temperature-sensing element and described temperature controller links to each other, and the iron staff body links to each other by a voltage input end of lead and voice guard.When A.C. contactor is connected, electrical heating elements energising heating, the iron staff body heats up, temperature-sensing element is gathered the temperature of iron staff body, give temperature controller with temperature signal, when the iron staff body reached the temperature controller design temperature, temperature controller output control signal was given the control end of A.C. contactor, A.C. contactor is disconnected, thereby avoid damaging when Yin Jiawen prod temperature is too high to cause test semiconductor particle.The prod of heating adopts the structure of electric soldering iron formula, takes during test conveniently, puts on time that the tip of iron staff body contacts with semiconductor particle, presses also very conveniently, and contact point is little, can not damage semiconductor particle.
As preferably, described power conversion module comprises transformer and rectification module, the output terminal of described A.C. contactor links to each other with the input end of transformer, and the output terminal of transformer links to each other with the input end of rectification module, and the output terminal of rectification module links to each other with described temperature controller, the prod of heating.
As preferably, reverse parallel connection has voltage table on the described voice guard.When voice guard was not reported to the police, the voltage table indicating value was for just; When voice guard started warning, the voltage table indicating value was for negative.Voice guard and voltage table play dual test effect, avoid causing mistake to survey, judge by accident because of voice guard damages.On the other hand, can check voltage table whether working properly, can check voice guard whether working properly, deal with so that in time find fault by voltage table by voice guard.
As preferably, described voltage table is a pointer-type millivolt voltage table.During test, be the P-type semiconductor particle, the then clockwise deflection of voltage table pointer; Be the N-type semiconductor particle, then voltage table pointer inhour deflection.Observe more intuitively, test more convenient.
The beneficial effects of the utility model are: the operator only needs to press tested semiconductor particle with the prod of heating, listen attentively to simultaneously whether chimes of doom is arranged, also can observe the pointer trend of voltage table, just can determine tested like a cork is N-type semiconductor particle or P-type semiconductor particle, convenient test and quick, testing efficiency is very high, and test accurately, and cost is also lower.
Description of drawings
Fig. 1 is a kind of structural representation of the present utility model.
Fig. 2 is that a kind of circuit of the present utility model connects block diagram.
1. cabinets among the figure, 2. A.C. contactor, 3. power conversion module, 4. temperature controller, 5. voltage table, 6. conductive soleplate, 7. heat prod, 8. test table, 9. alternating current input signal, 10. voice guard, 31. transformers, 32. rectification modules, 71. iron staff body, 72. the handle body, 73. electrical heating elements, 74. temperature-sensing elements.
Embodiment
Below by embodiment, and in conjunction with the accompanying drawings, the technical solution of the utility model is described in further detail.
Embodiment 1: the P type of present embodiment, N-type semiconductor particle tester as shown in Figure 1, comprise test table 8 and are installed on cabinet 1 on the test table 8, are positioned over the conductive soleplate 6 on the test table 8 and the prod 7 of heating.A.C. contactor 2, power conversion module 3 and temperature controller 4 are installed in the cabinet 1, and power conversion module 3 is made of transformer 31 and rectification module 32, and voice guard 10 and voltage table 5 are installed on tester's side on the cabinet 1.The prod 7 of heating adopts the structure of electric soldering iron formula, comprises continuous hollow iron staff body 71 and handle body 72, and electrical heating elements 73 and temperature-sensing element 74 are housed in the iron staff body 71.As shown in Figure 2,220V alternating current input signal 9 links to each other with the input end of A.C. contactor 2, the output terminal of A.C. contactor 2 links to each other with input end with transformer 31, the output terminal of transformer 31 links to each other with the input end of rectification module 32, the output terminal of rectification module 32 is divided into two-way, one the tunnel provides operating voltage for temperature controller 4, another road links to each other with the prod 7 interior electrical heating elements 73 of heating by lead, the heat output terminal of the temperature-sensing element 74 in the prod 7 and the temperature signal input end of temperature controller 4 links to each other, and the control signal output ends of temperature controller 4 links to each other with the control end of A.C. contactor 2.The voltage input end parallel connected in reverse phase of the voltage input end of voice guard 10 and voltage table 5, promptly the negative pole of the positive pole of voice guard and voltage table links to each other, and the negative pole of voice guard links to each other with the positive pole of voltage table.Their voltage input end links to each other with iron staff body 71 by lead, and their another voltage input end links to each other with conductive soleplate 6 by lead.Voltage table 5 is a pointer-type millivolt voltage table in the present embodiment.
Test process: the semiconductor particle that a pile is tested is put on the conductive soleplate, connect the 220V alternating current, by the time heat after the iron staff body heating on the prod, the operator holds the handle body of the prod of heating, and presses semiconductor particle with the iron staff body, can be observed the voltage table pointer turns clockwise, show positive voltage and produce, what this moment, voice guard obtained is negative voltage, does not report to the police, then this semiconductor particle is the P-type semiconductor particle, is put on one side.After pressing over successively one by one, when pressing certain semiconductor particle as if discovery, the rotation of voltage table pointer inhour, be shown as the generation negative voltage, what this moment, voice guard obtained is positive voltage, starts and reports to the police, then this semiconductor particle is the N-type semiconductor particle, is put in another side.Thereby finish the differentiation of N-type semiconductor particle and P-type semiconductor particle like a cork, convenient test and quick, testing efficiency is very high, and test accurately guarantee normally carrying out in order of refrigerating sheet production, and cost of manufacture of the present utility model is also lower.

