CN1815305A - Electronics device, optical panel, inspection probe, inspection device for the optical panel and inspection method for the optical panel - Google Patents

Abstract

The optical panel has pixels which emit lights of the same colors for color display through color mixing of R, G, and B, column by column. The pixels of R, G, and B are arranged in a fixed order in the direction of rows, and common data lines 22 driving the pixels, column by column, are wired. At a lead-out section 24 where data lines 22 are arranged together in a mutually parallel state, an inspection terminal array layer 26 is formed. In the inspection terminal array layer 26, data lines 22 of colors other than a designated color are coated with an insulating film 261 in a direction orthogonal to the lead-out direction of the data lines 22, and data lines 22 of the designated color is exposed as signal input terminals for inspection. The inspection probe 200 includes a substrate 210, and a wiring portion 300 which is extended on the substrate 210 corresponding to the inspection terminal array layer 26 in the direction orthogonal to the lead-out direction of the data lines 22 and comes into contact with the signal input terminals when pressed from above the data lines 22 in a state orthogonal to the data lines 22.

Description

The inspection method of e-machine, optical panel, inspection probe, optical panel testing fixture, optical panel

Technical field

The present invention relates to the inspection of e-machine, optical panel, inspection probe, optical panel testing fixture, optical panel.

Background technology

In the past, as the known LCDs of the optical panel of displayed image, known: the display device that possesses the driving circuit of this liquid crystal display and driving liquid crystal display.

The formation of expression display device 10 in the past in Figure 17.

Liquid crystal display 20 possesses: the liquid crystal cells (omitting diagram) that is arranged in the pixel on the display surface; Be located at the film two-terminal element as on-off element (omitting diagram) of each liquid crystal cells; Be arranged in a plurality of sweep traces 21 of each row of liquid crystal display; Be arranged in a plurality of data lines 22 of each row of liquid crystal display 20.

And a plurality of data lines 22 and the sweep trace 21 of drawing from liquid crystal display 20 are the one side 31 that all is arranged in substrate 30.

In Figure 17, a plurality of data lines 22 all are routed in 31 approximate center on one side in substrate 30, and the sweep trace 21A of odd number is that the right side that is arranged in data line 22, the sweep trace 21B of even number are the left sides that is arranged in data line 22.

Driving circuit 40 possesses: the sweep signal of selecting sweep trace 21 in order, to the scan line driver (omitting diagram) of sweep trace 21 power supplies; The data-signal of the pixel on the sweep trace of having selected 21, to the datawire driver (omitting diagram) of each data line 22 power supply.

Be arranged in the data line 22 and the sweep trace 21 on one side 31 of substrate 30, be provided with the input splicing ear 32 of signal input usefulness, be provided with the output splicing ear 41 of signal output usefulness at driving circuit 40.

And output splicing ear 41 is connected input splicing ear 32, applies the method for signal from driving circuit 40 to data line 22 and sweep trace 21, and image is presented at liquid crystal display 20.

In recent years, in order to show fine and closely woven image, the pixel count of liquid crystal display 20 increased tremendously, followed these, and the interval between sweep trace 21 and the data line 22 narrows down.

But, in such liquid crystal display, carry out: confirm its be originally whether the signal wire (data line 22, sweep trace 21) that insulate has produced short circuit each other and the shortcoming of electric current electric leakage, image shows and checks (for example, the document spy opens the 2003-66870 communique).

Show in the inspection at such image, prepare it, this inspection temporarily is connected sweep trace 21 and data line 22 with probe 50 in order to send the inspection probe 50 of picture checks with signal to sweep trace 21 and data line 22.Then, by check with probe 50 to sweep trace 21 and data line 22 apply inspection with signal after, whether inspection liquid crystal display 20 is normally lighted.

At this, Figure 18 is an enlarged drawing of checking probe 50 and data line 22 coupling parts.

Certainly, as shown in figure 18, check that probe 50 has possessed terminal 23 that is connected sweep trace 21 and the probe terminal 51 that is connected the terminal 23 of data line 22.When checking that probe 50 is connected sweep trace 21 and data line 22, the terminal 23 that must correctly be located by connecting on the terminal 23 of sweep trace 21 and data line 22 to the terminal 51 of inspection probe 50 one by one.

In recent years, require small-sized and can show the liquid crystal display 20 of fine and closely woven image, so, the pixel more than in little zone, must arranging very.

If like this, the interval of signal wire (sweep trace 21, data line 22) becomes very narrow, for example, with the interval of 21 μ m, arranges the signal wire of hundreds of bar.

Like this, if arrange signal wire with narrow spacing, it is very narrow that the inspection probe 50 that is connected signal wire also must be made into its terminal intervals.

Yet, make the inspection probe 50 of narrow like this terminal intervals, exist: need very many manufacturing procedure and the high problem of cost.

In addition, with narrow spacing (for example, 21 μ m the operation that correctly is located by connecting one by one each other of) terminal is the very operation of difficulty, for example, Yi Bian must be on one side confirm that with monitor captured visual of ccd video camera connects operation.

Like this, the location that possesses video camera or monitor is need very high cost with the preliminary work of device, and can be created in and connect the problem that needs in the operation for a long time.

Like this, just produce, if also increase problem at the cost of cost that cost a lot of money aspect the image demonstration inspection of liquid crystal display with regard to product, and, if just reduce the problem of making efficient in the expensive time aspect the image demonstration inspection.

Summary of the invention

The objective of the invention is to, provide: can easyly carry out e-machine that image show to check, optical panel, inspection probe, the testing fixture of optical panel, the inspection method of optical panel.

E-machine of the present invention, be laid with a plurality of signal wires and be configured with the state of almost parallel each other at the described signal wire of the lead division of drawing described signal wire, at described lead division, be formed with inspection terminal alignment layer, this is checked with in the terminal alignment layer, with the drawing on the direction that direction intersects of described signal wire, the described signal wire of regulation is insulated film and covers, and be not insulated the regulation that film covers described signal wire, expose as the signal input terminal of checking usefulness.

In such formation, in examination phase, can import many signal line on the point of identical inspection signal, formed inspection terminal alignment layer at lead division, in this inspection terminal alignment layer, exposed many specified signal line can importing same inspection signal as the signal input terminal of checking usefulness, so, be pressed into as long as will connect up jointly and check, can realize and being connected of specified signal line with on the terminal alignment layer.

