JPS60220872A - Instrument for measuring resistance - Google Patents
Instrument for measuring resistanceInfo
- Publication number
- JPS60220872A JPS60220872A JP59078132A JP7813284A JPS60220872A JP S60220872 A JPS60220872 A JP S60220872A JP 59078132 A JP59078132 A JP 59078132A JP 7813284 A JP7813284 A JP 7813284A JP S60220872 A JPS60220872 A JP S60220872A
- Authority
- JP
- Japan
- Prior art keywords
- resistance
- voltage
- temperature
- sample
- output
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000004364 calculation method Methods 0.000 claims description 7
- 238000005259 measurement Methods 0.000 claims description 7
- 238000009529 body temperature measurement Methods 0.000 claims description 3
- 239000004065 semiconductor Substances 0.000 claims description 2
- 239000004020 conductor Substances 0.000 abstract description 18
- 238000010586 diagram Methods 0.000 description 4
- 238000012935 Averaging Methods 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 1
- 235000014676 Phragmites communis Nutrition 0.000 description 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- 229910052782 aluminium Inorganic materials 0.000 description 1
- 229910052802 copper Inorganic materials 0.000 description 1
- 239000010949 copper Substances 0.000 description 1
- 238000004088 simulation Methods 0.000 description 1
Landscapes
- Measurement Of Resistance Or Impedance (AREA)
Abstract
Description
【発明の詳細な説明】
（発明の技術分野）
本発明は複数の試料の抵抗を測定するに適した抵抗測定
装置に関する。DETAILED DESCRIPTION OF THE INVENTION (Technical Field of the Invention) The present invention relates to a resistance measuring device suitable for measuring the resistance of a plurality of samples.
（発明の技術的背景とその問題点）
布設された電線ケーブルの物理量の温度特性を推定する
ために、その模擬試験としてケーブル導体のサンプルを
用いてその温度特性を測定する必要がある。(Technical background of the invention and its problems) In order to estimate the temperature characteristics of the physical quantities of a laid electric wire cable, it is necessary to measure the temperature characteristics using a cable conductor sample as a simulation test.
従来、第１図に示すように条長ｔのケーブル導体Ｃに定
電流直流電源Ｅにより電流を流し、この導体における各
点ＰｉＱｉ （ｉ＝１・・・・・・ダ）間の電圧をスキ
ャナＳを介してディジタルボルトメータＤにより測定し
てその抵抗値を算出してプリンタＰにプリントすると共
に上記導体の温度を熱電対Ｈにより測定して温度記録計
Ｒにより表示した後上記抵抗値を２０℃における抵抗値
に換算していた。Conventionally, as shown in Fig. 1, a constant current DC power source E passes a current through a cable conductor C having a length t, and a scanner measures the voltage between each point PiQi (i=1...da) on this conductor. S, the resistance value is calculated and printed on the printer P, and the temperature of the conductor is measured with the thermocouple H and displayed on the temperature recorder R. It was converted into a resistance value at °C.
しかしながら、このような方法では点ＰｉＱｉ間の抵抗
と導体の温度とが別々の測定装置により測定されていた
ので、その抵抗の温度特性を測定する際、誤差が生じる
という欠点があった。However, in such a method, the resistance between points PiQi and the temperature of the conductor are measured by separate measuring devices, so there is a drawback that an error occurs when measuring the temperature characteristics of the resistance.
また、プリンタと記録計の出力に基いて２０℃の抵抗値
に換算する際、たとえば１人で数時間ないし数日の長時
間を必要とするという欠点もあった。Another disadvantage is that it takes several hours to several days for one person to convert the resistance value at 20° C. based on the output of the printer and recorder.
（発明の目的）
本発明は背景技術における上述の欠点を除去すべくなさ
れたもので、複数の試料電圧を同一の測定装置により正
確に測定して試料の基準温度における抵抗値に短時間に
演算するように抵抗測定装置を提供することを目的とす
る。(Object of the Invention) The present invention has been made to eliminate the above-mentioned drawbacks in the background art, and is to accurately measure multiple sample voltages using the same measuring device and calculate the resistance value of the sample at a reference temperature in a short time. The purpose of the present invention is to provide a resistance measuring device to do the following.
