CN1885054A - Apparatus and method for testing photoelectric characteristic of thermo-optic switch array - Google Patents

Apparatus and method for testing photoelectric characteristic of thermo-optic switch array Download PDF

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Publication number
CN1885054A
CN1885054A CN 200510078610 CN200510078610A CN1885054A CN 1885054 A CN1885054 A CN 1885054A CN 200510078610 CN200510078610 CN 200510078610 CN 200510078610 A CN200510078610 A CN 200510078610A CN 1885054 A CN1885054 A CN 1885054A
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thermo
test
optical switch
port
proving installation
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CN 200510078610
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CN100504419C (en
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李运涛
陈少武
余金中
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Institute of Semiconductors of CAS
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Institute of Semiconductors of CAS
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Abstract

The invention relates to a thermal-optical switch array optical electric property tester, which comprises a microprocessor test control part, a test signal processing circuit, a thermal-optical switch array driving circuit, a speed test port, a tested thermal-optical switch array, detector and ondoscope, wherein the test signal processing circuit via communicating with microprocessor test control part obtains control signal, and inputs the processed test signal to relative thermal-optical switch driving circuit, to change the state of light path. The invention uses computer to control the thermal-optical switch unit of light path in right switch state, to complete the switch function of light path; and it detects the output light power and driving current of each port, to test the characteristic parameters of optical switch array, and the kept speed test port can easily test the switch speed of thermal-optical switch. The invention simplifies the process and improves the testing efficiency.

