CN201311804Y - Inductance-coupling coil and inductance-coupling plasm device - Google Patents

Inductance-coupling coil and inductance-coupling plasm device Download PDF

Info

Publication number
CN201311804Y
CN201311804Y CNU2008200420794U CN200820042079U CN201311804Y CN 201311804 Y CN201311804 Y CN 201311804Y CN U2008200420794 U CNU2008200420794 U CN U2008200420794U CN 200820042079 U CN200820042079 U CN 200820042079U CN 201311804 Y CN201311804 Y CN 201311804Y
Authority
CN
China
Prior art keywords
inductance
coil
planar gate
gate shape
coupled
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
CNU2008200420794U
Other languages
Chinese (zh)
Inventor
刘宏
刘晓晗
袁洁静
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
SUZHOU HANSHEN MICROELECTRONICS CO Ltd
Original Assignee
SUZHOU HANSHEN MICROELECTRONICS CO Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by SUZHOU HANSHEN MICROELECTRONICS CO Ltd filed Critical SUZHOU HANSHEN MICROELECTRONICS CO Ltd
Priority to CNU2008200420794U priority Critical patent/CN201311804Y/en
Application granted granted Critical
Publication of CN201311804Y publication Critical patent/CN201311804Y/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Images

Landscapes

  • Plasma Technology (AREA)

Abstract

The utility model relates to the field of semiconductor manufacture equipment, in particular to an inductance-coupling plasm (ICP) device and an inductance-coupling coil applied to the inductance-coupling plasm device. The inductance-coupling plasm device comprises a reaction chamber (10), a worktable (11), the inductance-coupling coil, an inductance radio frequency matcher (12) and an inductance radio frequency power supply (13). The inductance-coupling plasm device is characterized in that the inductance-coupling coil is arranged in the reaction chamber (10) and positioned above the worktable (11); the inductance-coupling coil is formed by two groups of same plane grid-shaped coils (1) which are connected in parallel and symmetrically arranged, wherein each group of plane grid-shaped coil (1) is formed by folding a copper tube (2) into a grid-shaped structure on a plane according to a U-shaped wave path; the copper tube (2) is internally provided with an inner porcelain insulating bushing (5); the inner cavity of the inner porcelain insulating bushing (5) is used as a cooling water channel; and an outer porcelain insulating bushing (6) is arranged outside the copper tube (2). The utility model has well distributed magnetic field, high efficiency and less damage to the surface of a substrate, and is suitable for semiconductor manufacture processes such as large-area film deposition, etching, surface treatment, and the like.

