CN1869728A - Aging testing method and device for power-supply device - Google Patents
Aging testing method and device for power-supply device Download PDFInfo
- Publication number
- CN1869728A CN1869728A CN 200610021276 CN200610021276A CN1869728A CN 1869728 A CN1869728 A CN 1869728A CN 200610021276 CN200610021276 CN 200610021276 CN 200610021276 A CN200610021276 A CN 200610021276A CN 1869728 A CN1869728 A CN 1869728A
- Authority
- CN
- China
- Prior art keywords
- power supply
- power
- aging test
- supply equipment
- aging
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 230000032683 aging Effects 0.000 title claims abstract description 58
- 238000012360 testing method Methods 0.000 title claims abstract description 31
- 238000010998 test method Methods 0.000 claims abstract description 13
- 238000009826 distribution Methods 0.000 claims abstract description 7
- 238000009863 impact test Methods 0.000 claims description 16
- 238000002955 isolation Methods 0.000 claims description 10
- 230000000737 periodic effect Effects 0.000 claims description 6
- 238000004891 communication Methods 0.000 claims description 5
- 238000006243 chemical reaction Methods 0.000 claims description 4
- 238000003860 storage Methods 0.000 claims description 2
- 238000004519 manufacturing process Methods 0.000 abstract description 2
- 238000000034 method Methods 0.000 abstract 2
- 230000006870 function Effects 0.000 description 5
- 208000033999 Device damage Diseases 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000005265 energy consumption Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 230000017525 heat dissipation Effects 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
Images
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
Abstract
The invention relates to power supply technique, especially relating to power supply device ageing test, providing a power supply device ageing test method and device. And its technical solution: the method makes ON and OFF surge test on the power supply device in the ageing test course. And the ageing test device comprises distribution cabinet and power load cabinet, and switch controller, where the switch controller is connected with the power load cabinet to control the power supply of the power load cabinet. And it can detect abilities of components to resist ON surge current; and raise utilization ratio of the ageing test device and save production cost.
Description
Technical Field
The invention relates to a power supply technology, in particular to an aging test of power supply equipment.
Background
In the power supply equipment test, the reliability of the power supply equipment is checked through a high-temperature full-load aging test, and early failure devices are removed. The traditional aging test device comprises a power distribution cabinet and a power load cabinet, during test, power supply equipment is connected with a power load unit in the power load cabinet, and the power distribution cabinet provides power for the power supply equipment. The power load unit generally uses a resistance load, and is adjusted according to the output voltage and the output power of the power supply equipment, so that the power supply equipment is placed in a full-load working state, and continuous high-temperature aging is carried out for a plurality of hours after the setting is finished. Because the high-temperature aging needs to keep constant high temperature for a long time, the energy consumption causes the work operation cost of the aging chamber to be very high, the utilization rate of the aging chamber is improved, and the cost can be well saved. For an aging device using a resistance load, in order to solve the heat dissipation problem in the aging process, a tester has to reduce the placement density of power supply equipment, so that the utilization rate of the aging test device is reduced. In addition, the harsh degree of high-temperature aging is increased, the aging time can be shortened, the utilization rate of an aging chamber is improved, and the cost is saved.
Furthermore, a power circuit, especially a switching power circuit, has a large inductance and a large capacitance, and a power device using a high voltage and a large current generates a large inrush current at the moment of switching on and off, and the inrush current is one of the main causes of device damage. In the traditional aging test method, after the power supply equipment is started and aged, the power supply equipment is shut down until the aging is finished, and the surge resistance of the power supply equipment cannot be effectively tested without detecting the on-off impact resistance of the power supply equipment.
Disclosure of Invention
The invention aims to solve the technical problems that the existing aging test method is low in device utilization rate and high in operation cost, and provides a power supply equipment aging test method and device, which can improve the utilization rate of the aging test device and reduce the operation cost.
The invention solves the technical problem and adopts the technical scheme that the power supply equipment aging test method is characterized in that the power supply equipment is subjected to a power on/off impact test in the power supply equipment aging test.
The power supply equipment aging test device comprises a power distribution cabinet and a power load cabinet, and is characterized by also comprising a startup and shutdown controller; the power on/off controller is connected with the power load cabinet and controls the power supply of the power load cabinet.
