CN1989414A - Failsafe for differential circuit based on current sense scheme - Google Patents
Failsafe for differential circuit based on current sense scheme Download PDFInfo
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- CN1989414A CN1989414A CNA2004800347793A CN200480034779A CN1989414A CN 1989414 A CN1989414 A CN 1989414A CN A2004800347793 A CNA2004800347793 A CN A2004800347793A CN 200480034779 A CN200480034779 A CN 200480034779A CN 1989414 A CN1989414 A CN 1989414A
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- current
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/0046—Arrangements for measuring currents or voltages or for indicating presence or sign thereof characterised by a specific application or detail not covered by any other subgroup of G01R19/00
- G01R19/0053—Noise discrimination; Analog sampling; Measuring transients
Abstract
A system and method are described for receiving differential currents in a current mode circuit. When condition occur where the receiver inputs are floating, undriven, shorted together, or one or both shorted to ground, the output of the system remains stable. Diode connected MOS transistors receive the unequal currents, and current mirrors amplify the received currents. Those amplified mirrored currents are differentially amplified and converted into voltage signals suitable of typical computer and logic systems. The current mode differential nature of the invention provides high common mode current and voltage noise immunity. A threshold for the unequal curio rents helps provide high differential current and voltage noise immunity.
Description
Technical field
The present invention relates to logic differential logic/buffer circuits, relate in particular to the current transfer logic circuits of (fail-safe) circuit that has fault secure.
Background technology
When uncertain or invalid input signal appears in input end, fault secure differential amplifier or receiver provide known output.When input end is that float or ternary or during by short circuit, invalid input signal appears usually.But part short circuit or open circuit may cause invalid input signal.In the face of this invalid input signal, receiver can vibrate usually, inserts noise or be in nondeterministic statement.
Previous solution has based on addressing voltage with based on the circuit of low-voltage.These solutions provide bias resistor at the input end of differential receiver, so that by providing direct current offset at input end input is biased to known state.But this skew may make return current unbalance, makes output and possible load distortion, and reduces input signal amplitude.Other solution is biased to Vcc by logical circuit with the input of receiver, so that the output of receiver is driven into certain known state.
Another solution based on low-voltage circuit is the differential receiver of no.SN65LVDT32B at the Part No. of Texas Instruments company, and finds in several other similar device.The circuit of this device provides two active circuit high impedance comparers, and this comparer is shared the input of receiver.These comparers provide window, and one of them comparer provides+80 millivolts threshold value, another comparer provides-80 millivolts threshold value.With the output of fault secure timer and comparer " with ", and if in timer period end, the difference input is in+/-80 millivolts window, then output is driven to known fault secure high state.A limitation of sort circuit is, must connect the fault secure timer, so that pick up counting the device cycle.If to the input of receiver is effectively, for example greater than+80 millivolts of difference, but be returned to disarmed state then, for example+10 millivolt difference, then timer may not be activated, because can not connect the output of receiver.
The another fail safe device of low-voltage circuit is produced by Maxim, and Part No. is no.MAX9153/4.Though this device is marked as repeater, be actually differential amplifier or acceptor circuit.This circuit has diode spike pulse (spike) rejector, and when the transmission line by short circuit, or possible inoperation when powering up by low level (below 100 millivolts) decay differential signal.Also may worsen high-frequency operation.
An object of the present invention is to provide a kind of active fault secure acceptor circuit, it is to make receiver be output as stable known state under the genuine situation in following any situation.
Receiver input be float and not by termination.
Receiver input is by termination and be not driven because driver is motorless, forbidding and/or be disconnected.
The input cable is disconnected.
The receiver input for example because driver is exported by short circuit, and perhaps the input of one or two receiver is shorted to ground, is shorted to ground or has short circuit in cable because driver is exported by short circuit together.
Above in these situations neither one can produce uncertain output from the present invention.From the viewpoint of speed (bandwidth) and/or shake/noise, under normal operation, the fault secure biasing can not influence the performance of receiver.
Another object of the present invention provides a kind of fault secure current mode receiver, and it is competitive at power and chip field.
Carry out with reference to illustrative embodiment, accompanying drawing and using method though it will be appreciated by those skilled in the art that following detailed, should not limit the invention to these embodiment and using method.On the contrary, the present invention has the scope of broad, and only is restricted to described in appended claims.
