CN1988043A - Method for detecting electronic magnetic disc - Google Patents
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- CN1988043A CN1988043A CN 200510135017 CN200510135017A CN1988043A CN 1988043 A CN1988043 A CN 1988043A CN 200510135017 CN200510135017 CN 200510135017 CN 200510135017 A CN200510135017 A CN 200510135017A CN 1988043 A CN1988043 A CN 1988043A
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Abstract
This invention discloses a test method for electronic disks including: initializing a disk to set it in a processor system, then carrying out register test and formating it to prepare for reading and writing data, initializing specific test data then testing its data line, testing its open-circuit and short-circuit of the address line, formatting the disk to clear out the test data and quiting from the flow to finish the test.
Description
Technical field
The present invention relates to the method for a kind of detected electrons disk (DiskOnChip), in the production test field, faults such as page or leaf is wiped by electronic magnetic disc is carried out, the open circuit of data line that reading and writing operate detected electrons disk chip, address wire and short circuit, and the fine or not situation of the storage space of chip own, give security for improving electronic circuit board production outgoing.
Background technology
Electronic magnetic disc is a kind of memory storage that begins to be widely used in fields such as mobile phone, commercial unit, telecommunication apparatus and mobile memory card, and this memory storage is different with general flash memory FLASH, random access memory SDRAM, RAM.For storeies such as FLASH, SDRAM, RAM, all there is relation one to one its storage space and address; Yet, electronic magnetic disc manufacturer is an integrated file management system (TrueFFS) in chip, it is for providing a software interface between operating system and the electronic magnetic disc, operating system is carried out by file management system indirectly to the read-write of electronic magnetic disc inner space; Generally, no matter electronic magnetic disc chip memory capacity has much, its external address space has only 8K, this 8K space is what to shine upon to the electronic magnetic disc internal controller fully, all all realize through this controller visits of electronic magnetic disc inner space, so its address space of electronic magnetic disc and peripheral address line relation one to one.So the electronic magnetic disc test can not be used traditional FLASH, SDRAM method of testing, this also is the difficult point place of electronic magnetic disc test.
But, do not find the patent of any relevant electronic magnetic disc test aspect at present both at home and abroad, the common now test to electronic magnetic disc is to utilize operating system to write file by the file management system of electronic magnetic disc inside to electronic magnetic disc, read file again, the file read compared with the file that writes test, there is following shortcoming in this method: can not the weld defects of electronic magnetic disc data line effectively be detected, can not position the data line solder failure; Because there is the function of defective-area management electronic magnetic disc inside, the effective fine or not situation of detected electrons disk storage space; Can not effectively detect whole address wires opens circuit and short-circuit conditions; Therefore this test is incomplete.
Summary of the invention
The method of testing that the objective of the invention is to propose a kind of electronic magnetic disc is tested the electronic magnetic disc on the electronic circuit board of production field, and the electronic magnetic disc on the wiring board that guarantees to dispatch from the factory is intact.Find out the electronic magnetic disc failure cause of the wiring board that has electronic magnetic disc solder failure or the fault of chip own simultaneously, make things convenient for localization of fault and eliminating.
In order to realize the foregoing invention purpose, the present invention specifically is achieved in that
1, a kind of method of testing of electronic magnetic disc comprises, electronic magnetic disc inside is divided into some pages or leaves, and all pages or leaves are arranged from low to high, it is characterized in that, also comprise:
Step 1, electronic magnetic disc is carried out initialization, electronic magnetic disc is hung into processor system;
Step 2, electronic magnetic disc is carried out register testing, if the data that relatively write and read identical, are then tested successfully, enter step 3, otherwise withdraw from testing process, the electronic magnetic disc test crash;
Step 3, electronic magnetic disc is formatd, format is passed through, and then enters step 4, otherwise withdraws from testing process, the electronic magnetic disc test crash;
Step 4, the specific test data of initialization;
Step 5, carry out electronic magnetic disc data line test, test to the different particular data of the space of two pages or leaves of electronic magnetic disc read-write, test is by entering step 6, otherwise withdraws from testing process, the electronic magnetic disc test crash;
Step 6, carry out electronic magnetic disc address wire open test, specific data are write in page or leaf space toward particular range, up to having write all pages or leaves of electronic magnetic disc, read the data of all pages more respectively, compare, if the value that reads equates with the value of writing with writing data, then test is passed through, enter step 7, otherwise withdraw from testing process, electronics is surveyed the looping test failure;
Step 7, carrying out electronic magnetic disc address wire short-circuit test, is that unit carries out the displacement method test with the page or leaf, if test is passed through, then enters step 8, does not survey and does not withdraw from testing process, electronic magnetic disc test crash;
Step 8, all tests are finished, and the format electronic magnetic disc empties test data, withdraws from testing process, and electronic magnetic disc is tested successfully.