The invention has the advantages that the power supply device has an automatic power on/off impact control function, and performs power on/off impact on the power supply in the aging process of power supply equipment, thereby improving the harsh grade of power supply aging and effectively detecting the capability of components for resisting power on surge current; when the power supply equipment is aged, the power supply equipment is in an intermittent working state, the resistance load has low heat productivity, the placing density of the power supply equipment can be increased, the utilization rate of the aging test device is improved, and the production cost is saved.
Drawings
FIG. 1 is a schematic structural view of the present invention;
FIG. 2 is a schematic view of the embodiment;
FIG. 3 is a timing chart of an operating state of a power supply apparatus in a burn-in test;
FIG. 4 is a power state indication circuit of an embodiment.
Detailed Description
The technical solution of the present invention is described in detail below with reference to the accompanying drawings and embodiments.
According to the aging test method of the power supply equipment, the power supply equipment is subjected to on-off impact while the aging test is carried out, so that the harsh grade of the aging test is increased, the impact resistance of the power supply equipment is tested, and the heat productivity of a resistance load is reduced; not only can the aging time be shortened, but also the placing density of the power supply equipment can be increased.
The technical scheme of the invention is that the power supply equipment aging test method is characterized in that in the power supply equipment aging test, a power on/off impact test is carried out on the power supply equipment;
specifically, the power on/off impact test is a random power on/off impact test;
or the power on/off impact test is a periodic power on/off impact test;
the specific periodic startup and shutdown impact test comprises the following steps:
a. when the aging test time of the power supply equipment reaches t1, the power supply of the power supply equipment is turned off;
b. turning on the power of the power supply apparatus after time t 2;
c. turning off the power of the power supply apparatus at the elapsed time t 3;
d. returning to the step b for N times of circulation;
e. returning to the step a, and performing the next cycle;
further, the on-off interval time is equal, i.e., t2 is t 3;
the switch power supply aging test device comprises a power distribution cabinet and a power load cabinet, and is characterized by further comprising a switch machine controller; the power on/off controller is connected with the power load cabinet and controls the power supply of the power load cabinet;
specifically, the switch controller comprises a singlechip control unit, a memory unit, a driving isolation unit and a power execution unit; the storage unit and the drive isolation unit are connected with the single chip microcomputer control unit, the drive isolation unit is connected with the power execution unit, and the power execution unit is connected with the power load cabinet; wherein,
the singlechip control unit is used for operating a control program and outputting a control instruction to realize a master control function;
the driving isolation unit comprises a photoelectric isolator and a relay and is used for driving the power execution unit and isolating the alternating-current high voltage, so that the safety of operators and equipment is ensured, and the driving function and the isolation function are realized;
the power execution unit is connected with the power alternating-current power supply and the load cabinet, so that the functions of power supply up and power supply down of the alternating-current power supply of the power supply equipment are realized.
Further, the switch controller is also provided with a computer communication unit, and the computer communication unit is connected with the single chip microcomputer through an RS232 level conversion circuit.
Figure 1 shows the aging apparatus of the present invention. The power supply equipment is placed in the power load cabinet, each power supply equipment is connected with a corresponding socket on the power load cabinet, and the voltage output end of each power supply equipment is connected with the resistive load. The alternating current output by the power distribution cabinet is connected to the power load cabinet through the on-off controller to supply power to the power supply equipment. Through the power on/off controller, the power supply socket of each power supply device can be controlled, and the power on/off impact test is added during the aging test of the power supply devices.
Examples
The block diagram of the switching controller of this example is shown in fig. 2. The startup and shutdown controller of the embodiment comprises a singlechip control unit, a memory unit, a drive isolation unit and a power execution unit. The single chip microcomputer control unit is formed by taking a single chip microcomputer (89S52) as a core, the driving isolation unit comprises a photoelectric isolator and a relay, and the power execution unit is an alternating current contactor. The singlechip runs the program in the memory, outputs a control instruction, drives the relay to act through the photoelectric isolator, and the relay drives the alternating current contactor to control the power supply of the power socket on the power load cabinet, so that the on-off control of the power supply equipment is realized. According to different power supply equipment aging requirements, the control instruction can be a random on-off control instruction so as to carry out a random on-off impact test on the power supply equipment; or a periodic on-off control instruction to perform a periodic on-off impact test on the power supply equipment.
