CN101706436B - Atomizing chamber of ICP spectrometer sampling system - Google Patents
Atomizing chamber of ICP spectrometer sampling system Download PDFInfo
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- CN101706436B CN101706436B CN2009102321326A CN200910232132A CN101706436B CN 101706436 B CN101706436 B CN 101706436B CN 2009102321326 A CN2009102321326 A CN 2009102321326A CN 200910232132 A CN200910232132 A CN 200910232132A CN 101706436 B CN101706436 B CN 101706436B
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Abstract
The invention discloses an atomizing chamber of an ICP spectrometer sampling system, which is formed by concentrically sleeving three atomizing cylinders, wherein gaps among the atomizing cylinders form a channel in which aerosol flows. Gas inlets and gas outlets of the atomizing cylinders are far away from each other, which prolongs the stroke of the aerosol in the atomizing chamber and increases the volume of the atomizing chamber, thereby reducing the influence on signals caused by dropping of waste liquid drops of atomizers or fluctuation of sampling speeds of the aerosol because of the fluctuation of gas carrying pressures, and strengthening the stability of the signals.
Description
Technical field
The present invention relates to a kind of ICP spectrometer, particularly a kind of spray chamber of ICP spectrometer sampling system.
Background technology
The ICP spectrometer is a kind of Atomic Emission Spectrometer AES device of precision, and chief component comprises several parts such as inductively coupled plasma generator (being the ICP light source), sampling system, beam splitting system, photo-translating system, signal Processing.Wherein, the inductively coupled plasma generator produces plasma torch, and the high temperature of torch can excite sample atoms of elements to be analyzed, thereby produces the signature analysis line of this element; Sampling system is used for sample solution to be measured is formed gasoloid, and this gasoloid is sent into deexcitation in the plasma torch; The wavelength separated of the signature analysis line that beam splitting system is then sent plasma torch comes and qualitative its wavelength; Photo-translating system then is converted to electric signal with the light intensity signal of analytical line; Signal Processing comprises that amplification, filtering, the AD of photoelectric conversion signal change, calculate or the like.
Sampling system is a very important system in the ICP spectrometer, and the stability of sampling system and repeatability directly influence the stable and repeated of ICP spectrometer complete machine.The major function of sampling system is exactly that sample solution to be measured is formed the gasoloid that mixes by atomizer and spray chamber, by the central passage of spray chamber with this gasoloid importing torch pipe, excites then.In use find, spray chamber is bigger to the repeatability and the stability influence of sampling system, its reason is that former atomizer is the concentric spray chamber of the bitubular, the spray chamber internal volume is less, because the drippage of atomizer waste liquid drop, perhaps because the fluctuation of the gasoloid sample introduction speed that the fluctuation of nebulizer gas pressure causes, spray chamber can not well cushion the influence that this fluctuation causes.In addition, the stroke of gasoloid in spray chamber that atomizer forms is also shorter, and the aerosol particle uniformity coefficient that can cause entering torch tube hub passage is relatively poor, also can cause the fluctuation of excitation signal, thereby influence the stability of signal.
Summary of the invention
At above-mentioned the deficiencies in the prior art, the technical problem to be solved in the present invention provides a kind of spray chamber of new ICP spectrometer sampling system, this spray chamber is by increasing internal volume, prolong the stroke of gasoloid in spray chamber and come the influence of better cushion gas colloidal sol fluctuation to signal, the stability of enhancing signal.
For solving the problems of the technologies described above, the present invention adopts following technical scheme:
A kind of spray chamber of ICP spectrometer sampling system, it is characterized in that: it comprises first atomizing cup, second atomizing cup and the 3rd atomizing cup, described first atomizing cup is positioned at described second atomizing cup, leave the gap between described first atomizing cup and second atomizing cup, described second atomizing cup is positioned at described the 3rd atomizing cup, leave the gap between described second atomizing cup and the 3rd atomizing cup, one end of described first atomizing cup is provided with the atomizer installing port, described first atomizing cup is provided with first intercommunicating pore away from an end of atomizer installing port, described first atomizing cup is communicated with by described first intercommunicating pore with second atomizing cup, described second atomizing cup is provided with second intercommunicating pore away from an end of described first intercommunicating pore, described second atomizing cup is communicated with by described second intercommunicating pore with described the 3rd atomizing cup, described the 3rd atomizing cup is provided with the gasoloid outlet away from the upside of described second intercommunicating pore, one end, and described the 3rd atomizing cup is provided with the waste liquid escape hole away from the downside of described second intercommunicating pore, one end.
