CN201859354U - Water level control device for silicon slice cleaning tank - Google Patents

Water level control device for silicon slice cleaning tank Download PDF

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Publication number
CN201859354U
CN201859354U CN2010205465549U CN201020546554U CN201859354U CN 201859354 U CN201859354 U CN 201859354U CN 2010205465549 U CN2010205465549 U CN 2010205465549U CN 201020546554 U CN201020546554 U CN 201020546554U CN 201859354 U CN201859354 U CN 201859354U
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CN
China
Prior art keywords
water level
water
cleaning tank
rinse bath
level
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
CN2010205465549U
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Chinese (zh)
Inventor
屈莹
郝子龙
何垚
梁雪美
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Changzhou EGing Photovoltaic Technology Co Ltd
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Changzhou EGing Photovoltaic Technology Co Ltd
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Priority to CN2010205465549U priority Critical patent/CN201859354U/en
Application granted granted Critical
Publication of CN201859354U publication Critical patent/CN201859354U/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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Abstract

The utility model relates to a water level control device for a silicon slice cleaning tank, which comprises a cleaning tank, a water inlet valve, a transparent observation pipe, a low-level photoelectric switch, a high-level photoelectric switch and a solenoid reversing valve, wherein the transparent observation pipe is communicated with the bottom part of the cleaning tank; the height of the transparent observation pipe is consistent with that of the cleaning tank; a lowest water level marker and a highest water level marker are marked on the transparent observation pipe; and the photoelectric switches and the solenoid reversing valve are adopted to carry out automatic monitoring and liquid supplementation to the water level of the cleaning tank. Through additionally arranging the transparent observation pipe, the observation accuracy of people is improved, and the water level in the cleaning tank always conforms to the cleaning process requirements. If the water level control device is provided with the photoelectric switches, the photoelectric switches can automatically sense the practical water level in the transparent observation pipe, and then the solenoid reversing valve is used for controlling the water inlet valve to add the water to the cleaning tank.

