CN1858632A - Method and device for accurately determining optical system focus plane by interferometer - Google Patents

Method and device for accurately determining optical system focus plane by interferometer Download PDF

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CN1858632A
CN1858632A CN 200610027499 CN200610027499A CN1858632A CN 1858632 A CN1858632 A CN 1858632A CN 200610027499 CN200610027499 CN 200610027499 CN 200610027499 A CN200610027499 A CN 200610027499A CN 1858632 A CN1858632 A CN 1858632A
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optical system
plane
laser interferometer
interferometer
focal plane
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CN100383606C (en
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曹晓君
朱健强
林强
杨毓
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Shanghai Institute of Optics and Fine Mechanics of CAS
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Abstract

一种采用干涉仪精确确定光学系统聚焦面的方法和装置,适用于对有限焦距的光学系统装调和检测。本发明的工作原理是将激光干涉仪发射的标准光通过被测光学系统后,使光反射回干涉仪。而且利用干涉仪易于在其“猫眼”位置得到干涉条纹的道理,确定光学系统的聚焦面。由于本发明利用了激光干涉仪的检测光,显著提高了光学系统聚焦面的定位精度。本发明可以实现照相物镜、显微镜、投影仪物镜、幻灯机物镜、电影放映物镜等光学系统的精密装调和检测,精确确定其聚焦面。可以显著提高装调和检测的精度,而且易于实施,易于调整,有效地解决了确定光学系统聚焦面的盲目性。

A method and device for accurately determining the focal plane of an optical system using an interferometer, which is suitable for the assembly and detection of an optical system with a limited focal length. The working principle of the present invention is to reflect the standard light emitted by a laser interferometer back to the interferometer after passing it through the optical system to be measured. In addition, the principle that the interference fringes can be easily obtained at the "cat's eye" position of the interferometer is used to determine the focal plane of the optical system. Since the present invention utilizes the detection light of the laser interferometer, the positioning accuracy of the focal plane of the optical system is significantly improved. The present invention can realize the precise assembly and detection of optical systems such as photographic objective lenses, microscopes, projector objective lenses, slide projector objective lenses, and movie projection objective lenses, and accurately determine their focal planes. The accuracy of assembly and detection can be significantly improved, and it is easy to implement and adjust, which effectively solves the blindness of determining the focal plane of the optical system.

Description

干涉仪精确确定光学系统聚焦面的方法和装置Method and device for accurately determining the focal plane of an optical system by an interferometer

技术领域technical field

本发明涉及光学系统的测量,特别是一种干涉仪精确确定光学系统聚焦面的方法和装置。The invention relates to the measurement of an optical system, in particular to a method and a device for accurately determining the focal plane of an optical system by an interferometer.

技术背景technical background

随着科学技术的发展与计算机技术的提高,对光学系统的要求越来越高,因而对各种光学元件的要求也越来越高,干涉检测随之得到不断提高。现在干涉仪的测量精度在不断提高,并在光学装调中得到了越来越广泛的应用。With the development of science and technology and the improvement of computer technology, the requirements for optical systems are getting higher and higher, so the requirements for various optical components are also getting higher and higher, and interference detection has been continuously improved accordingly. Now the measurement accuracy of the interferometer is constantly improving, and it has been more and more widely used in optical adjustment.

为了提高光学系统精度,不少专利涉及组装光学系统,例如CN00130721.5,CN200420012162.9,CN99251361.8。CN00130721.5用光谱仪装调光学系统,装调过程中需要用其他波长的光,且不能确定系统的焦面;CN200420012162.9中包括了太多的元件,装调人员的经验显得更为重要,系统难以实施装调;CN99251361.8中涉及装调聚焦面,但还需依靠高精度机械加工,并缺乏通用性。In order to improve the precision of the optical system, many patents relate to assembling the optical system, such as CN00130721.5, CN200420012162.9, CN99251361.8. CN00130721.5 uses a spectrometer to install and adjust the optical system. Light of other wavelengths is needed during the installation and adjustment process, and the focal plane of the system cannot be determined; CN200420012162.9 includes too many components, and the experience of the adjustment personnel is more important. The system is difficult to install and adjust; CN99251361.8 involves adjusting the focus plane, but it still needs to rely on high-precision machining and lacks versatility.

发明内容Contents of the invention

本发明要解决的技术问题在于克服上述现有技术的不足,提供一种采用干涉仪精确确定光学系统聚焦面的方法和装置,适用于对有限焦距的光学系统的装调和检测,以提高待测光学系统的装配精度和焦长测量精度。The technical problem to be solved by the present invention is to overcome the deficiencies of the above-mentioned prior art, and provide a method and device for accurately determining the focal plane of an optical system using an interferometer, which is suitable for the assembly and detection of an optical system with a limited focal length, so as to improve the Assembly accuracy and focal length measurement accuracy of the optical system.