Description

Inductance-coupled coil and inductance coupled plasma device
Technical field
The utility model relates to the semiconductor manufacturing facility field, particularly a kind of inductance coupled plasma device (ICP) and the radio frequency inductive coupling coil that is used for this device.Described inductance coupled plasma device belongs to the high density perception coupled plasma device that the very high frequency(VHF) power source drives, and can be applicable to thin film deposition, etching and surface treatment technologies such as (as cleanings) in the semiconductor manufacturing.
Background technology
In semiconductor fabrication process, plasma reaction device is a kind of important process equipment, is widely used in technologies such as thin film deposition, etching and surface treatment.Plasma reaction device generally is made up of reative cell, workbench, induction coupling element, driving power, air supply system and extract system, wherein, workbench is positioned at reative cell and is used to install processed substrate, induction coupling element and driving power are responsible for providing the electromagnetic field of activated plasma in reative cell, air supply system is responsible for providing reacting gas to reative cell, and extract system is responsible for outside exhaust and control reative cell air pressure.Plasma reaction device is divided into two kinds in capacitively coupled plasma device and inductive coupled plasma device because of induction coupling element difference.The capacitively coupled plasma device adopts plate capacitive coupling element at present, and driving frequency is 13.56MHz, provides to reative cell to excite electric field to make reacting gas produce ionization formation plasma.This plasma reaction device is because of the restriction of capacitive coupling element, and the plasma density of generation is lower, about 10 9/ cm 3Magnitude, though there are some advantages in it aspect amplification of plasma area, the capacitively coupled plasma current potential higher (>20V), substrate surface is subjected to the bombardment of active ion easily, therefore, materials processing and surface modification difficult quality are guaranteed.The coupling element of inductive coupled plasma device (being inductance coupled plasma device ICP) adopts inductance-coupled coil, provides in radio-frequency power supply driving downhill reaction chamber to excite magnetic field to make reacting gas produce ionization formation plasma.Inductance-coupled coil is the technological core of inductive coupled plasma device, and its design is directly connected to the performance and the effect of plasma reaction device.Early stage inductance-coupled coil is the snail structure, this inductance-coupled coil is stronger in the magnetic field that reative cell central portion branch excites, and the magnetic field that the edge part branch excites a little less than, so the plasma density of reative cell middle body is higher, the marginal portion plasma density is lower.Particularly the processing dimension of substrate is increased to 400mm from 100mm, after the also corresponding increase of the volume of reative cell, there is very big azimuthal asymmetry in the plasma that the planar spiral inductor coupling coil excites, can only rely on diffusion to remedy the low density zone of environmental plasma.Such result causes the speed and the thickness of substrate membrane deposition or etching inhomogeneous, influences semi-conductive crudy and stability.
In order to obtain plasma density distribution relatively uniformly in reative cell, Chinese patent CN1812010A, CN1825505A, CN1925074A, CN101131893A, CN101136279A etc. all disclose the technical scheme about inductance-coupled coil and inductance coupled plasma device thereof.Taking a broad view of these schemes inventor is core with the plasma density distribution uniformity, has designed the inductance-coupled coil of a series of difformities and structure from different perspectives, and its characteristics cut both ways.
Summary of the invention
The purpose of this utility model provides a kind of Distribution of Magnetic Field good uniformity, efficient height, littler to the substrate surface damage, and is suitable for the inductance-coupled coil and the inductance coupled plasma device of large tracts of land processing.
For achieving the above object, the technical scheme that the utility model inductance-coupled coil adopts is: this inductance-coupled coil is made up of the planar gate shape coil of two groups of same structures, shape and size, wherein, every group of planar gate shape coil folds into bar structure by " U " shape wave path in the plane by a copper pipe, the bending part of bar structure is semicircle or arc transition, and the straight section of bar structure is parallel to each other; Be provided with the ceramic insulation inner sleeve in the copper pipe, the inner chamber of ceramic insulation inner sleeve is as cooling-water duct, and copper pipe is provided with the ceramic insulation outer tube outward;
Two groups of planar gate shape coils are that benchmark is symmetrically arranged in same plane with the axis that is parallel to described straight section, wherein, one end of one group of planar gate shape coil with after an end of another group planar gate shape coil symmetry is in parallel as first end of inductance-coupled coil, and the other end of one group of planar gate shape coil with another organize the other end of planar gate shape coil symmetry in parallel after as second end of inductance-coupled coil.
Related content in the technique scheme is explained as follows:
1, in the such scheme, described " size " is meant planar gate shape coil design and manufacturing dimension, such as inner and outer diameter, the thickness of copper pipe, the length of straight section, the radius of bending part semicircle or circular arc, spacing between the straight section or the like.
