CN1858632A - Method and device for accurately determining optical system focus plane by interferometer - Google Patents
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Abstract
一种采用干涉仪精确确定光学系统聚焦面的方法和装置,适用于对有限焦距的光学系统装调和检测。本发明的工作原理是将激光干涉仪发射的标准光通过被测光学系统后,使光反射回干涉仪。而且利用干涉仪易于在其“猫眼”位置得到干涉条纹的道理,确定光学系统的聚焦面。由于本发明利用了激光干涉仪的检测光,显著提高了光学系统聚焦面的定位精度。本发明可以实现照相物镜、显微镜、投影仪物镜、幻灯机物镜、电影放映物镜等光学系统的精密装调和检测,精确确定其聚焦面。可以显著提高装调和检测的精度,而且易于实施,易于调整,有效地解决了确定光学系统聚焦面的盲目性。
A method and device for accurately determining the focal plane of an optical system using an interferometer, which is suitable for the assembly and detection of an optical system with a limited focal length. The working principle of the present invention is to reflect the standard light emitted by a laser interferometer back to the interferometer after passing it through the optical system to be measured. In addition, the principle that the interference fringes can be easily obtained at the "cat's eye" position of the interferometer is used to determine the focal plane of the optical system. Since the present invention utilizes the detection light of the laser interferometer, the positioning accuracy of the focal plane of the optical system is significantly improved. The present invention can realize the precise assembly and detection of optical systems such as photographic objective lenses, microscopes, projector objective lenses, slide projector objective lenses, and movie projection objective lenses, and accurately determine their focal planes. The accuracy of assembly and detection can be significantly improved, and it is easy to implement and adjust, which effectively solves the blindness of determining the focal plane of the optical system.
Description
技术领域technical field
本发明涉及光学系统的测量,特别是一种干涉仪精确确定光学系统聚焦面的方法和装置。The invention relates to the measurement of an optical system, in particular to a method and a device for accurately determining the focal plane of an optical system by an interferometer.
技术背景technical background
随着科学技术的发展与计算机技术的提高,对光学系统的要求越来越高,因而对各种光学元件的要求也越来越高,干涉检测随之得到不断提高。现在干涉仪的测量精度在不断提高,并在光学装调中得到了越来越广泛的应用。With the development of science and technology and the improvement of computer technology, the requirements for optical systems are getting higher and higher, so the requirements for various optical components are also getting higher and higher, and interference detection has been continuously improved accordingly. Now the measurement accuracy of the interferometer is constantly improving, and it has been more and more widely used in optical adjustment.
为了提高光学系统精度,不少专利涉及组装光学系统,例如CN00130721.5,CN200420012162.9,CN99251361.8。CN00130721.5用光谱仪装调光学系统,装调过程中需要用其他波长的光,且不能确定系统的焦面;CN200420012162.9中包括了太多的元件,装调人员的经验显得更为重要,系统难以实施装调;CN99251361.8中涉及装调聚焦面,但还需依靠高精度机械加工,并缺乏通用性。In order to improve the precision of the optical system, many patents relate to assembling the optical system, such as CN00130721.5, CN200420012162.9, CN99251361.8. CN00130721.5 uses a spectrometer to install and adjust the optical system. Light of other wavelengths is needed during the installation and adjustment process, and the focal plane of the system cannot be determined; CN200420012162.9 includes too many components, and the experience of the adjustment personnel is more important. The system is difficult to install and adjust; CN99251361.8 involves adjusting the focus plane, but it still needs to rely on high-precision machining and lacks versatility.
发明内容Contents of the invention
本发明要解决的技术问题在于克服上述现有技术的不足,提供一种采用干涉仪精确确定光学系统聚焦面的方法和装置,适用于对有限焦距的光学系统的装调和检测,以提高待测光学系统的装配精度和焦长测量精度。The technical problem to be solved by the present invention is to overcome the deficiencies of the above-mentioned prior art, and provide a method and device for accurately determining the focal plane of an optical system using an interferometer, which is suitable for the assembly and detection of an optical system with a limited focal length, so as to improve the Assembly accuracy and focal length measurement accuracy of the optical system.
