CN102680790A - Method for measuring dynamic resistance of material - Google Patents

Method for measuring dynamic resistance of material Download PDF

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Publication number
CN102680790A
CN102680790A CN2012101471008A CN201210147100A CN102680790A CN 102680790 A CN102680790 A CN 102680790A CN 2012101471008 A CN2012101471008 A CN 2012101471008A CN 201210147100 A CN201210147100 A CN 201210147100A CN 102680790 A CN102680790 A CN 102680790A
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Prior art keywords
resistance
resistor
calibration resistor
hyperchannel
toggle switch
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CN2012101471008A
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CN102680790B (en
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陈建康
张明华
雷金涛
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Ningbo University
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Ningbo University
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Abstract

The invention discloses an instrument for measuring the static resistance and dynamic change resistance of a material. A power voltage signal display circuit is respectively connected with a first standard resistor and an adjustable resistor; the first standard resistor is connected with the adjustable resistor; the adjustable resistor is connected with a second standard resistor; a resistor to be measured is arranged between the first standard resistor and the second standard resistor; a balanced bridge display circuit is arranged between the connection point of the first standard resistor and the adjustable resistor and the connection point of the resistor to be measured and the second standard resistor; and a dynamic voltage display circuit is arranged between the connection point of the first standard resistor and the adjustable resistor and the connection point of the resistor to be measured and the second standard resistor. The instrument has the advantages that when external environment such as load and temperature is severely changed, measurement of the dynamic change resistance of the material is realized, and when the external environment such as the load and the temperature is severely changed, measurement of the static resistance of the material is realized.

Description

A kind of measuring method of MATERIALS ' DYNAMIC resistance
The application is to be that October 25, application number in 2010 are 201010517682.5, denomination of invention is to the applying date: a kind ofly measure material static resistance and the instrument of dynamic change resistance and dividing an application of measuring method.
Technical field
The present invention relates to a kind of instrument of measuring material resistance, especially relate to a kind of instrument and measuring method of measuring material static resistance and dynamic change resistance.
Background technology
At present according to the difference of specific insulation ; The way of measuring resistance is divided into two kinds: a kind of is during as , uses general digital multimeter to get final product; Another kind is the develop rapidly along with the space flight and aviation cause; Light material and research with new material of function of shielding are deepened continuously; Research work personnel put into sight on one's body the superpolymer such as polypropylene, polyaniline; They are macromolecular materials; After adding conductive particle; Their electric property during to the research material load action electric conductivity inherent mechanism have very important significance, above-mentioned macromolecular material specific insulation
Figure 2012101471008100002DEST_PATH_IMAGE003
, this need use the high resistant appearance and test.
Within a short period of time, when imposed load, temperature etc. sharply changed, the resistance of measured material can occur one and be exceedingly fast and great variable quantity, and this is the dynamic change resistance of material.Existing resistance-meter is mainly used in the measurement of material static resistance; Can't carry out the dynamic change resistance of material measures; Because also do not wait the surveying instrument image data, the dynamic load effect changes the resistance variations (requiring survey frequency is 1 time/second) that causes and is through with.
Moreover some material is when external environments such as load and temperature sharply change, and its material resistance magnitude alters a great deal, like resistance 10 2-10 10In, require survey frequency at 1 time/minute, also can use the static measurement method this moment.Static measurement can be used common digital multimeter and two kinds of resistance-meters of high resistant appearance; But changing two kinds of surveying instruments measures; Cumbersome on the one hand, because of changing two kinds of required certain time intervals of instrument, may cause measuring error on the other hand because of delaying of time.
Summary of the invention
Technical matters to be solved by this invention provides a kind of instrumentation and testing method of measuring material static resistance and dynamic change resistance; MATERIALS ' DYNAMIC in the time of both can having measured external environment and sharply change changes resistance, the material static resistance in the time of also can measuring external environment and sharply change.When external environment sharply changed, some material resistance magnitude altered a great deal, and the present invention promptly can the higher resistance of measuring amount level, also simultaneously can measure the lower resistance of magnitude, realized the material that magnitude alters a great deal is measured.
