CN201340394Y - Detecting system of solar energy ultrawhite patterned glass - Google Patents
Detecting system of solar energy ultrawhite patterned glass Download PDFInfo
- Publication number
- CN201340394Y CN201340394Y CNU2009200689381U CN200920068938U CN201340394Y CN 201340394 Y CN201340394 Y CN 201340394Y CN U2009200689381 U CNU2009200689381 U CN U2009200689381U CN 200920068938 U CN200920068938 U CN 200920068938U CN 201340394 Y CN201340394 Y CN 201340394Y
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- solar energy
- patterned glass
- detecting
- energy ultrawhite
- ultrawhite
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Abstract
The utility model relates to a base plate which is matched with a crystalline silicon battery and an amorphous silicon battery in a solar energy photovoltaic battery component, belonging to the detecting technical field of solar energy ultrawhite patterned glass, and in particular relates to a detecting system of solar energy ultrawhite patterned glass; the detecting system comprises an LED/BAD light source, a brightness detecting channel, a darkness detecting channel and cameras arranged in the brightness detecting channel and the darkness detecting channel; the cameras are connected to a graphic processing resolution machine by an image collector. The detecting system mainly solves the technical problems that the quality of the solar energy ultrawhite patterned glass can not obtain complete data and graphics by adopting a CCD imaging and a microscope in the prior art, so as to lead the solar energy ultrawhite patterned glass to achieve the purposes that the critical defects of the base plate of a solar energy component can not be timely controlled and found and are overcome in the production process of the solar energy ultrawhite patterned glass.
Description
Technical field
The utility model relate in the solar photovoltaic battery component use crystal silicon cell and amorphous silicon battery lead plate the detection system in detection technique field, particularly a kind of solar energy ultra-white configurated glass of supporting substrate----solar energy ultra-white configurated glass.
Background technology
Along with sun power utilizes cause and development of technology, because the substrate----solar energy ultra-white configurated glass of the crystalline silicon that photovoltaic electrification component uses, in molten, manufacture process abnormal conditions such as various bubbles, calculus, scuffing and nickel sulfide taking place very easily takes place, generally all adopt under normal conditions hand inspection, supervision, discovery, separation, way.But hand inspection is to be found for little existence of particle down, and in a single day these hidden danger flow in the product, will cause blast under certain environmental baseline, cause photovoltaic electrification component is produced fatal destruction.Though the economic worth of substrate solar energy ultra-white configurated glass is not very high,, restricting the development that sun power utilizes market to a great extent because crystalline silicon yields poorly.Therefore cost an arm and a leg, the serious economy loss that electrification component causes is threatening the existence of many R﹠D institutions.Thereby the solar energy ultra-white configurated glass quality is had higher requirement.How manufacturing enterprise in time correctly checks these defectives and to obtain getting rid of is the major subjects that solar energy ultra-white configurated glass manufacturing enterprise faces.
The CCD imaging and the microscopic examination of Cai Yonging in the past, the quality problems that energy ultrawhite figured glass is existed can not obtain complete data and figure.Usually the sort check method of checking sheet glass is also inapplicable.Because solar energy ultra-white configurated glass is characterized in that light transmission is more outstanding, when there was exotic matter in pattern glass inside, different types of material had different optical properties.
The utility model content
The purpose of this utility model is to provide a kind of detection system of solar energy ultra-white configurated glass, mainly solve existing CCD imaging and the microscopic examination of adopting, the quality problems that energy ultrawhite figured glass is existed can not obtain the complete data and the technical matters of figure, and it can make solar energy ultra-white configurated glass reach timely control in process of production and find that there is critical defect in the solar components substrate and obtains getting rid of purpose.
For addressing the above problem, the utility model is achieved in that
A kind of detection system of solar energy ultra-white configurated glass is characterized in that: it comprises LED/BAD light source, bright inspection passage, secretly examines passage and be arranged on bright inspection passage, secretly examine camera in the passage; This camera is connected to graphics process by image acquisition device and differentiates machine.
The detection system of described solar energy ultra-white configurated glass is characterized in that: described graphics process resolution machine connects display screen.
By technique scheme, the beneficial effects of the utility model are:
The relatively more outstanding characteristics of its light transmission of solar energy ultra-white configurated glass of using effectively of the present utility model, different types of material has different optical properties, adopts different spectrum channels to check that with testing different unusual defectives be a kind of desirable scientific approach.
Description of drawings
Fig. 1 is a system architecture synoptic diagram of the present utility model.
Among the figure:
The 1--LED/BAD light source;
The bright inspection passage of 2--;
3--secretly examines passage;
4,5--camera;
The 6--image acquisition device;
The 7--graphics process is differentiated machine;
The 8--display screen.
Embodiment
See also Fig. 1, the utility model discloses a kind of detection system of solar energy ultra-white configurated glass.As shown in the figure: it comprises LED/BAD light source 1, bright inspection passage 2, secretly examines passage 3 and be arranged on bright inspection passage 2, secretly examine camera 4,5 in the passage 3; This camera 4,5 is connected to graphics process by image acquisition device 6 and differentiates machine 7.Described graphics process is differentiated machine 7 and is connected display screen 8.