Description

Silicon chip rinse bath water-level control apparatus
Technical field:
The utility model relates to a kind of water level proving installation, relates in particular to the Level monitor of the full-automatic silicon wafer cleaner solution tank of photovoltaic cell production.
Background technology:
Along with the continuous lifting of photovoltaic industrial technology, new requirement has been proposed for the quality and the cost of solar product.And the raw material of making solar cell is the silicon material, the silicon material is drawn into silicon rod, silicon chip is prepared from by the multi-line cutting machine cutting by silicon rod, the silicon chip that cuts, impurity and surface irregularities such as surface attachment mortar, therefore before making battery, the surface treatment of silicon chip be to carry out earlier, the chemical cleaning of silicon chip and the surface corrosion of silicon chip comprised.Chemical cleaning is in order to remove the various impurity on the silicon chip, and the purpose of surface corrosion is the cutting damage of removing silicon chip surface, obtains to be fit to the silicon face that the system knot requires.The performance and the state of silicon chip surface before the system knot directly influence the characteristic of knot, thereby influence the performance of finished product battery.Silicon chip promptly begins making herbs into wool through after the surface treatment, process for etching is an of paramount importance ring in the whole production line, its objective is that carrying out texturing by the method for chemical corrosion at silicon chip surface handles, form good sunken luminous effect, reduce the silicon chip surface emissivity.General production technology is to adopt slot type making herbs into wool at present, in higher temperature environment, carry out anisotropic etch with KOH or NaOH solution, erode away the pyramid that is similar to pyramid structure at silicon chip surface, realize the repeatedly reflection of incident light, reduce surface reflectivity.And the homogeneity in the homogeneity of groove internal corrosion liquid and temperature field has just determined the stability of mass industrialized production.
The solution preparation of adopting at present is to feed hot water to mix with acid or alkali in rinse bath, hot water is independently heating and the adding rinse bath in the tank, rinse bath consumes hot water, therefore must constantly add water in the rinse bath and just can satisfy the demand, when the interpolation pure water enters rinse bath, open valve, make pure water directly enter in the cell body by a pure water pipeline, when treating that water level reaches required water level, valve-off stops to add pure water.
In traditional cleaning machine, operating personnel need use marking pen to draw mark at the cell body inwall, height with the required water level of mark, as shown in Figure 1, former silicon chip rinse bath water-level control apparatus, it comprises rinse bath 1, water intaking valve 2, lowest water level mark A and peak level mark B, water intaking valve 2 adds water in rinse bath 1, lowest water level mark A and peak level mark B are arranged on the inwall of rinse bath 1, when the water level of rinse bath 1 is lower than lowest water level mark A, the operator must open water intaking valve 2, otherwise when the water level of rinse bath 1 was higher than peak level mark B, the operator must close water intaking valve 2.In actual mechanical process, because the operator is standing to observe lowest water level mark A and peak level mark B from the inwall to rinse bath 1 suitable for reading of rinse bath 1, operator's observation visual angle is relevant with height, different operators can produce the different visual angles error, thereby influence the accuracy of rinse bath 1 middle water level, make the cleaning quality fluctuation increase.
The utility model content:
In order to overcome above weak point, the utility model provides a kind of silicon chip rinse bath water-level control apparatus, and it can be controlled accurately to the water level of rinse bath, has avoided the inaccurate problem of water level control that causes because of the collimation error.
The technical scheme that the utility model adopted is:
A kind of silicon chip rinse bath water-level control apparatus, it comprises rinse bath and water intaking valve, it is characterized in that: further comprising the transparent observing pipe, and the bottom of transparent observing pipe and the bottom of rinse bath interlink, and the height of transparent observing pipe is consistent with the height of rinse bath.
Further, it also comprises the solenoid directional control valve of low level optoelectronic switch, high-order optoelectronic switch and control water intaking valve, peak level mark and lowest water level mark are arranged on the transparent observing pipe, lowest water level mark on the corresponding transparent observing pipe of low level optoelectronic switch, peak level mark on the corresponding transparent observing pipe of high-order optoelectronic switch, solenoid directional control valve is electrically connected with low level optoelectronic switch and high-order optoelectronic switch respectively.
Owing to outside rinse bath, increased a transparent observing pipe, the transparent observing pipe is provided with peak level mark and lowest water level mark, the operator can accurately control water intaking valve according to these two marks, and the water level in the rinse bath is between peak level mark and the lowest water level mark all the time.When adopting manual observation peak level mark and lowest water level marking of control water intaking valve, the operator can not produce the collimation error, thereby influences the accuracy of water level in the rinse bath.When peak level mark on adopting optoelectronic switch monitoring transparent observing pipe and lowest water level mark, the optoelectronic switch monitoring can be issued solenoid valve with the electric signal that obtains, the switch of control water intaking valve, thereby control water level in the rinse bath automatically, need not the operator and detect by an unaided eye, effectively avoid the inaccurate problem of water level control that causes because of the collimation error.
Description of drawings:
Fig. 1 is the synoptic diagram of former cleaning machine water-level control apparatus;
Fig. 2 is a kind of embodiment of the present utility model, the manual water inlet compensation of visual inspection;
Fig. 3 is another kind of embodiment of the present utility model, photoelectricity monitoring water inlet compensation automatically.
Among the figure: the 1-rinse bath; The 2-water intaking valve; 3-transparent observing pipe; 4-low level optoelectronic switch; The high-order optoelectronic switch of 5-; The 6-solenoid directional control valve; A-lowest water level mark; B-peak level mark.
Embodiment:
Below in conjunction with description of drawings specific embodiments of the present utility model:
Embodiment 1: a kind of silicon chip rinse bath water-level control apparatus, as shown in Figure 2, it is the control device of the manual water inlet compensation of a kind of operator's of dependence visual inspection, it comprises rinse bath 1, water intaking valve 2 and transparent observing pipe 3, the bottom of the bottom of transparent observing pipe 3 and rinse bath 1 interlinks, the height of transparent observing pipe 3 is consistent with the height of rinse bath 1, on transparent observing pipe 3, be provided with peak level mark B and lowest water level mark A, because transparent observing pipe 3 middle water levels are identical with rinse bath 1, when the operator finds that water level is lower than lowest water level mark A, must open water intaking valve 2 immediately discharges water in rinse bath 1, when water level arrived peak level mark B, the operator closed water intaking valve 2 immediately.
Embodiment 2: a kind of silicon chip rinse bath water-level control apparatus, as shown in Figure 3, it is a kind of photoelectricity monitoring control device of water inlet compensation automatically, it comprises rinse bath 1, water intaking valve 2, transparent observing pipe 3, low level optoelectronic switch 4, high-order optoelectronic switch 5 and solenoid directional control valve 6, the bottom of the bottom of transparent observing pipe 3 and rinse bath 1 interlinks, the height of transparent observing pipe 3 is consistent with the height of rinse bath 1, be marked with lowest water level mark A and peak level mark B at transparent observing pipe 3, low level optoelectronic switch 4 corresponding lowest water level mark A, high-order optoelectronic switch 5 corresponding peak level mark B, solenoid directional control valve 6 is electrically connected with low level optoelectronic switch 4 and high-order optoelectronic switch 5, when the water level in the transparent observing pipe 3 is lower than lowest water level mark A, low level optoelectronic switch 4 just can monitor, and detected electric signal issued solenoid directional control valve 6, water intaking valve 2 is opened in rinse bath 1 added water; When high-order optoelectronic switch 5 monitors peak level mark B when water is arranged, 6 of solenoid directional control valves cut out water intaking valve 2 automatically, stop to add water in rinse bath 1, thereby can control water level in the rinse bath 1 automatically.