Preferably, the dead in line of described first atomizing cup, second atomizing cup, the 3rd atomizing cup.
Such scheme has following beneficial effect: spray chamber adopts three atomizing cups to be socketed to form in such scheme, gap between the atomizing cup forms the passage that gasoloid flows, because each atomizing cup air intake opening and gas outlet are all away from each other, so just prolonged the stroke of gasoloid in spray chamber, increased the volume of spray chamber, thereby, strengthened the stability of signal with the drippage of atomizer waste liquid drop or because the fluctuation of the gasoloid sample introduction speed that the fluctuation of nebulizer gas pressure causes reduces to minimum to the influence of signal.
Above-mentioned explanation only is the general introduction of technical solution of the present invention, for can clearer understanding technological means of the present invention, and can be implemented according to the content of instructions, below with preferred embodiment of the present invention and conjunction with figs. describe in detail as after.The specific embodiment of the present invention is provided in detail by following examples and accompanying drawing thereof.
Description of drawings
Fig. 1 is the structural representation of the embodiment of the invention.
Embodiment
Below in conjunction with accompanying drawing the preferred embodiments of the present invention are described in detail.
As shown in Figure 1, the spray chamber of this ICP spectrometer sampling system, comprise first atomizing cup 1, second atomizing cup 2 and the 3rd atomizing cup 3, first atomizing cup 1 is positioned at described second atomizing cup 2, second atomizing cup 2 is positioned at the dead in line of the 3rd atomizing cup 3, the first atomizing cups 1, second atomizing cup 2, the 3rd atomizing cup 3, and three atomizing cup concentric locking collars together, leave the gap between first atomizing cup 1 and second atomizing cup 2, leave the gap between second atomizing cup 2 and the 3rd atomizing cup 3.One end of first atomizing cup 1 is provided with the atomizer installing port that is connected with atomizer 4, and first atomizing cup 1 is provided with first intercommunicating pore, 7, the first atomizing cups 1 away from an end of atomizer installing port and is communicated with by first intercommunicating pore 7 with second atomizing cup 2.Second atomizing cup 2 is provided with second intercommunicating pore, 8, the second atomizing cups 2 away from an end of first intercommunicating pore 7 and is communicated with by second intercommunicating pore 8 with the 3rd atomizing cup 3.The 3rd atomizing cup 3 is provided with gasoloid outlet 5, the three atomizing cups 3 away from the upside of second intercommunicating pore, 8 one ends and is provided with waste liquid escape hole 6 away from the downside of second intercommunicating pore, 8 one ends.
This spray chamber is when work, gasoloid enters in first atomizing cup 1 by atomizer 4, get rid of from gasoloid outlet 5 along the direction of A among the figure along first atomizing cup, second atomizing cup 2, the 3rd atomizing cup 3 gap each other then, the waste liquid of generation is got rid of by waste liquid escape hole 6.Gasoloid is got rid of the path of having passed through " an it " font from entering spray chamber to exporting 5 from gasoloid, rather than " U " shape path of original bitubular shape spray chamber.By such design, gasoloid in spray chamber stroke and the time of stop increased more than one times, effectively improved the aerocolloidal homogeneity in spray chamber exit, with the drippage of atomizer waste liquid drop or because the fluctuation of the gasoloid sample introduction speed that the fluctuation of nebulizer gas pressure causes reduces to minimum to the influence of signal, strengthened the stability of signal.
More than the spray chamber of a kind of ICP spectrometer sampling system that the embodiment of the invention provided is described in detail; for one of ordinary skill in the art; thought according to the embodiment of the invention; part in specific embodiments and applications all can change; in sum; this description should not be construed as limitation of the present invention, and all any changes of making according to design philosophy of the present invention are all within protection scope of the present invention.
Claims (2)
1. the spray chamber of an ICP spectrometer sampling system, it is characterized in that: it comprises first atomizing cup, second atomizing cup and the 3rd atomizing cup, described first atomizing cup is positioned at described second atomizing cup, leave the gap between described first atomizing cup and second atomizing cup, described second atomizing cup is positioned at described the 3rd atomizing cup, leave the gap between described second atomizing cup and the 3rd atomizing cup, one end of described first atomizing cup is provided with the atomizer installing port, described first atomizing cup is provided with first intercommunicating pore away from an end of atomizer installing port, described first atomizing cup is communicated with by described first intercommunicating pore with second atomizing cup, described second atomizing cup is provided with second intercommunicating pore away from an end of described first intercommunicating pore, described second atomizing cup is communicated with by described second intercommunicating pore with described the 3rd atomizing cup, described the 3rd atomizing cup is provided with the gasoloid outlet away from the upside of described second intercommunicating pore, one end, and described the 3rd atomizing cup is provided with the waste liquid escape hole away from the downside of described second intercommunicating pore, one end.