2, in the such scheme, " in the plane " in described " by a copper pipe in the plane ... " is three-dimensional relatively, mean copper pipe and on a plane, fold into bar structure, and be planarized structure.
3, in the such scheme, what described " bending part of bar structure " referred to is exactly " U " shape bend.And described " straight section of bar structure " refers to U " the straight portion of shape both sides.
4, in the such scheme,, can on the copper pipe outer wall of every group of planar gate shape coil, be provided with silver coating in order to improve the electrical property of copper pipe outer surface.
5, in the such scheme, the copper pipe external diameter of described planar gate shape coil is 0.8 centimetre~1.2 centimetres, and the copper pipe wall thickness is 0.08~0.12 centimetre, and described bar structure grid centre-to-centre spacing is 5 centimetres~12 centimetres, and grid straight section length is 80 centimetres~100 centimetres.
6, in the such scheme, the wall thickness of described ceramic insulation inner sleeve and ceramic insulation outer tube is 0.4 millimeter~0.6 millimeter.
For achieving the above object, the technical scheme that the utility model inductance coupled plasma device adopts is: this device comprises reative cell, workbench, inductance-coupled coil, inductive radio frequency adaptation and inductive radio frequency power supply, described inductance-coupled coil is located in the reative cell, and is positioned at the workbench top; Described inductance-coupled coil is made up of the planar gate shape coil of two groups of same structures, shape and size, wherein, every group of planar gate shape coil folds into bar structure by " U " shape wave path in the plane by a copper pipe, the bending part of bar structure is semicircle or arc transition, and the straight section of bar structure is parallel to each other; Be provided with the ceramic insulation inner sleeve in the copper pipe, the inner chamber of ceramic insulation inner sleeve is as cooling-water duct, and copper pipe is provided with the ceramic insulation outer tube outward;
Two groups of planar gate shape coils are that benchmark is symmetrically arranged in same plane with the axis that is parallel to described straight section, wherein, one end of one group of planar gate shape coil with after an end of another group planar gate shape coil symmetry is in parallel as the radio-frequency (RF) output end of the first termination inductive radio frequency adaptation of inductance-coupled coil, and the other end of one group of planar gate shape coil with after the other end of another group planar gate shape coil symmetry is in parallel as the earth terminal of the second termination inductive radio frequency adaptation of inductance-coupled coil, the inductive radio frequency adaptation is connected with the inductive radio frequency power supply.
Related content in the technique scheme is explained as follows:
1, in the such scheme, described " first end of inductance-coupled coil " is power end [axial coil feed (powered)].Described " second end of inductance-coupled coil " is earth terminal [axial coil feed (terminated)].
2, in the such scheme, plasma also is set on the described workbench receives electrode of substrate, the counterpart substrate electrode is provided with substrate radio frequency adaptation and substrate bias power supply, and electrode of substrate is connected with the radio-frequency (RF) output end of substrate radio frequency adaptation, and the substrate radio frequency adaptation is connected with the substrate bias power supply.
3, in the such scheme,, reacting gas also is equipped with air supply system for being provided to reative cell.Chamber waste gas will be discharged and control reative cell air pressure also is equipped with extract system in order to react.These all are existing known technologies.
4, above explanatory content to the inductance-coupled coil technical scheme is equally applicable to inductance coupled plasma device is laid down a definition.Here no longer be repeated in this description.
The utility model principle and effect are: replace conventional spiral coil with the grid shape coil in parallel that can produce the Uniform Electromagnetic Field distribution, use the very high frequency(VHF) driving frequency power source of 27.12MHz to load on grid shape coil power end in parallel, and on the electrode of substrate of workbench, being aided with the bias supply of 13.56MHz, formed plasma density is greater than 7 * 10 11/ cm 3, be higher than conventional inductively coupled plasma; Plasma uniformity is good, and the fluctuation of plasma density is less than 5% in the scope of 400mm * 400mm; The plasma potential that produces is less than 10V, and energetic ion is little to the bombardment damage of substrate; The continual and steady discharge time of inductively coupled plasma was greater than 720 hours.Therefore, prepare the growth rate of amorphous silicon, Nano thin film greater than 20nm/min with the utility model inductance coupled plasma device, the growth rate of preparation polysilicon, carborundum films is greater than 10nm/min, and interior (8in wafer) the thickness evenness deviation of the sheet of film is less than 5%, surface modification is abundant, the power coupling efficiency height, energy consumption is low.
Description of drawings
Accompanying drawing 1 is existing helical coil inductance coupled plasma device structural representation.
Accompanying drawing 2 is the utility model inductance coupled plasma device structural representation.
Accompanying drawing 3 is the utility model inductance-coupled coil structural representation.
Accompanying drawing 4 is the utility model inductance-coupled coil cross-sectional view.