为了达到上述目的及其相关目的,本发明的工作原理是将干涉仪发射的标准光通过被测光学系统后,使光反射回干涉仪。而且利用干涉仪易于在其“猫眼”位置得到干涉条纹的道理,确定光学系统的聚焦面。In order to achieve the above and related purposes, the working principle of the present invention is to reflect the standard light emitted by the interferometer back to the interferometer after passing through the measured optical system. Moreover, it is easy to obtain interference fringes at the "cat's eye" position of the interferometer to determine the focal plane of the optical system.
本发明的技术解决方案如下:Technical solution of the present invention is as follows:
一种采用干涉仪精确确定光学系统聚焦面的方法,其特征在于该方法包括下列步骤:A method for accurately determining the focal plane of an optical system using an interferometer, characterized in that the method includes the following steps:
(1)选用Fizeau激光干涉仪作为确定光学系统聚焦面的检测仪器,该干涉仪的标准面与被测光学系统相匹配;(1) Fizeau laser interferometer is selected as the detection instrument for determining the focal plane of the optical system, and the standard plane of the interferometer matches the optical system under test;
(2)将所述的激光干涉仪发射的检测光束入射到待测测光学系统,调整所述的激光干涉仪的出射光中心与待测测光学系统的中心重合;继续调整待测光学系统使光束会聚光斑为最小;(2) The detection beam emitted by the laser interferometer is incident on the optical system to be measured, and the center of the outgoing light of the laser interferometer is adjusted to coincide with the center of the optical system to be measured; continue to adjust the optical system to be measured so that The beam spot is the smallest;
(3)在所述的待测光学系统后加入一个标准反射镜,使光束沿原光路返回光学系统,再返回所述的激光干涉仪;(3) add a standard reflector after described optical system to be measured, make light beam return optical system along original optical path, return described laser interferometer again;
(4)调整所述的标准反射镜,并微调待测测光学系统,使所述的激光干涉仪产生干涉条纹,并使所述的激光干涉仪测得的被测光学系统的离焦量为最小;(4) Adjust the standard reflector, and fine-tune the optical system to be measured, so that the laser interferometer produces interference fringes, and the defocus of the optical system to be measured by the laser interferometer is minimum;
(5)在所述的激光干涉仪出射光后任意一个光束聚焦点位置插入一平面反射镜,该平面反射镜的反射面与一调整架的基准面重合,调整所述的调整架的位置,使该平面反射镜的反射光返回所述的激光干涉仪内,产生干涉条纹,并使离焦量最小,此处即为“猫眼”位置,取走所述的平面反射镜,则所述的调整架的基准面就是所述的待测光学系统的聚焦面。(5) Insert a plane reflector at any one beam focal point position behind the laser interferometer outgoing light, the reflective surface of the plane reflector coincides with the datum plane of an adjustment mount, adjust the position of the adjustment mount, Make the reflected light of the plane mirror return to the laser interferometer to generate interference fringes and minimize the defocus amount, which is the "cat's eye" position here. If the plane mirror is removed, the The reference plane of the adjustment frame is the focal plane of the optical system to be tested.
一种采用激光干涉仪精确确定光学系统聚焦面的装置,其特征在于包括一台激光干涉仪,在该激光干涉仪的出射光路上同光轴地设有一具有基准面的调整架、一块平面反射镜和一块与待测光学系统相匹配的标准反射镜,所述的平面反射镜置于所述的调整架的基准面上,所述的平面反射镜的反射面垂直于所述的光轴。A device for accurately determining the focal plane of an optical system using a laser interferometer is characterized in that it includes a laser interferometer, and an adjustment frame with a reference plane and a plane reflector are arranged coaxially on the exit light path of the laser interferometer mirror and a standard mirror matching the optical system to be tested, the plane mirror is placed on the reference plane of the adjustment frame, and the reflection surface of the plane mirror is perpendicular to the optical axis.