Like this, just wiring is pressed into and checks, so the operation that the probe of checking usefulness is connected on the signal wire is extremely simple with terminal alignment layer (operation).

In addition, check that with the terminal alignment layer be drawing many in direction and be made as at signal wire.And in each checked with terminal alignment layer, when the signal wire of regulation exposed as signal input terminal, when observing all signal wires one by one, whichsoever signal wire is inevitable exposed for good in the terminal alignment layer in a certain inspection.

In such formation, check with on the terminal alignment layer if the wiring of separately inspection probe is pressed into, then can in all signal wires, obtain conducting respectively.

Optical panel of the present invention, in every row, has the pixel that produces same primary colours, and described different base colors at line direction with certain arranged in order, show the different base colors colour mixture more than two is carried out colour, and dispose the common data line that drives described pixel in every row, and drawing the lead division of described data line, described data line is with state configuration parallel to each other.At described lead division, be formed with inspection terminal alignment layer, this is checked with in the terminal alignment layer, with the drawing on the direction that direction intersects of described data line, data line beyond the primary colours of regulation is insulated film and covers, and be not insulated the described primary colours of the regulation that film covers data line, expose as the signal input terminal of checking usefulness.

In this constituted, at first, optical panel was to mix two above primary colours (for example, red, green, blueness) and carry out colour and show, the image of such optical panel shows in the inspection, lighted according to each primary colours and checked the inhomogeneous etc. of demonstration.

At this moment, unified input same signal in the data line that drives identical color pixel.For example, in the data line that red pixel links to each other, concentrate the input same signal.

Therefore, lead division at data line, formed inspection that the data line of the primary colours of regulation just exposes as signal input terminal position with the terminal alignment layer, as long as draw the wiring that has length on the direction of direction intersecting at data line, be pressed into and check, just can obtain common conducting the data line of the primary colours stipulated with making its contact on the terminal alignment layer.

And if check the drive signal input of usefulness and the wiring of data line conducting, the data line that then compiles for the regulation primary colours sends same signal simultaneously, and optical panel is bright with the regulation color dot.Carry out the image demonstration inspection of optical panel from the illuminating state of this moment, can judge the defective that shows inhomogeneous grade.

As in the past, image shows when checking, if to the data line inspection probe that is linked in sequence one by one, then the spacing along with data line attenuates close, the fine and closely woven terminal that probe is set of also having to, along with fine and closely wovenization of data line, check the increase of processing cost of probe or data line and inspection probe to be connected the complicated of operation be inevitable.

This point, in the present invention, check the lead division that is formed on optical panel with the terminal alignment layer, in this inspection terminal alignment layer, just the specified data line exposes as signal input terminal, so, just common wiring is pressed into inspection and just can carries out and being connected of specified data line with the terminal alignment layer.

Like this, it is just passable with the terminal alignment layer just wiring to be pressed into inspection, so extremely simple with the operation that probe is connected data line inspection.

In view of the huge manufacture of optical panel, connect the simplification of checking with the operation of probe to going up one by one of optical panel, can shorten image greatly and show the required time of checking, the raising of making efficient is brought epoch-making effect.

In addition, being not only the optical panel with nature light emitting pixel as optical panel, for example, also can be to have had the transmitance that changes its illumination light of regulating bias light and the optical panel of luminous pixel.

In the present invention, described inspection terminal alignment layer preferably is located at described data line according to each primary colours and draws on the direction.

According to such formation, check to be located at each color with the terminal alignment layer, so the wiring of each self-check probe just is pressed into the inspection terminal alignment layer of each color data line, just separately conducting at data line of all kinds.

And, if the wiring that each self-check signal input is connected with data line of all kinds then can be given me a little bright optical panel and carry out image demonstration inspection according to each color.

In the present invention, described inspection with the terminal alignment layer on, conductor layer is stacked in the data line that exposes as described signal input terminal for well.

In such formation, the wiring of checking probe is pressed into checks that with when the terminal alignment layer this wiring contact is on electric conductor.And,, connect mutually as the data line and the wiring of signal input terminal by electric conductor.In checking with the terminal alignment layer, data line beyond the primary colours of regulation is insulated film and covers, the data line of regulation primary colours is than the amount of dielectric film low insulation film thickness, so, in this state, even wiring is pressed into inspection terminal alignment layer, specified data line and wiring might become the danger of bad connection.

This point, in the present invention, conductor layer is stacked in the data line that exposes as signal input terminal, so, correspondingly uprising with this electric conductor, wiring contacts by electric conductor with data line and conducting easily.

In addition, in the present invention, described electric conductor is also thicker in good than described dielectric film.According to this formation, electric conductor reliably contacts with electric conductor so check the wiring of probe than also outstanding one section of dielectric film.Therefore, by electric conductor data line and the reliably conducting of wiring of checking probe.

Optical panel of the present invention is laid with the sweep trace that drives described pixel, and is drawing the lead division of described sweep trace in every row, described sweep trace is with state configuration parallel to each other.At described lead division, be formed with inspection terminal alignment layer, this is checked with in the terminal alignment layer, with the drawing on the direction that direction intersects of described sweep trace, the described sweep trace of regulation is insulated film and covers, and be not insulated the regulation that film covers described sweep trace, expose as the signal input terminal of checking usefulness.

In this constituted, at first, optical panel had sweep trace, for example, and to the sweep trace input of adjacency reverse inspection signal and the defect inspection of the grade of carrying out between sweep trace, whether leaking electricity mutually.

At this moment, for example, import under the situation of reverse mutually inspection signal to the sweep trace of adjacency, to the identical signal of the unified input of sweep trace of odd numbered, and it is just passable to import reverse signal to the sweep trace unification of even number.

Therefore, on the lead division of sweep trace, formed the inspection terminal aligning section that the sweep trace of regulation just exposes as signal input terminal, just intersecting at the wiring that has length on the direction of drawing direction of sweep trace, be pressed into inspection and contact, can obtain common conducting the regulation sweep trace with the terminal alignment layer.And, if the signal of using to the wiring input checking that is connected with sweep trace then sends same signal simultaneously and optical panel is lighted to the sweep trace of regulation is unified.Carry out the image of optical panel from the illuminating state of this moment and show to check, the inspection of the defective of carrying out whether leaking electricity between the sweep trace etc.