为了达到上述目的及其相关目的,本发明的工作原理是将干涉仪发射的标准光通过被测光学系统后,使光反射回干涉仪。而且利用干涉仪易于在其“猫眼”位置得到干涉条纹的道理,确定光学系统的聚焦面。In order to achieve the above and related purposes, the working principle of the present invention is to reflect the standard light emitted by the interferometer back to the interferometer after passing through the measured optical system. Moreover, it is easy to obtain interference fringes at the "cat's eye" position of the interferometer to determine the focal plane of the optical system.

本发明的技术解决方案如下:Technical solution of the present invention is as follows:

一种采用干涉仪精确确定光学系统聚焦面的方法,其特征在于该方法包括下列步骤:A method for accurately determining the focal plane of an optical system using an interferometer, characterized in that the method includes the following steps:

(1)选用Fizeau激光干涉仪作为确定光学系统聚焦面的检测仪器,该干涉仪的标准面与被测光学系统相匹配;(1) Fizeau laser interferometer is selected as the detection instrument for determining the focal plane of the optical system, and the standard plane of the interferometer matches the optical system under test;

(2)将所述的激光干涉仪发射的检测光束入射到待测测光学系统,调整所述的激光干涉仪的出射光中心与待测测光学系统的中心重合;继续调整待测光学系统使光束会聚光斑为最小;(2) The detection beam emitted by the laser interferometer is incident on the optical system to be measured, and the center of the outgoing light of the laser interferometer is adjusted to coincide with the center of the optical system to be measured; continue to adjust the optical system to be measured so that The beam spot is the smallest;

(3)在所述的待测光学系统后加入一个标准反射镜,使光束沿原光路返回光学系统,再返回所述的激光干涉仪;(3) add a standard reflector after described optical system to be measured, make light beam return optical system along original optical path, return described laser interferometer again;

(4)调整所述的标准反射镜,并微调待测测光学系统,使所述的激光干涉仪产生干涉条纹,并使所述的激光干涉仪测得的被测光学系统的离焦量为最小;(4) Adjust the standard reflector, and fine-tune the optical system to be measured, so that the laser interferometer produces interference fringes, and the defocus of the optical system to be measured by the laser interferometer is minimum;

(5)在所述的激光干涉仪出射光后任意一个光束聚焦点位置插入一平面反射镜,该平面反射镜的反射面与一调整架的基准面重合,调整所述的调整架的位置,使该平面反射镜的反射光返回所述的激光干涉仪内,产生干涉条纹,并使离焦量最小,此处即为“猫眼”位置,取走所述的平面反射镜,则所述的调整架的基准面就是所述的待测光学系统的聚焦面。(5) Insert a plane reflector at any one beam focal point position behind the laser interferometer outgoing light, the reflective surface of the plane reflector coincides with the datum plane of an adjustment mount, adjust the position of the adjustment mount, Make the reflected light of the plane mirror return to the laser interferometer to generate interference fringes and minimize the defocus amount, which is the "cat's eye" position here. If the plane mirror is removed, the The reference plane of the adjustment frame is the focal plane of the optical system to be tested.

一种采用激光干涉仪精确确定光学系统聚焦面的装置,其特征在于包括一台激光干涉仪,在该激光干涉仪的出射光路上同光轴地设有一具有基准面的调整架、一块平面反射镜和一块与待测光学系统相匹配的标准反射镜,所述的平面反射镜置于所述的调整架的基准面上,所述的平面反射镜的反射面垂直于所述的光轴。A device for accurately determining the focal plane of an optical system using a laser interferometer is characterized in that it includes a laser interferometer, and an adjustment frame with a reference plane and a plane reflector are arranged coaxially on the exit light path of the laser interferometer mirror and a standard mirror matching the optical system to be tested, the plane mirror is placed on the reference plane of the adjustment frame, and the reflection surface of the plane mirror is perpendicular to the optical axis.

所述的激光干涉仪发射的相干光以平行方式、或以一定的发散角、或以一定的会聚角入射到被测光学系统中。The coherent light emitted by the laser interferometer is incident into the optical system under test in a parallel manner, or at a certain divergence angle, or at a certain convergence angle.

所述的被测光学系统是折射式光学系统、或反射式光学系统、或折反射式光学系统。The measured optical system is a refractive optical system, or a reflective optical system, or a catadioptric optical system.

所述的块标准反射镜的反射面为平面或球面。The reflective surface of the block standard reflector is a plane or a spherical surface.