The present invention solves the problems of the technologies described above the technical scheme that is adopted: a kind of instrument of measuring material static resistance and dynamic change resistance; Comprise variable voltage source and power supply voltage signal display circuit; Described variable voltage source is connected with described power supply voltage signal display circuit; It is characterized in that it also comprises first calibration resistor, adjustable resistor, second calibration resistor, balanced bridge display circuit and dynamic electric voltage display circuit; Described power supply voltage signal display circuit is connected with adjustable resistor with described first calibration resistor respectively; Described first calibration resistor is connected with described adjustable resistor; Described adjustable resistor is connected with described second calibration resistor; Testing resistance is arranged between first calibration resistor and second calibration resistor, and described balanced bridge display circuit is arranged between the tie point and the tie point between the testing resistance and second calibration resistor between first calibration resistor and the adjustable resistor, and described dynamic electric voltage display circuit is arranged between the tie point and the tie point between the testing resistance and second calibration resistor between first calibration resistor and the adjustable resistor.
Described balanced bridge display circuit comprises the first hyperchannel toggle switch, selectable resistors, second hyperchannel toggle switch and the microampere meter; Described selectable resistors is connected between the first hyperchannel toggle switch and the second hyperchannel toggle switch; The described first hyperchannel toggle switch is connected with tie point between first calibration resistor and the adjustable resistor; The described second hyperchannel toggle switch is connected with tie point between the testing resistance and second calibration resistor; Described dynamic electric voltage display circuit comprises digital storage oscilloscope; Described microampere meter is connected the tie point between first calibration resistor and the adjustable resistor with a end after digital storage oscilloscope is parallelly connected, and described microampere meter is connected the tie point between second calibration resistor and the testing resistance with the other end after digital storage oscilloscope is parallelly connected.
Be provided with the 3rd SS and the 8th SS between tie point between first calibration resistor and the first hyperchannel toggle switch and the adjustable resistor; Be provided with the 5th SS between tie point, microampere meter and the digital storage oscilloscope between the 3rd SS and the 8th SS; Be provided with second SS between tie point between the second hyperchannel toggle switch and second calibration resistor and the testing resistance; Be provided with the 7th SS between tie point, microampere meter and the digital storage oscilloscope between the second hyperchannel toggle switch and second calibration resistor; Described adjustable resistor comprises accurate adjustment resistance and roughly adjusted rheostat, and accurate adjustment resistance is connected with multimeter through the 9th SS with roughly adjusted rheostat.
Described variable voltage source one end is provided with first switch, and described power supply voltage signal display circuit comprises first light emitting diode and the 7th resistance.
Described first calibration resistor comprises first resistance, second resistance, the 3rd resistance, the 4th resistance, the 5th resistance and the 6th resistance; Adjustable resistor also comprises the 9th resistance, the tenth resistance, the 11 resistance and the 12 resistance; Selectable resistors comprises the 13 resistance, the 14 resistance, the 15 resistance, the 16 resistance, the 17 resistance and the 18 resistance; Second calibration resistor comprises the 19 resistance, the 20 resistance, the 21 resistance, the 22 resistance, the 23 resistance and the 24 resistance; The described first hyperchannel toggle switch and the second hyperchannel toggle switch all are six passage toggle switchs, and second SS, the 3rd SS, the 7th SS and the 8th SS all are No. six SSes.
A kind of measuring method of material static resistance, its concrete steps are following:
Step 1: connect electrode in the both sides of detected materials earlier;
Step 2: the detected materials that will connect electrode is linked between second SS and first calibration resistor;
Step 3: regulate the 3rd SS, the 6th resistance in first calibration resistor is connected, regulate the first hyperchannel toggle switch and the second hyperchannel toggle switch; The 13 resistance in the selectable resistors is connected, regulated second SS, the 24 resistance in second calibration resistor is connected; Regulate the 8th SS; Roughly adjusted rheostat in the adjustable resistor is connected, regulated the 5th SS and the 7th SS, microampere meter is connected; First switch that closes makes variable voltage source output 10V voltage;
Step 4: regulate roughly adjusted rheostat, make microampere meter pointer nulling;
Step 5: regulate the 8th SS, the accurate adjustment resistance in the adjustable resistor is connected, regulate accurate adjustment resistance, make microampere meter pointer nulling, reach bridge balance;
Step 6: regulate the 9th SS, measure the resistance value of accurate adjustment resistance, according to the resistance of resistance/the 8th resistance of resistance * the 24 resistance of detected materials resistance RX=the 6th resistance with multimeter.
