CN201731957U - 温度传感器最终测试用温度校准系统 - Google Patents
温度传感器最终测试用温度校准系统 Download PDFInfo
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- CN201731957U CN201731957U CN2009202148667U CN200920214866U CN201731957U CN 201731957 U CN201731957 U CN 201731957U CN 2009202148667 U CN2009202148667 U CN 2009202148667U CN 200920214866 U CN200920214866 U CN 200920214866U CN 201731957 U CN201731957 U CN 201731957U
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Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN103090899B (zh) * | 2011-10-28 | 2017-05-10 | 新奥科技发展有限公司 | 传感器检测装置及检测方法 |
CN107328492A (zh) * | 2017-03-08 | 2017-11-07 | 芯海科技(深圳)股份有限公司 | 一种校准芯片温度传感器的方法 |
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Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN103090899B (zh) * | 2011-10-28 | 2017-05-10 | 新奥科技发展有限公司 | 传感器检测装置及检测方法 |
CN107328492A (zh) * | 2017-03-08 | 2017-11-07 | 芯海科技(深圳)股份有限公司 | 一种校准芯片温度传感器的方法 |
CN107328492B (zh) * | 2017-03-08 | 2020-02-21 | 芯海科技(深圳)股份有限公司 | 一种校准芯片温度传感器的方法 |
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Legal Events
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C14 | Grant of patent or utility model | ||
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Owner name: SHANGHAI HUAHONG GRACE SEMICONDUCTOR MANUFACTURING Free format text: FORMER OWNER: HUAHONG NEC ELECTRONICS CO LTD, SHANGHAI Effective date: 20131216 |
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C41 | Transfer of patent application or patent right or utility model | ||
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Free format text: CORRECT: ADDRESS; FROM: 201206 PUDONG NEW AREA, SHANGHAI TO: 201203 PUDONG NEW AREA, SHANGHAI |
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Effective date of registration: 20131216 Address after: 201203 Shanghai city Zuchongzhi road Pudong New Area Zhangjiang hi tech Park No. 1399 Patentee after: Shanghai Huahong Grace Semiconductor Manufacturing Corporation Address before: 201206, Shanghai, Pudong New Area, Sichuan Road, No. 1188 Bridge Patentee before: Shanghai Huahong NEC Electronics Co., Ltd. |
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CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20110202 Termination date: 20151231 |
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EXPY | Termination of patent right or utility model |