Description

A kind of photoelectric characteristic of thermo-optic switch array proving installation and method
Technical field
The present invention relates to a kind of testing apparatus of semiconductor photoelectronic device, be meant a kind of photoelectricity test equipment of realizing that multinomial hot light switch feature parameter detects simultaneously especially.
Background technology
Dense wave division multipurpose (DWDM) technology is a kind of effective ways that solve broadband, high capacity optical fiber network communication.Thermo-optical switch is the critical component of structure dwdm system.In the research and production of thermo-optical switch, need a kind of specific checkout equipment, this equipment can detect the various optics of each port of thermo-optical switch and the overall characteristic parameter of electricity simultaneously, can possess higher detection efficient again, also simple to operate simultaneously, be fit to common operator and use.Trade information up to now and open source literature show still do not have the proving installation that satisfies above-mentioned requirements in present existing test mode and the testing apparatus.Mainly there is following defective in currently used test mode: the one, and adopt and utilize tip probe Direct Contact Heating electrode to cause the damage of heating electrode easily; The 2nd, the tip probe will be finished at microscopically with contacting of heating electrode, operation inconvenience and makeing mistakes easily; The 3rd, to finish by artificial calculating the judgement of light path, be not suitable for the test of extensive array of photoswitch; The 4th, test process needs a plurality of expensive precision currents source, and these equipment costs are very high, and also very high to the requirement of test environment.
Summary of the invention
The object of the present invention is to provide a kind of photoelectric characteristic of thermo-optic switch array proving installation, it has the advantage that cost is low, simple to operate, testing efficiency is high.
Designed a kind of photoelectric characteristic of thermo-optic switch array test macro according to above-mentioned purpose, comprise microprocessor/computer testing control section, the test signal treatment circuit, the thermo-optical switch array column drive circuit, the thermo-optic switch array that is connected with driving circuit and velocity test port, the detector array that the thermo-optic switch array output power is measured.Wherein, microprocessor test control section can be PC, utilizes the parallel port communications control software to be connected with test signal level conversion and treatment circuit by strengthening parallel port (EPP parallel port).The test signal treatment circuit is complex programmable gate array (CPLD), links to each other with the thermo-optical switch driving circuit.The thermo-optical switch driving circuit is connected with thermo-optical switch chip heating electrode after the pressure welding by test port.Wherein, the effect of thermo-optical switch driving circuit is to provide the different driving electric current for different thermo-optical switchs unit.Used detector is that the detector number is corresponding with the output port number in order to the detector of reception photoswitch output port luminous power parameter.The velocity test port directly is connected with the thermo-optical switch chip heating electrode of drawing after the pressure welding, can the adjustable square wave driving signal of independent loads size of current.
The present invention by thermo-optical switch control and driving circuit control thermo-optic switch array state, realizes the switching of light path at different passages by computing machine, and the detector of each output port is surveyed the luminous power P of output simultaneously o, the drive current size in the device also can utilize instrument to measure easily simultaneously.The parameter that the present invention detects has contained the normal attribute parameter of thermo-optical switch, as Output optical power with the P that concerns of working current o-I OpCurve, loss and working current concern Loss-I OpCurve, and crosstalk, operating power, switching speed etc.; Once can finish the test of thermo-optical switch normal attribute with an equipment, and simple to operate, improve detection efficiency greatly.
Described microprocessor test control section can be a PC, utilize parallel interface, serial line interface, general-purpose serial bus USB interface, or send the test steering order by industry standard architecture isa bus, peripheral component interconnect pci bus or other special purpose interface.
The test signal that microprocessor sends will be through corresponding level conversion treatment circuit ability input test signal treatment circuit.
Described test signal treatment circuit can be complex programmable gate array (CPLD), comprises order register, command decoder, data register, output data register, on off state storer etc.
Described thermo-optical switch array column drive circuit can be different thermo-optical switchs unit different drive currents is provided, thereby makes each switch element be in best delustring state.
The drive current size that described thermo-optical switch drive current can provide can be regulated.
The velocity test port can the adjustable square wave driving signal of independent loads size of current.
Described detector is that the detector number is corresponding with the output port number in order to the detector of reception photoswitch output port luminous power parameter.
Described thermo-optical switch array is fixed on the special-purpose circuit board when being listed in test, links to each other with driving circuit by extension line after the pressure welding of thermo-optical switch well heater pin.
Described tested thermo-optical switch heater electrode adopts the mode of spun gold or Si-Al wire pressure welding to draw.
Description of drawings
For further specifying content of the present invention and characteristics, below in conjunction with drawings and Examples the present invention is done a detailed description, wherein:
Fig. 1 is the block scheme of proving installation of the present invention.
Fig. 2 is the circuit theory synoptic diagram of one embodiment of the invention.
Fig. 3 is a thermo-optical switch array column drive circuit principle schematic of the present invention.
Fig. 4 is a workflow synoptic diagram of the present invention.
Embodiment
From Fig. 1 as seen, the present invention includes: computing machine 1, level shifting circuit 2, one group of test signal treatment circuit 3, one group of thermo-optical switch array column drive circuit 4, thermo-optic switch array 5, velocity test port 6, one group of detector 7.Described computing machine also can be a single-chip microcomputer, adopts the parallel port connected mode between itself and the test signal treatment circuit, and promptly the test signal treatment circuit is connected with computing machine by the EPP parallel port.Thermo-optic switch array then is placed on the circuit board of special reservation, and the thermo-optical switch well heater links to each other with driving circuit by the interface on the circuit board.
Fig. 2 has provided a kind of embodiment of device shown in Figure 1, is a kind of test circuit that is suitable for 4 * 4 simplification tree type thermo-optic switch arrays.Among the figure, the computer testing control section is finished the instruction manipulation of computing machine to thermo-optic switch array mainly by the interface of computing machine and test signal treatment circuit.Computer testing software has comprised all possible routing iinformation of photoswitch, it sends detecting information by computing machine EPP parallel port to the test signal treatment circuit, and the test signal treatment circuit sends driving command according to the driving circuit of detecting information to the thermo-optical switch unit of correspondence.Comprise eight road level shifting circuits and test signal treatment circuit among the figure.Level shifting circuit is converted into the compatible mutually level of fiduciary level with subordinate's circuit input with the level of different agreement.In this example, finish by eight impact dampers/line drive U1 by EPP parallel port to the level conversion of test signal treatment circuit.The test signal processing section is finished by CPLD in the present invention, comprise order register, command decoder, data register, output data register, on off state storer, and the state of finally selected array of photoswitch, the driving circuit to corresponding thermo-optical switch unit sends driving command.Be input to the detector from the light of each output port output of thermo-optic switch array.
Fig. 3 has provided the schematic diagram of thermo-optical switch array column drive circuit.Come the conducting of controlling and driving triode or end by driving command, thereby provide electric current or power for well heater.Variable resistor R VarConnect with well heater, thereby can change the switch motion that the electric current that flows through well heater changes the temperature of waveguide phase modulation (PM) arm and then realizes the thermo-optical switch unit by regulating variable-resistance size.
Fig. 4 has provided the method for work of the embodiment of the invention.The present invention is when using, and concrete operations should be followed following steps:
1) send out test signal by Control Software control computer EPP parallel port, this test signal has determined array of photoswitch input port and output port; Test signal is imported CPLD after level conversion, CPLD sends driving command according to the state of the selected thermo-optic switch array of test signal and to the driving circuit of the thermo-optical switch of correspondence;
2) according to driving command, the driving triode conducting of corresponding driving circuit or end provides electric current to well heater, regulates the size that corresponding variable-resistance resistance can change drive current successively, monitors the output power of each output port;
3) draw output power with the curve of drive current variations, the pairing electric current of the peak value of output power curve is optimum current;
4) regulate the drive current size that variable-resistance resistance makes each switch element successively and be the optimum drive current value, detect the output power of each output port this moment, by characteristic such as calculate the loss that can obtain array of photoswitch, crosstalk; According to P=I 2R can calculate the thermo-optical switch power consumption;
5) deenergization at the square-wave signal of velocity test port loading current adjustable size, detects the output waveform of corresponding port, can measure the response speed of thermo-optical switch;
6) detect whether do not survey port in addition, if all surveyed, end of test (EOT), otherwise repeat above step.