（発明の概要）
本発明の抵抗測定装置に、通電された試料の電圧をスキ
ャナを介して電圧測定装置により測定し、試料温度を温
度測定装置により測定し試料の電圧を抵抗演算装置によ
り演算して、基準温度における試料抵抗を出力して表示
したことを特徴とする。(Summary of the Invention) The resistance measuring device of the present invention measures the voltage of an energized sample with a voltage measuring device via a scanner, measures the sample temperature with a temperature measuring device, and calculates the voltage of the sample with a resistance calculating device. The present invention is characterized in that the sample resistance at the reference temperature is output and displayed.
（発明の実施例） 以下、図面を参照して本発明の詳細な説明する。(Example of the invention) Hereinafter, the present invention will be described in detail with reference to the drawings.
第２図において抵抗測定装置は、標準抵抗Ｒおよび銅や
アルミ等の条長ｔのケーブル導体Ｃにおける各点ｐｔｑ
ｔ （ｉ＝・・・・・・η）等の試料抵抗に通電する電
源装置１と、ケーブル導体の温度を測定する温度測定装
置２と、標準抵抗の電圧ｖ、ｙおよび各点ｐｉＱｉ間の
電圧■、ｖ 等の試料電圧を選択的に出力するスキャナ
３と、このスキャナの出力を測定するディジタルボルト
メータ装置４等の電圧測定装置と、この電圧測定装置の
出力に基いて試料電圧を演算して基準温度（通常は２０
℃）Ｋおける各点ＰｉＱｉの抵抗値を示す信号ｒｉ ｔ
−出力する抵抗演算装置５と、この演算装置の出力を表
示するプリンタ６等の表示器とから構成されている。In Fig. 2, the resistance measuring device measures the standard resistance R and each point ptq on a cable conductor C of length t made of copper, aluminum, etc.
A power supply device 1 that energizes a sample resistor such as t (i=...η), a temperature measuring device 2 that measures the temperature of the cable conductor, and voltages v and y of the standard resistor and between each point piQi. A scanner 3 that selectively outputs sample voltages such as voltages ■ and v, a voltage measurement device such as a digital voltmeter device 4 that measures the output of this scanner, and a sample voltage calculated based on the output of this voltage measurement device. and the reference temperature (usually 20
℃) A signal ri t indicating the resistance value of each point PiQi at K
- Consists of a resistance calculation device 5 that outputs output, and a display such as a printer 6 that displays the output of this calculation device.
電源装置１は、定電流直流電源１ａと、この電源の極性
を極性切換信号Ｅにより切換えて、試料に流す電流Ｉ、
Ｉ’？反転するリードリレー等の極性切換装置１ｂとを
備えている。The power supply device 1 includes a constant current DC power supply 1a, a current I flowing through the sample by switching the polarity of this power supply using a polarity switching signal E, and a current I flowing through the sample.
I'? It is equipped with a polarity switching device 1b such as a reed relay that reverses the polarity.
上記温度測定装置２は、ケーブル導体温度を検出する熱
電対２ａと、０℃との温度差に対する出力電圧に補償す
る半導体温度センサ２ｂとを備えている。The temperature measuring device 2 includes a thermocouple 2a that detects the cable conductor temperature, and a semiconductor temperature sensor 2b that compensates the output voltage for a temperature difference from 0°C.
第３図においである温度差が２点間にあって電流が流れ
と、熱の発生・吸収および熱起電力が生ずるのでこの影
響に基づく測定誤差を除くため、ディジタルボルトメー
タ装置４は、温度測定装置の出力とスキャナを介した標
準抵抗の電圧およびケーブル導体の各点間の電圧を測定
するディジタルボルトメータ本体４ａと、この本体から
の出力電圧ｔ、Ｖ、Ｖｉ （ｉ＝１・・・・・・・・・
ｎ）を記憶するゲイジタルメモリ４ｂと、このメモリに
信号ｔＸＶ。In Fig. 3, when there is a certain temperature difference between two points and current flows, heat is generated and absorbed and thermoelectromotive force is generated.In order to eliminate measurement errors due to this influence, the digital voltmeter device 4 is a temperature measuring device. A digital voltmeter main body 4a that measures the output of the standard resistance via the scanner and the voltage between each point of the cable conductor, and the output voltages t, V, Vi (i=1...) from this main body.・・・・・・
n), and a signal tXV is stored in this memory.