As in the past, image shows when checking, if the inspection probe that is linked in sequence one by one to sweep trace, then the spacing along with sweep trace attenuates close, the fine and closely woven setting of also having to of the terminal of probe, along with fine and closely wovenization of sweep trace, check the increase of processing cost of probe or sweep trace and inspection probe to be connected the complicated of operation be inevitable.

This point, in the present invention, check the lead division that is formed on optical panel with the terminal alignment layer, check with the terminal alignment layer to be that the regulation sweep trace exposes as signal input terminal at this, so, just common wiring is pressed into inspection and just can carries out and being connected of regulation sweep trace with the terminal alignment layer.

Like this, just wiring is pressed into inspection terminal alignment layer, so extremely simple with the operation that probe is connected sweep trace inspection.

In view of the huge manufacture of optical panel, connect the simplification of checking with the operation of probe to going up one by one of optical panel, can shorten image greatly and show the required time of checking, the raising of making efficient is brought epoch-making effect.

In described e-machine of the present invention, preferably: the signal input terminal of described inspection usefulness is the sweep trace that can import the regulation of same inspection signal; Described inspection with the terminal alignment layer in, be insulated the sweep trace of the described regulation that can the same inspection signal of input in the described sweep trace that film covers, draw longly than other signal wires, and be connected a wire connecting portion.

In described e-machine of the present invention (each row is furnished with the optical panel of the common data line that drives described pixel), the data line of at least a color among beyond the primary colours of described regulation, draw longly than other signal wires, and be connected a wire connecting portion by color separately.

In described e-machine of the present invention (each row is furnished with the optical panel of the sweep trace that drives described pixel), preferably: the signal input terminal of described inspection usefulness is a sweep trace that identical inspection signal can be imported, the conduct regulation, use on the terminal alignment layer in described inspection, be insulated in the sweep trace of film covering, the sweep trace of the regulation that described identical inspection signal can be imported is drawn longly than other sweep traces, and connects in a wire connecting portion.

During these constitute, on the basis as the action effect of described e-machine and optical panel, in wire connecting portion, specified signal line, specified data line or the unified connection of regulation sweep trace, so, wiring is connected this wire connecting portion, just jointly on the sweep trace of conducting wiring in wire connecting portion.

That is, the wiring of the drive signal of using to the sweep trace input checking, when being connected liquid crystal display, just check with the terminal alignment layer push connect up just passable, particularly wire connecting portion connect a wiring just can, so, extremely simple inspection with the operation that probe is connected sweep trace.

Inspection probe of the present invention is when the characteristic check of described e-machine, temporarily is connected a kind of inspection probe of described signal wire, it is characterized in that possessing: substrate; On described substrate, with the drawing on the direction that direction intersects of described signal wire, corresponding to described inspection with the terminal alignment layer extend arrange and with described signal wire crossing condition, above described signal wire when the crimping, the wiring portion that contacts with described signal input terminal.

Inspection probe of the present invention is when the image of described optical panel shows inspection, temporarily is connected a kind of inspection probe of described data line, it is characterized in that possessing: substrate; On described substrate, with the drawing on the direction that direction intersects of described data line, corresponding to described inspection with the terminal alignment layer extend arrange and with described data line crossing condition, above described data line when the crimping, the wiring portion that contacts with described signal input terminal.

Inspection probe of the present invention is when the image of described optical panel shows inspection, temporarily is connected a kind of inspection probe of described sweep trace, it is characterized in that possessing: substrate; On described substrate, with the drawing on the direction that direction intersects of described sweep trace, corresponding to described inspection with the terminal alignment layer extend arrange and with described sweep trace crossing condition, above described sweep trace when the crimping, the wiring portion that contacts with described signal input terminal.

According to such formation, checking that probe is crimped on the lead division of data line or sweep trace, use the terminal alignment layer and just wiring portion is pressed into inspection, make wiring portion and signal wire (data line, sweep trace) conducting, can be checking that probe be installed in optical panel.Thereby it is extremely simple to check that operation that probe is connected data line or sweep trace becomes, and can epoch-making ground extremely improves image and shows the efficient of checking.

In addition, as checking probe, it is just passable just to establish a wiring portion that extends on the substrate, so, can make the manufacturing cost of checking probe become extremely cheap.

In the present invention, described wiring portion possesses: the conducting wiring of signal conduction and cover described conducting wiring portion and the electric conductor of the electric conductivity that is provided with for well.

According to such formation, in wiring portion, establish the elastic body of electric conductivity above the conducting wiring, check that the elastic body of electric conductivity is made elastic deformation and connected airtight on data line or sweep trace with when the terminal alignment layer so wiring portion is pressed into.Like this, by elastic body, wiring portion reliably is connected and conducting with signal wire (sweep trace, data line).

In addition, on checking with the terminal alignment layer, specified signal line (data line, sweep trace) is to be insulated under the situation that film comes tunicle in addition, as the specified signal line (data line, sweep trace) of signal input terminal amount than dielectric film low insulation film thickness, when wiring portion is crimped on the inspection usefulness terminal alignment layer, elastic body is made elastic deformation and can be contacted being positioned at than the specified signal line (data line, sweep trace) below the dielectric film, can obtain the conducting between wiring portion and the signal wire (data line, sweep trace).

In described inspection probe of the present invention, possess on the basis of substrate and wiring portion, also possesses contact site for well, this contact site is: be located on the described substrate, described wiring portion and described signal input terminal state of contact, above described signal wire (data line, sweep trace) when the crimping, the contact site that contacts with described wire connecting portion.

According to such formation, just wiring portion is pressed into inspection checking probe to be crimped on the lead division of data line or sweep trace and just can makes wiring portion and signal wire (data line, sweep trace) conducting with the terminal alignment layer, can be checking that probe be installed in optical panel.Meanwhile, the contact of contact site portion can obtain the signal wire (data line, sweep trace) of wiring in the wire connecting portion and the conducting between the contact site portion in wire connecting portion.

