CN201653940U - Seed crystal offset tester - Google Patents
Seed crystal offset tester Download PDFInfo
- Publication number
- CN201653940U CN201653940U CN2010201632576U CN201020163257U CN201653940U CN 201653940 U CN201653940 U CN 201653940U CN 2010201632576 U CN2010201632576 U CN 2010201632576U CN 201020163257 U CN201020163257 U CN 201020163257U CN 201653940 U CN201653940 U CN 201653940U
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- tester
- seed crystal
- crystal
- apart
- probe
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- Expired - Fee Related
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Abstract
The utility model provides a seed crystal offset tester, which relates to a measuring device, which comprises an X ray pipe box body (1), a testing table (2), a probe (3), a controller, an indicating instrument, a high voltage generator, a voltage stabilizer and a regulated power supply, wherein the high voltage generator, the voltage stabilizer and the regulated power supply are arranged in a machine table, a measuring light path orderly passes through the X ray pipe box body, crystal and the probe (3), and a counter is arranged in the probe. The seed crystal offset tester further comprises an electron microscope (4) and a display (5) which is connected with the electron microscope (4), wherein the testing table (2) is levelly arranged, and measured crystal is put in a fixture (6). The seed crystal offset tester uses fixing angle position testing, the measured crystal is levelly arranged, the angle of a geometric surface and a seed crystal surface of the crystal does not need to be measured and calculated, the position of the seed crystal surface of the crystal and the distance value thereof with the surface can be directly obtained through the electron microscope (4), thereby preparing for next polishing process. Compared with an existing single crystal tester, the operation is simpler and more rapid, the measuring precision is high, manpower and material resources are saved, and the production efficiency of crystal products is obviously increased.
Description
Technical field
The utility model relates to a kind of measurement mechanism, is specially a kind of tester that detects quartzy structure.
Background technology
At present, fast development along with electronics technology, crystal is widely used in electron trade, quartzy architectural characteristic directly has influence on the performance of processing back electronic product, the test of quartzy structure becomes a requisite link in the industry production run, measuring equipment has all utilized the quartzy principle that X ray is produced coherent diffraction, measure the angle of the geometric jacquard patterning unit surface and the inner crystal face of crystal material, existing homemade hand-rail type equipment and Japanese like product composition generally comprise X-ray tube, vertical test board, counter, single-chip microcomputer, device for digit-displaying, controller etc., by little rotary vertically to test board, make test quartzy to X ray generation coherent diffraction, diffracted ray enters counter, pass through opto-electronic conversion, light signal is converted into electric signal is demonstrated diffracted ray by microampere meter power, measure according to the rotation drift angle of vertical test board and to calculate angle, operating process is too loaded down with trivial details, and tested quartzy direction difficulty or ease control, be easy to generate error, influence testing efficiency, and this class device can only be calculated angle, and tested crystal is further processed the polishing amount that needs needs other devices to calculate.
Summary of the invention
It is a kind of simple and efficient to handle that the purpose of this utility model will provide exactly, and the employing that measuring accuracy is high is decided the seed crystal inspection of angle locator meams apart from tester, and can be accurately with in the quartzy seed crystal rule, the disposable stock removal of finishing.
A kind of seed crystal inspection is apart from tester, comprise high pressure generator, voltage stabilizer, stabilized voltage supply in X-ray tube casing, test board, probe, controller, indicating instrument and the board that is fixed on the board, measure light path and pass through X-ray tube, crystal, probe successively, be provided with counter in the probe, counter is connected with the controller internal circuit, this tester also includes electron microscope and coupled display, the test board horizontal positioned, and tested crystal is placed in the horizontal anchor clamps.
The side of the seed face that described electron microscopic lens head lateral alignment test is quartzy.
Described electron microscopic lens head is provided with rule center line and scale.
Described clamp base is provided with position, school bolt, and avris is provided with fishbolt.
Described quartzy test board can be finely tuned up and down, tube and sliding ring thread connection in the test board, and sliding ring and important actor are slidingly connected, and adjust the test board height by the rotational slide circle.
The table top of test board can horizontally rotate, and is convenient to position, the school bolt of the tested quartzy bottom of operator's adjustment.
The described X ray emission mouth of pipe is provided with cylinder, in order to boundling, prevents the X ray scattering.
The seed crystal inspection also comprises the worktable cover apart from tester, and the worktable cover is arranged on the work top, and whole device is surrounded, only stay a direction opening for operating personnel's operation, be provided with illuminator in the worktable cover,, be convenient to operating personnel and observe in order to strengthen field of microscope.The side of the seed face that described electron microscopic lens head lateral alignment test is quartzy.
The course of work of this tester is: tested crystal is lain in a horizontal plane on the standard fixture, open electron microscope, quartzy seed crystal rule center line preliminary and in the display is overlapped, open high-voltage switch gear, X-ray tube produces elementary X ray, shine quartzy crystal, adjusting bolt by the fine setting clamp base, further adjust the level of seed face, elementary X ray is meeting the Bragg equation formula: produce coherent diffraction under n λ=2dsin θ situation, then measure the light path path, carry out opto-electronic conversion after probe receives diffracted ray, electric signal amplifies through amplifier, finally demonstrate the power of X ray by microampere meter, finish the adjustment test process, be placed horizontally at tested crystal on the standard fixture and finish process in the rule of seed face simultaneously, can needing directly obtain the numerical value of grinding by display.