As can be seen from fig. 2, the power on/off controller of this embodiment further includes a computer communication unit formed by a computer interface and an RS232 level conversion circuit. The single chip microcomputer can receive instructions output by a computer through an RS232 level conversion circuit and update a control program. The download interface in fig. 2 is used for downloading, updating programs, or performing remote control through a network.
For example, a test configuration requiring port number 15 is as follows:
the total aging time of the power supply is 24 hours, and one round of power on and off impact is carried out every 7 hours, and 20 times are carried out in each round. The power-on time is 3 seconds, the power-off time is 3 seconds, and the configuration time sequence chart is shown in fig. 3. If the test parameters for the port have been set, then the state of the port may be set to up.
After the configuration of the startup and shutdown controller is completed, an operator places power supply equipment in the power load cabinet, switches on the alternating current power supply, and enters a normal aging program. The power supply equipment of the embodiment has + 5.5V; + 12V; -12V; -48V four sets of voltage outputs. FIG. 4 shows a power state indicating circuit, wherein four groups of voltages respectively drive opto-couplers N1-N4 through resistors R1-R4. The indicator light L is driven by +5.5V voltage through the resistor R5 and four optical couplers connected in series, and the indicator light L can be extinguished when any voltage is lower than a specified value. The operator visually observes the indicator light L, and if the indicator light L is turned off, the power supply is indicated to be in fault. And in the aging process, the on-off controller automatically operates according to the configuration parameters, after aging for 7 hours, the on-off controller starts to operate for 3 seconds and turns off for 3 seconds, and after 20 times, the normal aging is continuously carried out. After the next 7 hours, the on-off test is carried out again, and the operation is repeated, if the total aging time is 24 hours, 3 turns of 60 on-off impacts exist in the middle.
Claims (8)
1. The power supply equipment aging test method is characterized in that in the power supply equipment aging test, a power on/off impact test is carried out on the power supply equipment.
2. The power supply apparatus aging test method according to claim 1, wherein the on-off impact test is a random on-off impact test.
3. The power supply apparatus aging test method according to claim 1, wherein the on-off impact test is a periodic on-off impact test.
4. The power supply apparatus aging test method according to claim 3, wherein the periodic on/off impact test includes the steps of:
a. when the aging test time of the power supply equipment reaches t1, the power supply of the power supply equipment is turned off;
b. turning on the power of the power supply apparatus after time t 2;
c. turning off the power of the power supply apparatus at the elapsed time t 3;
d. returning to the step b for N times of circulation;
e. and returning to the step a, and performing the next round of circulation.
5. The power supply apparatus aging test method according to claim 4, wherein t2 is t 3.
6. The switch power supply aging test device comprises a power distribution cabinet and a power load cabinet, and is characterized by also comprising a switch machine controller; the power on/off controller is connected with the power load cabinet and controls the power supply of the power load cabinet.
7. The switching power supply aging test device according to claim 6, wherein the switching controller comprises a single chip microcomputer control unit, a memory unit, a drive isolation unit and a power execution unit; the storage unit and the drive isolation unit are connected with the single chip microcomputer control unit, the drive isolation unit is connected with the power execution unit, and the power execution unit is connected with the power load cabinet.