In the described step 4, the initialization test array is determined Data1[512 according to concrete data-bus width] and Data2[512] initialization value, initialization array Data3[512], Data4[512] initialization value all be 0.
Described step 5 specifically comprises the steps:
(1) to certain page of space write data Data1[512], 512 data that read this page space again are to Data3[512], compare Data1[512] and Data3[512], if comparative result is correct, then carry out step (2);
(2) again to another page space write data Data2[512], 512 data that read this page space again are to Data4[512], compare Data2[512] and Data4[512], if comparative result is correct, then the test of electronic magnetic disc data line is passed through, and carry out step 6;
If above twice comparative result has the failure phenomenon, then format electronic magnetic disc, directly withdraw from testing process, the electronic magnetic disc test crash.
Described step 6 specifically comprises the steps:
(1) test beginning composes initial value 1 for page or leaf sequence number n;
(2) whether judge page or leaf sequence number n greater than total page number N, if page or leaf sequence number n is less than total page number N, toward P
nTo P
2nThe page or leaf space write data n of scope, page or leaf sequence number n takes advantage of 2 multiplications, judges that whether page or leaf sequence number n is greater than total page number N, again toward P
nTo P
2nThe page or leaf space write data n of scope, all pages of electronic magnetic disc space has been write in circulation like this;
(3) compose initial value 1 for page or leaf sequence number n; Whether judge page or leaf sequence number n greater than total page number N, if page or leaf sequence number n reads P less than total page number N
nTo P
2nThe data in the page or leaf space of scope, and institute's read data and the data that write are compared, comparative result is correct, and a page or leaf sequence number n takes advantage of 2 multiplications, judges that page or leaf sequence number n whether greater than total page number N, reads P again
nTo P
2nThe data in the page or leaf space of scope compare data that read and the data that write, and the data that read all pages of electronic magnetic disc spatial data and write that circulate like this compare;
(4) all read-writes are relatively finished, and comparative result is correct, and then electronic magnetic disc address wire open test passes through, and enters step 7;
If electronic magnetic disc is then formatd in above-mentioned open test failure, directly withdraw from testing process, the electronic magnetic disc test crash.
Described step 7 specifically comprises the steps:
(1) test beginning composes initial value 1 for page or leaf sequence number n;
(2) whether judge page or leaf sequence number n greater than total page number N, if page or leaf sequence number n is less than total page number N, toward P
nPage or leaf space write data is toward P
2nPage or leaf space write data; Read P
nThe data in page or leaf space are read P
2nThe data in page or leaf space, whether the data in 2 page or leaf spaces of relatively reading equate with the data that write;
(3) comparative result is correct, and page or leaf sequence number n takes advantage of 2 multiplications, again toward P
nPage or leaf space write data is toward P
2nPage or leaf space write data reads this 2 page data that writes again, and relatively whether its data equate with the data that write;
(4) loop test, up to page or leaf sequence number n greater than page or leaf sum N;
(5) all read-writes are relatively finished, and comparative result is correct, and then electronic magnetic disc address wire short-circuit test passes through;
If electronic magnetic disc is then formatd in above-mentioned open test failure, directly withdraw from testing process, the electronic magnetic disc test crash.