Claims (5)

1. P type, N-type semiconductor particle tester, it is characterized in that comprising cabinet (1), A.C. contactor (2), power conversion module (3), temperature controller (4), voice guard (10), conductive soleplate (6) and the prod of heating (7), A.C. contactor (2), power conversion module (3) and temperature controller (4) are located in the cabinet (1), voice guard (10) is located on the cabinet (1), conductive soleplate (6) is positioned on the test table (8), the input end of described A.C. contactor (2) links to each other with alternating current input signal (9), the output terminal of A.C. contactor (2) links to each other with described power conversion module (3), described power conversion module (3) again with described temperature controller (4), the prod (7) of heating links to each other, the prod (7) of heating links to each other with the temperature signal input end of described temperature controller (4) again, and the control signal output ends of temperature controller (4) links to each other with the control end of described A.C. contactor (2); Described conductive soleplate (6), the prod of heating (7) link to each other by the voltage input end of lead with described voice guard (10) respectively.
2. P type according to claim 1, N-type semiconductor particle tester, it is characterized in that the described prod of heating (7) adopts the structure of electric soldering iron formula, comprise continuous hollow iron staff body (71) and handle body (72), be provided with electrical heating elements (73) and temperature-sensing element (74) in the iron staff body (71), the output terminal of described power conversion module (3) links to each other with electrical heating elements (73), the output terminal of temperature-sensing element (74) links to each other with the temperature signal input end of described temperature controller (4), and iron staff body (71) links to each other by a voltage input end of lead and voice guard (10).
3. P type according to claim 1, N-type semiconductor particle tester, it is characterized in that described power conversion module (3) comprises transformer (31) and rectification module (32), the output terminal of described A.C. contactor (2) links to each other with the input end of transformer (31), the output terminal of transformer (31) links to each other with the input end of rectification module (32), and the output terminal of rectification module (32) links to each other with described temperature controller (4), the prod of heating (7).
4. according to claim 1 or 2 or 3 described P types, N-type semiconductor particle tester, it is characterized in that described voice guard (10) goes up reverse parallel connection voltage table (5) is arranged.
5. P type according to claim 4, N-type semiconductor particle tester is characterized in that described voltage table (5) is pointer-type millivolt voltage table.
CN2010206481784U 2010-12-09 2010-12-09 P-type/N-type semiconductor particle tester Expired - Fee Related CN201897586U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN2010206481784U CN201897586U (en) 2010-12-09 2010-12-09 P-type/N-type semiconductor particle tester

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN2010206481784U CN201897586U (en) 2010-12-09 2010-12-09 P-type/N-type semiconductor particle tester

Publications (1)

Publication Number Publication Date
CN201897586U true CN201897586U (en) 2011-07-13

Family

ID=44255491

Family Applications (1)

Application Number Title Priority Date Filing Date
CN2010206481784U Expired - Fee Related CN201897586U (en) 2010-12-09 2010-12-09 P-type/N-type semiconductor particle tester

Country Status (1)

Country Link
CN (1) CN201897586U (en)

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C14 Grant of patent or utility model
GR01 Patent grant
CF01 Termination of patent right due to non-payment of annual fee

Granted publication date: 20110713

Termination date: 20161209

CF01 Termination of patent right due to non-payment of annual fee