Claims (2)

1. silicon chip rinse bath water-level control apparatus, it comprises rinse bath (1) and water intaking valve (2), it is characterized in that: further comprising transparent observing pipe (3), the bottom of the bottom of transparent observing pipe (3) and rinse bath (1) interlinks, and the height of transparent observing pipe (3) is consistent with the height of rinse bath (1).
2. according to the described silicon chip rinse bath of claim 1 water-level control apparatus, it is characterized in that: further comprising low level optoelectronic switch (4), the solenoid directional control valve (6) of high-order optoelectronic switch (5) and control water intaking valve (2), peak level mark (B) and lowest water level mark (A) are arranged on the transparent observing pipe (3), lowest water level mark (A) on the corresponding transparent observing pipe of low level optoelectronic switch (4) (3), peak level mark (B) on high-order optoelectronic switch (5) the corresponding transparent observing pipes (3), solenoid directional control valve (6) is electrically connected with low level optoelectronic switch (4) and high-order optoelectronic switch (5) respectively.
CN2010205465549U 2010-09-29 2010-09-29 Water level control device for silicon slice cleaning tank Expired - Fee Related CN201859354U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN2010205465549U CN201859354U (en) 2010-09-29 2010-09-29 Water level control device for silicon slice cleaning tank

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN2010205465549U CN201859354U (en) 2010-09-29 2010-09-29 Water level control device for silicon slice cleaning tank

Publications (1)

Publication Number Publication Date
CN201859354U true CN201859354U (en) 2011-06-08

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CN2010205465549U Expired - Fee Related CN201859354U (en) 2010-09-29 2010-09-29 Water level control device for silicon slice cleaning tank

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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102004501A (en) * 2010-09-29 2011-04-06 常州亿晶光电科技有限公司 Water level control device for silicon wafer cleaning tank
CN115491685A (en) * 2022-09-30 2022-12-20 合肥江航飞机装备股份有限公司 Cleaning device and cleaning method for part surface cutting fluid

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102004501A (en) * 2010-09-29 2011-04-06 常州亿晶光电科技有限公司 Water level control device for silicon wafer cleaning tank
CN115491685A (en) * 2022-09-30 2022-12-20 合肥江航飞机装备股份有限公司 Cleaning device and cleaning method for part surface cutting fluid

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C14 Grant of patent or utility model
GR01 Patent grant
C17 Cessation of patent right
CF01 Termination of patent right due to non-payment of annual fee

Granted publication date: 20110608

Termination date: 20120929