Ｖｔ を記憶させて、極性切換信号ＥＴｈ発生して定電
流直流電源装置に送出する制御器４Ｃと、上記メモリの
出力ｔ１ｖ、ｖｔ および極性切換後の点ＰｉＱｉ間ノ
ｍ圧ｔ’、ｖｔＸｖ′ｉノ相加平均を演算して電圧Ｔ、
Ｕ、Ｕｉ ｋ出力する演算器４ｄとを備えている。A controller 4C that stores the polarity switching signal ETh and sends it to the constant current DC power supply device, and outputs t1v, vt of the memory and nominal pressures t', vtXv'i between the points PiQi after polarity switching. Calculate the arithmetic mean of the voltage T,
It is provided with a computing unit 4d which outputs U, Uik.
第４図において、抵抗演算装置５は、温度測定装置の出
力として、温度測定装置２の出力に対応する信号がディ
ジタルボルトメータ装Ｒ２から送出された温度電圧信号
Ｔを、記憶する温度ディジタルメモリ５ａと、ディジタ
ルボルトメータ装置から送出された標準抵抗Ｒ間の’！
、圧信号Ｕを記憶する標準抵抗ディジタルメモＩＪ ５
ｂと、この標準抵抗メモリおよび温度メモＩＪ ５
ｆｉに信号を記憶させて各点ＰｉＱｉ間の電圧をスキャ
ナを介してディジタルボルトメータ装置から順次出力さ
せる制御器５ｃと、温度メモリの出力Ｔ１標準抵抗メモ
リの出力Ｕ１ケーブル導体抵抗の温度係数α、基準温度
ＴＯおよび抵抗Ｒの抵抗値ｒｆ設定されて、点ｐｉ Ｑ
ｉ間の電圧のディジタルボルトメータ装置による出力［
Ｊｉ を入力して基準温度における抵抗値を示す電圧信
号ｒｉ を演算して出力する演算器５ｄとを備えている
。In FIG. 4, the resistance calculation device 5 has a temperature digital memory 5a that stores a temperature voltage signal T, which is a signal corresponding to the output of the temperature measurement device 2 and is sent from a digital voltmeter device R2, as an output of the temperature measurement device. and the standard resistance R sent out from the digital voltmeter device!'!
, standard resistance digital memo IJ 5 that stores pressure signal U.
b and this standard resistance memory and temperature memo IJ5
a controller 5c that stores a signal in fi and sequentially outputs the voltage between each point PiQi from a digital voltmeter device via a scanner; output T1 of temperature memory; output U1 of standard resistance memory; temperature coefficient α of cable conductor resistance; After setting the reference temperature TO and the resistance value rf of the resistor R, the point pi Q
The output by the digital voltmeter device of the voltage between i [
It is provided with an arithmetic unit 5d which inputs Ji and calculates and outputs a voltage signal ri indicating the resistance value at the reference temperature.
以上のように構成された抵抗測定装置の作動を説明する
。The operation of the resistance measuring device configured as above will be explained.
定電流直流電源１ａによりケーブル導体Ｃと、これに直
列に接続された標準抵抗Ｒとに電流Ｉｖｉ−流して温度
測定装置２の出力電圧ｔ′ヲデイジタルメータボルト本
体４ａにより測定してディジタルメモリ４ｂに記憶した
後、制御器４Ｃから極性切換信号Ｅが送出されて極性切
換装置１ｂによりその極性が切換えられることによって
ケーブル導体Ｃと標準抵抗Ｒとに電流■と逆向きの電流
１′が流れる。A current Ivi- is caused to flow through the cable conductor C and a standard resistor R connected in series thereto by a constant current DC power source 1a, and the output voltage t' of the temperature measuring device 2 is measured by the digital meter voltage body 4a and stored in the digital memory 4b. After the polarity switching signal E is sent from the controller 4C and the polarity is switched by the polarity switching device 1b, a current 1' in the opposite direction to the current 2 flows through the cable conductor C and the standard resistor R.
