CN201589815U - Resistance test device - Google Patents
Resistance test device Download PDFInfo
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- CN201589815U CN201589815U CN2010200268277U CN201020026827U CN201589815U CN 201589815 U CN201589815 U CN 201589815U CN 2010200268277 U CN2010200268277 U CN 2010200268277U CN 201020026827 U CN201020026827 U CN 201020026827U CN 201589815 U CN201589815 U CN 201589815U
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Abstract
A resistance test device comprises an insulating resistance test device and a short circuit test device, wherein, the insulating resistance test device comprises two test ends M omega+ and M omega-, an output end CTRL, the short circuit test device comprises a first short circuit test circuit, a second short circuit test circuit and an alarm circuit, two test ends M omega+ and M omega- of the insulating resistance test device are respectively connected with the first short circuit test circuit and the second short circuit test circuit, the insulating resistance test device output end CTRL, the first short circuit test circuit and the second short circuit test circuit are all connected with the alarm circuit. The insulating resistance test device and the short circuit test device are combined, when the insulating resistance of the insulating medium between two conductive metal objects are tested, meanwhile, whether the two conductive metals are contacted with the test ends to electrify or not can be detected, the test accuracy of the insulating resistance can be ensured, and erroneous judge caused by bad contact can not be generated.
Description
Technical field
The utility model relates to the test of insulation resistance, the especially test of the insulation resistance of " insulating medium " between two conductive metal substrates.
Background technology
At present, the test pole of Insulation Resistance Tester all is " two lines " system, and promptly p-wire connects an end of testee, and another root p-wire connects the other end of testee, when the resistance between two p-wires during greater than a certain setting value instrument be judged to be qualifiedly, otherwise be defective.
This method of testing has a defective, cannot judge exactly whether p-wire contacts well with testee, when the measured object surface oxidation or there are situations such as foreign matter to cause erroneous judgement.For example, when p-wire does not contact testee instrument show qualified, when the insulation resistance of testee also show greater than setting value qualified, like this we just cannot judge testee be genuine qualified or p-wire contacting well with testee.
Summary of the invention
Technical problem to be solved in the utility model provides a kind of impedance test device, have and detect the insulation impedance p-wire and whether contact excellent function with testee, during the insulation impedance of test object, can effectively prevent because of metal body surface because of oxidation or there are situations such as foreign matter to cause erroneous judgement.
For solving the problems of the technologies described above, the technical solution of the utility model is: a kind of impedance test device, comprise megger test device and short-circuit test device, described megger test device comprises ohmmeter M Ω, anodal test lead M Ω+, negative pole test lead M Ω-, output terminal CTRL, described short-circuit test device comprises the first short-circuit test circuit, the second short-circuit test circuit, warning circuit, described megger test device two test lead M Ω+, M Ω-be connected with the second short-circuit test circuit with the first short-circuit test circuit respectively, described megger test device output terminal CTRL, the first short-circuit test circuit, the second short-circuit test circuit all is connected with warning circuit.The megger test device is when testing the insulation resistance of the insulating medium between two conducting metals, because two test lead M Ω+, M Ω-be connected with the second short-circuit test circuit with the first short-circuit test circuit respectively, when test lead M Ω+contact electrically-conducting metal surface, whether the first short-circuit test circuit starts simultaneously, detect this conducting metal body and switch on; In like manner, when test lead M Ω-another electrically-conducting metal surface of contact, whether the second short-circuit test circuit starts simultaneously, detect this conducting metal body and switch on; If two tested conducting metals all can be switched on, then start warning circuit, point out the test passes of the insulation resistance of the insulating medium between these two conductive metal substrates.
As improvement, the described first short-circuit test circuit comprises two test lead A+, B+, wherein test lead A+ is by being connected with a direct current power output end behind the backward dioded, and test lead B+ is connected to the input end of described direct supply by electric switch, and described electric switch and warning circuit link; The test lead M Ω of described megger test device+be connected with the test lead A+ end of the first short-circuit test circuit, output terminal CTRL is connected with warning circuit by triode.
As improvement, be provided with comparer between the test lead B+ of the described first short-circuit test circuit and the electric switch, described test lead B+ is connected with the end of the same name of comparer, and the output terminal of comparer is connected with electric switch.
As improvement, the described second short-circuit test circuit comprises two test lead A-, B-, wherein test lead B-is connected with a direct current power output end by behind the backward dioded, test lead A-connects the input end of electric switch and described direct supply after by forward diode successively, described electric switch and warning circuit interlock; The test lead M Ω of described megger test device-be connected with the test lead A-of the second short-circuit test circuit, output terminal CTRL is connected with warning circuit by triode.