Accompanying drawing 5 is the near gain directional diagram of the utility model embodiment inductance-coupled coil radiation.Directional diagram shows that radiation is along the polarization perpendicular to the inductance-coupled coil in-plane, and the 150 ° of field angles of having an appointment, and can form bigger homogeneity range in base plan.
In the above accompanying drawing: 1, planar gate shape coil; 2, copper pipe; 3, bending part; 4, straight section; 5, ceramic insulation inner sleeve; 6, ceramic insulation outer tube; 7, first end; 8, second end; 9, silver coating; 10, reative cell; 11, workbench; 12, inductive radio frequency adaptation; 13, inductive radio frequency power supply; 14, electrode of substrate; 15, substrate radio frequency adaptation; 16, substrate bias power supply; 17, helical coil; 18, radome; 19, quartz plate; 20, vacuum pump; 21, air supply opening; 22, bleeding point; 23, the power sense of current; 24, the direction of the winding current.
Embodiment
Below in conjunction with drawings and Examples the utility model is further described:
Embodiment: a kind of inductance coupled plasma device (comprising inductance-coupled coil)
As shown in Figure 2, this device mainly is made up of several parts such as reative cell 10, workbench 11, inductive radio frequency generator, substrate radio freqnency generator, air supply system and extract systems.Wherein, the inductive radio frequency generator is made up of inductance-coupled coil, inductive radio frequency adaptation 12 and inductive radio frequency power supply 13, and the substrate radio freqnency generator is made up of electrode of substrate 14, substrate radio frequency adaptation 15 and substrate bias power supply 16.
Reative cell 10 constitutes one by housing and handles the space, workbench 11, inductance-coupled coil and electrode of substrate 14 all are located in the reative cell 10, wherein, the bottom that workbench 11 is positioned at reative cell 10 processing spaces is used to install processed substrate, inductance-coupled coil is positioned at workbench 11 tops, and electrode of substrate 14 is located on the workbench 11.Electrode of substrate 14 is connected with the radio-frequency (RF) output end of substrate radio frequency adaptation 15, and substrate radio frequency adaptation 15 is connected 16 with the substrate bias power supply.
As shown in Figure 3 and Figure 4, inductance-coupled coil is made up of the planar gate shape coil 1 of two groups of same structures, shape and size, wherein, every group of planar gate shape coil 1 folds into bar structure by " U " shape wave path in the plane by a copper pipe 2, the bending part 3 of bar structure is semicircle or arc transition, and the straight section 4 of bar structure is parallel to each other; Be provided with ceramic insulation inner sleeve 5 in the copper pipe 2, the inner chamber of ceramic insulation inner sleeve 5 is as cooling-water duct, and copper pipe 2 outer walls are provided with silver coating 9, the copper pipe 2 outer ceramic insulation outer tubes 6 that are provided with.
Described planar gate shape coil 1 parameter of structure design: the copper pipe external diameter is 0.8 centimetre~1.2 centimetres, and the copper pipe wall thickness is 0.08~0.12 centimetre, and described bar structure grid centre-to-centre spacing is 5 centimetres~12 centimetres, and grid straight section length is 80 centimetres~100 centimetres.The wall thickness of described ceramic insulation inner sleeve (5) and ceramic insulation outer tube (6) is 0.4 millimeter~0.6 millimeter.
Two groups of planar gate shape coils 1 are that benchmark is symmetrically arranged in same plane with the axis that is parallel to described straight section 4, wherein, one end of one group of planar gate shape coil 1 and the radio-frequency (RF) output end that connects inductive radio frequency adaptation 12 after an end of another group planar gate shape coil 1 symmetry is in parallel as first end 7 of inductance-coupled coil, and the other end of one group of planar gate shape coil 1 and the earth terminal that connects inductive radio frequency adaptation 12 after the other end of another group planar gate shape coil 1 symmetry is in parallel as second end 8 of inductance-coupled coil, inductive radio frequency adaptation 12 is connected with inductive radio frequency power supply 13.
Air supply system is connected with reative cell 10 by air supply opening 21, and being responsible for provides reacting gas to reative cell 10.Extract system is connected with reative cell 10 with bleeding point 22 by vacuum pump 20, the air pressure size (vacuum degree) of being responsible in reative cell 10 work outside exhaust and controlling reative cell 10.In the work, inductive radio frequency power supply 13 is the radio-frequency power supply of 27.12MHz by inductive radio frequency adaptation 12 to the inductance-coupled coil loading frequency, thereby produces the high-intensity magnetic field of activated plasma in reative cell 10.And substrate bias power supply 16 applies the rf bias power supply that frequency is 13.56MHz by substrate radio frequency adaptation 15 to electrode of substrate 14, thereby provides bias field to substrate.Because inductance-coupled coil is a hollow-core construction, the heat of generation can cool off by water cooling passageway.
The foregoing description only is explanation technical conceive of the present utility model and characteristics, and its purpose is to allow the personage who is familiar with this technology can understand content of the present utility model and enforcement according to this, can not limit protection range of the present utility model with this.All equivalences of being done according to the utility model spirit change or modify, and all should be encompassed within the protection range of the present utility model.