Thereby, extremely simple checking that operation that probe is connected signal wire, data line or sweep trace becomes, can epoch-making ground improve image greatly and show the efficient of checking.

Particularly, as checking probe, as long as on substrate, be provided with to checking that the wiring of pushing with the terminal alignment layer is just passable with the contact site that is connected wire connecting portion, so can reduce the manufacturing cost of checking probe greatly.

Testing fixture of the present invention is characterized in that, possesses: described inspection probe; By described inspection probe, to described inspection signal input terminal (optical panel or e-machine), the input checking inspection signaling component of drive signal.

According to such formation, check that the manufacturing cost of probe is very cheap, so testing fixture is become at a low price.

And, very simple checking that probe is connected the operation of signal wire (data line, sweep trace) of optical panel or e-machine, show the efficient of checking so can improve image.

The inspection method of optical panel of the present invention is characterized in that, possesses: described inspection probe is connected the described data line of described optical panel and the operation of described sweep trace; Import operation with the signal input terminal input checking with the signal of drive signal to described inspection by described inspection probe.

According to such formation, in connecting operation, the operation that the inspection probe is connected data line and sweep trace is very simple, so can improve the checking efficiency of optical panel.

In the optical panel inspection method of the present invention, preferably also possess: after in described signal input operation, finishing the inspection of described optical panel, excise the excision operation of described wire connecting portion.

According to such formation, after finishing to check, signal wire (data line, sweep trace) all is to be necessary to separate and independence, so in the excision operation, excise on the point of wire connecting portion, contact is checking that signal wire with the terminal alignment layer is originally separation, so the number of the wire connecting portion that should excise is few, for example, one or two degree.Thereby the excision number of times in the excision operation is few and easy.Like this, operation and excision operation can be easyly connected, thereby the checking efficiency of optical panel can be improved.

Description of drawings

Fig. 1 is all pie graphs that are connected the testing fixture state in first embodiment of the present invention, liquid crystal display.

Fig. 2 is all pie graphs of the liquid crystal display of described first embodiment.

Fig. 3 is the enlarged drawing of the data line lead division of described first embodiment.

Fig. 4 is the pie graph of the inspection probe of first embodiment.

Fig. 5 is an enlarged drawing of checking the part of probe contact data line in first embodiment, on the data line lead division.

Fig. 6 is in first embodiment, checks that probe is connected the sectional drawing of data line state.

Fig. 7 is the sectional drawing that is connected the state of red terminal alignment layer in second embodiment of the present invention, the redness of checking probe with wiring portion.

Fig. 8 is the liquid crystal display pie graph of relevant the 3rd embodiment.

Fig. 9 is the pie graph of the inspection probe of the 3rd embodiment.

Figure 10 is the enlarged drawing of drawing the lead division of data line in described the 4th embodiment, from liquid crystal display.

Figure 11 is in described the 4th embodiment, check the pie graph of probe.

Figure 12 is in described the 4th embodiment, checks the enlarged drawing of probe contact in the part of data line at the data line lead division.

Figure 13 is in described the 4th embodiment, checks that probe is connected the sectional drawing of data line state.

Figure 14 is the sectional drawing that is connected the state of red terminal alignment layer in the 5th embodiment of the present invention, the redness of checking probe with wiring portion.

Figure 15 is the pie graph of the liquid crystal display in the 6th embodiment of the present invention.

Figure 16 is in described the 6th embodiment, checks the pie graph of probe.

Figure 17 is the pie graph of display device in the past.

Figure 18 be in the past the inspection probe and data line between the enlarged drawing of coupling part.

The embodiment of invention

Below, in the time of the diagram embodiments of the present invention, embodiments of the present invention are described in conjunction with the symbol that is attached to each key element among the figure.

(first embodiment)

Illustrate in conjunction with Fig. 1 to 6: optical panel of the present invention and first embodiment of this optical panel as the relevant testing fixture of checking object.

Fig. 1 is all pie graphs that are connected testing fixture 100 states as the liquid crystal display 20 of optical panel.

Check that probe 200 is connected an end of the substrate 30 of liquid crystal display 20, from inspection portion (inspection signaling component) 500, by checking probe 200, to liquid crystal display 20 input checking signals.Carry out liquid crystal display 20 image demonstration inspections from the illuminating state of liquid crystal display 20 at this moment.

At first, illustrate: become the liquid crystal display 20 of inspection object and the inspection summary of this liquid crystal display 20.

In addition, when the image that carries out liquid crystal display 20 shows inspection, checking that probe 200 is connected after the data line 22 and sweep trace 21 of liquid crystal display 20, the image that carries out liquid crystal display 20 shows to be checked, but in the first embodiment, main is that example describes with data line 22 situations that inspection probe 200 are connected liquid crystal display 20.

Fig. 2 is all pie graphs of liquid crystal display 20.

In this explanation, becoming the liquid crystal display 20 of checking object for example is, mix R (redness), G (green) and B (blueness) and the liquid crystal display 20 of colored demonstration has been arranged the pixel (for example, with reference to Fig. 3) of sending R (redness), G (green) and B (blueness) at each row.

And when line direction was seen, R (redness), G (green) and B (blueness) put in order according to this and repeat to arrange.

In each pixel, arrange liquid crystal cells (omitting diagram) and be located at the film two-terminal element as on-off element (omit and illustrate) of liquid crystal cells, data line 22 is arranged in the longitudinal direction (column direction) of liquid crystal display 20, and sweep trace 21 is arranged in the horizontal direction (line direction) of liquid crystal display 20.That is, the pixel that belongs to mutually the colleague is to be connected common scanning line 21, and the pixel that the pixel that belongs to identical row is promptly sent same color is to be connected common data line 22.

At this, the data line that the data line that the data line 22 that is connected red pixel is called red data line 22R, be connected green pixel is called green data line 22G, be connected blue pixel is called green data line 22B.

And data line 22 and sweep trace 21 are to draw from the display part 38 of liquid crystal display 20, and all are arranged in the bottom (one side below in Fig. 2 being) of substrate 30.

Particularly, all data lines 22 are to draw (for example, being to draw in the drawings) from the display part 38 of liquid crystal display 20 downwards by original state, and near the bottom of substrate 30, all data line 22 states parallel to each other are arranged.