本发明的技术效果:Technical effect of the present invention:

采用本发明显著提高了待测光学系统聚焦面的定位精度,并且使整个系统的装调精度和检测精度得到提高。这种确定聚焦面的结构易于实施,易于调整,有效地解决了确定光学系统聚焦面的盲目性。能够有效的提高照相物镜、显微镜、投影仪物镜、幻灯机物镜、电影放映物镜和其他光学系统的装调精度,精确确定其聚焦面。本发明不仅适用于光学系统聚焦面的精确定位,而且适用于精确确定光学系统的焦点位置以及精确测量光学系统的焦长,还可以检测出光学系统的装调情况及其残余像差。By adopting the invention, the positioning accuracy of the focal plane of the optical system to be tested is significantly improved, and the assembly accuracy and detection accuracy of the whole system are improved. This structure for determining the focal plane is easy to implement and easy to adjust, effectively solving the blindness of determining the focal plane of the optical system. It can effectively improve the adjustment accuracy of photographic objective lenses, microscopes, projector objective lenses, slide projector objective lenses, movie projection objective lenses and other optical systems, and accurately determine their focal planes. The invention is not only applicable to the precise positioning of the focal plane of the optical system, but also to precisely determining the focal position of the optical system and measuring the focal length of the optical system, as well as detecting the adjustment of the optical system and its residual aberration.

本发明所采用的干涉仪发射出相干光束并入射到被测光学系统中,具有灵敏地反映光学系统像差的能力。The interferometer adopted in the invention emits coherent light beams and is incident into the measured optical system, and has the ability to sensitively reflect the aberration of the optical system.

本发明所描述的被测光学系统是折射式光学系统,或是反射式光学系统,或是折反射式光学系统。该光学系统具有有限的焦距。The measured optical system described in the present invention is a refractive optical system, or a reflective optical system, or a catadioptric optical system. This optical system has a finite focal length.

附图说明Description of drawings

图1为本发明精确确定光学系统的聚焦面方法和装置的基本工作原理图,平面反射镜在聚焦点位置Fig. 1 is the basic working principle diagram of the method and device for accurately determining the focal plane of the optical system in the present invention, and the plane reflector is at the focal point position

图2(a)和2(b)为本发明精确确定光学系统的聚焦面方法和装置实施例1结构原理示意图Figures 2(a) and 2(b) are schematic diagrams of the structure and principle of Embodiment 1 of the method and device for accurately determining the focal plane of the optical system according to the present invention

图3(a)和3(b)为本发明精确确定光学系统的聚焦面方法和装置实施例2结构原理示意图Figure 3(a) and 3(b) are schematic diagrams of the structural principles of Embodiment 2 of the method and device for accurately determining the focal plane of the optical system in the present invention

图4(a)、4(b)和4(c)为本发明精确确定光学系统的聚焦面方法和装置实施例3结构原理示意图Figures 4(a), 4(b) and 4(c) are schematic diagrams of the structural principle of Embodiment 3 of the method and device for accurately determining the focal plane of the optical system of the present invention

图5为本发明精确确定光学系统的聚焦面方法和装置实施例4结构原理示意图Fig. 5 is a schematic diagram of the structural principle of Embodiment 4 of the method and device for accurately determining the focal plane of the optical system in the present invention

图6为本发明精确确定光学系统的聚焦面方法和装置实施例5结构原理示意图Fig. 6 is a schematic diagram of the structural principle of Embodiment 5 of the method and device for accurately determining the focal plane of the optical system according to the present invention

图7为本发明精确确定光学系统的聚焦面方法和装置实施例6结构原理示意图Fig. 7 is a schematic diagram of the structural principle of Embodiment 6 of the method and device for accurately determining the focal plane of the optical system in the present invention

具体实施方式Detailed ways

下面结合实施例和附图对本发明作进一步说明,但不应以此限制本发明的保护范围。The present invention will be further described below in conjunction with the embodiments and accompanying drawings, but the protection scope of the present invention should not be limited thereby.

先请参阅图1,图1说明了精确确定光学系统的聚焦面方法和装置的基本工作原理。由图可见,本发明采用干涉仪精确确定光学系统聚焦面的方法,其特征在于该方法包括下列步骤:Please refer to FIG. 1 first. FIG. 1 illustrates the basic working principle of the method and device for accurately determining the focal plane of the optical system. As can be seen from the figure, the present invention uses an interferometer to accurately determine the method for the focal plane of an optical system, which is characterized in that the method includes the following steps:

(1)选用Fizeau激光干涉仪1做为确定光学系统2聚焦面的检测仪器,该干涉仪的标准面与被测光学系统2相匹配;(1) Select the Fizeau laser interferometer 1 as the detection instrument for determining the focal plane of the optical system 2, and the standard plane of the interferometer matches the optical system 2 under test;

(2)将所述的激光干涉仪1发射的检测光束入射到被测光学系统2,调整所述的激光干涉仪1的出射光中心与被测光学系统2的中心重合;继续调整待测光学系统2,使光束会聚光斑为最小;(2) The detection beam emitted by the laser interferometer 1 is incident on the measured optical system 2, and the center of the outgoing light of the described laser interferometer 1 is adjusted to coincide with the center of the measured optical system 2; continue to adjust the optical system to be measured System 2, to minimize the beam spot;