Summary of the invention
Discussion in view of the front the invention provides: a kind of fail safe differential current logic receiver and method, this receiver comprises at least two input ends.Fault condition comprises not driven unsteady receiver input, is shorted to ground by short circuit input or in the input one or two together.Under this condition, the invention provides first input end electric current first driver and to second driver of the different value electric current of second input end.These unequal electric currents of sensing, and the corresponding difference current of unequal electric current that provides and received.When having the fail-safe condition of any definition, it is stable that the difference output current of sensing apparatus keeps.
In a preferred embodiment, connect resistor between two input ends, and set up the threshold value difference current, wherein this threshold value difference current need be reached to set up the logic state after changing.Difference current is exaggerated and is converted into the output voltage signal that is suitable for flogic system.First and second current receiving circuits are provided.One between first input end and electric current return path, second between second input end and electric current return path.First and second current receiving circuits are the MOS transistor of diode connection preferably, and each biasing with it is to present given impedance between input end.Current mirror circuit is used to each unequal received current, current/voltage conversion provide with the unequal electric current that is received between the proportional voltage of difference export.Unequal electric current allows positive current to be shunted from each receiver input end, and when unequal electric current is reverse owing to logic changes, the difference between the unequal electric current also will be reversed, to allow detection.If the positive current that the CMOS transistor that connects by two diodes is received equates, then oppositely just can not provide output with them.
Though it will be understood by those of skill in the art that following detailed by carrying out with reference to illustrative embodiment, accompanying drawing and using method, should not limit the invention to these embodiment and using method.On the contrary, the present invention has the scope of broad, and only is limited to described in appended claims.
Description of drawings
Following invention introduction is with reference to accompanying drawing, wherein:
Accompanying drawing 1B has equational calcspar, the design proposal of its expression embodiment of the invention;
Accompanying drawing 2 is detail circuits synoptic diagram, and it comprises and is suitable for the current driver that uses with the present invention;
Accompanying drawing 3 is circuit of expression current sense;
Accompanying drawing 4 is combination synoptic diagram of acceptor circuit of the present invention.
Embodiment
If use two transmission lines, wherein every transmission lines has 50 ohm characteristic impedance, and then 100 ohm Rt is placed the end across signal conductor, and is used for these two lines of termination.In addition, Ip and Im are unequal each other, make to exist to pass the return current Is of shielding.And in this preferred embodiment, owing to the end of Rt across two transmission lines, thereby the two ends of Rt are biased in certain positive voltage.Preferably, in a logic state, Ip is+1.0ma that Im is-0.5ma therefore to have return current Is, in the shielding of 0.5ma.In opposite logic state, still exist 0.5ma to return by shielding.
Shake is also than low in the voltage-type circuit, and this is because the voltage gain of current sense is low.Use current sensing circuit almost to eliminate the negative effect of high gain voltage reception amplifier capacitance multiplication (capacitance multiplication).In this preferred embodiment, current sense is configured to parallel with Rt, and is described in greater detail below.Current amplification circuit 56 receives the electric current that senses, and last, current/voltage (I/V) converter 58 provides the CMOS output signal with the criterion calculation circuit compatibility.The present invention produces the voltage signal away from termination and sensing circuit.On I/V conversion this point, circuit parasitic capacitance is relatively little and invalid.
With reference to accompanying drawing 1A, difference current sensing 54 has very little voltage amplification, has therefore got rid of any Miller capacitor effect.Effect-common-mode voltage gaim that the difference characteristic of current sense has reduced common mode voltage signal is very little or negligible.
Accompanying drawing 1B represents the present invention's allowing current noise.Usually, a part of i1 of Ip and Im and i2 pass differential current sense circuit 54.Current sense 54 is designed to have difference current threshold value Ith, wherein must reach this difference current threshold value in order to discern effective logical signal.Therefore, the difference between Ip and the Im must cause equaling between i1 and the i2 difference of (or greater than) threshold value Ith.Usually, the formula 13 and 15 that is respectively applied for i1 and i2 is represented as the function of Ip and Im.If deduct i2 from i1, ecbatic in item 17 then.Because i1-i2 must equal or exceed Ith, 19, therefore in item 21, represent Ith formula as the function of Ip and Im.See that by observing easily Ip-Im must be enough big, surpasses threshold value so that guarantee i1-i2.Under normal fail-safe condition, if the difference between Ip and the Im is enough not big, then the difference between a and the b (current distribution factor) is also less, and this makes and is difficult to keep formula 21.In the application of reality, this means that in case receiver enters the fault secure pattern, receiver is with respect to noise just very firm (robust).See easily that from 21 the common mode current noise is cancelled out each other, thereby make present embodiment very firm with respect to the common mode current noise.In a preferred embodiment, the present invention allows the difference current noise of 100uA.Other embodiment can be designed as has bigger noise immunity.Note that i1 and i2 are positive, but have unequal value.If they equate, then do not have difference when logic level change occurring.These electric currents are unequal each other usually, except line short circuit together.Under this condition, receiver is by the insurance of the internal fault in the accompanying drawing 4 bias transistor P
F1And N
F1Keep stable output.This skew provides fails safe action of the present invention, and still, in a preferred embodiment, only approximately the drift current of 20uA produces very little secondary power consumption, and in fact embodiments of the invention do not use extra dead band (die area).