This method of testing has solved the deficiency of testing the electronic magnetic disc method with file system fully, has the following advantages:
Because to register, the format of electronic magnetic disc, data line, address wire have all been carried out Validity Test, so method of testing of the present invention can be complete electronic magnetic disc are detected, and it is relatively good to detect effect; Can also detect electronic magnetic disc because of the caused read-write fault of address wire short circuit, can detect the address wire open circuit and the data line fault of electronic magnetic disc reliably, and fault is accurately located, be beneficial to and fix a breakdown; Because in address wire open test process, the institute of electronic magnetic disc had living space carried out read-write operation, thus the actual storage amount of capacity that this method can the detected electrons disk, and then the damaged condition of definite electronic magnetic disc internal storage space.
Description of drawings
Accompanying drawing 1 is an electronic magnetic disc functional test general flow chart;
Accompanying drawing 2 is electronic magnetic disc data line test flow charts;
Accompanying drawing 3 is electronic magnetic disc address wire open test process flow diagrams;
Accompanying drawing 4 is electronic magnetic disc address wire short-circuit test process flow diagrams.
Embodiment
The invention provides a kind of method of testing, under the prerequisite with the weld defects that solves address wire that existing method of testing can not the Validity Test electronic magnetic disc and data line, realize complete test electronic magnetic disc to electronic magnetic disc.
The test beginning earlier to the electronic magnetic disc initialization, hangs into processor system electronic magnetic disc, then electronic magnetic disc is carried out register testing; Again electronic magnetic disc is formatd if test successfully, prepare for reading and writing data; If electronic magnetic disc formats successfully, the specific test data of initialization then; Carry out the test of electronic magnetic disc data line then; If test successfully, carry out electronic magnetic disc address wire open test again; If test successfully, carry out electronic magnetic disc address wire short-circuit test again; All tests are finished, and the format electronic magnetic disc empties test data, withdraws from testing process, and electronic magnetic disc is tested successfully.
If in above test, finding wherein has a certain test crash, will format electronic magnetic disc, withdraws from test, the electronic magnetic disc test crash.
As can be known, electronic magnetic disc test of the present invention comprises electronic magnetic disc register testing, format, data line test, address wire open test, address wire short-circuit test from principle; In the address wire short-circuit test, owing to require the whole pages or leaves of electronic magnetic disc are carried out read-write operation, so realized test to the storage space of electronic magnetic disc.
The test specification of data line: the test employing to data line is tested to the different particular data of the space of two pages or leaves of electronic magnetic disc read-write.
The test specification of address wire: among the present invention address wire short circuit and two kinds of situation branches of open circuit are come and tested.
Short-circuit test: with the page or leaf is that unit carries out the displacement method test;
Open test: toward P
n-P
2nParticular data is write in the page or leaf space of scope, and up to having write all pages or leaves of electronic magnetic disc, the data of reading all pages more respectively compare with the data that write, if the value that reads is unequal with the value of writing, thinks that then test makes mistakes.
Electronic magnetic disc is divided into many with the inner space at present, and each piece comprises many pages or leaves (typically having 32 pages, 64 pages) again, and every page comprises 512 bytes.The inner minimum memory of electronic magnetic disc unit is exactly a page or leaf, so operating system is 512 bytes to the minimum unit of electronic magnetic disc read-write, and for example, the past electronic magnetic disc of operating system is write the data of 1 byte, and these data also can occupy 1 page space.
Electronic magnetic disc causes reading and writing wrong reason in application have, the electronic magnetic disc welding is bad, short or open circuit conditions appear in data line, address wire, control line, and electronic magnetic disc in use may produce bad storage space, cause the actual storage capacity of electronic magnetic disc to reduce.The data bus of different electronic magnetic disc chips has 8,16,32 three kinds, the fault characteristic that the present invention shows when different faults appears in welding according to electronic magnetic disc, with the page or leaf is that unit reads and writes comparison to electronic magnetic disc, realizes address wire, the data line to electronic magnetic disc, the complete test of storage space.
Introduce step of the present invention in detail below in conjunction with process flow diagram:
Here be that example describes detailed implementation step of the present invention with the production fault of the MD2811-D32 chip of M-SYSTEM company and the full test of the fault of chip own.