所述的激光干涉仪发射的相干光以平行方式、或以一定的发散角、或以一定的会聚角入射到被测光学系统中。The coherent light emitted by the laser interferometer is incident into the optical system under test in a parallel manner, or at a certain divergence angle, or at a certain convergence angle.
所述的被测光学系统是折射式光学系统、或反射式光学系统、或折反射式光学系统。The measured optical system is a refractive optical system, or a reflective optical system, or a catadioptric optical system.
所述的块标准反射镜的反射面为平面或球面。The reflective surface of the block standard reflector is a plane or a spherical surface.
本发明的技术效果:Technical effect of the present invention:
采用本发明显著提高了待测光学系统聚焦面的定位精度,并且使整个系统的装调精度和检测精度得到提高。这种确定聚焦面的结构易于实施,易于调整,有效地解决了确定光学系统聚焦面的盲目性。能够有效的提高照相物镜、显微镜、投影仪物镜、幻灯机物镜、电影放映物镜和其他光学系统的装调精度,精确确定其聚焦面。本发明不仅适用于光学系统聚焦面的精确定位,而且适用于精确确定光学系统的焦点位置以及精确测量光学系统的焦长,还可以检测出光学系统的装调情况及其残余像差。By adopting the invention, the positioning accuracy of the focal plane of the optical system to be tested is significantly improved, and the assembly accuracy and detection accuracy of the whole system are improved. This structure for determining the focal plane is easy to implement and easy to adjust, effectively solving the blindness of determining the focal plane of the optical system. It can effectively improve the adjustment accuracy of photographic objective lenses, microscopes, projector objective lenses, slide projector objective lenses, movie projection objective lenses and other optical systems, and accurately determine their focal planes. The invention is not only applicable to the precise positioning of the focal plane of the optical system, but also to precisely determining the focal position of the optical system and measuring the focal length of the optical system, as well as detecting the adjustment of the optical system and its residual aberration.
本发明所采用的干涉仪发射出相干光束并入射到被测光学系统中,具有灵敏地反映光学系统像差的能力。The interferometer adopted in the invention emits coherent light beams and is incident into the measured optical system, and has the ability to sensitively reflect the aberration of the optical system.
本发明所描述的被测光学系统是折射式光学系统,或是反射式光学系统,或是折反射式光学系统。该光学系统具有有限的焦距。The measured optical system described in the present invention is a refractive optical system, or a reflective optical system, or a catadioptric optical system. This optical system has a finite focal length.
附图说明Description of drawings
图1为本发明精确确定光学系统的聚焦面方法和装置的基本工作原理图,平面反射镜在聚焦点位置Fig. 1 is the basic working principle diagram of the method and device for accurately determining the focal plane of the optical system in the present invention, and the plane reflector is at the focal point position
图2(a)和2(b)为本发明精确确定光学系统的聚焦面方法和装置实施例1结构原理示意图Figures 2(a) and 2(b) are schematic diagrams of the structure and principle of Embodiment 1 of the method and device for accurately determining the focal plane of the optical system according to the present invention
图3(a)和3(b)为本发明精确确定光学系统的聚焦面方法和装置实施例2结构原理示意图Figure 3(a) and 3(b) are schematic diagrams of the structural principles of
图4(a)、4(b)和4(c)为本发明精确确定光学系统的聚焦面方法和装置实施例3结构原理示意图Figures 4(a), 4(b) and 4(c) are schematic diagrams of the structural principle of
图5为本发明精确确定光学系统的聚焦面方法和装置实施例4结构原理示意图Fig. 5 is a schematic diagram of the structural principle of Embodiment 4 of the method and device for accurately determining the focal plane of the optical system in the present invention
图6为本发明精确确定光学系统的聚焦面方法和装置实施例5结构原理示意图Fig. 6 is a schematic diagram of the structural principle of
图7为本发明精确确定光学系统的聚焦面方法和装置实施例6结构原理示意图Fig. 7 is a schematic diagram of the structural principle of
具体实施方式Detailed ways
下面结合实施例和附图对本发明作进一步说明,但不应以此限制本发明的保护范围。The present invention will be further described below in conjunction with the embodiments and accompanying drawings, but the protection scope of the present invention should not be limited thereby.