The beneficial effects of the utility model are:
1. seed crystal inspection is adopted apart from tester and decide the angle locator meams and measures, and angle and diffraction occurrence positions are all located, and the operator need not to consider the angle of being tested, and the calculating of angle, and the step that simplifies the operation uses manpower and material resources sparingly, the raising measuring accuracy;
2. this tester is equipped with electron microscope, can clearly observe the quartzy piece of optics, the seed crystal of crystal and the position and the distance on quartzy piece surface, be convenient to quartzy seed crystal location, and can calculate next step processing capacity accurately, in the rule of seed face,, and once finish stock removal for quartzy following process has solved a difficult problem, the disposable qualification rate of product after the processing can reach more than 98%, has improved production efficiency significantly;
3. be equipped with horizontal anchor clamps, simpler than vertical testing platform clip structure, and easy to adjust quick, behind the fixing tested crystal, can directly take off, be applied to next step sanding operation, need not to change other immobilising devices, the step that simplifies the operation uses manpower and material resources sparingly.
Description of drawings
Fig. 1 is an embodiment of the invention structural representation;
Fig. 2 is a clamp structure synoptic diagram among Fig. 1.
Embodiment
A kind of seed crystal inspection as shown in the drawing is apart from tester, comprise high pressure generator, voltage stabilizer, stabilized voltage supply in X-ray tube casing 1, test board 2, probe 3, controller, indicating instrument and the board that is fixed on the board, measure light path and pass through X-ray tube, crystal, probe 3 successively, be provided with counter in the probe, counter is connected with the controller internal circuit, this tester also includes electron microscope 4 and coupled display 5, test board 2 horizontal positioned, tested crystal are placed in the horizontal anchor clamps 6.
The side of the seed face that described electron microscope 4 camera lens lateral alignment test is quartzy.
Described electron microscope 4 camera lenses are provided with rule center line and scale.
Described anchor clamps 6 bottoms are provided with position, school bolt 7, and in order to adjust the level orientation of tested crystal, avris is provided with fishbolt 8, in order to fixing adjusted crystal.
Described quartzy test board 2 can be finely tuned up and down, tube and sliding ring thread connection in the test board 2, and sliding ring and important actor are slidingly connected, and adjust the test board height by the rotational slide circle.
The table top of test board 2 can horizontally rotate, and is convenient to position, the school bolt 7 of the tested quartzy bottom of operator's adjustment.
The described X ray emission mouth of pipe is provided with cylinder 9, in order to boundling, prevents the X ray scattering.
The seed crystal inspection also comprises worktable cover 12 apart from tester, worktable cover 12 is arranged on the work top, whole device is surrounded, only stay a direction opening for operating personnel's operation, probe 3 and electron microscope 4 are housed in wherein, only stay visual field mouth, and worktable cover 12 is provided with illuminator 10, in order to strengthen field of microscope, be convenient to operating personnel and observe.
This device is measured bragg's formula with electron microscope observation and is combined, in the rule of seed face, for quartzy following process has solved a difficult problem, and once finish stock removal, the disposable qualification rate of product after the processing can reach more than 98%, and uses manpower and material resources sparingly, and has improved production efficiency significantly.
Claims (8)
1. a seed crystal inspection is apart from tester, comprise high pressure generator, voltage stabilizer, stabilized voltage supply in X-ray tube casing (1), test board (2), probe (3), controller, indicating instrument and the board that is fixed on the board, measure light path and pass through X-ray tube, crystal, probe (3) successively, be provided with counter in the probe, it is characterized in that: also include electron microscope (4) and coupled display (5), test board (2) horizontal positioned, tested crystal is placed in the anchor clamps (6).
2. seed crystal inspection according to claim 1 is characterized in that apart from tester: the side of the seed face that the test of described electron microscope (4) camera lens lateral alignment is quartzy.
3. seed crystal inspection according to claim 1 and 2 is apart from tester, and it is characterized in that: electron microscope (4) camera lens is provided with rule center line and scale.
4. seed crystal inspection according to claim 1 is characterized in that apart from tester: described anchor clamps (6) bottom is provided with position, school bolt (7), and avris is provided with fishbolt (8).
5. seed crystal inspection according to claim 1 is apart from tester, and it is characterized in that: quartzy test board (2) can be finely tuned up and down.
6. the seed crystal inspection is apart from tester according to claim 1 or 5, and it is characterized in that: test board (2) table top is rotatable.
7. seed crystal inspection according to claim 1 is characterized in that apart from tester: the X ray emission mouth of pipe is provided with cylinder (9).
8. seed crystal inspection according to claim 1 is apart from tester, and it is characterized in that: also comprise worktable cover (12), worktable cover (12) is provided with illuminator (10).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2010201632576U CN201653940U (en) | 2010-04-16 | 2010-04-16 | Seed crystal offset tester |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2010201632576U CN201653940U (en) | 2010-04-16 | 2010-04-16 | Seed crystal offset tester |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN201653940U true CN201653940U (en) | 2010-11-24 |
Family
ID=43119184
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN2010201632576U Expired - Fee Related CN201653940U (en) | 2010-04-16 | 2010-04-16 | Seed crystal offset tester |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN201653940U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104111262A (en) * | 2014-08-01 | 2014-10-22 | 丹东通达科技有限公司 | Manual fine adjustment tilt table in crystal orientation instrument |
-
2010
- 2010-04-16 CN CN2010201632576U patent/CN201653940U/en not_active Expired - Fee Related
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104111262A (en) * | 2014-08-01 | 2014-10-22 | 丹东通达科技有限公司 | Manual fine adjustment tilt table in crystal orientation instrument |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| C17 | Cessation of patent right | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20101124 Termination date: 20140416 |