CN201741690U - 轻型功率半导体模块 - Google Patents

轻型功率半导体模块 Download PDF

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CN201741690U
CN201741690U CN 201020266598 CN201020266598U CN201741690U CN 201741690 U CN201741690 U CN 201741690U CN 201020266598 CN201020266598 CN 201020266598 CN 201020266598 U CN201020266598 U CN 201020266598U CN 201741690 U CN201741690 U CN 201741690U
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shell
cermet substrate
electrode
semi
light
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王晓宝
姚玉双
姚天保
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Jiangsu Macmic Science & Technology Co Ltd
Macmic Science and Technology Co Ltd
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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/44Structure, shape, material or disposition of the wire connectors prior to the connecting process
    • H01L2224/45Structure, shape, material or disposition of the wire connectors prior to the connecting process of an individual wire connector
    • H01L2224/45001Core members of the connector
    • H01L2224/45099Material
    • H01L2224/451Material with a principal constituent of the material being a metal or a metalloid, e.g. boron (B), silicon (Si), germanium (Ge), arsenic (As), antimony (Sb), tellurium (Te) and polonium (Po), and alloys thereof
    • H01L2224/45117Material with a principal constituent of the material being a metal or a metalloid, e.g. boron (B), silicon (Si), germanium (Ge), arsenic (As), antimony (Sb), tellurium (Te) and polonium (Po), and alloys thereof the principal constituent melting at a temperature of greater than or equal to 400°C and less than 950°C
    • H01L2224/45124Aluminium (Al) as principal constituent
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/4805Shape
    • H01L2224/4809Loop shape
    • H01L2224/48091Arched
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/73Means for bonding being of different types provided for in two or more of groups H01L2224/10, H01L2224/18, H01L2224/26, H01L2224/34, H01L2224/42, H01L2224/50, H01L2224/63, H01L2224/71
    • H01L2224/732Location after the connecting process
    • H01L2224/73251Location after the connecting process on different surfaces
    • H01L2224/73265Layer and wire connectors
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/10Details of semiconductor or other solid state devices to be connected
    • H01L2924/11Device type
    • H01L2924/13Discrete devices, e.g. 3 terminal devices
    • H01L2924/1304Transistor
    • H01L2924/1305Bipolar Junction Transistor [BJT]
    • H01L2924/13055Insulated gate bipolar transistor [IGBT]

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  • Cooling Or The Like Of Semiconductors Or Solid State Devices (AREA)

Abstract

本实用新型涉及一种轻型功率半导体模块,包括外壳、覆金属陶瓷基板、半导体芯片和电极,半导体芯片连接在覆金属陶瓷基板上,电极与覆金属陶瓷基板连接,所述外壳内设有一体的盖板,外壳底面的壳壁上设有安装槽口,覆金属陶瓷基板固定在该安装槽口内,且覆金属陶瓷基板的厚度在1-2mm,电极穿出盖板;所述外壳底部沿壳壁的外侧分别设有两安装座,两安装座上对称设有弧形的应力释放槽孔,且应力释放槽孔的内侧槽壁与安装槽口相切或相交。本实用新型结构合理,半导体模块工作时无机械和热应力,长期工作可靠性,并能降低半导体模块的材料成本和重量。