At this, the method for all data line 22 layouts parallel to each other constitutes lead division 24.

And sweep trace 21 is that the sweep trace 21A of odd number draws on the right side when the mutual reverse direction of odd even is drawn, and the sweep trace 21B of even number draws in the left side.

And sweep trace 21A that draws at the odd number on right side and the sweep trace 21B that draws in the even number in left side are that the bottom to substrate 30 retracts, and arrangement parallel to each other.

At this, sweep trace 21 layouts parallel to each other and constitute lead division 25.

At this, when the image that carries out liquid crystal display 20 showed inspection, pixel can be categorized as R (redness), G (green) and B (blueness) three groups and carry out the image demonstration inspection of each color.

For example, when checking,, unifiedly send same signal and liquid crystal display all lights up as redness to the data line that is connected red pixel (red data line 22R) about lighting of redness.

Under this state, check when red point defect, line defect, pixel are inhomogeneous etc., bad according to showing, can check whether data line has produced the defective of short circuit etc. each other.

At this, for example, any one of red data line 22R and other data lines (green data line 22G, blue data line 22B) if any one between the defective of electric leakage etc. is arranged, then pixel can not suitably be lighted, so can check out defective.

Equally, green lights when checking, also sends same signal and liquid crystal display is all lighted with green to green data line 22G is unified, and blue lights when checking, also send same signal and liquid crystal display is all lighted with blueness to blue data line 22B is unified, show inspection and carry out image.

Fig. 3 is the enlarged drawing of the lead division 24 of data line 22.

As shown in Figure 3, at lead division 24, in the direction of drawing direction perpendicular to data line 22, data line 22 beyond the specified color is that the data line 22 that the specified color of dielectric film 261 is not set has formed the inspection terminal alignment layer of exposing as the signal input terminal of checking usefulness 26 when being insulated film 261 coverings.Check that with terminal alignment layer 26 are the directions of drawing at data line 22, be provided with according to each color.

In Fig. 3, as checking with terminal alignment layer 26, from last red terminal alignment layer 26R, green terminal alignment layer 26G, the blue end alignment layer 26B of being provided with in order.

In red terminal alignment layer 26R, just red data line 22R exposes as signal input terminal, and green data line 22G and blue data line 22B are with dielectric film 261 tunicles.

In green terminal alignment layer 26G, just green data line 22G exposes as signal input terminal, and red data line 22R and blue data line 22B are with dielectric film 261 tunicles.

In blue end alignment layer 26B, just blue data line 22B exposes as signal input terminal, and red data line 22R and green data line 22G are with dielectric film 261 tunicles.

At this, three inspections that are provided with red terminal alignment layer 26R, green terminal alignment layer 26G, blue end alignment layer 26B are during with the terminal alignment layer, and the width of each layer etc. is that arbitrarily, for example to form the width of degree of dielectric film 261 easily just passable.

Below, in conjunction with Fig. 4 to Fig. 6 inspection probe 200 is described.Fig. 4 is that the probe pie graph is checked in expression, and Fig. 5 is on the lead division of data line, amplifies expression and checks the enlarged drawing of probe contact in the part of data line; Fig. 6 checks that probe is connected the sectional drawing of the state of data line.

Check that probe 200 comprises substrate 210 and three 300R of wiring portion, 300G, the 300B that are arranged on the substrate 210.

300R～the B of wiring portion checks when probe 200 is crimped on the lead division 24 of data line 22 that contact is checked with the data line 22 as signal input terminal that exposes on terminal alignment layer 26R～B and be connected checking with terminal alignment layer 26R～B.

As wiring portion, be provided with: three of the wiring 300B of portion are used in the redness wiring 300R of portion that contacts at red terminal alignment layer 26R, contact in the blueness of blue data line 22B with the wiring 300G of portion, contact in the green of green terminal alignment layer 26G.

In Fig. 4, from last be red in order with the wiring 300R of portion, green with the wiring 300G of portion, blue with the wiring 300B of portion.

300R～the B of each wiring portion forms in Fig. 4, has following shape: in the top of leaning on of substrate 210, to the linearly extended main shaft part 310 of horizontal direction; From the lower end that an end of main shaft part 310 is drawn downwards, from the binding axial region 320 of inspection portion 500 input checking signals.And the 300R～B of wiring portion possesses: the conducting wiring 330 that is arranged in the electric conductivity on the substrate 210; In the 300R～B of wiring portion, be located at the protuberance 311 (with reference to Fig. 6) in the conducting wiring 330.

Conducting wiring 330 is crossed over main shaft part 310 and is linked axial region 320 and connects up.

Protuberance 311 is in main shaft part 310, is formed by the conductive elastomer that is layered in the conducting wiring 330, and protuberance 311 is to form from the convex that substrate 210 has a specified altitude.

Below, illustrate: use the image of the liquid crystal display 20 of testing fixture 100 to show inspection.

Show when checking at the image of liquid crystal display 20, at first, inspection probe 200 is installed in after the lead division 24, be connected data line 22 (connection operation).

At this moment, the main shaft part 310 that makes the 300R～G of wiring portion is perpendicular to data line 22, and inspection probe 200 is crimped on the lead division 24 of data line 22, the main shaft part 310 of the 300R～G of each wiring portion rides over the connection contact site of correspondence proving with terminal alignment layer 26R～B respectively.

If like this, the data line 22 that protuberance 311 contacts of the 300R～G of each wiring portion are exposed in each checks with terminal alignment layer 26R～B, and connect each 300R～G of wiring portion and specified data line 22R～B.

At this, as shown in Figure 5, if being crimped on, the main shaft part 310 of the 300R～G of wiring portion checks that then the data line 22 of insulation is not to be connected with protuberance 311 in dielectric film 261 with terminal alignment layer 26R～B, but the data line 22 that exposes is connected with protuberance 311 contacts.

For example, in red terminal alignment layer 26R, red data line 22R exposes as signal input terminal, and green data line 22G and blue data line 22B are insulated film 261 tunicles, so, if redness is crimped on red terminal alignment layer 26R with the protuberance 311 of the 300R of wiring portion, then 311 of protuberances are with red data line 22R contact and be connected.

