CN201488932U - Multi-mode AFM (atomic force microscope) - Google Patents
Multi-mode AFM (atomic force microscope) Download PDFInfo
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- CN201488932U CN201488932U CN2009201755910U CN200920175591U CN201488932U CN 201488932 U CN201488932 U CN 201488932U CN 2009201755910 U CN2009201755910 U CN 2009201755910U CN 200920175591 U CN200920175591 U CN 200920175591U CN 201488932 U CN201488932 U CN 201488932U
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Abstract
The utility model relates to a multi-mode AFM (atomic force microscope) which comprises an AFM host machine, an electronic control system and a computer system. The AFM host machine is connected with the computer system by the electronic control system and comprises an AFM probe head and an AFM base, wherein a probe module is arranged at the middle lower part of one side of the AFM probe head near the rim position, the AFM base which is arranged right below the AFM probe head comprises an upper base and a lower base, the upper base is connected with the lower base by three cylindrical components, a scanner is arranged at the middle part of the upper base, precision two-dimensional adjusting devices are symmetrically arranged below the scanner, and rough-adjustment driving devices which penetrate through the upper base are symmetrically arranged at the two sides of the scanner. The multi-mode AFM has the following benefits: the operation is easy; the functions of the multi-mode AFM exceed the technology of the present microscope; therefore, the multi-mode AFM is one of the most important tools at present for doing research on nanotechnology and making material analysis.
Description
Technical field
The utility model relates to a kind of multiple-pattern atomic force microscope.
Background technology
Breadboard Gerd Binning of nineteen eighty-two Zurich, Switzerland and Heinrich Rohrer develop first scanning tunnel microscope (Scanning Tunneling Microscope in the world, be called for short STM), STM makes can observe single atom in real time at the ordered state of material surface and the physico-chemical property relevant with the surface electronic behavior the human first time, at Surface Science, material science, significant meaning and application prospects are arranged in the research in fields such as life science, be known as one of the eighties world ten big technological achievements by international scientific circle, be the inventors that the commend STM outstanding contribution to scientific research, guest Buddhist nun in 1986 and Luo Leier are awarded Nobel Prize in physics.The principle of work of scanning tunnel microscope is based on the tunnel effect in the quantum mechanics, and the ultimate principle of AFM and STM are similar, in AFM, raster scanning is made to sample surfaces in tip on the flexible cantilever of power sensitivity, most advanced and sophisticated interaction force with sample surfaces makes cantilever produce small bending, detect the signal of this bending and as feedback, constant by confining force can obtain the feature image of the sample surfaces under the constant force state.
So-called atomic force microscope is exactly to utilize interatomic acting force to reach the microscope of observing purpose.The invention of atomic force microscope, opened up human brand-new research field, AFM both can be used for conducting sample, also can be used for non-conductive sample, thereby with respect to STM, greatly expanded range of application, particularly be applied to biological sample, can carry out active dynamic studies, almost need not to carry out specimen preparation.By the various microscopes that it derives out, make people can observe the structure of matter of Nano grade even atomic level intuitively, thereby promoted human development in an all-round way in nanosecond science and technology.
The utility model content
The purpose of this utility model provides a kind of multiple-pattern atomic force microscope, makes people can observe the structure of matter of Nano grade even atomic level intuitively, almost need not to carry out specimen preparation, can carry out active dynamic studies.
The purpose of this utility model is to be achieved through the following technical solutions:
A kind of multiple-pattern atomic force microscope, comprise the AFM main frame, electronic control system and computer system, described AFM main frame connects computer system by electronic control system, described AFM main frame comprises AFM end of probe and AFM pedestal, wherein the place of keeping to the side, AFM end of probe one side middle and lower part is provided with probe module, be provided with the AFM pedestal under the AFM end of probe, the AFM pedestal comprises top base and bottom base, top base links to each other by three cylindrical parts with bottom base, described top base middle part is provided with scanner, the scanner below is arranged with the precise 2-D regulating device, the scanner symmetria bilateralis is provided with the coarse adjustment drive unit, and described coarse adjustment drive unit passes described top base.
The beneficial effects of the utility model are: adopt modular design, change the different probe module according to different needs, have atom and nano level analysis ability, its processing ease and easy, can under conditions such as atmosphere, vacuum, liquid phase, carry out object analysis, be one of present most important instrument of studying nanosecond science and technology and material analysis.It is a relation of utilizing probe and sample room atom acting force, learn the geometric configuration of sample surfaces, sample can be conductor or nonconductor, can carry out sample electrically, magnetic, the little processing of nanometer and bioactive molecule property analysis etc., it uses the non-measurement that is confined to the nanoscale surface topography, the rerum natura (light, power, electricity, magnetic) that more widely is applied to explore microcosmic under the nanoscale measures, function is a kind of indispensable important analysis instrument in the new science from generation to generation considerably beyond microscopy in the past.
Description of drawings
Fig. 1 is the microscopical structural representation of a kind of multiple-pattern atomic force described in the utility model.
Among the figure:
1, AFM main frame; 11, AFM end of probe; 12, AFM pedestal; 13, probe module; 14, top base; 15, bottom base; 16, scanner; 17, precise 2-D regulating device; 18, motion device is driven in coarse adjustment; 2, electronic control system; 3, computer system.