このときの温度測定装置２の出力ｔ′とメモリ４ｂの出
力ｔとを相加平均演算器４ｄにより相加平均して信号Ｔ
を出力する。また、電流Ｉに対する標準抵抗Ｒ間の電圧
Ｖおよび点ＰｉＱｉ間の電圧ｖｌと、電流Ｉ′に対する
電圧ｖ′、■′ｉ とを同様にディジタルボルトメータ
本体４ａにより測定して、これらの信号をそれぞれ相方
ｎ平均演算器４ｄＫより相加平均し、信号ＵＸＵｉ を
出力する。このようにして得られた信号Ｕｉをスキャナ
３を介してディジタルボルトメータ装置４から順次出力
する際、信号Ｔ、Ｕｔ一温度信号デイジタルメモ’Ｊ
５ ａ ％標準抵抗ディジタルメモリ５ｂに予め記憶さ
せる。At this time, the output t' of the temperature measuring device 2 and the output t of the memory 4b are arithmetic averaged by the arithmetic mean calculator 4d, and a signal T
Output. In addition, the voltage V across the standard resistance R with respect to the current I, the voltage vl between the points PiQi, and the voltages v' and ■'i with respect to the current I' are similarly measured using the digital voltmeter main body 4a, and these signals are measured. Arithmetic averaging is performed by a partner n-averaging calculator 4dK, respectively, and a signal UXUi is output. When the signals Ui obtained in this way are sequentially outputted from the digital voltmeter device 4 via the scanner 3, the signals T, Ut and the temperature signal digital memo 'J
5 a % standard resistance Stored in advance in digital memory 5b.
その後、点ＰｉＱｉ間のディジタルボルトメータ装置４
の出力［Ｊｉを導体の温度係数α０、基準温度ＴＯおよ
び標準抵抗Ｒの抵抗値ｒを設定して演算器５ｄで次式に
より演算して基準温度における抵抗値ｒｉｔ＝出力して
プリンタ６にプリントする。After that, the digital voltmeter device 4 between the points PiQi
The output [Ji is set to the temperature coefficient α0 of the conductor, the reference temperature TO, and the resistance value r of the standard resistor R, and the calculator 5d calculates the resistance value rit=resistance value at the reference temperature by the following formula and prints it on the printer 6. do.
ｒｉ ＝ ｒＵｉ （１＋ａ （Ｔｏ−Ｔ） ）／Ｕこ
の場合、制御器５Ｃは、ｉ≦ｎであれば上式を順次繰返
し演算してプリントし、その後、もしｉ＞ｎとなれば演
算を停止する。ri = rUi (1+a (To-T))/U In this case, the controller 5C sequentially calculates and prints the above formula if i≦n, and then stops the calculation if i>n. do.
なお、以上の説明では試料がケーブル導体と、これに直
列接続された標準抵抗である例につき述べたが、本発明
はこれに限定されるものではなく、試料抵抗がストレン
ゲージ用抵抗であってもよい。In the above explanation, an example has been described in which the sample is a cable conductor and a standard resistor connected in series with the cable conductor, but the present invention is not limited to this. Good too.
この場合、このストレンゲージ用抵抗をケーブル表面に
張付けると共に演算器５ｄを、基準温度におけるケーブ
ルの歪を示す信号を出力させるよう構成すれば、ストレ
ンゲージ用抵抗を測定してケーブルの歪の温度特性上測
定することができる。In this case, if this strain gauge resistor is attached to the surface of the cable and the computing unit 5d is configured to output a signal indicating the strain of the cable at the reference temperature, the strain gauge resistor can be measured and the temperature of the strain of the cable can be measured. It can be measured in terms of characteristics.
また試料の温度を測定する温度測定装置の出力が一個で
ある例につき述べたが、必要に応じて複数個であっても
よい。Further, although an example has been described in which the temperature measuring device that measures the temperature of the sample has one output, it may have a plurality of outputs as necessary.