Description

轻型功率半导体模块
技术领域
本实用新型涉及一种轻型功率半导体模块,属于功率半导体模块制造领域。
背景技术
目前功率半导体模块的结构由半导体芯片(IGBT芯片)、覆金属陶瓷基板(DBC基板)、电极以及铜底板构成,IGBT芯片焊接到覆金属陶瓷基板上,先用铝丝键合完成芯片极性与覆金属陶瓷基板上有图形的铜箔进行互连,再将带IGBT芯片的覆金属陶瓷基板再一次焊接到铜底板上,再将电极焊接到覆金属陶瓷基板上,装上外壳密封灌胶保护。但将覆金属陶瓷基板通过焊接材料在高温下熔化而焊接在铜底板上时,因铜底板的热膨胀系数大于覆金属陶瓷基板的热膨胀系数,因此焊接前需要对铜底板材料进行机械预弯,焊接后使铜底板还保持一定的弧度,才能保证铜底板有一定的凸度,如果不进行机械预弯的话,铜底板就会变成凹度,但而铜底板的弧度会因预弯铜板的弧度不同而不同,需要进行弧度测试,一方面会影响成品率。另一方面,因铜底板与覆金属陶瓷基板热膨胀系数差别大,焊接后铜底板反扣变形,而铜底板与覆金属陶瓷基板在半导体模块工作温度下一直存在机械应力和热应力,半导体模块在经过几千次高低温热循环工作后,覆金属陶瓷基板与铜底板之间的焊接层就会发生位错、出现裂缝及空洞空隙,半导体模块的热阻变大,在这种情况下工作,半导体模块的工作温度不断升高,半导体模块中半导体芯片的工作温度因焊接层错乱、裂缝使热散不出去直至半导体芯片失效,而降低了半导体模块的使用寿命。
发明内容
本实用新型的目的是提供一种结构合理,工作时无机械和热应力,长期工作可靠性,并能降低了材料成本的轻型功率半导体模块。
本实用新型为达到上述目的的技术方案是:一种轻型功率半导体模块,包括外壳、覆金属陶瓷基板、半导体芯片和电极,半导体芯片固定在覆金属陶瓷基板上,电极与覆金属陶瓷基板连接,其特征在于:所述外壳内设有一体的盖板,外壳底面的壳壁上设有安装槽口,覆金属陶瓷基板固定在该安装槽口内,且覆金属陶瓷基板的厚度在1-2mm,电极穿出盖板;所述外壳底部沿壳壁的外侧分别设有两安装座,两安装座上对称设有弧形的应力释放槽孔,且应力释放槽孔的内侧槽壁与安装槽口相切或相交。
其中:所述外壳底面与覆金属陶瓷基板底面的高度差在-0.05~0.20mm。
所述一个安装座上设有安装孔,另一安装座上设有与底座外侧相通的安装槽。
所述外壳位于安装座的上部与外壳的壳壁外侧设有两个以上的加强筋。
本实用新型取消铜底板,直接将覆金属陶瓷基板固定在外壳的底面,由于取消覆金属陶瓷基板与铜板的焊接层,而没有了覆金属陶瓷基板与铜底板的机械应力和热应力,同时由于芯片与覆金属陶瓷基板也无机械应力和热应力,而且覆金属陶瓷基板是安装在外壳的安装槽内,可通过外壳的安装座上的应力释放槽孔,在工作中能使半导体模块底部保持平整,使半导体模块与散热器之间接触均匀,由于接触热阻小,半导体模块工作寿命以及高低温热循环能力大大提高,使半导体模块长期工作可靠性得到了保证。本实用新型去掉铜底板后,降低了半导体模块的材料成本和重量,提高了半导体模块的性价比,同时,也提高了半导体模块的热循环能力及长期工作可靠性,市场前景是非常看好。
附图说明
下面结合附图对本实用新型的实施例作进一步的描述。
图1是本实用新型的结构示意图。
图2是图1的俯视结构示意图。
图3是图2的仰视结构示意图。
图4是图2的A-A剖视结构示意图。
图5是图2的B-B剖视结构示意图。
其中:1-电极,2-外壳,21-加强筋,22-安装座,23-安装槽,24-应力释放槽孔,25-安装孔,26-安装槽口,27-盖板,3-覆金属陶瓷基板,4-半导体芯片,5-铝丝。
具体实施方式
见图1~5所示,本实用新型的轻型功率半导体模块,包括外壳2、覆金属陶瓷基板、半导体芯片4和电极1,半导体芯片4焊接在覆金属陶瓷基板3,铝丝5键合完成半导体芯片4的极性与覆金属陶瓷基板3上有图形的铜箔进行互连,而电极1与覆金属陶瓷基板3连接,电极1可通过铝丝5与覆金属陶瓷基板3连接,或电极1直接焊接在覆金属陶瓷基板3上。见图1~3所示,本实用新型的外壳2内设有一体的盖板27,盖板27位于外壳的中部将外壳2分为上下腔体,外壳2的上腔体内设有螺母座,外壳2底面的壳壁上设有安装槽口26,覆金属陶瓷基板3固定在该安装槽口26内,本实用新型的覆金属陶瓷基板3的厚度在1-2mm,如覆金属陶瓷基板3的厚度在1.2mm、1.3mm、1.5mm、1.8mm等,覆金属陶瓷基板3的陶瓷芯层厚度在0.6~0.9mm,如陶瓷芯层厚度在0.7mm、0.8mm等,覆金属陶瓷基板3两侧的金属层在高温下通过原子的互扩散形成原子键结合将金属层覆在陶瓷芯层上,其具有热阻小、绝缘强度和机械强度高、热膨胀系数小等优点,本实用新型外壳2底面与覆金属陶瓷基板3的高度差在-0.05~0.20mm,使覆金属陶瓷基板3与散热器均匀接触,而具有较好的散热效果,而半导体芯片4位于外壳2的下腔体内,电极1穿出盖板27,最后通过灌胶进行密封。见图1~3所示,本实用新型外壳2底部沿壳壁的外侧分别设有两安装座22,两安装座22上对称设有弧形的应力释放槽孔24,且应力释放槽孔24的内侧槽壁与安装槽口26相切或相交,通过该应力释放槽孔24使半导体芯片4在高低温热循环工作时进行应力释放,而提高了半导体模块的热循环能力及长期工作可靠性。见图2~4所示,本实用新型外壳2的一个安装座22上设有安装孔25,另一安装座22上设有与底座外侧相通的安装槽23,非常方便装卸,而外壳2位于安装座22的上部与外壳2的壳壁外侧设有两个以上的加强筋21,以提高外壳2的机械强度,能满足大功率半导体模块的使用。