Embodiment
As shown in Figure 1, a kind of multiple-pattern atomic force microscope, comprise AFM main frame 1, electronic control system 2 and computer system 3, described AFM main frame 1 connects computer system 3 by electronic control system 2, described AFM main frame 1 comprises AFM end of probe 11 and AFM pedestal 12, wherein the place of keeping to the side, AFM end of probe 11 1 side middle and lower part is provided with probe module 13, be provided with AFM pedestal 12 under the AFM end of probe 11, AFM pedestal 12 comprises top base 14 and bottom base 15, top base 14 links to each other by three cylindrical parts with bottom base 15, described top base 14 middle parts are provided with scanner 16, scanner 16 belows are arranged with precise 2-D regulating device 17, scanner 16 symmetria bilateralis are provided with coarse adjustment drive unit 18, described coarse adjustment drive unit 18 passes described top base 14, described electronic control system 2 comprises the various preset functions of realizing scanner 16 and the feedback control system of keeping scanning mode, and described computer system 3 comprises the operation to the software of the man-machine interaction of computing machine, instruction makes the end of probe system realize its function by the electronics control system, finish the processing of real-time process, obtaining and the output of the analyzing and processing of data of data.
The microscopical ultimate principle of the described a kind of multiple-pattern atomic force of the utility model embodiment is: one is fixed tetchy micro-cantilever one end of faint power, the other end has a small needle point, needle point contacts gently with sample surfaces, owing to have atomic weak repulsive force between most advanced and sophisticated atom of needle point and sample surfaces atom, by control the constant of this power when scanning, the micro-cantilever that has needle point will be corresponding to the equipotential surface of acting force between needle point and sample surfaces atom in the surface direction undulatory motion perpendicular to sample.Utilize optical detection or tunnel current detection method, can record the change in location of micro-cantilever, thereby can obtain the information of sample surfaces pattern corresponding to the scanning each point.Atomic force microscope (AFM) has two kinds of patterns: contact and contactless, and respectively based on repulsive interaction and sucking action.This uses the modular design of novel employing, except above two kinds of patterns, can increase STM probe module, liquid cell module and magnetic force module etc.
During operation, described AFM main frame 1 is controlled it by computer system 3, requirement according to scan operation software on the computer system 3, export different Control of Voltage scanners 16, thereby drive the sample motion scan, needle point and sample room can produce acting force, enter electronic control system 2 through the signal supervisory instrument in the AFM end of probe 11, and electronic control system 2 is converted into signal image and sends to computer system 3.
Claims (1)
1. multiple-pattern atomic force microscope, comprise AFM main frame (1), electronic control system (2) and computer system (3), described AFM main frame (1) connects computer system (3) by electronic control system (2), it is characterized in that: described AFM main frame (1) comprises AFM end of probe (11) and AFM pedestal (12), wherein the place of keeping to the side, AFM end of probe (11) one side middle and lower part is provided with probe module (13), be provided with AFM pedestal (12) under the AFM end of probe (11), AFM pedestal (12) comprises top base (14) and bottom base (15), top base (14) links to each other by three cylindrical parts with bottom base (15), described top base (14) middle part is provided with scanner (16), scanner (16) below is arranged with precise 2-D regulating device (17), scanner (16) symmetria bilateralis is provided with coarse adjustment drive unit (18), and described coarse adjustment drive unit (18) passes described top base (14).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2009201755910U CN201488932U (en) | 2009-08-24 | 2009-08-24 | Multi-mode AFM (atomic force microscope) |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2009201755910U CN201488932U (en) | 2009-08-24 | 2009-08-24 | Multi-mode AFM (atomic force microscope) |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN201488932U true CN201488932U (en) | 2010-05-26 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN2009201755910U Expired - Fee Related CN201488932U (en) | 2009-08-24 | 2009-08-24 | Multi-mode AFM (atomic force microscope) |
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| CN (1) | CN201488932U (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105510637A (en) * | 2014-09-24 | 2016-04-20 | 中国科学院宁波材料技术与工程研究所 | Micro-nano thermoelectric in-situ detection device and method based on scanning probe microscope |
| TWI634331B (en) * | 2014-06-25 | 2018-09-01 | 美商Ｄｃｇ系統公司 | System for nanoprobing of electronic devices and nanoprobe thereof |
| CN112540194A (en) * | 2020-12-04 | 2021-03-23 | 南京信息工程大学 | Modular quick-release combined scanning probe microscope |
-
2009
- 2009-08-24 CN CN2009201755910U patent/CN201488932U/en not_active Expired - Fee Related
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI634331B (en) * | 2014-06-25 | 2018-09-01 | 美商Ｄｃｇ系統公司 | System for nanoprobing of electronic devices and nanoprobe thereof |
| CN105510637A (en) * | 2014-09-24 | 2016-04-20 | 中国科学院宁波材料技术与工程研究所 | Micro-nano thermoelectric in-situ detection device and method based on scanning probe microscope |
| CN105510637B (en) * | 2014-09-24 | 2018-10-19 | 中国科学院宁波材料技术与工程研究所 | Micro-/ nano thermoelectricity in-situ detector based on scanning probe microscopy and detection method |
| CN112540194A (en) * | 2020-12-04 | 2021-03-23 | 南京信息工程大学 | Modular quick-release combined scanning probe microscope |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| C17 | Cessation of patent right | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20100526 Termination date: 20130824 |