As improvement, be provided with comparer between the test lead A-of the described second short-circuit test circuit and the electric switch, described test lead A-is connected with the end of the same name of comparer, and the output terminal of comparer is connected with electric switch.
As improvement, described warning circuit comprises power supply VCC, hummer, the metal-oxide-semiconductor that is connected with alarm.
As improvement, described direct supply comprises transformer, the rectification circuit that is connected with transformer.
As improvement, described electric switch is optoelectronic switch or relay.
The beneficial effect that the utility model is compared with prior art brought is:
Increased the short-circuit test circuit of conducting metal, made in the insulation resistance of the insulating medium between two conductive metal substrates of test, detected this this two conducting metals and whether can switch on, guaranteed that erroneous judgement can not appear in the test of insulation resistance; The output of the first short-circuit test circuit, the second short-circuit test circuit, megger test all is connected with warning circuit, when having only three test circuits to have signal output simultaneously, warning circuit could start, and the test value of insulation resistance is that the reliability of actual value further increases.
Description of drawings
Fig. 1 is the circuit diagram of embodiment 1;
Fig. 2 is the circuit diagram of embodiment 2;
Fig. 3 is the circuit diagram of embodiment 3;
Fig. 4 is an electrical principle block diagram of the present utility model.
Embodiment
The utility model is described in further detail below in conjunction with Figure of description.
Shown in Fig. 1,4, a kind of impedance test device comprises megger test device and short-circuit test device, and described short-circuit test device comprises the first short-circuit test circuit, the second short-circuit test circuit, warning circuit.Whether in the insulation resistance of the insulating medium between test two conducting metals, detect two conducting metals by the short-circuit test device and can switch on, the test value of guaranteeing the megger test device is an actual value.
As shown in Figure 1, the described first short-circuit test circuit comprises two test lead A+, B+, direct supply, described direct supply comprises transformer T1, full bridge rectifier D1, transformer T1 links to each other with the voltage incoming end of full bridge rectifier D1, test lead A+ is connected with the output terminal of full bridge rectifier D1 by behind the backward dioded D11, test lead B+ is connected to the input end of full bridge rectifier D1 after by optoelectronic switch U3, and the output pin of described optoelectronic switch U3 is connected with the loop of warning circuit.When the same conducting metal that contacts simultaneously with test lead A+, B+ for can switch on the time, test lead A+ and B+ are on-state, the first short-circuit test circuit forms the loop of a closure, and optoelectronic switch U3 gets electric work, thereby connects first breakpoint in warning circuit loop.
The described second short-circuit test circuit comprises two test lead A-, B-, direct supply, described direct supply comprises transformer T2, full bridge rectifier D2, transformer T2 links to each other with the voltage incoming end of full bridge rectifier D2, test lead B-is connected with the output terminal of full bridge rectifier D2 by behind the backward dioded D22, test lead A-is connected with optoelectronic switch U4 by forward diode D23, take back the input end of full bridge rectifier D2 then, the output pin of described optoelectronic switch U4 is connected with warning circuit.When another conducting metal that contacts simultaneously with test lead A-, B-for can switch on the time, test lead A-and B-are on-state, the second short-circuit test circuit forms the loop of a closure, and optoelectronic switch U4 gets electric work, thereby connects second breakpoint in warning circuit loop.
Described megger test device comprise ohmmeter M Ω, two test lead M Ω+, M Ω-, output terminal CTRL, wherein test lead M Ω+link to each other test lead M Ω-link to each other with the test lead A+ of the first short-circuit test circuit with the test lead A-of the second short-circuit test circuit.When testing the insulation resistance of the insulating medium between two conducting metals, test lead M Ω+, A+, B+ contact simultaneously on same conducting metal, test lead M Ω-, A-, B-contact simultaneously on another conducting metal.The megger test device when measurement insulation resistance, can demonstrate on the ohmmeter M Ω test result and by output terminal CTRL to low level signal of the loop-coupled triode Q1 of warning circuit output, thereby connect the 3rd breakpoint in warning circuit loop.If two tested conducting metals are and can conduct electricity, then two breakpoints of all the other on the warning circuit are switched on, form a loop, power supply VCC provides voltage that metal-oxide-semiconductor Q2 is opened, hummer LS1 gets and sounds after electric, point out the megger test of the insulating medium between these two conductive metal substrates qualified, the reading on the megger test device is an actual value.
In addition, in two short-circuit test circuit, because direct supply all by carrying out direct current output behind forward diode D11, the D22, makes the voltage on the ohmmeter M Ω mutual the interchange can not occur with voltage on the short-circuit test circuit, guarantees the reliability of whole test circuit; In like manner, ohmmeter negative pole test lead M Ω-and circuit between be provided with forward diode D23, make the electric current in the short-circuit test circuit can not flow to ohmmeter.The utility model is fit to more than or equal to the output voltage of 10V voltage as voltage-withstand test, to adapt to different product requirements, such as short circuit between two electrodes such as testing capacitor, battery or withstand voltage situation, and short circuit or withstand voltage situation between two electrodes such as testing capacitor, battery and the shell.