Claims (9)

1, a kind of inductance-coupled coil, it is characterized in that: the planar gate shape coil (1) by two groups of same structures, shape and size is formed, wherein, every group of planar gate shape coil (1) folds into bar structure by " U " shape wave path in the plane by a copper pipe (2), the bending part of bar structure (3) is semicircle or arc transition, and the straight section of bar structure (4) is parallel to each other; Be provided with ceramic insulation inner sleeve (5) in the copper pipe (2), the inner chamber of ceramic insulation inner sleeve (5) is provided with ceramic insulation outer tube (6) as cooling-water duct outside the copper pipe (2);
Two groups of planar gate shape coils (1) are that benchmark is symmetrically arranged in same plane with the axis that is parallel to described straight section (4), wherein, one end of one group of planar gate shape coil (1) with after an end of another group planar gate shape coil (1) symmetry is in parallel as first end (7) of inductance-coupled coil, and the symmetrical other end of the other end of one group of planar gate shape coil (1) and another group planar gate shape coil (1) in parallel after as second end (8) of inductance-coupled coil.
2, inductance-coupled coil according to claim 1 is characterized in that: copper pipe (2) outer wall of described every group of planar gate shape coil (1) is provided with silver coating (9).
3, inductance-coupled coil according to claim 1, it is characterized in that: the copper pipe external diameter of described planar gate shape coil (1) is 0.8 centimetre~1.2 centimetres, the copper pipe wall thickness is 0.08~0.12 centimetre, described bar structure grid centre-to-centre spacing is 5 centimetres~12 centimetres, and grid straight section length is 80 centimetres~100 centimetres.
4, inductance-coupled coil according to claim 1 is characterized in that: the wall thickness of described ceramic insulation inner sleeve (5) and ceramic insulation outer tube (6) is 0.4 millimeter~0.6 millimeter.
5, a kind of inductance coupled plasma device, comprise reative cell (10), workbench (11), inductance-coupled coil, inductive radio frequency adaptation (12) and inductive radio frequency power supply (13), it is characterized in that: described inductance-coupled coil is located in the reative cell (10), and is positioned at workbench (11) top; Described inductance-coupled coil is made up of the planar gate shape coil (1) of two groups of same structures, shape and size, wherein, every group of planar gate shape coil (1) folds into bar structure by " U " shape wave path in the plane by a copper pipe (2), the bending part of bar structure (3) is semicircle or arc transition, and the straight section of bar structure (4) is parallel to each other; Be provided with ceramic insulation inner sleeve (5) in the copper pipe (2), the inner chamber of ceramic insulation inner sleeve (5) is provided with ceramic insulation outer tube (6) as cooling-water duct outside the copper pipe (2);
Two groups of planar gate shape coils (1) are that benchmark is symmetrically arranged in same plane with the axis that is parallel to described straight section (4), wherein, one end of one group of planar gate shape coil (1) with connect the radio-frequency (RF) output end of inductive radio frequency adaptation (12) as first end (7) of inductance-coupled coil after an end of another group planar gate shape coil (1) symmetry is in parallel, and the other end of one group of planar gate shape coil (1) with connect the earth terminal of inductive radio frequency adaptation (12) as second end (8) of inductance-coupled coil after the other end of another group planar gate shape coil (1) symmetry is in parallel, inductive radio frequency adaptation (12) is connected with inductive radio frequency power supply (13).
6, inductance coupled plasma device according to claim 5, it is characterized in that: described workbench (11) is provided with plasma and receives electrode of substrate (14), counterpart substrate electrode (14) is provided with substrate radio frequency adaptation (15) and substrate bias power supply (16), electrode of substrate (14) is connected with the radio-frequency (RF) output end of substrate radio frequency adaptation (15), and substrate radio frequency adaptation (15) is connected (16) with the substrate bias power supply.
7, inductance-coupled coil according to claim 5 is characterized in that: copper pipe (2) outer wall of described every group of planar gate shape coil (1) is provided with silver coating (9).
8, inductance-coupled coil according to claim 5, it is characterized in that: the copper pipe external diameter of described planar gate shape coil (1) is 0.8 centimetre~1.2 centimetres, the copper pipe wall thickness is 0.08~0.12 centimetre, described bar structure grid centre-to-centre spacing is 5 centimetres~12 centimetres, and grid straight section length is 80 centimetres~100 centimetres.
9, inductance-coupled coil according to claim 5 is characterized in that: the wall thickness of described ceramic insulation inner sleeve (5) and ceramic insulation outer tube (6) is 0.4 millimeter~0.6 millimeter.
CNU2008200420794U 2008-08-07 2008-08-07 Inductance-coupling coil and inductance-coupling plasm device Expired - Fee Related CN201311804Y (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CNU2008200420794U CN201311804Y (en) 2008-08-07 2008-08-07 Inductance-coupling coil and inductance-coupling plasm device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CNU2008200420794U CN201311804Y (en) 2008-08-07 2008-08-07 Inductance-coupling coil and inductance-coupling plasm device