Accompanying drawing 2 expression can be used according to the invention a kind of current driver circuits.Here, when V1 when low, P1 connects, and the I1 of 1mA via the P1 output terminal as Ip.If V2 is high, then N2 connects, and the I2 of 0.5mA is via the negative Im of N2 output conduct.The logic state of V1 and V2 is reverse, and I2 output is as negative Ip, and I1 exports as positive Im.Typically, for top operation, V2 is designed to the logic opposite with VI.Yet, if drive P1, P2, N1 and N2 (not shown) independently, can be with they whole disconnections, thus in transmission line, there is not electric current.Should be noted that do not have common mode feedback circuit (CMFB) with the common mode electrical level of regulated output voltage.Typically, such output driver is general to the low-voltage differential system.Native system does not need CMFB, and this is because employed specific receiver 54.Like this, do not use the CMFB circuit just to save chip space and power.
Accompanying drawing 3 is synoptic diagram of the current sensing circuit consistent with a preferred embodiment of the invention.At this, nmos pass transistor N3 and N4 that two diodes connect are biased, with electric current sucking-off I3 and the I4 from transmission line respectively.Can so that overcome any threshold value, and present obvious impedance, thereby minimum level ground influence the termination of transmission line along the curve biasing N3 and the N4 (not shown) of similar diode greater than Rt.In a preferred embodiment, each shows as about 1K ohm N3 and N4, although can use other impedance as known in the art.If when N3 and N4 are rendered as about 2K ohm across the transmission line that is equivalent to 100 ohm, then can make Rt equal 105 ohm, perhaps suitably higher or lower, so that keep suitable transmission line termination.Yet, as known in the art, even carefully diode transistors is remained on high impedance status, also may be owing to there is certain harmless ringing (ringing) in certain impedance mismatching.For example, if Rt is 105 ohm across 100 ohm transmission line, and the transistor that connects of diode since certain handle former thereby present very high impedance, 5 ohm do not match and will only cause approximately reflection coefficient then less than 2.5%.
Also with reference to accompanying drawing 3, consider that Ip is positive 1ma, Im is negative 0.5ma, and then the electric current I s that returns by shielding is 0.5ma.Can design N3 and N4, make that It is 0.65ma, wherein N3 draws the I3 of 0.35ma, and N4 draws the I4 of 0.15ma.Difference between sensing I3 and the I4 or 0.2ma, as described below, with presentation logic signal, for example logical one.When Ip and Im when the input signal to current driver changes state during the exchanging electric current level, the negative logic signal of this logical signal of sensing.In this state, I3 and I4 exchanging electric current level, and the difference of 0.2ma is sensed as logical zero.Therefore, the logic from " 1 " to " 0 " changes the variation that causes 0.4ma the electric current.
Accompanying drawing 4 expression is positioned at the acceptor circuit of more detailed complete of piece termination circuit end place, accompanying drawing 1 of two transmission lines 50 and 52 and realizes.As shown in the figure, Rt is connected to Pin-from Pin+, wherein Ip and Im drive the two ends of Rt, as shown in Figure 3.Accompanying drawing 4 is synoptic diagram of expression current sensing circuit 54, current amplification circuit 56 and current/voltage I/V change-over circuit 58.