A kind of measuring method of MATERIALS ' DYNAMIC resistance, its concrete steps are following:
Step 1: in the Hopkinson pressure bar device, add the detected materials sample;
Step 2: the both sides of detected materials are connected electrode;
Step 3: the detected materials that will connect electrode is linked between second SS and first calibration resistor;
Step 4: regulate the 3rd SS, the 5th resistance in first calibration resistor is connected, regulate the first hyperchannel toggle switch and the second hyperchannel toggle switch; The 14 resistance in the selectable resistors is connected, regulated second SS, the 23 resistance in second calibration resistor is connected; Regulate the 8th SS; Roughly adjusted rheostat in the adjustable resistor is connected, regulated the 5th SS and the 7th SS, microampere meter is connected; First switch that closes makes variable voltage source output 100V voltage;
Step 5: regulate roughly adjusted rheostat, make microampere meter pointer nulling;
Step 6: regulate the 8th SS, the accurate adjustment resistance in the adjustable resistor is connected, regulate accurate adjustment resistance, make microampere meter pointer nulling, reach bridge balance;
Step 7: regulate the 9th SS, measure the resistance value of accurate adjustment resistance, according to the resistance of resistance/the 8th resistance of resistance * the 23 resistance of detected materials resistance RX=the 5th resistance with multimeter;
Step 8: select the 5th SS, connect digital storage oscilloscope, select the 8th SS to connect and approaching the 9th resistance or the tenth resistance or the 11 resistance or the 12 resistance of accurate adjustment resistance magnitude;
Step 9: start the Hopkinson pressure bar device, drop bar bump incident bar, incident bar effect detected materials sample, detected materials sample effect transmission bar, transmission bar effect absorbing rod, absorbing rod bump damper;
Step 10: the change in voltage curve that shows on the record digital storage oscilloscope;
Step 11:, convert the change in voltage curve to material change in resistance curve through the conversion formula between voltage and the resistance.
Compared with prior art; Advantage of the present invention is externally during environment (load and temperature etc.) acute variation; Realization changes the measurement of resistance to MATERIALS ' DYNAMIC, and externally during environment (load and temperature etc.) acute variation, realization is to the measurement of material static resistance simultaneously.When external environment sharply changed, some material resistance magnitude altered a great deal, and the present invention promptly can the higher resistance of measuring amount level, also simultaneously can measure the lower resistance of magnitude, realized the material that magnitude alters a great deal is measured.
Description of drawings
Fig. 1 is a circuit structure block diagram of the present invention;
Fig. 2 is circuit theory diagrams of the present invention;
Fig. 3 is the dynamic resistance measurement mechanism of a present invention structural drawing.
Embodiment
Embodiment describes in further detail the present invention below in conjunction with accompanying drawing.
A kind of instrument of measuring material static resistance and dynamic change resistance; Comprise variable voltage source BT1 and power supply voltage signal display circuit 2; Variable voltage source BT1 is connected with power supply voltage signal display circuit 2; It also comprises first calibration resistor 3, adjustable resistor 4, second calibration resistor 5, balanced bridge display circuit 6 and dynamic electric voltage display circuit 7; Power supply voltage signal display circuit 2 is connected with adjustable resistor 4 with first calibration resistor 3 respectively; First calibration resistor 3 is connected with adjustable resistor 4; Adjustable resistor 4 is connected with second calibration resistor 5; Testing resistance RX is arranged between first calibration resistor 3 and second calibration resistor 5, and balanced bridge display circuit 6 is arranged between the tie point and the tie point between the testing resistance RX and second calibration resistor 5 between first calibration resistor 3 and the adjustable resistor 4, and dynamic electric voltage display circuit 7 is arranged between the tie point and the tie point between the testing resistance RX and second calibration resistor 5 between first calibration resistor 3 and the adjustable resistor 4.
Balanced bridge display circuit 6 comprises the first hyperchannel toggle switch S4, selectable resistors RZ, second hyperchannel toggle switch S6 and the microampere meter; Selectable resistors RZ is connected between the first hyperchannel toggle switch S4 and the second hyperchannel toggle switch S6; The first hyperchannel toggle switch S4 is connected with tie point between first calibration resistor 3 and the adjustable resistor 4; The second hyperchannel toggle switch S6 is connected with tie point between the testing resistance RX and second calibration resistor 5; Dynamic electric voltage display circuit 7 comprises digital storage oscilloscope; Microampere meter is connected the tie point between first calibration resistor 3 and the adjustable resistor 4 with a end after digital storage oscilloscope is parallelly connected, and microampere meter is connected the tie point between second calibration resistor 5 and the testing resistance RX with the other end after digital storage oscilloscope is parallelly connected.
