CN201628684U - Atomizing chamber of sampling system of inductively coupled plasma (ICP) spectrometer - Google Patents

Atomizing chamber of sampling system of inductively coupled plasma (ICP) spectrometer Download PDF

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Publication number
CN201628684U
CN201628684U CN2009202828533U CN200920282853U CN201628684U CN 201628684 U CN201628684 U CN 201628684U CN 2009202828533 U CN2009202828533 U CN 2009202828533U CN 200920282853 U CN200920282853 U CN 200920282853U CN 201628684 U CN201628684 U CN 201628684U
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China
Prior art keywords
atomizing chamber
sampling system
icp
spectrometer
chamber
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Expired - Fee Related
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CN2009202828533U
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Chinese (zh)
Inventor
应刚
张树龙
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Jiangsu Skyray Instrument Co Ltd
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Jiangsu Skyray Instrument Co Ltd
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Priority to CN2009202828533U priority Critical patent/CN201628684U/en
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Abstract

The utility model discloses an atomizing chamber of a sampling system of an ICP (inductively coupled plasma) spectrometer. The atomizing chamber comprises a double-barrel concentric part; an aerosol outlet, a waste liquid outlet and a swirl atomizing chamber mounting port are arranged on the double-barrel concentric part; a swirl atomizing chamber is mounted on the swirl atomizing chamber mounting port; and an atomizing chamber waste liquid outlet and an atomizer mounting port are formed on the swirl atomizing chamber respectively. The atomizing chamber of the sampling system of the ICP spectrometer integrates the characteristics of the swirl atomizing chamber and the double-barrel concentric atomizing chamber. The double-barrel concentric part has strong buffer function, which effectively eliminates the influence caused by the fluctuation of lifting capacity of the atomizer and the fluctuation of flow and pressure of the atomized gas, effectively improves the uniformity of the aerosol at the outlet of the atomizing chamber, and further effectively improves the stability of the sampling system of the ICP spectrometer.

Description

A kind of spray chamber of ICP spectrometer sampling system
Technical field
The utility model relates to a kind of ICP spectrometer, particularly a kind of spray chamber of ICP spectrometer sampling system.
Background technology
The ICP spectrometer is a kind of Atomic Emission Spectrometer AES device of precision, and chief component comprises several parts such as inductively coupled plasma generator (being the ICP light source), sampling system, beam splitting system, photo-translating system, signal Processing.Wherein, the inductively coupled plasma generator produces plasma torch, and the high temperature of torch can excite sample atoms of elements to be analyzed, thereby produces the signature analysis line of this element; Sampling system is used for sample solution to be measured is formed gasoloid, and this gasoloid is sent into deexcitation in the plasma torch; The wavelength separated of the signature analysis line that beam splitting system is then sent plasma torch comes and qualitative its wavelength; Photo-translating system then is converted to electric signal with the light intensity signal of analytical line; Signal Processing comprises that amplification, filtering, the AD of photoelectric conversion signal change, calculate or the like.
Sampling system is a very important system in the ICP spectrometer, and the stability of sampling system and repeatability directly influence the stable and repeated of ICP spectrometer complete machine.The major function of sampling system is exactly that sample solution to be measured is formed the gasoloid that mixes all by atomizer and spray chamber, by spray chamber this gasoloid is imported the central passage of torch pipe then, excites.In use find, spray chamber is bigger to the repeatability and the stability influence of sampling system, traditional swirling flow atomizing chamber is apparent in view for removing droplet effect big in the gasoloid, but because the volume of swirling flow atomizing chamber is less, not obvious to the fluctuation buffering effect of atomizer; And the concentric spray chamber of traditional bitubular because its inner volume is bigger, has good buffer action to the fluctuation of atomizer, but bad to the big droplet removal effect in the gasoloid, the gasoloid homogeneity of formation is good inadequately.
So the spray chamber of developing a kind of novel ICP spectrometer sampling system has become the technical matters that needs to be resolved hurrily in this area.
The utility model content
At above-mentioned the deficiencies in the prior art, the technical problems to be solved in the utility model provides a kind of spray chamber of new ICP spectrometer sampling system, and it can effectively suppress because the influence that the fluctuation of the fluctuation of atomizer lifting capacity and atomization gas flow air pressure brings.
For solving the problems of the technologies described above, the utility model adopts following technical scheme:
A kind of spray chamber of ICP spectrometer sampling system, comprise the concentric portion of the bitubular, be respectively equipped with gasoloid outlet, discard solution discharge port and swirling flow atomizing chamber installing port in the concentric portion of the described bitubular, be connected with the swirling flow atomizing chamber on the installing port of described swirling flow atomizing chamber, be respectively equipped with spray chamber discard solution discharge port and atomizer installing port on the described swirling flow atomizing chamber.
Preferably, described swirling flow atomizing chamber installing port is positioned on the concentric shafts of the concentric portion of the described bitubular.
Such scheme has following beneficial effect: spray chamber of the present utility model, make gasoloid on droplet homogeneity and surge capability, all be much improved to fluctuation, effectively improved the aerocolloidal homogeneity in spray chamber exit, and then effectively improved the stability of ICP spectrometer sampling system, its stability has been improved more than five times.
Above-mentioned explanation only is the general introduction of technical solutions of the utility model, for can clearer understanding technological means of the present utility model, and can be implemented according to the content of instructions, below describes in detail with preferred embodiment of the present utility model and conjunction with figs..Embodiment of the present utility model is provided in detail by following examples and accompanying drawing thereof.
Description of drawings
Fig. 1 is the structural representation of the utility model embodiment.
Embodiment
Below in conjunction with accompanying drawing preferred embodiment of the present utility model is described in detail.
As shown in Figure 1, the spray chamber of this ICP spectrometer sampling system, comprise the concentric portion 3 of the bitubular, be respectively equipped with gasoloid outlet 4, discard solution discharge port 5 and swirling flow atomizing chamber installing port 8 in the concentric portion 3 of the bitubular, be connected with swirling flow atomizing chamber 2 on the swirling flow atomizing chamber installing port 8, be respectively equipped with spray chamber discard solution discharge port 5 and atomizer installing port 9 on the swirling flow atomizing chamber 2, preferred, in the present embodiment, swirling flow atomizing chamber installing port 8 is positioned on the concentric shafts of the concentric portion 3 of the bitubular.
Spray chamber of the present utility model is when work, atomizer 1 enters in the atomizer installing port 9 of swirling flow atomizing chamber 2, testing sample and carrier gas enter swirling flow atomizing chamber 2 by inlet 6 of the testing sample on the atomizer 1 and carrier gas inlet 7 respectively, because the effect of swirling flow atomizing chamber 2 makes the gasoloid rotational flow, effectively removed the bigger droplet of volume in the gasoloid, the waste liquid that produce this moment is discharged by spray chamber discard solution discharge port 5, the uniform aerosol droplet of Xing Chenging enters the concentric portion 3 of the bitubular more afterwards, because the surge capability of the concentric portion 3 of the bitubular is more intense, effectively suppressed because the influence that the fluctuation of the fluctuation of atomizer lifting capacity and atomization gas flow air pressure brings, the waste liquid that produce this moment is discharged by discard solution discharge port 5, and gasoloid is discharged by gasoloid outlet 4.
More than the spray chamber of a kind of ICP spectrometer sampling system that the utility model embodiment is provided be described in detail; for one of ordinary skill in the art; thought according to the utility model embodiment; part in specific embodiments and applications all can change; in sum; this description should not be construed as restriction of the present utility model, and all any changes of being made according to the utility model design philosophy are all within protection domain of the present utility model.