Principle of the present utility model is: under bright light source diffuse background condition, just can produce the blackspot defective when there is the opaque article of calculus in solar energy ultra-white configurated glass itself.Opposite this method just can not be tested the situation of transparent or translucent defective, and with regard under the condition, under black background, transparent or translucent defective just forms bright spot to just necessary employing half-light source diffuse background immediately to transparent or translucent defective.Satisfy and produce the actual laterally requirement of product, adopt LED granule intense light source, be organized into the selection of different angles.And bright half-light source is parallel, finds the corresponding target of vision area easily, and it is the gordian technique that detects white foreign matter.
During use, LED/BAD light source 1 respectively at bright inspection passage 2, secretly examine 3 pairs of products of passage and detect, the situation of detection captures graphics process by camera 4,5 and image acquisition device 6 and differentiates in the machine 7 and handle and analyze.
Being preferred embodiment of the present utility model only in sum, is not to be used for limiting practical range of the present utility model.Be that all equivalences of doing according to the content of the utility model claim change and modification, all should be technology category of the present utility model.
Claims (2)
1, a kind of detection system of solar energy ultra-white configurated glass is characterized in that: it comprises LED/BAD light source, bright inspection passage, secretly examines passage and be arranged on bright inspection passage, secretly examine camera in the passage; This camera is connected to graphics process by image acquisition device and differentiates machine.
2, the detection system of solar energy ultra-white configurated glass according to claim 1 is characterized in that: described graphics process resolution machine connects display screen.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CNU2009200689381U CN201340394Y (en) | 2009-03-17 | 2009-03-17 | Detecting system of solar energy ultrawhite patterned glass |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CNU2009200689381U CN201340394Y (en) | 2009-03-17 | 2009-03-17 | Detecting system of solar energy ultrawhite patterned glass |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN201340394Y true CN201340394Y (en) | 2009-11-04 |
Family
ID=41235937
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CNU2009200689381U Expired - Lifetime CN201340394Y (en) | 2009-03-17 | 2009-03-17 | Detecting system of solar energy ultrawhite patterned glass |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN201340394Y (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102590158A (en) * | 2012-02-23 | 2012-07-18 | 常州天合光能有限公司 | Method for quickly identifying solar-grade UMG (Upgraded Metallurgical Grade) silicon wafer |
| CN102709206A (en) * | 2012-01-12 | 2012-10-03 | 上海华力微电子有限公司 | Automatic defect scanning and casual inspecting method and automatic defect scanning and casual inspecting device for controlling abnormality during silicon wafer production |
| CN115774029A (en) * | 2023-02-10 | 2023-03-10 | 唐山飞远科技有限公司 | Quality detector for ultra-white embossed solar original glass |
-
2009
- 2009-03-17 CN CNU2009200689381U patent/CN201340394Y/en not_active Expired - Lifetime
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102709206A (en) * | 2012-01-12 | 2012-10-03 | 上海华力微电子有限公司 | Automatic defect scanning and casual inspecting method and automatic defect scanning and casual inspecting device for controlling abnormality during silicon wafer production |
| CN102590158A (en) * | 2012-02-23 | 2012-07-18 | 常州天合光能有限公司 | Method for quickly identifying solar-grade UMG (Upgraded Metallurgical Grade) silicon wafer |
| CN115774029A (en) * | 2023-02-10 | 2023-03-10 | 唐山飞远科技有限公司 | Quality detector for ultra-white embossed solar original glass |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| EE01 | Entry into force of recordation of patent licensing contract |
Assignee: Zhejiang Jiafu Glass Co.,Ltd. Assignor: Shanghai Follett Glass Co., Ltd.|Ruan Hongliang|Xu Shanfan Contract record no.: 2010330000403 Denomination of utility model: Detecting system of solar energy ultrawhite patterned glass Granted publication date: 20091104 License type: Exclusive License Record date: 20100402 |
|
| ASS | Succession or assignment of patent right |
Free format text: FORMER OWNER: RUAN HONGLIANG XU SHANFAN Effective date: 20110830 |
|
| C41 | Transfer of patent application or patent right or utility model | ||
| TR01 | Transfer of patent right |
Effective date of registration: 20110830 Address after: 201802 No. 59 Ting Road, Anting Dazhong Industrial Park, Shanghai, Jiading District Patentee after: Shanghai Flat Glass Co., Ltd. Address before: 201802 No. 59 Ting Road, Anting Dazhong Industrial Park, Shanghai, Jiading District Co-patentee before: Ruan Hongliang Patentee before: Shanghai Flat Glass Co., Ltd. Co-patentee before: Xu Shanfan |
|
| CX01 | Expiry of patent term | ||
| CX01 | Expiry of patent term |
Granted publication date: 20091104 |