At this moment, shown in the sectional drawing of Fig. 6, green data line 22G and blue data line 22B come tunicle with dielectric film 261, so red data line 22R is low, differ the thickness of dielectric film 261, still, if protuberance 311 is pressed at red data line 22R, then protuberance 311 is made elastic deformation, arrives red data line 22R and connects.

Equally, the green that is crimped on green terminal alignment layer 26G is to be connected green data line 22G with the protuberance 311 of the 300G of wiring portion, and the blueness that is crimped on blue end alignment layer 26B is to be connected blue data line 22B with the protuberance 311 of the 300B of wiring portion.

At this state, from inspection portion 500 to the 300R～B of each wiring portion drive signal used of input checking in order.

For example, at first, carry out under the situation of lighting inspection of red pixel, from inspection portion to redness with the wiring 300R of portion input checking signal.

If like this, pass through protuberance 311 to all red data line 22R while input checking signals with the conducting wiring 330 of the wiring 300R of portion from redness.

On the other hand, check that the signal input is at green data line 22G and blue data line 22B.

Therefore, be applied to red pixel by red data line 22R voltage, and all red pixels are lighted.Overlooker visual this moment light appearance inspection, or according to the method that the image that ccd video camera is taken is checked, carry out image to redness and show and check.Then, green, blue order is lighted inspection equally.

If finish to check, check that then probe 200 separates from data line 22, qualified liquid crystal display 20 is transported to next manufacturing process.

First embodiment according to such formation can obtain following effect.

(1) lead division 24 at data line 22 forms inspection terminal alignment layer 26R～B, only expose predetermined data line 22 with terminal alignment layer 26R～B as signal input terminal in this inspection, so to checking that the 300R of the wiring portion～B method that just is pressed into inspection probe 200 with terminal alignment layer 26R～B just can carry out and being connected of specified data line 22.Just 300R～the B of wiring portion of inspection probe 200 is pressed into the method for checking with terminal alignment layer 26R～B and just can connects data line 22 and check probe 200, so the operation that inspection probe 200 is connected data line 22 is very simple.In view of the huge manufacture of liquid crystal display 20, connect the simplification of checking with the operation of probe 200 to going up one by one of liquid crystal display 20, can shorten image greatly and show the required time of checking, the raising of making efficient is brought epoch-making effect.

(2) inspection is located at each color with terminal alignment layer 26R～B, so, if the inspection that the 300R～B of wiring portion of inspection probe 200 is pressed into data line 22R～B of all kinds respectively then can obtain conducting respectively at data line 22R～B of all kinds with terminal alignment layer 26R～B.And,, can carry out image and show inspection if, liquid crystal display 20 is lighted with each color to the 300R of wiring portion that is connected data line of all kinds 22～B difference input checking signal.

(3) at the 300R～B of wiring portion, be provided with protuberance 311 above the conducting wiring 330, check that protuberance 311 is made elastic deformation and connected airtight at data line 22R～G with when terminal alignment layer 26R～B so the 300R～B of wiring portion is pressed into.Therefore, by the reliably 300R～B of connecting wiring portion and data line 22R～G and conducting of protuberance 311.

Its result.Can not produce because of checking the inspection mistake of probe 200 and data line 22R～B bad connection etc., can carry out suitable image and show inspection.

In addition, in checking with terminal alignment layer 26, line beyond the specified data line is with dielectric film 261 tunicles, so as the specified data line 22 of signal input terminal be with dielectric film 261 thickness correspondingly, be positioned at downside than dielectric film, but the 300R～B of wiring portion is crimped on and checks that protuberance 311 is made elastic deformation and can be connected the specified data line 22 that is positioned at downside than dielectric film 261, so can make the 300R～B of wiring portion and data line 22R～B conducting with when terminal alignment layer 26R～B.

(4) be provided with inspection terminal alignment layer 26R～B at liquid crystal display 20, so, as checking probe 200, as long as be provided with, to checking that the 300R～B of wiring portion that pushes with terminal alignment layer 26R～B is just passable at substrate 30.The inspection probe 200 of simple manufacturing like this is just passable, so that the manufacturing cost of checking probe 200 very at a low price.

(5) when the image of liquid crystal display 20 shows inspection, when checking that probe 200 is connected the data line 22 of liquid crystal display 20, it is just passable with terminal alignment layer 26R～B just 300R～the B of wiring portion of inspection probe 200 to be pressed into inspection, so the operation that inspection probe 200 is connected data line 22 is very simple.Its result can shorten activity duration from probe 200 to liquid crystal display 20 connection inspections that use greatly, can improve the checking efficiency of liquid crystal display 20.

(second embodiment)

Below, second embodiment of relevant optical panel of the present invention is described in conjunction with Fig. 7.

Basic comprising as the liquid crystal display of second embodiment is identical with the liquid crystal display of first embodiment, but in second embodiment, it is characterized in that: on checking with the terminal alignment layer, conductor layer is stacked on the data line that exposes as signal input terminal.

Fig. 7 is expression, in the lead division 24 of data line 22, the redness of checking probe 200 is connected the sectional drawing of red terminal alignment layer 26R state with the 300R of wiring portion.

As red terminal alignment layer 26R, green data line 22G except red data line 22R and blue data line 22B are with dielectric film 261 tunicles.

And, at red data line 22R, the stacked formed electric conductor 262 of elastic body of electric conductivity.

Electric conductor 262 is also thicker than dielectric film 261, and electric conductor 262 protrudes one section height than dielectric film 261.

In this constitutes, if the protuberance 311 of inspection probe 200 is pressed into red terminal alignment layer 26R, then as shown in Figure 7, protuberance 311 contacts are layered in the electric conductor 262 of red data line 22R at it, if brute force is pushed protuberance 311, then protuberance 311 and electric conductor 262 are made elastic deformation and brute force is connected airtight jointly.Thus, red data line 22R and conducting wiring 330 reliable conducting by protuberance 311 and electric conductor 262.