Publications (1)

Publication Number Publication Date
CN201311804Y true CN201311804Y (en) 2009-09-16

Family

ID=41109061

Family Applications (1)

Application Number Title Priority Date Filing Date
CNU2008200420794U Expired - Fee Related CN201311804Y (en) 2008-08-07 2008-08-07 Inductance-coupling coil and inductance-coupling plasm device

Country Status (1)

Country Link
CN (1) CN201311804Y (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101409126B (en) * 2008-08-07 2011-07-13 苏州科技学院 Inductance coupling coil and inductance coupling plasma apparatus

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101409126B (en) * 2008-08-07 2011-07-13 苏州科技学院 Inductance coupling coil and inductance coupling plasma apparatus

Similar Documents

Publication Publication Date Title
CN101409126B (en) Inductance coupling coil and inductance coupling plasma apparatus
CN101136279B (en) Jigger coupling coil and jigger coupling plasma device
KR101920842B1 (en) Plasma source design
CN102076162B (en) Plasma processing apparatus
CN1230043C (en) Antenna structure for inductively coupled plasma generator
CN1925074B (en) Induction coupling coil and induction coupling plasma device
CN101515498B (en) Inductance coupling coil and plasma processing device adopting same
US20040149387A1 (en) Inductively coupled antenna and plasma processing apparatus using the same
CN103695868B (en) The linear plasma reinforced chemical vapor deposition system of long-range mirror-magnetic field fetter
TW200303035A (en) Method and apparatus for substrate processing
CN100527294C (en) Inductance coupled coil and inductance coupled plasma device
CN1937880B (en) Inductive coupling source
CN105088196A (en) Large-area and high-density microwave plasma generating device
CN1852631A (en) Multi-solenoid plasma source
CN101131893B (en) Inductance coupling coil and inductance coupling plasma body device
CN2726076Y (en) Inductive comping coil and its inductive coupling plasma apparatus
CN103985624A (en) Inductive coupling plasma processing device
CN100527293C (en) Inductive coupling coil and inductive coupling plasma apparatus thereof
CN201311804Y (en) Inductance-coupling coil and inductance-coupling plasm device
CN101500369B (en) Inductor coupling coil and inductor coupling plasma generation apparatus
CN103811262A (en) Inductive coupled plasma processing apparatus
CN101465189A (en) Inductance coupling coil and plasma device
CN201313936Y (en) Normal pressure plasma generator
CN101211687B (en) Inductance coupling coil and inductance coupling plasma device applying same
CN104733275B (en) Plasma processing tool

Legal Events

Date Code Title Description
C14 Grant of patent or utility model
GR01 Patent grant
C17 Cessation of patent right
CF01 Termination of patent right due to non-payment of annual fee

Granted publication date: 20090916

Termination date: 20100807