Claims (11)

1. a photoelectric characteristic of thermo-optic switch array proving installation is characterized in that, this device comprises: microprocessor test control section,
Test signal level conversion and treatment circuit,
The thermo-optical switch array column drive circuit,
The thermo-optic switch array that is connected with driving circuit and velocity test port,
The detector that the thermo-optic switch array output power is measured.
2. proving installation according to claim 1, it is characterized in that, described microprocessor test control section can be a PC, utilize parallel interface, serial line interface, general-purpose serial bus USB interface, or send the test steering order by industry standard architecture isa bus, peripheral component interconnect pci bus or other special purpose interface.
3. proving installation according to claim 1 is characterized in that, the test signal that microprocessor sends will be through corresponding level conversion treatment circuit ability input test signal treatment circuit.
4. proving installation according to claim 1 is characterized in that, described test signal treatment circuit can be the complex programmable gate array, comprises order register, command decoder, data register, output data register, on off state storer etc.
5. proving installation according to claim 1 is characterized in that, described thermo-optical switch array column drive circuit can be different thermo-optical switchs unit different drive currents is provided, thereby makes each switch element be in best delustring state.
6. proving installation according to claim 1 is characterized in that, the drive current size that described thermo-optical switch drive current can provide can be regulated.
7. proving installation according to claim 1 is characterized in that, the velocity test port can the adjustable square wave driving signal of independent loads size of current.
8. proving installation according to claim 1 is characterized in that, described detector is that the detector number is corresponding with the output port number in order to the detector of reception photoswitch output port luminous power parameter.
9. proving installation according to claim 1 is characterized in that, described thermo-optical switch array is fixed on the special-purpose circuit board when being listed in test, links to each other with driving circuit by extension line after the pressure welding of thermo-optical switch well heater pin.
10. proving installation according to claim 1 is characterized in that, described tested thermo-optical switch heater electrode adopts the mode of spun gold or Si-Al wire pressure welding to draw.
11. photoelectric characteristic of thermo-optic switch array proving installation and method, its step is as follows:
1) send out test signal by Control Software control computer EPP parallel port, this test signal has determined array of photoswitch input port and output port; Test signal is imported CPLD after level conversion, CPLD sends driving command according to the state of the selected thermo-optic switch array of test signal and to the driving circuit of the thermo-optical switch of correspondence;
2) according to driving command, the driving triode conducting of corresponding driving circuit or end provides electric current to well heater, regulates the size that corresponding variable-resistance resistance can change drive current successively, monitors the output power of each output port;
3) draw output power with the curve of drive current variations, the pairing electric current of the peak value of output power curve is optimum current;
4) regulate the drive current size that variable-resistance resistance makes each switch element successively and be the optimum drive current value, detect the output power of each output port this moment, by calculating loss, the crosstalk effect that can obtain array of photoswitch; According to P=I 2R can calculate the thermo-optical switch power consumption;
5) deenergization at the square-wave signal of velocity test port loading current adjustable size, detects the output waveform of corresponding port, can measure the response speed of thermo-optical switch;
6) detect whether do not survey port in addition, if all surveyed, end of test (EOT), otherwise repeat above step.
CNB2005100786104A 2005-06-20 2005-06-20 Apparatus and method for testing photoelectric characteristic of thermo-optic switch array Expired - Fee Related CN100504419C (en)