(3)在所述的待测光学系统2后加入一个标准反射镜3,使光束沿原光路返回光学系统2,再返回所述的激光干涉仪1;(3) add a standard reflector 3 behind described optical system 2 to be measured, make light beam return optical system 2 along original optical path, return described laser interferometer 1 again;

(4)调整所述的标准反射镜3,并微调被测光学系统2,使激光干涉仪1上产生干涉条纹,并使所述的激光干涉仪1测得的被测光学系统2的离焦量为最小;(4) Adjust the standard reflector 3, and fine-tune the measured optical system 2, so that interference fringes are produced on the laser interferometer 1, and the defocus of the measured optical system 2 measured by the laser interferometer 1 is amount is minimum;

(5)在所述的激光干涉仪1出射光后任意一个光束聚焦点位置插入一平面反射镜4,该平面反射镜4的反射面与一调整架5的基准面6重合,调整所述的调整架5的位置,使该平面反射镜4的反射光返回所述的激光干涉仪1内,产生干涉条纹,并使离焦量最小,此处即为“猫眼”位置,取走所述的平面反射镜4,则所述的调整架5的基准面6就是所述的待测光学系统2的聚焦面。(5) Insert a plane reflector 4 at any one of the focal point positions of the light beam after the laser interferometer 1 emits light, the reflective surface of the plane reflector 4 coincides with the reference plane 6 of an adjustment frame 5, adjust the Adjust the position of the frame 5 so that the reflected light of the plane reflector 4 returns to the laser interferometer 1 to generate interference fringes and minimize the defocus, which is the "cat's eye" position here. plane mirror 4, the reference plane 6 of the adjustment frame 5 is the focal plane of the optical system 2 to be tested.

一种采用激光干涉仪精确确定光学系统聚焦面的装置,其特征在于包括一台激光干涉仪1,在该激光干涉仪1的出射光路上同光轴地设有一具有基准面6的调整架5、一块平面反射镜4和一块与待测光学系统2相匹配的标准反射镜3,所述的平面反射镜4置于所述的调整架5的基准面6上,所述的平面反射镜4的反射面垂直于所述的光轴。A device for accurately determining the focal plane of an optical system using a laser interferometer, characterized in that it includes a laser interferometer 1, and an adjustment frame 5 with a reference plane 6 is provided coaxially with the optical axis on the outgoing light path of the laser interferometer 1 , a plane reflector 4 and a standard reflector 3 matched with the optical system 2 to be measured, the plane reflector 4 is placed on the reference plane 6 of the adjustment frame 5, the plane reflector 4 The reflective surface is perpendicular to the optical axis.

所述的激光干涉仪1发射的相干光以平行方式、或以一定的发散角、或以一定的会聚角入射到被测光学系统2中。The coherent light emitted by the laser interferometer 1 is incident into the optical system 2 under test in a parallel manner, or at a certain divergence angle, or at a certain convergence angle.

所述的被测光学系统2是折射式光学系统、或反射式光学系统、或折反射式光学系统。The measured optical system 2 is a refractive optical system, or a reflective optical system, or a catadioptric optical system.

所述的块标准反射镜3的反射面为平面或球面。The reflective surface of the block standard mirror 3 is a plane or a spherical surface.

从激光干涉仪1发出的相干光束7,入射到被测光学系统2中,并使光束会聚在光学系统2的聚焦面6上。在光学系统的出射光束后加入一个标准的球面反射镜3,使出射光束沿原光路8反射回去,在激光干涉仪1中产生干涉条纹,调整光路使离焦量最小。激光干涉仪1出射光束后面的所有光束聚焦位置都可认为是“猫眼”。在任意一个“猫眼”位置插入一个带有基准面6调整架5的平面反射镜4,并使平面反射镜4在调整架5的基准面6上。调整调整架5,使平面反射镜4将光束7沿光路9返回干涉仪内,产生“猫眼”处的干涉条纹,并使离焦量最小。取走平面反射镜4,则调整架的基准面6就是待测光学系统的聚焦面。The coherent beam 7 emitted from the laser interferometer 1 is incident into the optical system 2 under test, and the beam is converged on the focusing plane 6 of the optical system 2 . A standard spherical reflector 3 is added behind the outgoing light beam of the optical system, so that the outgoing light beam is reflected back along the original optical path 8, interference fringes are generated in the laser interferometer 1, and the optical path is adjusted to minimize the defocus amount. All the focus positions of the beams behind the output beam of the laser interferometer 1 can be considered as "cat's eyes". Insert a plane reflector 4 with a datum plane 6 adjustment mount 5 at any "cat's eye" position, and make the plane mirror 4 on the datum plane 6 of the adjustment mount 5. Adjust the adjustment frame 5 so that the plane mirror 4 returns the light beam 7 to the interferometer along the optical path 9 to generate interference fringes at the "cat's eye" and minimize the defocus. Taking away the plane reflector 4, the reference plane 6 of the adjustment frame is the focal plane of the optical system to be tested.