Be provided with the 3rd SS S3 and the 8th SS S8 between tie point between first calibration resistor 3 and the first hyperchannel toggle switch S4 and the adjustable resistor 4; Be provided with the 5th SS S5 between tie point, microampere meter and the digital storage oscilloscope between the 3rd SS S3 and the 8th SS S8; Be provided with the second SS S2 between tie point between the second hyperchannel toggle switch S6 and second calibration resistor 5 and the testing resistance RX; Be provided with the 7th SS S7 between tie point, microampere meter and the digital storage oscilloscope between the second hyperchannel toggle switch S6 and second calibration resistor 5; Adjustable resistor 4 comprises accurate adjustment resistance R 8 and roughly adjusted rheostat R25, and accurate adjustment resistance R 8 is connected with multimeter through the 9th SS S9 with roughly adjusted rheostat R25.Through selection to two hyperchannel toggle switchs, can be at the suitable resistance of the selection among the selectable resistors RZ.
Variable voltage source BT1 one end is provided with first switch S 1, and power supply voltage signal display circuit 2 comprises the first light emitting diode D1 and the 7th resistance R 7.
First calibration resistor 3 comprises that resistance is that 100 ohm first resistance R 1, resistance is that second resistance R 2, the resistance of 1K ohm is that the 3rd resistance R 3, the resistance of 10K ohm is that the 4th resistance R 4, the resistance of 100K ohm is the 5th resistance R 5 of 1M ohm and the 6th resistance R 6 that resistance is 10M ohm; Adjustable resistor 4 comprises that also resistance is that 1 ohm the 9th resistance R 9, resistance is the 12 resistance R 12 that 10 ohm the tenth resistance R 10, the 11 resistance R 11 that resistance is 100 ohm and resistance are 1K ohm; Selectable resistors RZ comprises that resistance is that the 13 resistance R 13, the resistance of 100K ohm is that the 14 resistance R 14, the resistance of 100K ohm is that the 15 resistance R 15, the resistance of 10K ohm is the 18 resistance R 18 that the 16 resistance R 16 of 1K ohm, the 17 resistance R 17 that resistance is 100 ohm and resistance are 10 ohm; Second calibration resistor 5 comprises that resistance is that 100 ohm the 19 resistance R 19, resistance is that the 20 resistance R 20, the resistance of 1K ohm is that the 21 resistance R 21, the resistance of 10K ohm is that the 22 resistance R 22 of 100K ohm, the 23 resistance R 23 and the resistance that resistance is 1M ohm are the 24 resistance R 24 of 10M ohm; The first hyperchannel toggle switch S4 and the second hyperchannel toggle switch S6 are six passage toggle switchs, and the second SS S2, the 3rd SS S3, the 7th SS S7 and the 8th SS S8 are No. six SSes.
A kind of measuring method of material static resistance, its concrete steps are following:
Step 1: connect electrode in the both sides of detected materials RX earlier;
Step 2: the detected materials RX that will connect electrode is linked between the second SS S2 and first calibration resistor 3;
Step 3: regulate the 3rd SS S3, the 6th resistance R 6 in first calibration resistor 3 is connected, regulate the first hyperchannel toggle switch S4 and the second hyperchannel dial-up S6 switch; The 13 resistance R 13 among the selectable resistors RZ is connected, regulated the second SS S2, the 24 resistance R 24 in second calibration resistor 5 is connected; Regulate the 8th SS S8; Roughly adjusted rheostat R25 in the adjustable resistor 4 is connected, regulate the 5th SS S5 and the 7th SS S7, microampere meter is connected; First switch S 1 of closing makes variable voltage source BT1 output 10V voltage;
Step 4: regulate roughly adjusted rheostat R25, make microampere meter pointer nulling;
Step 5: regulate the 8th SS S8, the accurate adjustment resistance R 8 in the adjustable resistor 4 is connected, regulate accurate adjustment resistance R 8, make microampere meter pointer nulling, reach bridge balance;
Step 6: regulate the 9th SS S9, measure the resistance value of accurate adjustment resistance R 8, according to the resistance of resistance/the 8th resistance R 8 of resistance * the 24 resistance R 24 of resistance=the 6th resistance R 6 of detected materials RX with multimeter.