Claims (2)

1. the spray chamber of an ICP spectrometer sampling system, it is characterized in that: comprise the concentric portion of a bitubular, be respectively equipped with gasoloid outlet, discard solution discharge port and swirling flow atomizing chamber installing port in the concentric portion of the described bitubular, be connected with the swirling flow atomizing chamber on the installing port of described swirling flow atomizing chamber, be respectively equipped with spray chamber discard solution discharge port and atomizer installing port on the described swirling flow atomizing chamber.
2. the spray chamber of ICP spectrometer sampling system according to claim 1 is characterized in that: described swirling flow atomizing chamber installing port is positioned on the concentric shafts of the concentric portion of the described bitubular.
CN2009202828533U 2009-12-24 2009-12-24 Atomizing chamber of sampling system of inductively coupled plasma (ICP) spectrometer Expired - Fee Related CN201628684U (en)

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CN2009202828533U CN201628684U (en) 2009-12-24 2009-12-24 Atomizing chamber of sampling system of inductively coupled plasma (ICP) spectrometer

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Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102507536A (en) * 2011-11-16 2012-06-20 天津重型装备工程研究有限公司 Method for analyzing trace element capable generating hydride gas through hydrogenation
CN103364393A (en) * 2013-07-10 2013-10-23 中国科学院生态环境研究中心 Atomizer of atomic emission spectroscopy of inductively coupled plasma and measurement method
CN103900892A (en) * 2014-03-25 2014-07-02 北京元盛科仪科技有限责任公司 Aerosol diluting device
CN105929012A (en) * 2016-04-13 2016-09-07 中国科学院生态环境研究中心 Spray chamber, sampling system and ICP-MS using spray chamber
CN109900683A (en) * 2019-03-26 2019-06-18 攀钢集团攀枝花钢铁研究院有限公司 The online internal standard hybrid system of Element detection
CN115753742A (en) * 2022-11-02 2023-03-07 上海美析仪器有限公司 Plasma emission spectrometer capable of efficiently atomizing and feeding sample

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102507536A (en) * 2011-11-16 2012-06-20 天津重型装备工程研究有限公司 Method for analyzing trace element capable generating hydride gas through hydrogenation
CN103364393A (en) * 2013-07-10 2013-10-23 中国科学院生态环境研究中心 Atomizer of atomic emission spectroscopy of inductively coupled plasma and measurement method
CN103900892A (en) * 2014-03-25 2014-07-02 北京元盛科仪科技有限责任公司 Aerosol diluting device
CN105929012A (en) * 2016-04-13 2016-09-07 中国科学院生态环境研究中心 Spray chamber, sampling system and ICP-MS using spray chamber
CN105929012B (en) * 2016-04-13 2018-11-09 中国科学院生态环境研究中心 Spray chamber, sampling system and ICP-MS using it
CN109900683A (en) * 2019-03-26 2019-06-18 攀钢集团攀枝花钢铁研究院有限公司 The online internal standard hybrid system of Element detection
CN115753742A (en) * 2022-11-02 2023-03-07 上海美析仪器有限公司 Plasma emission spectrometer capable of efficiently atomizing and feeding sample

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GR01 Patent grant
C17 Cessation of patent right
CF01 Termination of patent right due to non-payment of annual fee

Granted publication date: 20101110

Termination date: 20101224