图2(a)和2(b)为本发明精确确定光学系统聚焦面方法和装置的实施例1结构原理示意图。在图2(a)中,从干涉仪1发出的相干光束7是平行光,入射到被测光学系统2中,在光学系统2的出射光束7后加入一个标准反射镜3为凹面的球面反射镜,使出射光束7沿原光路8反射回去,在激光干涉仪1中可以得到干涉条纹,调整光路使系统的像差最小。在图2(b)中,在该被测光学系统2和标准凹面球面反射镜3之间的“猫眼”位置插入一块平面反射镜4,该平面反射镜4置于调整架5上,使所述的平面反射镜4的反射平面与所述的基准面6重合。调整调整架5,使平面反射镜4将光束7沿光路9返回干涉仪内,产生干涉条纹,并使离焦量最小。取走平面反射镜4,则调整架的基准面6就是待测光学系统2的聚焦面。这个聚焦面也就是光学系统的焦平面。通过测得光学系统的入瞳大小,已知标准球面波反射镜的相对孔径,即可得到系统的焦长。2(a) and 2(b) are schematic diagrams of the structural principle of Embodiment 1 of the method and device for accurately determining the focal plane of an optical system according to the present invention. In Fig. 2(a), the coherent light beam 7 emitted from the interferometer 1 is parallel light, which is incident into the optical system 2 under test, and a standard reflector 3 is added after the outgoing light beam 7 of the optical system 2, which is a concave spherical reflection Mirror, so that the outgoing beam 7 is reflected back along the original optical path 8, interference fringes can be obtained in the laser interferometer 1, and the optical path is adjusted to minimize the aberration of the system. In Fig. 2 (b), a plane reflector 4 is inserted at the "cat's eye" position between the measured optical system 2 and the standard concave spherical reflector 3, and the plane reflector 4 is placed on the adjustment frame 5, so that the The reflection plane of the above-mentioned flat mirror 4 coincides with the above-mentioned reference plane 6 . Adjust the adjustment frame 5 so that the plane mirror 4 returns the light beam 7 to the interferometer along the optical path 9 to generate interference fringes and minimize the amount of defocus. Taking away the plane reflector 4, the reference plane 6 of the adjustment frame is the focal plane of the optical system 2 to be tested. This focal plane is also the focal plane of the optical system. By measuring the size of the entrance pupil of the optical system and knowing the relative aperture of the standard spherical wave mirror, the focal length of the system can be obtained.

图3(a)和3(b)为本发明精确确定光学系统聚焦面方法和装置的实施例2结构原理示意图。在图3(a)中,会聚点在光学系统前焦面上。实施过程与实例1类似。只是从激光干涉仪1发出的相干光束7是会聚光,先会聚于光学系统2的前聚焦面上,出射光是平行光,被一个标准平面反射镜14沿原光路8反射回去。该被测光学系统2的前聚焦面“猫眼”位置如图3(b)中所示,在该位置上确定了光学系统的聚焦面。3(a) and 3(b) are schematic diagrams of the structural principle of Embodiment 2 of the method and device for accurately determining the focal plane of an optical system according to the present invention. In Figure 3(a), the converging point is on the front focal plane of the optical system. The implementation process is similar to Example 1. The only thing is that the coherent light beam 7 emitted from the laser interferometer 1 is converging light, which first converges on the front focusing surface of the optical system 2, and the outgoing light is parallel light, which is reflected back along the original optical path 8 by a standard flat mirror 14. The "cat's eye" position of the front focal plane of the tested optical system 2 is shown in FIG. 3( b ), where the focal plane of the optical system is determined.