8. The switching power supply aging test device of claim 7, wherein the switching controller further comprises a computer communication unit, and the computer communication unit is connected with the singlechip control unit through an RS232 level conversion circuit.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 200610021276 CN1869728A (en) | 2006-06-27 | 2006-06-27 | Aging testing method and device for power-supply device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 200610021276 CN1869728A (en) | 2006-06-27 | 2006-06-27 | Aging testing method and device for power-supply device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN1869728A true CN1869728A (en) | 2006-11-29 |
Family
ID=37443441
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN 200610021276 Pending CN1869728A (en) | 2006-06-27 | 2006-06-27 | Aging testing method and device for power-supply device |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN1869728A (en) |
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103323048A (en) * | 2013-05-28 | 2013-09-25 | 郑州精益达汽车零部件有限公司高新区分公司 | Automobile instrument panel dynamic aging system under high temperature |
| CN103345166A (en) * | 2013-05-29 | 2013-10-09 | 厦门光莆电子股份有限公司 | Ultralow frequency electrical aging controller |
| CN103389458A (en) * | 2012-05-11 | 2013-11-13 | 四川优的科技有限公司 | Testing system for fuel switch |
| CN105866604A (en) * | 2016-06-22 | 2016-08-17 | 重庆长安汽车股份有限公司 | Automatic on/off testing system and method |
| CN106771914A (en) * | 2016-12-13 | 2017-05-31 | 深圳市沃特玛电池有限公司 | A kind of method of testing and device |
| CN109726058A (en) * | 2018-12-30 | 2019-05-07 | 联想(北京)有限公司 | Detection method, device and computer equipment |
-
2006
- 2006-06-27 CN CN 200610021276 patent/CN1869728A/en active Pending
Cited By (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103389458A (en) * | 2012-05-11 | 2013-11-13 | 四川优的科技有限公司 | Testing system for fuel switch |
| CN103323048A (en) * | 2013-05-28 | 2013-09-25 | 郑州精益达汽车零部件有限公司高新区分公司 | Automobile instrument panel dynamic aging system under high temperature |
| CN103323048B (en) * | 2013-05-28 | 2015-08-19 | 郑州精益达汽车零部件有限公司高新区分公司 | Automobile instrument panel dynamic burn-in systems under high temperature |
| CN103345166A (en) * | 2013-05-29 | 2013-10-09 | 厦门光莆电子股份有限公司 | Ultralow frequency electrical aging controller |
| CN103345166B (en) * | 2013-05-29 | 2015-09-30 | 厦门光莆电子股份有限公司 | Ultralow frequency voltage ageing controller |
| CN105866604A (en) * | 2016-06-22 | 2016-08-17 | 重庆长安汽车股份有限公司 | Automatic on/off testing system and method |
| CN105866604B (en) * | 2016-06-22 | 2019-06-28 | 重庆长安新能源汽车科技有限公司 | A kind of automatic switching test system and method |
| CN106771914A (en) * | 2016-12-13 | 2017-05-31 | 深圳市沃特玛电池有限公司 | A kind of method of testing and device |
| CN109726058A (en) * | 2018-12-30 | 2019-05-07 | 联想(北京)有限公司 | Detection method, device and computer equipment |
| CN109726058B (en) * | 2018-12-30 | 2021-02-19 | 联想(北京)有限公司 | Detection method and device and computer equipment |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN1869728A (en) | Aging testing method and device for power-supply device | |
| CN113933677B (en) | SiC MOSFET device grid aging monitoring circuit and online monitoring method | |
| CN203465392U (en) | Automatic computer motherboard test system | |
| CN103412203B (en) | Motor variable-frequency driver ageing tester and method of testing thereof | |
| CN106294043A (en) | Method for testing automatic startup and shutdown | |
| CN205539356U (en) | Big power semiconductor switching element testing arrangement | |
| CN107942241B (en) | Test circuit for high-voltage direct-current breaker submodule | |
| CN201110878Y (en) | Aging test system | |
| CN102565591B (en) | Automatic testing device for frequency converter power board | |
| CN111983546A (en) | Ammeter detection configuration device and method | |
| CN111722117A (en) | Automatic test method and system suitable for vehicle fuel cell | |
| CN102998630A (en) | Automatic testing device and method of power module | |
| CN202929167U (en) | Testing device for diagnosing and testing circuit board in electric drive device | |
| CN102721929B (en) | A kind of battery discharge testing apparatus and method | |
| CN110764000B (en) | Motor reliability test device, control method and system | |
| CN102508064A (en) | Electrical equipment fault diagnosis method, equipment, system and engineering machinery | |
| CN208140914U (en) | A kind of electric energy meter aging apparatus for impact testing | |
| CN202956473U (en) | Quality detection circuit of motor drive plate | |
| CN103487768A (en) | System and method for lamp batch aging and detection | |
| CN203084104U (en) | OTP burning and upper/lower-limit voltage detecting system of liquid crystal display module | |
| CN1779472A (en) | Multiple frequency-converter ageing tester and testing method thereof | |
| CN201886091U (en) | Tester of frequency converter | |
| CN211402666U (en) | 6KV frequency converter low-voltage complete machine test circuit | |
| CN111856196B (en) | Automatic test system and method for switching product input power supply without power failure | |
| CN207037403U (en) | A kind of smart electronicses contactor for automobile starter |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| C12 | Rejection of a patent application after its publication | ||
| RJ01 | Rejection of invention patent application after publication |
Application publication date: 20061129 |