Shown in Fig. 2,4, different is with embodiment 1: the described first short-circuit test circuit comprises two test lead A+, B+, direct supply, described direct supply comprises transformer T1, commutator tube D1, D4, commutator tube D1, D4 series connection forms the half-bridge rectification circuit, test lead A+ is connected with the output terminal of commutator tube D1, test lead B+ is connected with the input end of the same name of comparer N1, the output terminal of comparer N1 is connected to the input end of transformer T1 after by optoelectronic switch U3, and the output pin of described optoelectronic switch U3 is connected with the loop of warning circuit.When the conducting metal that is contacted with test lead A+, B+ for can switch on the time, test lead A+ and B+ are on-state, when comparer N1 end of the same name detects high level, output voltage signal is got back to transformer T1 input end by optoelectronic switch U3, the first short-circuit test circuit forms the loop of a closure, optoelectronic switch U3 gets electric work, thereby connects first breakpoint in warning circuit loop.In like manner, the described second short-circuit test circuit comprises two test lead A-, B-, direct supply, described direct supply comprises transformer T2, commutator tube D3, D5, commutator tube D3, D5 series connection forms the half-bridge rectification circuit, test lead B-is connected with the output terminal of commutator tube D3, test lead A-is connected with the input end of the same name of comparer N2 by behind the forward diode D2, the output terminal of comparer N2 is connected to the input end of transformer T2 after by optoelectronic switch U4, and the output pin of described optoelectronic switch U4 is connected with the loop of warning circuit.When the conducting metal that is contacted with test lead A-, B-for can switch on the time, test lead A-and B-are on-state, when comparer N2 end of the same name detects high level, output voltage signal is got back to transformer T2 input end by optoelectronic switch U4, the second short-circuit test circuit forms the loop of a closure, optoelectronic switch U4 gets electric work, thereby connects second breakpoint in warning circuit loop.The principle of work of megger test device is described the same with embodiment 1, be not described in detail in the present embodiment, when the optoelectronic switch U4 of the output terminal CTRL of and if only if megger test device, the optoelectronic switch U3 of the first short-circuit test circuit, the second short-circuit test circuit has signal output simultaneously, warning circuit starts, point out the megger test of the insulating medium between these two conductive metal substrates qualified, the reading on the megger test device is an actual value.
Embodiment 3
Shown in Fig. 3,4, different is with embodiment 2: the test lead B+ of the first short-circuit test circuit is with after the input end of the same name of comparer N1 is connected, the output terminal of comparer N1 is connected with the grid of metal-oxide-semiconductor Q12, the former utmost point of metal-oxide-semiconductor Q12 is connected with relay K 1, drain electrode is connected with the input end of transformer T1, is connected with door U5A with one with the contact of relay K 1 interlock.The test lead A-of the described second short-circuit test circuit is with after the input end of the same name of comparer N2 is connected, the output terminal of comparer N2 is connected with the grid of metal-oxide-semiconductor Q22, the former utmost point of metal-oxide-semiconductor Q22 is connected with relay K 2, with the contact of relay K 2 interlock be connected with door U5A.The output terminal CTRL of insulated test device by behind the triode Q1 be connected with door U5A.When the relay K 2 of the output terminal CTRL of and if only if megger test device, the relay K 1 of the first short-circuit test circuit, the second short-circuit test circuit has signal output simultaneously, open with door U5A, make metal-oxide-semiconductor Q2 conducting, warning circuit forms the loop, hummer LS1 is unlocked, point out the megger test of the insulating medium between these two conductive metal substrates qualified, the reading on the megger test device is an actual value.
In the utility model, the megger test device combines with the short-circuit test device, make in the insulation resistance of the insulating medium between two conductive metal substrates of test, detect this this two conducting metals and whether can switch on, guarantee that erroneous judgement can not appear in the test of insulation resistance.
Claims (8)
1. impedance test device, it is characterized in that: comprise megger test device and short-circuit test device, described megger test device comprises ohmmeter M Ω, anodal test lead M Ω+, negative pole test lead M Ω-, output terminal CTRL, described short-circuit test device comprises the first short-circuit test circuit, the second short-circuit test circuit, warning circuit, described megger test device two test lead M Ω+, M Ω-be connected with the second short-circuit test circuit with the first short-circuit test circuit respectively, described megger test device output terminal CTRL, the first short-circuit test circuit, the second short-circuit test circuit all is connected with warning circuit.