图4(a)、4(b)和4(c)为本发明精确确定光学系统聚焦面方法和装置的实施例3结构原理示意图。在图4(a)中,在光学系统前后各有一个会聚点。实施过程与实例1和实例2类似。从干涉仪1发出的相干光束7首先会聚于光学系统的前聚焦面,入射到被测光学系统2后,又会聚于后聚焦面上。在光学系统的出射光束后加入一个标准反射镜3为凹面球面反射镜,使出射光束沿原光路8反射回去。该被测光学系统2的后聚焦面“猫眼”位置如图4(b)中所示,在该位置上确定了光学系统2的后聚焦面。在确定了后聚焦面后,还可以在该被测光学系统2的前聚焦面“猫眼”位置插入一个带有基准面12和调整架11的平面反射镜10。调整调整架11,使平面反射镜10将光束7沿光路13返回干涉仪内,产生干涉条纹,并使离焦量最小。如图4(c)中所示,在该位置上确定了光学系统的前聚焦面,这样就同时确定了光学系统的前后两个共轭聚焦面。4(a), 4(b) and 4(c) are schematic structural diagrams of Embodiment 3 of the method and device for accurately determining the focal plane of an optical system according to the present invention. In Fig. 4(a), there is a converging point before and after the optical system. The implementation process is similar to Example 1 and Example 2. The coherent light beam 7 emitted from the interferometer 1 first converges on the front focus plane of the optical system, and then converges on the back focus plane after being incident on the measured optical system 2 . A standard reflector 3 is added behind the outgoing light beam of the optical system as a concave spherical reflector, so that the outgoing light beam is reflected back along the original optical path 8 . The "cat's eye" position of the rear focal plane of the tested optical system 2 is shown in FIG. 4( b ), where the rear focal plane of the optical system 2 is determined. After the rear focal plane is determined, a plane mirror 10 with a reference plane 12 and an adjustment mount 11 can also be inserted at the "cat's eye" position of the front focal plane of the optical system 2 under test. Adjust the adjustment frame 11 so that the plane mirror 10 returns the light beam 7 to the interferometer along the optical path 13 to generate interference fringes and minimize the amount of defocus. As shown in Fig. 4(c), the front focal plane of the optical system is determined at this position, so that the front and rear conjugate focal planes of the optical system are determined at the same time.

图5为本发明精确确定光学系统聚焦面方法和装置的实施例4结构原理示意图。在图5中,本发明的标准反射镜为凸面反射镜15,这就要求在确定其聚焦面时,首先将凸面反射镜15取走,然后在该被测光学系统2的后聚焦面“猫眼”位置插入一个带有基准面6调整架5的平面反射镜4,在该位置上确定光学系统的聚焦面。Fig. 5 is a schematic diagram of the structure and principle of Embodiment 4 of the method and device for accurately determining the focal plane of an optical system according to the present invention. In Fig. 5, the standard reflector of the present invention is convex reflector 15, and this just requires when determining its focal plane, first convex reflector 15 is taken away, and then "cat's eye" on the rear focal plane of this tested optical system 2 Insert a flat reflector 4 with a reference plane 6 adjustment mount 5 in the position ", and determine the focal plane of the optical system at this position.

图6为本发明精确确定光学系统聚焦面方法和装置的实施例5结构原理示意图。在图6中,本发明的被测光学系统是由多个系统组成,有多个聚焦面,如聚焦面6、聚焦面18、聚焦面19等,在聚焦面位置可插入一个带有基准面调整架的平面反射镜,这样就在相应位置上确定了光学系统的聚焦面。Fig. 6 is a schematic diagram of the structure and principle of Embodiment 5 of the method and device for accurately determining the focal plane of an optical system according to the present invention. In Fig. 6, the optical system under test of the present invention is made up of multiple systems, has multiple focal planes, such as focal plane 6, focal plane 18, focal plane 19, etc. Adjust the plane mirror of the frame, so that the focal plane of the optical system is determined at the corresponding position.

精确调整光学系统和确定光学系统的焦长:Precisely adjust the optical system and determine the focal length of the optical system:

图2(a)和2(b)也可做为本发明精确调整光学系统和确定光学系统焦长的实施例1原理示意图。在图2(a)中,按照上述调整光路使测得的系统的像差最小,这时像差的大小表明了被测光学系统2装调状况,也体现了本发明的调整方法和装置对光学系统装调的辅助作用。在图2(b)中,按照上述调整光路得到的聚焦面也就是被测光学系统的后焦面。通过测得光学系统的入瞳大小,即可得到系统的后焦长。Figures 2(a) and 2(b) can also be used as schematic diagrams of Embodiment 1 of the present invention for precisely adjusting the optical system and determining the focal length of the optical system. In Fig. 2 (a), the aberration of the measured system is minimized according to the above-mentioned adjustment of the optical path. At this moment, the size of the aberration shows the adjustment status of the measured optical system 2, and also reflects the adjustment method and device of the present invention. Auxiliary function of optical system adjustment. In Fig. 2(b), the focal plane obtained by adjusting the optical path above is the back focal plane of the optical system under test. By measuring the size of the entrance pupil of the optical system, the back focal length of the system can be obtained.

图3(a)和3(b)也可做为本发明精确调整光学系统和确定光学系统焦长的实施例2原理示意图。在图3(a)中也可以通过像差得到被测光学系统2装调状况。在图3(b)中,按照上述调整光路得到的聚焦面也就是被测光学系统的前焦面。通过测得光学系统的出瞳大小,即可得到系统的前焦长。3(a) and 3(b) can also be used as schematic diagrams of Embodiment 2 of the present invention for precisely adjusting the optical system and determining the focal length of the optical system. In Fig. 3(a), the adjustment status of the optical system 2 under test can also be obtained through aberration. In Fig. 3(b), the focal plane obtained by adjusting the optical path above is the front focal plane of the optical system under test. By measuring the exit pupil size of the optical system, the front focal length of the system can be obtained.