Claims (4)

1.一种轻型功率半导体模块,包括外壳(2)、覆金属陶瓷基板(3)、半导体芯片(4)和电极(1),半导体芯片(4)固定在覆金属陶瓷基板(3)上,电极(1)与覆金属陶瓷基板(3)连接,其特征在于:所述外壳(2)内设有一体的盖板(27),外壳(2)底面的壳壁上设有安装槽口(26),覆金属陶瓷基板(3)固定在该安装槽口(26)内,且覆金属陶瓷基板(3)的厚度在1-2mm,电极(1)穿出盖板(27);所述外壳(2)底部沿壳壁的外侧分别设有两安装座(22),两安装座(22)上对称设有弧形的应力释放槽孔(24),且应力释放槽孔(24)的内侧槽壁与安装槽口(26)相切或相交。
2.根据权利要求1所述的轻型功率半导体模块,其特征在于:所述外壳(2)底面与覆金属陶瓷基板(3)底面的高度差在-0.05~0.20mm。
3.根据权利要求1所述的轻型功率半导体模块,其特征在于:所述一个安装座(22)上设有安装孔(25),另一安装座(22)上设有与底座外侧相通的安装槽(23)。
4.根据权利要求1所述的轻型功率半导体模块,其特征在于:所述外壳(2)位于安装座(22)的上部与外壳(2)的壳壁外侧设有两个以上的加强筋(21)。
CN 201020266598 2010-07-22 2010-07-22 轻型功率半导体模块 Expired - Fee Related CN201741690U (zh)

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Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102867788A (zh) * 2012-09-29 2013-01-09 江苏宏微科技股份有限公司 基于新型覆金属陶瓷基板的功率模块
CN106783773A (zh) * 2016-12-13 2017-05-31 中航(重庆)微电子有限公司 一种非绝缘双塔型二极管模块
CN108232695A (zh) * 2018-02-28 2018-06-29 成都宇鑫洪科技有限公司 一种多排微距型多频、高低混频滤波电连接器

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102867788A (zh) * 2012-09-29 2013-01-09 江苏宏微科技股份有限公司 基于新型覆金属陶瓷基板的功率模块
CN102867788B (zh) * 2012-09-29 2016-03-02 江苏宏微科技股份有限公司 基于新型覆金属陶瓷基板的功率模块
CN106783773A (zh) * 2016-12-13 2017-05-31 中航(重庆)微电子有限公司 一种非绝缘双塔型二极管模块
CN108232695A (zh) * 2018-02-28 2018-06-29 成都宇鑫洪科技有限公司 一种多排微距型多频、高低混频滤波电连接器

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