In accompanying drawing 4, form current sensing circuit 54 by the circuit that is connected to each end of Rt, wherein current source I5 and I6 are each line feed.As known in the art, typically by the PMOS transistor biasing is formed these current sources to positive track (power rail) 60.The current sensing circuit of I3 comprises N5-N8.N7 and N8, and the current sensing circuit of I4 comprises N5 '-N8 '.N7 is the nmos pass transistor that diode is connected with N7 ', and they share the leakage current that equates with N8 and N8 ' respectively.Because N7 has identical leakage current (I5) with N8, thereby gate pole-source voltage of N7 and N8 is identical, suppose it is the transistor of coupling.Be directly applied for N5 '-N7 ' at I3 for the argumentation of N5-N7, therefore no longer repeat below at I4.N6 is the transistor that diode connects, and itself and N5 arrange the linear resistance that forms the controlled xtal pipeization, are biased away from the flex point zone with the device that diode is connected, and have therefore improved current sensitivity.By the gate voltage control N5 of N7 and N7 ' and the resistance of N5 ', this depends on the electric current among diode interface unit N6 and the N6 ' again respectively.Like this, be used to revise the resistance of N5 or N5 ', make and to improve two watt current differences between the branch road from the current information of sensing element (diode interface unit).Resistance also has damping effect to the high frequency noise that appears on node A and the Ab.In this circuit structure I5, N7 and N8 control I3 by mirror effect, and reduce across the voltage of N5 and N6, and be as described below.Identical electric current passes N5 and N6, makes their gate pole-source voltage be equal to each other, and equals the voltage at Pin+ place via the N7 mirror image.Like this, the offset voltage of the N6 of diode connection can be compensated, and the impedance of N6 can be controlled.
The gate pole of N9 and N10 is connected to and is labeled as drain electrode A, N6, thereby forms current mirror.Equally, the electric current among N11 and the N12 mirror image N6 '.The size of design N10 and N12 is to provide by the amplified current of I-V change-over circuit via B and Bb sensing.In a preferred embodiment, when I3 when 0.15ma changes to 0.35ma, this variation is reflected in I9 and I10 via current mirror amplifying circuit 56.Biasing fault secure bias transistor P
F1And N
F1, insure bias current to form internal fault, thereby,, just output remained on known state such as driver power down or cable short circuit in case receiver enters fail-safe condition.In a preferred embodiment and as known in the art, can make up biasing 1 and biasing 2 by the band gap device, wherein the band gap device is together with P
F1And N
F1Characteristic selected together so that about 20 microamperes holding current is provided in I9 and I11.Can be by changing transistorized size, as known in the art, making I10 is the amplified version that I3 changes.Equally, P9 is aligned to the transistor that diode connects, and can be biased (not shown), and I10 mirror image I9, but can be exaggerated by the size that changes P10.Gate pole-source voltage of P10 and P9 equates.This provides electric current to amplify, and makes that I10 is the amplified version of I3.Similar circuit receives I4, and provides amplified version at I12.
The circuit of voltage transitions is carried out in item 58 expressions of accompanying drawing 4.Two outputs B and Bb are imported into the gate pole of N13 and N14 respectively.I13 and I14 are respectively the mirror images of I10 and I12.P13 and P14 are current mirrors.There is the fully differential operation of using B and Bb, voltage output is provided at the C place, its driving N 15 and P15 action, thinking provides the CMOS logic level of track to track.
Should be appreciated that the foregoing description proposes as an example here, its many variations and replacement are possible.Therefore, the present invention should be thought broadly that only to be defined as following appended claims described.
Claims (10)
1. fail-safe system that is used for the differential current logic acceptor circuit, wherein fail-safe condition comprises that receiver input is that float, that do not drive, by short circuit together, perhaps one or two receiver input is shorted to ground, and described fail-safe system comprises:
Limit the current-mode differential receiver of first end and second input end,
Enter first driver and second driver that enters the electric current of described second input end of the electric current of described first input end, wherein under normal operation, described first and second electric currents are unequal each other,
Be used for described unequal electric current of sensing and the output device corresponding to the difference current of the unequal electric current of described reception, wherein under the fail-safe condition of any regulation, the output of the difference current of described sensing apparatus keeps stable.
2. fail-safe system according to claim 1, wherein said sensing apparatus comprises:
Be used to set up the device of difference current threshold value, wherein when reaching described threshold value, described sensing apparatus is exported the logic state after changing.
3. fail-safe system according to claim 1 further comprises:
The difference current amplifier is used to accept the difference current output of described sensing apparatus, and the electric current after the amplification is provided, and
Current-to-voltage convertor, described current-to-voltage convertor is accepted the electric current after the described amplification, and the output voltage signal consistent with flogic system.