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Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102095901A (en) * 2009-11-09 2011-06-15 株式会社村田制作所 Substrate for use in measuring electric characteristics
CN108008551A (en) * 2017-12-15 2018-05-08 湖北工业大学 A kind of thermo-optical switch and its manufacture method based on SU8 glue
CN110596432A (en) * 2019-09-09 2019-12-20 武汉电信器件有限公司 Test system for multidirectional photoelectric device
CN113176497A (en) * 2021-04-21 2021-07-27 之江实验室 Calibration method for switch unit in integrated optical switching chip
CN115372779A (en) * 2022-08-18 2022-11-22 无锡芯光互连技术研究院有限公司 Method and device for testing working state of thermo-optic switch array

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE19547759A1 (en) * 1995-12-20 1997-06-26 Basf Ag Stabilized hydroxylamine solutions
CA2348121A1 (en) * 2000-05-30 2001-11-30 Nortel Networks Limited Optical switch with connection verification
US6504965B2 (en) * 2000-12-07 2003-01-07 Intel Corporation Method and apparatus for self-testing and maintaining alignment of an optical beam in an optical switch
US6738543B1 (en) * 2002-05-30 2004-05-18 E. I. Du Pont De Nemours And Company Hitless tunable wavelength filters

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102095901A (en) * 2009-11-09 2011-06-15 株式会社村田制作所 Substrate for use in measuring electric characteristics
CN102095901B (en) * 2009-11-09 2013-06-12 株式会社村田制作所 Substrate for use in measuring electric characteristics
US8698514B2 (en) 2009-11-09 2014-04-15 Murata Manufacturing Co., Ltd. Electrical characteristic measuring substrate
CN108008551A (en) * 2017-12-15 2018-05-08 湖北工业大学 A kind of thermo-optical switch and its manufacture method based on SU8 glue
CN110596432A (en) * 2019-09-09 2019-12-20 武汉电信器件有限公司 Test system for multidirectional photoelectric device
CN113176497A (en) * 2021-04-21 2021-07-27 之江实验室 Calibration method for switch unit in integrated optical switching chip
CN113176497B (en) * 2021-04-21 2022-05-27 之江实验室 Calibration method for switch unit in integrated optical switching chip
CN115372779A (en) * 2022-08-18 2022-11-22 无锡芯光互连技术研究院有限公司 Method and device for testing working state of thermo-optic switch array
CN115372779B (en) * 2022-08-18 2024-04-05 无锡芯光互连技术研究院有限公司 Method and device for testing working state of thermo-optical switch array

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