先请参阅图1,图1说明了精确确定光学系统的聚焦面方法和装置的基本工作原理。由图可见,本发明采用干涉仪精确确定光学系统聚焦面的方法,其特征在于该方法包括下列步骤:Please refer to FIG. 1 first. FIG. 1 illustrates the basic working principle of the method and device for accurately determining the focal plane of the optical system. As can be seen from the figure, the present invention uses an interferometer to accurately determine the method for the focal plane of an optical system, which is characterized in that the method includes the following steps:
(1)选用Fizeau激光干涉仪1做为确定光学系统2聚焦面的检测仪器,该干涉仪的标准面与被测光学系统2相匹配;(1) Select the Fizeau laser interferometer 1 as the detection instrument for determining the focal plane of the
(2)将所述的激光干涉仪1发射的检测光束入射到被测光学系统2,调整所述的激光干涉仪1的出射光中心与被测光学系统2的中心重合;继续调整待测光学系统2,使光束会聚光斑为最小;(2) The detection beam emitted by the laser interferometer 1 is incident on the measured
(3)在所述的待测光学系统2后加入一个标准反射镜3,使光束沿原光路返回光学系统2,再返回所述的激光干涉仪1;(3) add a
(4)调整所述的标准反射镜3,并微调被测光学系统2,使激光干涉仪1上产生干涉条纹,并使所述的激光干涉仪1测得的被测光学系统2的离焦量为最小;(4) Adjust the
(5)在所述的激光干涉仪1出射光后任意一个光束聚焦点位置插入一平面反射镜4,该平面反射镜4的反射面与一调整架5的基准面6重合,调整所述的调整架5的位置,使该平面反射镜4的反射光返回所述的激光干涉仪1内,产生干涉条纹,并使离焦量最小,此处即为“猫眼”位置,取走所述的平面反射镜4,则所述的调整架5的基准面6就是所述的待测光学系统2的聚焦面。(5) Insert a plane reflector 4 at any one of the focal point positions of the light beam after the laser interferometer 1 emits light, the reflective surface of the plane reflector 4 coincides with the
一种采用激光干涉仪精确确定光学系统聚焦面的装置,其特征在于包括一台激光干涉仪1,在该激光干涉仪1的出射光路上同光轴地设有一具有基准面6的调整架5、一块平面反射镜4和一块与待测光学系统2相匹配的标准反射镜3,所述的平面反射镜4置于所述的调整架5的基准面6上,所述的平面反射镜4的反射面垂直于所述的光轴。A device for accurately determining the focal plane of an optical system using a laser interferometer, characterized in that it includes a laser interferometer 1, and an
所述的激光干涉仪1发射的相干光以平行方式、或以一定的发散角、或以一定的会聚角入射到被测光学系统2中。The coherent light emitted by the laser interferometer 1 is incident into the
所述的被测光学系统2是折射式光学系统、或反射式光学系统、或折反射式光学系统。The measured
所述的块标准反射镜3的反射面为平面或球面。The reflective surface of the block
从激光干涉仪1发出的相干光束7,入射到被测光学系统2中,并使光束会聚在光学系统2的聚焦面6上。在光学系统的出射光束后加入一个标准的球面反射镜3,使出射光束沿原光路8反射回去,在激光干涉仪1中产生干涉条纹,调整光路使离焦量最小。激光干涉仪1出射光束后面的所有光束聚焦位置都可认为是“猫眼”。在任意一个“猫眼”位置插入一个带有基准面6调整架5的平面反射镜4,并使平面反射镜4在调整架5的基准面6上。调整调整架5,使平面反射镜4将光束7沿光路9返回干涉仪内,产生“猫眼”处的干涉条纹,并使离焦量最小。取走平面反射镜4,则调整架的基准面6就是待测光学系统的聚焦面。The