（発明の効果）
上述の如く、本発明の抵抗測定装置では、複数の試料Ｖ
ｃ′ｌＩ源により通電し、試料温度を温度測定装置によ
り測定し、試料電圧をスキャナを介して電圧測定装置に
より測定し、電圧測定装置の出力に基いて試料電圧を抵
抗演算装置により演算し、基準温度における試料抵抗を
出力して表示器に表示したので、基準温度における試料
の抵抗を同一の測定装置により誤差なく短時間に自動的
に測定することができる。(Effect of the invention) As described above, in the resistance measuring device of the present invention, a plurality of samples V
The sample temperature is measured by a temperature measuring device, the sample voltage is measured by a voltage measuring device via a scanner, and the sample voltage is calculated by a resistance calculating device based on the output of the voltage measuring device. Since the sample resistance at the reference temperature is output and displayed on the display, the resistance of the sample at the reference temperature can be automatically measured in a short time without error using the same measuring device.
第１図は従来の抵抗測定方法の説明図、第２図は本発明
の抵抗測定装置の説明図、第３図は本発明の抵抗測定装
置におけるディジタルボルトメータ装置のブロック図、
第４図は同演算装置のブロック図である。
ＰｉＱｉ・・・・・・・・・ケーブル導体上の点Ｒ・・
・・・・・・・・・・・・・・・・標準抵抗１・・・・
・・・・・・・・・・・・・・電源装置２・・・・・・
・・・・・・・・・・・・温度測定装置３・・・・・・
・・・・・・・・・・・・スキャナ４・・・・・・・・
・・・・・・・・・・ディジタルボルトメータ装置５・
・・・・・・・・・・・・・・・・・抵抗演算装置６・
・・・・・・・・・・・・・・・・・表示器第１図FIG. 1 is an explanatory diagram of a conventional resistance measuring method, FIG. 2 is an explanatory diagram of a resistance measuring device of the present invention, and FIG. 3 is a block diagram of a digital voltmeter device in the resistance measuring device of the present invention.
FIG. 4 is a block diagram of the arithmetic unit. PiQi・・・・・・Point R on the cable conductor・・
・・・・・・・・・・・・・・・Standard resistance 1・・・・
・・・・・・・・・・・・・・・Power supply device 2・・・・・・
......Temperature measuring device 3...
・・・・・・・・・・・・Scanner 4・・・・・・・・・
......Digital volt meter device 5.
・・・・・・・・・・・・・・・Resistance calculation device 6・
・・・・・・・・・・・・・・・Display Figure 1
Claims (1)
を測定する温度測定装置と、前記試料の電圧を選択的に
出力するスキャナと、このスキャナの出力を測定する電
圧測定装置と、この電圧測定装置の出力に基いて前記試
料の電圧を演算して基準温度における試料の抵抗値を出
力する抵抗波Ｒ１装置と、この演算装置の出力を表示す
る表示器とから成ることを特徴とする抵抗測定装置。 ２、試料のうち１つが標準抵抗であり、その他が直列に
接続された試料抵抗であることを特徴とする特許請求の
範囲第１項に記載の抵抗測定装置。 ３、温度測定装置が、試料源［ｋ検出する熱電対と、０
℃との温度差に対する出力電圧に補償する半導体温度セ
ンサとを備えていることを特徴とする特許請求の範囲第
１項または第２項に記載の抵抗測定装置。 ４、ディジタルボルトメータ装置は、試料電圧を測定す
るディジタルボルトメータ本体と、この本体からの出力
電圧を記憶するメモリと、このメモリに信号を記憶させ
て電源装置に極性切換信号を送出する制御器と、前記メ
モリの出力および極性切換後の試料の電圧の相加平均を
演算する演算器とを備えていることを特徴とする特許請
求の範囲第１項ないし第３項に記載の抵抗測定装置。 ５、抵抗演算装置が、温度測定装置の出力を電圧測定装
置から送出された記憶する温度メモリと、電圧測定装置
から送られた標準抵抗の電圧を記憶する標準抵抗メモリ
と、この標準抵抗メモリおよび温度メモリに信号を記憶
させて標準抵抗および試料抵抗の電圧をスキャナを介し
て電圧測定装置から出力さぜる制御器と、温度メモリの
出力、標準抵抗メモリの出力、試料抵抗の温度係数、基
準温度および標準抵抗の抵抗値を設定して電圧測定装置
を介して試料抵抗の電圧を入力して基準温度における抵
抗値を演算して出力する演算器とを備えていることを特
徴とする特許請求の範囲第２項ないし距４項に記載の抵
抗測定装置。[Claims] 1. A power supply device that energizes a plurality of samples, a temperature measuring device that measures the temperature of the samples, a scanner that selectively outputs the voltage of the samples, and a device that measures the output of the scanner. A voltage measurement device, a resistance wave R1 device that calculates the voltage of the sample based on the output of the voltage measurement device and outputs the resistance value of the sample at a reference temperature, and a display that displays the output of the calculation device. A resistance measuring device characterized by: 2. The resistance measuring device according to claim 1, wherein one of the samples is a standard resistance, and the others are sample resistances connected in series. 3. The temperature measuring device connects the sample source [k to detect the thermocouple and 0