2. a kind of impedance test device according to claim 1, it is characterized in that: the described first short-circuit test circuit comprises two test lead A+, B+, wherein test lead A+ is connected with a direct current power output end by behind the backward dioded, test lead B+ is connected to the input end of described direct supply by electric switch, described electric switch and warning circuit interlock; The test lead M Ω of described megger test device+be connected with the test lead A+ end of the first short-circuit test circuit, output terminal CTRL is connected with warning circuit by triode.
3. a kind of impedance test device according to claim 2, it is characterized in that: be provided with comparer between the test lead B+ of the described first short-circuit test circuit and the electric switch, described test lead B+ is connected with the end of the same name of comparer, and the output terminal of comparer is connected with electric switch.
4. a kind of impedance test device according to claim 1, it is characterized in that: the described second short-circuit test circuit comprises two test lead A-, B-, wherein test lead B-is connected with a direct current power output end by behind the backward dioded, test lead A-connects the input end of electric switch and described direct supply after by forward diode successively, described electric switch and warning circuit interlock; The test lead M Ω of described megger test device-be connected with the test lead A-of the second short-circuit test circuit, output terminal CTRL is connected with warning circuit by triode.
5. a kind of impedance test device according to claim 4, it is characterized in that: be provided with comparer between the test lead A-of the described second short-circuit test circuit and the electric switch, described test lead A-is connected with the end of the same name of comparer, and the output terminal of comparer is connected with electric switch.
6. according to any described a kind of impedance test device of claim 1 to 5, it is characterized in that: described warning circuit comprises power supply VCC, hummer, the metal-oxide-semiconductor that is connected with alarm.
7. according to any described a kind of impedance test device of claim 2 to 5, it is characterized in that: described direct supply comprises transformer, the rectification circuit that is connected with transformer.
8. according to any described a kind of impedance test device of claim 2 to 5, it is characterized in that: described electric switch is optoelectronic switch or relay.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2010200268277U CN201589815U (en) | 2010-01-15 | 2010-01-15 | Resistance test device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2010200268277U CN201589815U (en) | 2010-01-15 | 2010-01-15 | Resistance test device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN201589815U true CN201589815U (en) | 2010-09-22 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN2010200268277U Expired - Fee Related CN201589815U (en) | 2010-01-15 | 2010-01-15 | Resistance test device |
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| CN (1) | CN201589815U (en) |
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102680789A (en) * | 2010-10-25 | 2012-09-19 | 宁波大学 | Method for measuring static resistance of material |
| CN102680790A (en) * | 2010-10-25 | 2012-09-19 | 宁波大学 | Method for measuring dynamic resistance of material |
| CN102967789A (en) * | 2011-09-01 | 2013-03-13 | 致茂电子股份有限公司 | High voltage test method and device with contact point loop rapid test function |
| CN106771622A (en) * | 2017-01-10 | 2017-05-31 | 深圳顺络电子股份有限公司 | A kind of method of testing and test system of test product insulaion resistance |
| CN109425444A (en) * | 2017-08-30 | 2019-03-05 | 罗伯特·博世有限公司 | Pot temperature probe with position sensor |
| CN109932565A (en) * | 2017-12-18 | 2019-06-25 | 浙江昱能科技有限公司 | A kind of insulating resistor detecting circuit of inverter |
-
2010
- 2010-01-15 CN CN2010200268277U patent/CN201589815U/en not_active Expired - Fee Related
Cited By (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102680789A (en) * | 2010-10-25 | 2012-09-19 | 宁波大学 | Method for measuring static resistance of material |
| CN102680790A (en) * | 2010-10-25 | 2012-09-19 | 宁波大学 | Method for measuring dynamic resistance of material |
| CN102680789B (en) * | 2010-10-25 | 2014-06-25 | 宁波大学 | Method for measuring static resistance of material |
| CN102680790B (en) * | 2010-10-25 | 2014-06-25 | 宁波大学 | Method for measuring dynamic resistance of material |
| CN102967789A (en) * | 2011-09-01 | 2013-03-13 | 致茂电子股份有限公司 | High voltage test method and device with contact point loop rapid test function |
| CN106771622A (en) * | 2017-01-10 | 2017-05-31 | 深圳顺络电子股份有限公司 | A kind of method of testing and test system of test product insulaion resistance |
| CN109425444A (en) * | 2017-08-30 | 2019-03-05 | 罗伯特·博世有限公司 | Pot temperature probe with position sensor |
| CN109932565A (en) * | 2017-12-18 | 2019-06-25 | 浙江昱能科技有限公司 | A kind of insulating resistor detecting circuit of inverter |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20100922 Termination date: 20160115 |
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| EXPY | Termination of patent right or utility model |