图2(a)和2(b)为本发明精确确定光学系统聚焦面方法和装置的实施例1结构原理示意图。在图2(a)中,从干涉仪1发出的相干光束7是平行光,入射到被测光学系统2中,在光学系统2的出射光束7后加入一个标准反射镜3为凹面的球面反射镜,使出射光束7沿原光路8反射回去,在激光干涉仪1中可以得到干涉条纹,调整光路使系统的像差最小。在图2(b)中,在该被测光学系统2和标准凹面球面反射镜3之间的“猫眼”位置插入一块平面反射镜4,该平面反射镜4置于调整架5上,使所述的平面反射镜4的反射平面与所述的基准面6重合。调整调整架5,使平面反射镜4将光束7沿光路9返回干涉仪内,产生干涉条纹,并使离焦量最小。取走平面反射镜4,则调整架的基准面6就是待测光学系统2的聚焦面。这个聚焦面也就是光学系统的焦平面。通过测得光学系统的入瞳大小,已知标准球面波反射镜的相对孔径,即可得到系统的焦长。2(a) and 2(b) are schematic diagrams of the structural principle of Embodiment 1 of the method and device for accurately determining the focal plane of an optical system according to the present invention. In Fig. 2(a), the
图3(a)和3(b)为本发明精确确定光学系统聚焦面方法和装置的实施例2结构原理示意图。在图3(a)中,会聚点在光学系统前焦面上。实施过程与实例1类似。只是从激光干涉仪1发出的相干光束7是会聚光,先会聚于光学系统2的前聚焦面上,出射光是平行光,被一个标准平面反射镜14沿原光路8反射回去。该被测光学系统2的前聚焦面“猫眼”位置如图3(b)中所示,在该位置上确定了光学系统的聚焦面。3(a) and 3(b) are schematic diagrams of the structural principle of
图4(a)、4(b)和4(c)为本发明精确确定光学系统聚焦面方法和装置的实施例3结构原理示意图。在图4(a)中,在光学系统前后各有一个会聚点。实施过程与实例1和实例2类似。从干涉仪1发出的相干光束7首先会聚于光学系统的前聚焦面,入射到被测光学系统2后,又会聚于后聚焦面上。在光学系统的出射光束后加入一个标准反射镜3为凹面球面反射镜,使出射光束沿原光路8反射回去。该被测光学系统2的后聚焦面“猫眼”位置如图4(b)中所示,在该位置上确定了光学系统2的后聚焦面。在确定了后聚焦面后,还可以在该被测光学系统2的前聚焦面“猫眼”位置插入一个带有基准面12和调整架11的平面反射镜10。调整调整架11,使平面反射镜10将光束7沿光路13返回干涉仪内,产生干涉条纹,并使离焦量最小。如图4(c)中所示,在该位置上确定了光学系统的前聚焦面,这样就同时确定了光学系统的前后两个共轭聚焦面。4(a), 4(b) and 4(c) are schematic structural diagrams of
图5为本发明精确确定光学系统聚焦面方法和装置的实施例4结构原理示意图。在图5中,本发明的标准反射镜为凸面反射镜15,这就要求在确定其聚焦面时,首先将凸面反射镜15取走,然后在该被测光学系统2的后聚焦面“猫眼”位置插入一个带有基准面6调整架5的平面反射镜4,在该位置上确定光学系统的聚焦面。Fig. 5 is a schematic diagram of the structure and principle of Embodiment 4 of the method and device for accurately determining the focal plane of an optical system according to the present invention. In Fig. 5, the standard reflector of the present invention is
图6为本发明精确确定光学系统聚焦面方法和装置的实施例5结构原理示意图。在图6中,本发明的被测光学系统是由多个系统组成,有多个聚焦面,如聚焦面6、聚焦面18、聚焦面19等,在聚焦面位置可插入一个带有基准面调整架的平面反射镜,这样就在相应位置上确定了光学系统的聚焦面。Fig. 6 is a schematic diagram of the structure and principle of
精确调整光学系统和确定光学系统的焦长:Precisely adjust the optical system and determine the focal length of the optical system:
图2(a)和2(b)也可做为本发明精确调整光学系统和确定光学系统焦长的实施例1原理示意图。在图2(a)中,按照上述调整光路使测得的系统的像差最小,这时像差的大小表明了被测光学系统2装调状况,也体现了本发明的调整方法和装置对光学系统装调的辅助作用。在图2(b)中,按照上述调整光路得到的聚焦面也就是被测光学系统的后焦面。通过测得光学系统的入瞳大小,即可得到系统的后焦长。Figures 2(a) and 2(b) can also be used as schematic diagrams of Embodiment 1 of the present invention for precisely adjusting the optical system and determining the focal length of the optical system. In Fig. 2 (a), the aberration of the measured system is minimized according to the above-mentioned adjustment of the optical path. At this moment, the size of the aberration shows the adjustment status of the measured
图3(a)和3(b)也可做为本发明精确调整光学系统和确定光学系统焦长的实施例2原理示意图。在图3(a)中也可以通过像差得到被测光学系统2装调状况。在图3(b)中,按照上述调整光路得到的聚焦面也就是被测光学系统的前焦面。通过测得光学系统的出瞳大小,即可得到系统的前焦长。3(a) and 3(b) can also be used as schematic diagrams of
图4(a)、4(b)和4(c)也可做为本发明精确调整光学系统和确定光学系统共轭距的实施例原理示意图。按照上述图4(a)所示调整光路,使测得的系统的像差最小,这时像差的大小表明了被测光学系统2装调状况。按照4(b)和4(c)调整确定了光学系统的前后两个共轭聚焦面,即可测得共轭距。Figures 4(a), 4(b) and 4(c) can also be used as schematic diagrams of embodiments of the present invention for precisely adjusting the optical system and determining the conjugate distance of the optical system. Adjust the optical path as shown in FIG. 4(a) to minimize the aberration of the measured system. At this time, the size of the aberration indicates the adjustment status of the
图5也可做为本发明精确调整光学系统和确定光学系统共轭距的实施例原理示意图。在图5中首先放置标准凸面反射镜,调整光路,使测得系统的像差最小,这时像差的大小表明了被测光学系统2的装调状况。然后移去标准凸面反射镜,在该被测光学系统2的前后聚焦面“猫眼”位置分别插入带有基准面6调整架5的平面反射镜4,即可确定光学系统的共轭聚焦面。FIG. 5 can also be used as a schematic diagram of an embodiment of the present invention for precisely adjusting the optical system and determining the conjugate distance of the optical system. In Figure 5, a standard convex mirror is placed first, and the optical path is adjusted to minimize the aberration of the measured system. At this time, the size of the aberration indicates the adjustment status of the measured
图6也可做为本发明精确调整光学系统和确定光学系统共轭距的实施实例原理示意图。该装置原理同图1类似,同图1的不同之处在于该装置由两组光学系统2和17组成,在光路中对应的猫眼位置6、18和19分别放置带有基准面和调整架的平面反射镜,可以实现两组共轭距的测量,并可实现对光学系统2和17装调状况的测试。Fig. 6 can also be used as a schematic diagram of the implementation example of the present invention for precisely adjusting the optical system and determining the conjugate distance of the optical system. The principle of the device is similar to that in Figure 1, except that the device is composed of two sets of
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