3. The resistance measuring device according to claim 1, further comprising a semiconductor temperature sensor that compensates the output voltage for a temperature difference between the resistance measuring device and the resistance measuring device. 4. The digital voltmeter device includes a digital voltmeter body that measures the sample voltage, a memory that stores the output voltage from this body, and a controller that stores the signal in this memory and sends a polarity switching signal to the power supply device. and an arithmetic unit that calculates the arithmetic mean of the output of the memory and the voltage of the sample after polarity switching. . 5. The resistance calculation device includes a temperature memory that stores the output of the temperature measurement device sent from the voltage measurement device, a standard resistance memory that stores the voltage of the standard resistance sent from the voltage measurement device, this standard resistance memory, and A controller that stores signals in the temperature memory and outputs the voltages of the standard resistance and sample resistance from the voltage measuring device via the scanner, the output of the temperature memory, the output of the standard resistance memory, the temperature coefficient of the sample resistance, and the standard. A patent claim characterized by comprising: a computing unit that sets the temperature and the resistance value of the standard resistor, inputs the voltage of the sample resistor via a voltage measuring device, and computes and outputs the resistance value at the reference temperature. The resistance measuring device according to range 2 to distance 4.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP59078132A JPS60220872A (en) | 1984-04-17 | 1984-04-17 | Instrument for measuring resistance |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP59078132A JPS60220872A (en) | 1984-04-17 | 1984-04-17 | Instrument for measuring resistance |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS60220872A true JPS60220872A (en) | 1985-11-05 |
Family
ID=13653350
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP59078132A Pending JPS60220872A (en) | 1984-04-17 | 1984-04-17 | Instrument for measuring resistance |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS60220872A (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102680789A (en) * | 2010-10-25 | 2012-09-19 | 宁波大学 | Method for measuring static resistance of material |
| CN102680790A (en) * | 2010-10-25 | 2012-09-19 | 宁波大学 | Method for measuring dynamic resistance of material |
| CN103163380A (en) * | 2013-03-27 | 2013-06-19 | 西南交通大学 | Micro-ohm resistance measurement system based on LabVIEW developing platform |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS4737975A (en) * | 1971-04-14 | 1972-12-02 | ||
| JPS531380B2 (en) * | 1973-05-23 | 1978-01-18 |
-
1984
- 1984-04-17 JP JP59078132A patent/JPS60220872A/en active Pending
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS4737975A (en) * | 1971-04-14 | 1972-12-02 | ||
| JPS531380B2 (en) * | 1973-05-23 | 1978-01-18 |
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102680789A (en) * | 2010-10-25 | 2012-09-19 | 宁波大学 | Method for measuring static resistance of material |
| CN102680790A (en) * | 2010-10-25 | 2012-09-19 | 宁波大学 | Method for measuring dynamic resistance of material |
| CN102680789B (en) * | 2010-10-25 | 2014-06-25 | 宁波大学 | Method for measuring static resistance of material |
| CN102680790B (en) * | 2010-10-25 | 2014-06-25 | 宁波大学 | Method for measuring dynamic resistance of material |
| CN103163380A (en) * | 2013-03-27 | 2013-06-19 | 西南交通大学 | Micro-ohm resistance measurement system based on LabVIEW developing platform |
| CN103163380B (en) * | 2013-03-27 | 2015-01-28 | 西南交通大学 | Micro-ohm resistance measurement system based on LabVIEW developing platform |
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