According to such formation, electric conductor 262 is layered in the data line 22 that exposes as signal input terminal, so, correspondingly uprise protuberance 311 and data line 22 conducting by electric conductor 262 with this electric conductor 262.And because electric conductor 262 has thickness, electric conductor 262 protrudes one section than dielectric film 261, reliably contacts with electric conductor 262 so check the protuberance 311 of probe 200.Therefore, by protuberance 311 and electric conductor 262, can make data line 22 and the conducting wiring 330 reliable conductings of checking probe 200.

In addition, electric conductor 262 is elastic bodys, so when protuberance 311 and electric conductor 262 are crimped, make elastic deformation mutually and contact area broadens, can make protuberance 311 be connected more reliable with electric conductor 262.

(the 3rd embodiment)

Below, in conjunction with Fig. 8 and Fig. 9 the 3rd embodiment of the present invention is described.

The basic comprising of the 3rd embodiment is identical with first embodiment, it is characterized in that: the lead division 25 at sweep trace 21 also is provided with inspection terminal alignment layer, and, checking that probe 200 also is provided with, be connected the wiring portion 300R～B of the inspection of sweep trace 21 with terminal alignment layer 26R～B.

Fig. 8 is the liquid crystal display pie graph of relevant the 3rd embodiment, and Fig. 9 is the pie graph of the inspection probe of expression the 3rd embodiment.

In Fig. 8, be provided with at the lead division 24 of data line 22 and check with terminal alignment layer 26R～B.

And, on the lead division 25 of sweep trace 21, also form and check with terminal alignment layer 27.

At this, as for sweep trace 21, the sweep trace 21A of odd number draws to the right, and the sweep trace 21B of even number draws to the left.So the lead division 25 on the left of the lead division 25 on right side might as well, on the direction of drawing direction perpendicular to sweep trace 21, dielectric film 271 is located on the sweep trace 21 of prescribed distance, and regulation sweep trace 21 has formed as the inspection of exposing terminal alignment layer 27.

The inspection of sweep trace 21 with terminal alignment layer 27 in, dielectric film 271 be located at left side and right side lead division 25 on one data line 21, and expose as signal input terminal every one sweep trace 21.And the inspection of sweep trace 21 is to be set as two-layerly with terminal alignment layer 27, and being insulated sweep trace 21 that film covers with the inspection on upper strata with terminal alignment layer 27A is that inspection in lower floor is exposed in terminal alignment layer 27B.

Fig. 9 is the figure of expression about the inspection probe 200 of the testing fixture of the 3rd embodiment.The basic comprising of the inspection probe 200 of the 3rd embodiment is identical with first embodiment, central authorities at substrate 210, be provided with on the basis of three 300R～B of wiring portion that are connected data line 22, about it, also be provided with two sweep trace wiring portions 400 that are connected sweep trace 21.

Each sweep trace is identical with the 300R～B of wiring portion illustrated in the formation of wiring portion 400 and first embodiment, and possessed main shaft part 310 and linked the shape of axial region 320, be to possess conducting wiring 330 and protuberance 311.

In such formation, when inspection probe 200 is connected liquid crystal display 20, the 300R～G of each wiring portion, 400 that checks probe 200 is pressed into corresponding inspection terminal alignment layer 26R～G, 27A, B.If like this, can be checking that probe 200 is connected data line 22 and sweep trace 21 simultaneously.

(the 4th embodiment)

In conjunction with Figure 10～Figure 13 the 4th embodiment of the present invention is described.

In addition, present embodiment is the testing fixture of checking as the liquid crystal display of optical panel, and basic comprising is identical with described first embodiment.Therefore, omission is to the repeat specification of liquid crystal display 20, substrate 30, inspection probe 200, inspection portion (inspection sender unit) 500.

In Figure 10, same at the lead division 24 and described first embodiment of the data line 22 of present embodiment, formed and checked with terminal alignment layer 26.

The inspection of present embodiment is to be provided with red terminal alignment layer 26R, blue end alignment layer 26B in order and to have omitted green terminal alignment layer 26G from last with terminal alignment layer 26, but is provided with common wire connecting portion 29.Be that green data line 22G is connected the common wire connecting portion 29 of also wanting downside to draw than red terminal alignment layer 26R, blue end alignment layer 26B.

Wire connecting portion 29 possesses: have Rack in the summary middle body of common common line 291 that connects of the downside of all green data line 22G and common line 291 and the portion of terminal 292 protruded from common line 291 convexs.

In Figure 11, check that probe 200 possesses: substrate 210, be connected and check with two redness of terminal alignment layer 26 with the 300R of wiring portion, 300B be connected the contact site portion 350 of wire connecting portion 29.

The 300R of wiring portion, 300B are that contact is being checked with terminal alignment layer 26R, 26B, and are connected the data line 22 as signal input terminal.These structures and described first embodiment are same, so omit repeat specification.In addition, in the present embodiment, wire connecting portion 29 and contact site portion 350 in green system, have been utilized, so omitted the 300G of wiring portion of first embodiment.

Contact site portion 350 is arranged in the slightly protuberance of the electric conductor of central authorities of substrate 210, the 300R of wiring portion, B are connected the state of checking with terminal alignment layer 26R, B, be arranged to: when checking that probe 200 is crimped on the lead division 24 of data line 22, contact is in the position of wire connecting portion 29.Contact site portion 350 possesses: contact is in the portion of terminal 292 of wire connecting portion 29 and the contact head 351 that connects; Draw from contact head 351 belows, import the input signal protuberance 352 that it comes the inspection signal of self-check portion 500.

Below, illustrate: utilize the image of the liquid crystal display 20 of testing fixture 100 to show inspection.

The image of liquid crystal display 20 shows when checking, inspection probe 200 is installed in the lead division 24 of liquid crystal display 20, and is connected data line 22 (connection operation).

At this moment, the main shaft part 310 that makes the 300R of wiring portion, B is perpendicular to data line 22, checking that probe 200 is crimped on the lead division 24 of data line 22, the main shaft part 310 of the 300R of each wiring portion, B is costed respectively and is checked with terminal alignment layer 26R, B, and becomes the contact site state.

If like this, the data line 22 that protuberance 311 contacts of the 300R of each wiring portion, B are exposed in each checks with terminal alignment layer 26R, B makes the 300R of each wiring portion, B be connected with data line 22R, B.In addition, at this moment, contact head 351 contacts of contact site portion 350 are in the portion of terminal 292 of wire connecting portion 29, and the green data line 22G of wiring and 350 conductings of contact site portion in wire connecting portion 29.