图4(a)、4(b)和4(c)也可做为本发明精确调整光学系统和确定光学系统共轭距的实施例原理示意图。按照上述图4(a)所示调整光路,使测得的系统的像差最小,这时像差的大小表明了被测光学系统2装调状况。按照4(b)和4(c)调整确定了光学系统的前后两个共轭聚焦面,即可测得共轭距。Figures 4(a), 4(b) and 4(c) can also be used as schematic diagrams of embodiments of the present invention for precisely adjusting the optical system and determining the conjugate distance of the optical system. Adjust the optical path as shown in FIG. 4(a) to minimize the aberration of the measured system. At this time, the size of the aberration indicates the adjustment status of the optical system 2 under test. According to 4(b) and 4(c), the two conjugate focal planes before and after the optical system are adjusted and determined, and then the conjugate distance can be measured.

图5也可做为本发明精确调整光学系统和确定光学系统共轭距的实施例原理示意图。在图5中首先放置标准凸面反射镜,调整光路,使测得系统的像差最小,这时像差的大小表明了被测光学系统2的装调状况。然后移去标准凸面反射镜,在该被测光学系统2的前后聚焦面“猫眼”位置分别插入带有基准面6调整架5的平面反射镜4,即可确定光学系统的共轭聚焦面。FIG. 5 can also be used as a schematic diagram of an embodiment of the present invention for precisely adjusting the optical system and determining the conjugate distance of the optical system. In Figure 5, a standard convex mirror is placed first, and the optical path is adjusted to minimize the aberration of the measured system. At this time, the size of the aberration indicates the adjustment status of the measured optical system 2. Then remove the standard convex reflector, and insert the plane reflector 4 with the reference plane 6 adjustment frame 5 respectively at the "cat's eye" position of the front and rear focus planes of the measured optical system 2, so as to determine the conjugate focus plane of the optical system.

图6也可做为本发明精确调整光学系统和确定光学系统共轭距的实施实例原理示意图。该装置原理同图1类似,同图1的不同之处在于该装置由两组光学系统2和17组成,在光路中对应的猫眼位置6、18和19分别放置带有基准面和调整架的平面反射镜,可以实现两组共轭距的测量,并可实现对光学系统2和17装调状况的测试。Fig. 6 can also be used as a schematic diagram of the implementation example of the present invention for precisely adjusting the optical system and determining the conjugate distance of the optical system. The principle of the device is similar to that in Figure 1, except that the device is composed of two sets of optical systems 2 and 17, and the corresponding cat's eye positions 6, 18 and 19 in the optical path are respectively placed with reference planes and adjustment frames. The plane mirror can realize the measurement of two groups of conjugate distances, and can realize the test of the adjustment status of the optical systems 2 and 17.

Claims (5)