4. fail-safe system according to claim 1 further comprises the resistor that is connected between described first and second input ends.
5. fail-safe system according to claim 1, wherein said sensing apparatus comprises:
First current receiving circuit, described first current receiving circuit are connected described first input end and turn back between the electric current return path of described current driver,
Second current receiving circuit, described second current receiving circuit are connected described second input end and turn back between the electric current return path of described current driver.
6. fail-safe system according to claim 5, wherein said first and second current receiving circuits comprise the MOS transistor that diode connects.
7. fail-safe system according to claim 6 further comprises MOS transistor that each diode that is used to setover connects, makes MOS transistor that each diode connects show device to constant impedance to the electric current return path to described current driver.
8. fail-safe system according to claim 5 further comprises being used for the device that electric current and the electric current in described second receiving circuit with described first receiving circuit compare.
9. fail-safe system according to claim 8, wherein said comparison means comprises:
The first amplified current mirror image circuit, the described first amplified current mirror image circuit provides the first mirror image output current of the electric current that is received by described first receiving circuit,
The second amplified current mirror image circuit, the described second amplified current mirror image circuit provides the second mirror image output current of the electric current that is received by described second receiving circuit, and
Current-to-voltage converting circuit is used to receive described first and second output currents, and provide and the output of the described first and second amplified current mirror image circuits between the proportional voltage output of difference.
One kind be used for when receiver input be that float, not driven, by short circuit together or one or two receiver input generate the method for the fail-safe condition system that is used for the differential current logic acceptor circuit when being shorted to ground, said method comprising the steps of:
Receive outside differential noise electric current, wherein the current-mode differential receiver limits first and second input ends,
With first current drives in described first input end, in described second input end, wherein the difference between the foreign current noise is enough not big usually on the differential data line, with under fail-safe condition with second current drives, overcome the threshold value that internally is provided with by the fault secure bias transistor
Under normal operation, the unequal electric current of sensing effectively, and under fail-safe condition the stable known state of output.
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US10/720,568 | 2003-11-24 | ||
| US10/720,568 US6927599B2 (en) | 2003-11-24 | 2003-11-24 | Failsafe for differential circuit based on current sense scheme |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN1989414A true CN1989414A (en) | 2007-06-27 |
| CN100568005C CN100568005C (en) | 2009-12-09 |
Family
ID=34591578
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CNB2004800347793A Expired - Fee Related CN100568005C (en) | 2003-11-24 | 2004-11-08 | Fault secure based on the difference channel of current sense design |
Country Status (7)
| Country | Link |
|---|---|
| US (1) | US6927599B2 (en) |
| JP (1) | JP4919806B2 (en) |
| KR (1) | KR101029669B1 (en) |
| CN (1) | CN100568005C (en) |
| DE (1) | DE112004002308T5 (en) |
| TW (1) | TWI340541B (en) |
| WO (1) | WO2005054882A1 (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102375465A (en) * | 2010-08-13 | 2012-03-14 | 联咏科技股份有限公司 | Linear voltage regulator and current sensing circuit thereof |
| CN102426285A (en) * | 2011-09-14 | 2012-04-25 | 深圳航天科技创新研究院 | Current sensor used for bidirectional current sampling |
| CN104218974A (en) * | 2013-05-30 | 2014-12-17 | 英飞凌科技股份有限公司 | Method, Device and Circuitry for Detecting a Failure on a Differential Bus |