With reference to accompanying drawing 1, this method of testing is divided into many pages or leaves with electronic magnetic disc inside, and all pages or leaves are arranged P from low to high
1, P
2..., P
N, total page number is N, every page of size is 512 bytes; Execution in step is described as follows in detail:
1, initialization electronic magnetic disc is hung on the CPU processor electronic magnetic disc;
2, the electronic magnetic disc register is carried out readwrite tests, relatively write whether equally,, carry out next step if comparative result is identical with the data of reading;
3, under the prerequisite that the electronic magnetic disc register testing passes through, the format electronic magnetic disc empties institute and has living space, if the format failure is directly withdrawed from testing process, the electronic magnetic disc test crash;
4, under the prerequisite that format is passed through, initialization test use-case array Data1[512] all be 0X55,0X5555 or 0X55555555 (determining) according to concrete data-bus width, initialization array Data2[512] all be 0XAA, 0XAAAA or 0XAAAAAAAA (determining) according to concrete data-bus width; Initialization array Data3[512], Data4[512] all be 0;
5, data line test: referring to accompanying drawing 2, to P
X(X is smaller or equal to N) page or leaf space write data Data1[512], read P again
X512 data in space are to Data3[512], compare Data1[512] and Data3[512], if comparative result is correct; Again to P
YPage or leaf (Y is smaller or equal to N, the space write data Data2[512 of and X ≠ Y)], read P again
Y512 data in space are to Data4[512], compare Data2[512] and Data4[512], if comparative result is correct, then the test of electronic magnetic disc data line is passed through, and carries out next step; If above twice comparative result has the failure phenomenon, then format electronic magnetic disc, directly withdraw from testing process, the electronic magnetic disc test crash.
6, under the prerequisite that the data line test is passed through, carry out the address wire open test, electronic magnetic disc address wire open test process flow diagram as shown in Figure 3;
The test beginning composes initial value 1 for page or leaf sequence number n; Whether judge page or leaf sequence number n less than total page number N, if page or leaf sequence number n is less than total page number N, toward P
nTo P
2nThe page or leaf space write data n of scope, page or leaf sequence number n takes advantage of 2 multiplications, judges that whether page or leaf sequence number n is greater than total page number N, again toward P
nTo P
2nThe page or leaf space write data n of scope, all pages of electronic magnetic disc space has been write in circulation like this.
Then, compose initial value 1 for page or leaf sequence number n; Whether judge page or leaf sequence number n greater than total page number N, if page or leaf sequence number n reads P less than total page number N
nTo P
2nThe data in the page or leaf space of scope, and institute's read data and the data that write are compared, judge comparative result, if the comparative result mistake withdraws from test, the failure of electronic magnetic disc address wire open test; If comparative result is correct, page or leaf sequence number n takes advantage of 2 multiplications, judges that page or leaf sequence number n whether greater than total page number N, reads P again
nTo P
2nThe data in the page or leaf space of scope compare data that read and the data that write, and the data that read all pages of electronic magnetic disc spatial data and write that circulate like this compare.
All read-writes are relatively finished, and comparative result is correct, and then electronic magnetic disc address wire open test passes through, and can carry out following test.
If electronic magnetic disc is then formatd in the failure of address wire open test, directly withdraw from testing process, the electronic magnetic disc test crash.
7, under the prerequisite that the address wire open test passes through, carry out the address wire short-circuit test, address wire short-circuit test process flow diagram as shown in Figure 4;
The test beginning; Compose initial value 1 for page or leaf sequence number n, whether judge page or leaf sequence number n, if page or leaf sequence number n is less than total page number N, toward P greater than total page number N
nPage or leaf space write data 0x55 is toward P
2nPage or leaf space write data 0xAA; Read P
nThe data in page or leaf space are read P
2nThe data in page or leaf space, whether the data in 2 page or leaf spaces of relatively reading equate with the data that write; If comparative result is correct, page or leaf sequence number n takes advantage of 2 multiplications, again toward P
nPage or leaf space write data 0x55 is toward P
2nPage or leaf space write data 0xAA reads this 2 page data that writes again, and relatively whether its data equate with the data that write; Loop test like this, up to page or leaf sequence number n greater than page or leaf sum N.All read-writes are relatively finished, and comparative result is correct, and then electronic magnetic disc address wire short-circuit test passes through.