1.一种采用干涉仪精确确定光学系统聚焦面的方法,其特征在于该方法包括下列步骤:1. A method for accurately determining the focal plane of an optical system using an interferometer, characterized in that the method comprises the following steps: (1)选用Fizeau激光干涉仪(1)做为确定光学系统(2)聚焦面的检测仪器,该干涉仪的标准面与被测光学系统(2)相匹配;(1) Select the Fizeau laser interferometer (1) as the detection instrument for determining the focal plane of the optical system (2), and the standard plane of the interferometer matches the measured optical system (2); (2)将所述的激光干涉仪(1)发射的检测光束入射到被测光学系统(2),调整所述的激光干涉仪(1)的出射光中心与被测光学系统(2)的中心重合;继续调整待测光学系统(2),使光束会聚光斑为最小;(2) The detection beam emitted by the laser interferometer (1) is incident on the measured optical system (2), and the center of the outgoing light of the described laser interferometer (1) and the measured optical system (2) are adjusted. The center coincides; continue to adjust the optical system to be tested (2) to minimize the beam spot; (3)在所述的待测光学系统(2)后加入一个标准反射镜(3),使光束沿原光路返回光学系统(2),再返回所述的激光干涉仪(1);(3) Add a standard reflector (3) behind the described optical system to be measured (2), so that the light beam returns to the optical system (2) along the original optical path, and then returns to the laser interferometer (1); (4)调整所述的标准反射镜(3),并微调被测光学系统(2),使激光干涉仪(1)上产生干涉条纹,并使所述的激光干涉仪(1)测得的被测光学系统(2)的离焦量为最小;(4) Adjust the standard reflector (3), and fine-tune the measured optical system (2), so that interference fringes are produced on the laser interferometer (1), and the laser interferometer (1) measures The defocus amount of the measured optical system (2) is the smallest; (5)在所述的激光干涉仪(1)出射光后任意一个光束聚焦点位置插入一平面反射镜(4),该平面反射镜(4)的反射面与一调整架(5)的基准面(6)重合,调整所述的调整架(5)的位置,使该平面反射镜(4)的反射光返回所述的激光干涉仪(1)内,产生干涉条纹,并使离焦量最小,此处即为“猫眼”位置,取走所述的平面反射镜(4),则所述的调整架(5)的基准面(6)就是所述的待测光学系统(2)的聚焦面。(5) Insert a plane reflector (4) at any beam focal point position after the laser interferometer (1) exits the light, and the reflective surface of the plane reflector (4) is aligned with an adjustment frame (5) Surfaces (6) overlap, adjust the position of the adjustment frame (5), so that the reflected light of the plane reflector (4) returns to the laser interferometer (1) to generate interference fringes, and the defocus amount Minimum, here is the "cat's eye" position, take away the plane mirror (4), then the reference plane (6) of the adjustment frame (5) is the focus surface. 2.一种采用激光干涉仪精确确定光学系统聚焦面的装置,其特征在于包括一台激光干涉仪(1),在该激光干涉仪(1)的出射光路上同光轴地设有一具有基准面(6)的调整架(5)、一块平面反射镜(4)和一块与待测光学系统(2)相匹配的标准反射镜(3),所述的平面反射镜(4)置于所述的调整架(5)的基准面(6)上,所述的平面反射镜(4)的反射面垂直于所述的光轴。2. A device that adopts a laser interferometer to accurately determine the focal plane of an optical system is characterized in that it includes a laser interferometer (1), and a laser interferometer (1) is coaxially provided with a reference The adjustment frame (5) on the surface (6), a plane reflector (4) and a standard reflector (3) matching the optical system to be measured (2), the said plane reflector (4) is placed in the On the reference plane (6) of the adjustment frame (5), the reflection surface of the plane mirror (4) is perpendicular to the optical axis. 3.根据权利要求2所述的采用激光干涉仪精确确定光学系统聚焦面的装置,其特征在于所述的激光干涉仪(1)发射的相干光以平行方式、或以一定的发散角、或以一定的会聚角入射到被测光学系统(2)中。3. The device for accurately determining the focal plane of an optical system using a laser interferometer according to claim 2, characterized in that the coherent light emitted by the laser interferometer (1) is in a parallel manner, or at a certain divergence angle, or It is incident into the optical system under test (2) at a certain convergence angle. 4.根据权利要求2所述的采用干涉仪精确确定光学系统聚焦面的装置,其特征在于所述的被测光学系统(2)是折射式光学系统、或反射式光学系统、或折反射式光学系统。4. The device for accurately determining the focal plane of an optical system using an interferometer according to claim 2, characterized in that the measured optical system (2) is a refractive optical system, or a reflective optical system, or a catadioptric optical system optical system. 5、根据权利要求2所述的采用干涉仪精确确定光学系统聚焦面的装置,其特征在于所述的块标准反射镜(3)的反射面为平面或球面。5. The device for accurately determining the focal plane of an optical system using an interferometer according to claim 2, characterized in that the reflection surface of the block standard mirror (3) is a plane or a spherical surface.
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Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN100449260C (en) * 2007-01-17 2009-01-07 哈尔滨工业大学 A Method of Measuring the Distance Deviation Between Objective Lens and Eyepiece of Telescope System Accurately Using Interferometer
CN102073122A (en) * 2010-12-24 2011-05-25 中国科学院长春光学精密机械与物理研究所 Concentric assembly method for concentric optical element in off-axis concentric optical system
CN102507153A (en) * 2011-10-31 2012-06-20 北京空间机电研究所 Focal plane calibration method for infrared lens of astronautic camera
CN106443642A (en) * 2016-09-29 2017-02-22 中国科学技术大学 Method for assembling a coherent laser radar FC/APC fiber coupling off-axis transmitting-receiving telescope
CN108426699A (en) * 2018-01-29 2018-08-21 中国科学院长春光学精密机械与物理研究所 A kind of detection method of optical system image planes defocusing amount
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Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3933057A1 (en) * 1989-10-04 1991-04-18 Doerries Scharmann Gmbh METHOD AND DEVICE FOR DETERMINING THE POSITION AND DIAMETER OF THE FOCUS (FOCUS) OF A LASER BEAM, ESPECIALLY FOR USE FOR THE PROCESSING OF MATERIALS WITH A HIGH-PERFORMANCE LASER BEAM
CN1124473C (en) * 2000-10-11 2003-10-15 中国科学院长春光学精密机械与物理研究所 Method of utilizing digital interferometer to regulate vacuum ultraviolet interference spectrometer
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EP1524491A1 (en) * 2003-10-16 2005-04-20 Universite Libre De Bruxelles Apparatus coupling an interferometer and a microscope

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