2. the spray chamber of ICP spectrometer sampling system according to claim 1 is characterized in that: the dead in line of described first atomizing cup, second atomizing cup, the 3rd atomizing cup.
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2009102321326A CN101706436B (en) | 2009-12-02 | 2009-12-02 | Atomizing chamber of ICP spectrometer sampling system |
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| CN2009102321326A CN101706436B (en) | 2009-12-02 | 2009-12-02 | Atomizing chamber of ICP spectrometer sampling system |
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| CN101706436A CN101706436A (en) | 2010-05-12 |
| CN101706436B true CN101706436B (en) | 2011-09-21 |
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| CN2009102321326A Active CN101706436B (en) | 2009-12-02 | 2009-12-02 | Atomizing chamber of ICP spectrometer sampling system |
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Families Citing this family (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102507536A (en) * | 2011-11-16 | 2012-06-20 | 天津重型装备工程研究有限公司 | Method for analyzing trace element capable generating hydride gas through hydrogenation |
| US9427821B2 (en) * | 2013-03-15 | 2016-08-30 | Agilent Technologies, Inc. | Integrated magnetron plasma torch, and related methods |
| CN103364393A (en) * | 2013-07-10 | 2013-10-23 | 中国科学院生态环境研究中心 | Atomizer of atomic emission spectroscopy of inductively coupled plasma and measurement method |
| CN103604940B (en) * | 2013-11-26 | 2015-05-06 | 福州大学 | Inductively coupled plasma-atomic emission spectrometry/mass spectrometry (ICP-AES/ MS) switching-free type organic sampling device |
| CN103900892A (en) * | 2014-03-25 | 2014-07-02 | 北京元盛科仪科技有限责任公司 | Aerosol diluting device |
| CN116840010B (en) * | 2023-07-03 | 2024-05-03 | 暨南大学 | Air inlet device of atomizing chamber |
Citations (5)
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| CN2084618U (en) * | 1991-01-30 | 1991-09-11 | 北京优联光电技术开发部 | Atmotizing device |
| CN2514344Y (en) * | 2001-12-27 | 2002-10-02 | 北京有色金属研究总院 | Induction coupled plasma mass spectrum sample feeding system |
| JP2007114063A (en) * | 2005-10-20 | 2007-05-10 | Horiba Ltd | Nebulizer and sample liquid atomizer |
| WO2007057527A1 (en) * | 2005-11-18 | 2007-05-24 | Institut Francais Du Petrole | Method and device for direct isotopic measurements on trace elements in organic matrices |
| JP2008275372A (en) * | 2007-04-26 | 2008-11-13 | Agilent Technol Inc | Plasma analyzer and plasma analysis method |
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2009
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Patent Citations (5)
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| CN2084618U (en) * | 1991-01-30 | 1991-09-11 | 北京优联光电技术开发部 | Atmotizing device |
| CN2514344Y (en) * | 2001-12-27 | 2002-10-02 | 北京有色金属研究总院 | Induction coupled plasma mass spectrum sample feeding system |
| JP2007114063A (en) * | 2005-10-20 | 2007-05-10 | Horiba Ltd | Nebulizer and sample liquid atomizer |
| WO2007057527A1 (en) * | 2005-11-18 | 2007-05-24 | Institut Francais Du Petrole | Method and device for direct isotopic measurements on trace elements in organic matrices |
| JP2008275372A (en) * | 2007-04-26 | 2008-11-13 | Agilent Technol Inc | Plasma analyzer and plasma analysis method |
Non-Patent Citations (4)
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| 丁兰.ICP-AES用微波热雾化器的研究.《中国博士学位论文全文数据库 工程科技Ⅰ辑》.2005,(第07期),B014-46:25-27. * |
| 何志壮等.采用旋流雾室改善ICP_AES和ICP_AFS分析性能的研究.《分析化学》.1987,第15卷(第2期),136-141. * |
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| CN101706436A (en) | 2010-05-12 |
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