A kind of measuring method of MATERIALS ' DYNAMIC resistance, its concrete steps are following:
Step 1: the both sides of detected materials RX are connected electrode;
Step 2: the detected materials RX that will connect electrode is linked between the second SS S2 and first calibration resistor 3;
Step 3: detected materials RX sample is added in the Hopkinson pressure bar device;
Step 4: regulate the 3rd SS S3, the 5th resistance R 5 in first calibration resistor 3 is connected, regulate the first hyperchannel toggle switch S4 and the second hyperchannel dial-up S6 switch; The 14 resistance R 14 among the selectable resistors RZ is connected, regulated the second SS S2, the 23 resistance R 23 in second calibration resistor 5 is connected; Regulate the 8th SS S8; Roughly adjusted rheostat R25 in the adjustable resistor 4 is connected, regulate the 5th SS S5 and the 7th SS S7, microampere meter is connected; First switch S 1 of closing makes variable voltage source BT1 output 100V voltage;
Step 5: regulate roughly adjusted rheostat R25, make microampere meter pointer nulling;
Step 6: regulate the 8th SS S8, the accurate adjustment resistance R 8 in the adjustable resistor 4 is connected, regulate accurate adjustment resistance R 8, make microampere meter pointer nulling, reach bridge balance;
Step 7: regulate the 9th SS S9, measure the resistance value of accurate adjustment resistance R 8, according to the resistance of resistance/the 8th resistance R 8 of resistance * the 23 resistance R 23 of detected materials RX resistance=the 5th resistance R 5 with multimeter;
Step 8: select the 5th SS S5, connect digital storage oscilloscope, select the 8th SS S8 to connect and approaching the 9th resistance R 9 or the tenth resistance R 10 or the 11 resistance R 11 or the 12 resistance R 12 of accurate adjustment resistance R 8 resistance magnitudes; Avoid big electric current to damage accurate adjustment resistance R 8;
Step 9: start the Hopkinson pressure bar device, drop bar 8 bump incident bars 9, incident bar 9 effect detected materials RX samples, detected materials RX sample effect transmission bar 10, transmission bar 10 effect absorbing rods 11, absorbing rod 11 bump dampers 12;
Step 10: the change in voltage curve that shows on the record digital storage oscilloscope;
Step 11:, convert the change in voltage curve to material change in resistance curve through the conversion formula between voltage and the resistance.

Claims (2)

1. the measuring method of a MATERIALS ' DYNAMIC resistance; Use a kind of instrument of measuring material static resistance and dynamic change resistance; Comprise variable voltage source and power supply voltage signal display circuit; Described variable voltage source is connected with described power supply voltage signal display circuit; It is characterized in that it also comprises first calibration resistor, adjustable resistor, second calibration resistor, balanced bridge display circuit and dynamic electric voltage display circuit; Described power supply voltage signal display circuit is connected with adjustable resistor with described first calibration resistor respectively; Described first calibration resistor is connected with described adjustable resistor, and described adjustable resistor is connected with described second calibration resistor, and testing resistance is arranged between first calibration resistor and second calibration resistor; Described balanced bridge display circuit is arranged between the tie point and the tie point between the testing resistance and second calibration resistor between first calibration resistor and the adjustable resistor, and described dynamic electric voltage display circuit is arranged between the tie point and the tie point between the testing resistance and second calibration resistor between first calibration resistor and the adjustable resistor;
Described balanced bridge display circuit comprises the first hyperchannel toggle switch, selectable resistors, second hyperchannel toggle switch and the microampere meter; Described selectable resistors is connected between the first hyperchannel toggle switch and the second hyperchannel toggle switch; The described first hyperchannel toggle switch is connected with tie point between first calibration resistor and the adjustable resistor; The described second hyperchannel toggle switch is connected with tie point between the testing resistance and second calibration resistor; Described dynamic electric voltage display circuit comprises digital storage oscilloscope; Described microampere meter is connected the tie point between first calibration resistor and the adjustable resistor with a end after digital storage oscilloscope is parallelly connected, and described microampere meter is connected the tie point between second calibration resistor and the testing resistance with the other end after digital storage oscilloscope is parallelly connected;