Families Citing this family (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7405593B2 (en) * | 2005-10-28 | 2008-07-29 | Fujitsu Limited | Systems and methods for transmitting signals across integrated circuit chips |
| US7631953B2 (en) * | 2006-03-31 | 2009-12-15 | Lexmark International, Inc. | Micro-fluid ejection apparatus signal communication devices and methods |
| US8446977B2 (en) * | 2007-09-12 | 2013-05-21 | Valery Vasilievich Ovchinnikov | Method for transmitting discrete electric signals |
| WO2013061272A1 (en) * | 2011-10-28 | 2013-05-02 | Koninklijke Philips Electronics N.V. | Data communication with interventional instruments |
| US8896250B2 (en) | 2012-10-24 | 2014-11-25 | General Electric Company | Methods to avoid a single point of failure |
| TWI451095B (en) | 2012-12-10 | 2014-09-01 | Ind Tech Res Inst | Current sensing circuit and current sensing method |
| KR101499431B1 (en) * | 2013-11-04 | 2015-03-06 | 코닝정밀소재 주식회사 | Apparatus for forming glass substrate |
| US9667156B2 (en) | 2015-03-06 | 2017-05-30 | Fairchild Semiconductor Corporation | Power supply with line compensation circuit |
| US10305495B2 (en) * | 2016-10-06 | 2019-05-28 | Analog Devices, Inc. | Phase control of clock signal based on feedback |
| US10361732B1 (en) | 2018-10-10 | 2019-07-23 | Nxp Usa, Inc. | Fault detection in a low voltage differential signaling (LVDS) system |
Family Cites Families (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH03242035A (en) * | 1990-02-20 | 1991-10-29 | Nec Corp | Fail safe logic circuit |
| CN2082868U (en) * | 1990-08-18 | 1991-08-14 | 杨伯 | Double-channel differential voltage monitoring instrument |
| US5488306A (en) * | 1994-05-31 | 1996-01-30 | International Business Machines Corp. | Open and short fault detector for a differential interface |
| JP3454708B2 (en) | 1998-04-06 | 2003-10-06 | 矢崎総業株式会社 | Current detector |
| JP3948864B2 (en) * | 1999-09-28 | 2007-07-25 | 富士通株式会社 | Receiver, transceiver circuit and signal transmission system |
| US6320406B1 (en) * | 1999-10-04 | 2001-11-20 | Texas Instruments Incorporated | Methods and apparatus for a terminated fail-safe circuit |
| US6476642B1 (en) * | 2000-07-17 | 2002-11-05 | Agere Systems Guardian Corp. | Differential current driver circuit |
| JP2002257869A (en) | 2001-02-28 | 2002-09-11 | Sanyo Electric Co Ltd | Current detection circuit |
| US6288577B1 (en) * | 2001-03-02 | 2001-09-11 | Pericom Semiconductor Corp. | Active fail-safe detect circuit for differential receiver |
| US6650149B1 (en) * | 2002-08-15 | 2003-11-18 | Pericom Semiconductor Corp. | Latched active fail-safe circuit for protecting a differential receiver |
-
2003
- 2003-11-24 US US10/720,568 patent/US6927599B2/en not_active Expired - Lifetime
-
2004
- 2004-11-08 DE DE112004002308T patent/DE112004002308T5/en not_active Withdrawn
- 2004-11-08 CN CNB2004800347793A patent/CN100568005C/en not_active Expired - Fee Related
- 2004-11-08 JP JP2006541230A patent/JP4919806B2/en not_active Expired - Fee Related
- 2004-11-08 WO PCT/US2004/037144 patent/WO2005054882A1/en active Application Filing
- 2004-11-08 KR KR1020067010030A patent/KR101029669B1/en active IP Right Grant
- 2004-11-24 TW TW093136116A patent/TWI340541B/en active
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102375465A (en) * | 2010-08-13 | 2012-03-14 | 联咏科技股份有限公司 | Linear voltage regulator and current sensing circuit thereof |
| CN102375465B (en) * | 2010-08-13 | 2013-11-13 | 联咏科技股份有限公司 | Linear voltage regulator and current sensing circuit thereof |
| CN102426285A (en) * | 2011-09-14 | 2012-04-25 | 深圳航天科技创新研究院 | Current sensor used for bidirectional current sampling |
| CN104218974A (en) * | 2013-05-30 | 2014-12-17 | 英飞凌科技股份有限公司 | Method, Device and Circuitry for Detecting a Failure on a Differential Bus |
| CN104218974B (en) * | 2013-05-30 | 2017-01-04 | 英飞凌科技股份有限公司 | Method, device and circuit arrangement for detecting faults on a differential bus |
Also Published As
| Publication number | Publication date |
|---|---|
| KR101029669B1 (en) | 2011-04-15 |
| CN100568005C (en) | 2009-12-09 |
| WO2005054882A1 (en) | 2005-06-16 |
| TW200522510A (en) | 2005-07-01 |
| DE112004002308T5 (en) | 2006-10-12 |
| TWI340541B (en) | 2011-04-11 |
| JP4919806B2 (en) | 2012-04-18 |
| US6927599B2 (en) | 2005-08-09 |
| JP2007512624A (en) | 2007-05-17 |
| KR20070006676A (en) | 2007-01-11 |
| US20050110515A1 (en) | 2005-05-26 |
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