If electronic magnetic disc is then formatd in the failure of address wire short-circuit test, directly withdraw from testing process, the electronic magnetic disc test crash.
If 8 above tests are all passed through, then whole end of test (EOT), the format electronic magnetic disc empties test data, and the electronic magnetic disc test is passed through.
Describe the process of the reading and writing operation of this method of testing in the above step in detail.In addition; in order to protect electronic magnetic disc, what have has established the Electronic Protection lock to electronic magnetic disc when hardware design, and the method for different its electronic magnetic disc releases of design hardware is different; can operate according to concrete hardware design explanation, but whole method of testing is the same.
This method of testing is applicable to processor systems such as MPC755, MPC82XX, MPC860, ARM, the electronic magnetic disc of different capabilities size, the functional test of electronic hard disc.
Claims (5)
1, a kind of method of testing of electronic magnetic disc comprises, electronic magnetic disc inside is divided into some pages or leaves, and all pages or leaves are arranged from low to high, it is characterized in that, also comprise:
Step 1, electronic magnetic disc is carried out initialization, electronic magnetic disc is hung into processor system;
Step 2, electronic magnetic disc is carried out register testing, if the data that relatively write and read identical, are then tested successfully, enter step 3, otherwise withdraw from testing process, the electronic magnetic disc test crash;
Step 3, electronic magnetic disc is formatd, format is passed through, and then enters step 4, otherwise withdraws from testing process, the electronic magnetic disc test crash;
Step 4, the specific test data of initialization;
Step 5, carry out electronic magnetic disc data line test, test to the different particular data of the space of two pages or leaves of electronic magnetic disc read-write, test is by entering step 6, otherwise withdraws from testing process, the electronic magnetic disc test crash;
Step 6, carry out electronic magnetic disc address wire open test, specific data are write in page or leaf space toward particular range, up to having write all pages or leaves of electronic magnetic disc, read the data of all pages more respectively, compare, if the value that reads equates with the value of writing with writing data, then test is passed through, enter step 7, otherwise withdraw from testing process, electronics is surveyed the looping test failure;
Step 7, carrying out electronic magnetic disc address wire short-circuit test, is that unit carries out the displacement method test with the page or leaf, if test is passed through, then enters step 8, does not survey and does not withdraw from testing process, electronic magnetic disc test crash;
Step 8, all tests are finished, and the format electronic magnetic disc empties test data, withdraws from testing process, and electronic magnetic disc is tested successfully.
2, the method for testing of electronic magnetic disc as claimed in claim 1 is characterized in that:
In the described step 4, the initialization test array is determined Data1[512 according to concrete data-bus width] and Data2[512] initialization value, initialization array Data3[512], Data4[512] initialization value all be 0.
3, the method for testing of electronic magnetic disc as claimed in claim 2 is characterized in that, described step 5 specifically comprises the steps:
(1) to certain page of space write data Data1[512], 512 data that read this page space again are to Data3[512], compare Data1[512] and Data3[512], if comparative result is correct, then carry out step (2);
(2) again to another page space write data Data2[512], 512 data that read this page space again are to Data4[512], compare Data2[512] and Data4[512], if comparative result is correct, then the test of electronic magnetic disc data line is passed through, and carry out step 6;
If above twice comparative result has the failure phenomenon, then format electronic magnetic disc, directly withdraw from testing process, the electronic magnetic disc test crash.
4, the method for testing of electronic magnetic disc as claimed in claim 1 is characterized in that, described step 6 specifically comprises the steps:
(1) test beginning composes initial value 1 for page or leaf sequence number n;
(2) whether judge page or leaf sequence number n greater than total page number N, if page or leaf sequence number n is less than total page number N, toward P
nTo P
2nThe page or leaf space write data n of scope, page or leaf sequence number n takes advantage of 2 multiplications, judges that whether page or leaf sequence number n is greater than total page number N, again toward P
nTo P
2nThe page or leaf space write data n of scope, all pages of electronic magnetic disc space has been write in circulation like this;
(3) compose initial value 1 for page or leaf sequence number n; Whether judge page or leaf sequence number n greater than total page number N, if page or leaf sequence number n reads P less than total page number N
nTo P
2nThe data in the page or leaf space of scope, and institute's read data and the data that write are compared, comparative result is correct, and a page or leaf sequence number n takes advantage of 2 multiplications, judges that page or leaf sequence number n whether greater than total page number N, reads P again
nTo P
2nThe data in the page or leaf space of scope compare data that read and the data that write, and the data that read all pages of electronic magnetic disc spatial data and write that circulate like this compare;
(4) all read-writes are relatively finished, and comparative result is correct, and then electronic magnetic disc address wire open test passes through, and enters step 7;
If electronic magnetic disc is then formatd in above-mentioned open test failure, directly withdraw from testing process, the electronic magnetic disc test crash.