Be provided with the 3rd SS and the 8th SS between tie point between first calibration resistor and the first hyperchannel toggle switch and the adjustable resistor; Be provided with the 5th SS between tie point, microampere meter and the digital storage oscilloscope between the 3rd SS and the 8th SS; Be provided with second SS between tie point between the second hyperchannel toggle switch and second calibration resistor and the testing resistance; Be provided with the 7th SS between tie point, microampere meter and the digital storage oscilloscope between the second hyperchannel toggle switch and second calibration resistor; Described adjustable resistor comprises accurate adjustment resistance and roughly adjusted rheostat, and accurate adjustment resistance is connected with multimeter through the 9th SS with roughly adjusted rheostat;
Described first calibration resistor comprises first resistance, second resistance, the 3rd resistance, the 4th resistance, the 5th resistance and the 6th resistance; Adjustable resistor also comprises the 9th resistance, the tenth resistance, the 11 resistance and the 12 resistance; Selectable resistors comprises the 13 resistance, the 14 resistance, the 15 resistance, the 16 resistance, the 17 resistance and the 18 resistance; Second calibration resistor comprises the 19 resistance, the 20 resistance, the 21 resistance, the 22 resistance, the 23 resistance and the 24 resistance; The described first hyperchannel toggle switch and the second hyperchannel toggle switch all are six passage toggle switchs, and second SS, the 3rd SS, the 7th SS and the 8th SS all are No. six SSes;
It is characterized in that concrete steps are following:
Step 1: the both sides of detected materials RX are connected electrode;
Step 2: the detected materials RX that will connect electrode is linked between second SS and first calibration resistor; Step 3: detected materials RX sample is added in the Hopkinson pressure bar device;
Step 4: regulate the 3rd SS, the 5th resistance in first calibration resistor is connected, regulate the first hyperchannel toggle switch and the second hyperchannel toggle switch; The 14 resistance in the selectable resistors is connected, regulated second SS, the 23 resistance in second calibration resistor is connected; Regulate the 8th SS; Roughly adjusted rheostat in the adjustable resistor is connected, regulated the 5th SS and the 7th SS, microampere meter is connected; First switch that closes makes variable voltage source output 100V voltage;
Step 5: regulate roughly adjusted rheostat, make microampere meter pointer nulling;
Step 6: regulate the 8th SS, the accurate adjustment resistance in the adjustable resistor is connected, regulate accurate adjustment resistance, make microampere meter pointer nulling, reach bridge balance;
Step 7: regulate the 9th SS, measure the resistance value of accurate adjustment resistance, according to the resistance of resistance/the 8th resistance of resistance * the 23 resistance of detected materials resistance RX=the 5th resistance with multimeter;
Step 8: select the 5th SS, connect digital storage oscilloscope, select the 8th SS to connect and approaching the 9th resistance or the tenth resistance or the 11 resistance or the 12 resistance of accurate adjustment resistance magnitude;
Step 9: start the Hopkinson pressure bar device, drop bar bump incident bar, incident bar effect detected materials sample, detected materials sample effect transmission bar, transmission bar effect absorbing rod, absorbing rod bump damper;
Step 10: the change in voltage curve that shows on the record digital storage oscilloscope;
Step 11:, convert the change in voltage curve to material change in resistance curve through the conversion formula between voltage and the resistance.
2. the measuring method of a kind of MATERIALS ' DYNAMIC resistance according to claim 1 is characterized in that described variable voltage source one end is provided with first switch, and described power supply voltage signal display circuit comprises first light emitting diode and the 7th resistance.
CN201210147100.8A 2010-10-25 2010-10-25 Method for measuring dynamic resistance of material Expired - Fee Related CN102680790B (en)

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CN104020354A (en) * 2014-06-19 2014-09-03 上海市纺织科学研究院 Method for detecting specific resistance of short fibers of chemical fibers
CN105717393B (en) * 2016-02-16 2019-10-18 常州同惠电子股份有限公司 A kind of parameter test system and test method for electronic component

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GB691633A (en) * 1951-02-20 1953-05-20 George Frederick Shotter Improvements in or relating to the measurement of resistance
DE2357693A1 (en) * 1973-11-19 1975-05-22 Rose Walter Kg CIRCUIT ARRANGEMENT FOR COMPARATIVE MEASUREMENT OF RESISTORS, IN PARTICULAR INSULATION RESISTORS
US4278932A (en) * 1978-07-11 1981-07-14 Tait David A G A.C. Bridges
JPS60220872A (en) * 1984-04-17 1985-11-05 Showa Electric Wire & Cable Co Ltd Instrument for measuring resistance
CN2166460Y (en) * 1993-09-02 1994-05-25 施亚民 Computerized high-voltage insulation resistance tester
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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN104020354A (en) * 2014-06-19 2014-09-03 上海市纺织科学研究院 Method for detecting specific resistance of short fibers of chemical fibers
CN105717393B (en) * 2016-02-16 2019-10-18 常州同惠电子股份有限公司 A kind of parameter test system and test method for electronic component

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