5, the method for testing of electronic magnetic disc as claimed in claim 1 is characterized in that, described step 7 specifically comprises the steps:
(1) test beginning composes initial value 1 for page or leaf sequence number n;
(2) whether judge page or leaf sequence number n greater than total page number N, if page or leaf sequence number n is less than total page number N, toward P
nPage or leaf space write data is toward P
2nPage or leaf space write data; Read P
nThe data in page or leaf space are read P
2nThe data in page or leaf space, whether the data in 2 page or leaf spaces of relatively reading equate with the data that write;
(3) comparative result is correct, and page or leaf sequence number n takes advantage of 2 multiplications, again toward P
nPage or leaf space write data is toward P
2nPage or leaf space write data reads this 2 page data that writes again, and relatively whether its data equate with the data that write;
(4) loop test, up to page or leaf sequence number n greater than page or leaf sum N;
(5) all read-writes are relatively finished, and comparative result is correct, and then electronic magnetic disc address wire short-circuit test passes through;
If electronic magnetic disc is then formatd in above-mentioned open test failure, directly withdraw from testing process, the electronic magnetic disc test crash.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CNB2005101350179A CN100472667C (en) | 2005-12-23 | 2005-12-23 | Method for detecting electronic magnetic disc |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CNB2005101350179A CN100472667C (en) | 2005-12-23 | 2005-12-23 | Method for detecting electronic magnetic disc |
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| Publication Number | Publication Date |
|---|---|
| CN1988043A true CN1988043A (en) | 2007-06-27 |
| CN100472667C CN100472667C (en) | 2009-03-25 |
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|---|---|---|---|
| CNB2005101350179A Expired - Fee Related CN100472667C (en) | 2005-12-23 | 2005-12-23 | Method for detecting electronic magnetic disc |
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Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN100498720C (en) * | 2007-07-16 | 2009-06-10 | 威盛电子股份有限公司 | Formating and testing method |
| CN105302679A (en) * | 2015-11-03 | 2016-02-03 | 惠州Tcl移动通信有限公司 | Detection method and system for intelligent terminal storage stability |
| CN105607975A (en) * | 2015-12-16 | 2016-05-25 | 深圳市迪菲特科技股份有限公司 | Method, device and system for testing disk arrays |
| CN101650976B (en) * | 2008-08-12 | 2016-12-14 | 深圳市朗科科技股份有限公司 | Flash memory management device and method |
-
2005
- 2005-12-23 CN CNB2005101350179A patent/CN100472667C/en not_active Expired - Fee Related
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN100498720C (en) * | 2007-07-16 | 2009-06-10 | 威盛电子股份有限公司 | Formating and testing method |
| CN101650976B (en) * | 2008-08-12 | 2016-12-14 | 深圳市朗科科技股份有限公司 | Flash memory management device and method |
| CN105302679A (en) * | 2015-11-03 | 2016-02-03 | 惠州Tcl移动通信有限公司 | Detection method and system for intelligent terminal storage stability |
| CN105302679B (en) * | 2015-11-03 | 2019-04-30 | 惠州Tcl移动通信有限公司 | A kind of detection method and system of intelligent terminal storage stability |
| CN105607975A (en) * | 2015-12-16 | 2016-05-25 | 深圳市迪菲特科技股份有限公司 | Method, device and system for testing disk arrays |
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| Publication number | Publication date |
|---|---|
| CN100472667C (en) | 2009-03-25 |
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