At this, Figure 22 checks the enlarged drawing of probe 200 contacts in the part of data line 22 in the lead division 24 of data line 22.In addition, Figure 13 checks the sectional drawing of probe 200 contacts at data line 22 states.

As shown in figure 12, if being crimped on, the main shaft part 310 of the 300R of wiring portion, B checks with terminal alignment layer 26R, B, then the data line 22 with dielectric film 261 insulation is can not be connected with protuberance 311, but the data line 22R, the B that expose are connected with protuberance 311 contacts.

For example, red data line 22R exposes as signal input terminal in red terminal alignment layer 26R, and green data line 22G and blue data line 22B are with dielectric film 261 tunicles, so, if with the red terminal alignment layer 26R of being crimped on of the 300R of wiring portion, then protuberance 311 is just with red data line 22R contact and be connected redness.

At this moment, shown in the sectional drawing of Figure 13, green data line 22G and blue data line 22B are with dielectric film 261 tunicles, so, though red data line 22R and dielectric film 261 thickness correspondingly are positioned at downside, if but protuberance 311 is pressed in red terminal alignment layer 26R, then protuberance 311 is made elastic deformation, reaches red data line 22R and connects.

Equally, the blueness that is crimped on blue end alignment layer 26B is to be connected blue data line 22B with the protuberance of the 300B of wiring portion.

In addition, because wire connecting portion 29, green data line 22G is by wiring, so the contact head 351 of contact site portion 350 is connected the portion of terminal 292 of wire connecting portion 29 and contact site portion 350 and green data line 22G conducting.

At this state, from inspection portion 500 to the 300R of each wiring portion, B and contact site portion 350 drive signal used of input checking in order.

For example, at first, carry out under the situation of lighting inspection of red pixel, check that from inspection portion the signal input is at the redness wiring 300R of portion.

If import simultaneously at all red data line 22R by protuberance 311 inspection signals with the conducting wiring 330 of the 300R of wiring portion like this, from redness.

It checks that signal does not have input at green data line 22G and blue data line 22B on the other hand.

Therefore, be applied to red pixel by red data line 22R voltage, and all red pixels are lighted.Overlooker visual this moment light appearance inspection, or according to the method that the image that ccd video camera is taken is checked, carry out image to redness and show and check.Then, when carrying out blue inspection equally, the input of inspection signal is carried out the blue inspection of lighting in blueness with the 300B of wiring portion.In addition, when carrying out green inspection equally, check that from inspection portion 500 the signal input is in contact site portion 350.If like this, check the signal input at green data line 22G by contact site portion 350, and the green pixel of liquid crystal display 20 is lighted.Carry out green image demonstration inspection from the appearance of lighting of this moment.

If finish to check, check that then probe 200 separates from data line 22, qualified liquid crystal display 20 is transported to next manufacturing process.

At this moment, when liquid crystal display 20 was assembled in actual product, all data lines 22 must separate and when independent, with the A line shown in the symbol A among Figure 10, excise wire connecting portion 29 (excision operation) with laser cutting machine.

The 4th embodiment according to such formation can obtain following effect.

(6) at the lead division 24 of data line 22, formed and checked with terminal alignment layer 26R, B, checking with terminal alignment layer 26R, B, have only specified data line (red data line 22R, blue data line 22B) to expose as signal input terminal, so, just can carry out and being connected of specified data line (red data line 22R, blue data line 22B) checking the wiring portion 300 of just pushing inspection probe 200 with terminal alignment layer 26R, B.

And as for the green data line 22G of wiring in wire connecting portion 29, just wiring is connected this wire connecting portion just can obtain common conducting at all green data line 22G.

Like this, when inspection probe 200 was connected liquid crystal display 20, it was just passable only to push the 300R of wiring portion, B in inspection with terminal alignment layer 26R, B, in addition, 29 of wire connecting portion connect contact site portion 350 just can, so it is extremely simple that inspection probe 200 is connected the operation of data line 22.

(7) be provided with inspection terminal alignment layer 26R, B and wire connecting portion 29 at liquid crystal display 20, so, on substrate 210, only establish: to checking that the 300R of wiring portion, the B that push with terminal alignment layer 26R, B are just passable with the contact site portion 350 that is connected wire connecting portion 29 as checking probe 200.The inspection probe 200 of so simple structure is just passable, checks that probe 200 manufacturing costs become extremely at a low price so can make.

(8) in wiring portion 300, be provided with protuberance 311 above the conducting wiring 330, check that protuberance 311 is made elastic deformation and connected airtight at data line 22R, G with when terminal alignment layer 26R, the B so the 300R of wiring portion, B be pressed into.If like this, by the reliably 300R of connecting wiring portion, B and data line 22R, G and conducting of protuberance 311.In checking with terminal alignment layer 26R, B, be with dielectric film 261 tunicles beyond the specified data line, so, as the data line 22 of signal input terminal be with dielectric film 261 thickness correspondingly, be positioned at downside than dielectric film, but the 300R of wiring portion, B are crimped on and check that protuberance 311 is made elastic deformation and can be connected the specified data line 22 that is positioned at downside than dielectric film 261 with when terminal alignment layer 26R, the B, so can make the 300R of wiring portion, B and data line 22R, B conducting.

(9) check if finish, data line 22 is necessary to separate and independence, so during excision wire connecting portion 29, checking with terminal alignment layer 26R, B, being connected the data line 22 of checking probe 200 also separates simultaneously, so the number of the wire connecting portion 29 that should excise is one, thereby, utilize the number of times of excision of laser cutting machine few and easy.

(the 5th embodiment)

Below, illustrate in conjunction with Figure 14: the 5th embodiment of relevant optical panel of the present invention.

Liquid crystal display as the basic comprising of the liquid crystal display of the 5th embodiment and the 4th embodiment is same, but in the 5th embodiment, it is characterized in that: use the terminal alignment layer checking, conductor layer is stacked in the data line that exposes as signal input terminal.

Figure 14 is expression: in the lead division 24 of data line 22, the redness of checking probe 200 is connected the sectional drawing of red terminal alignment layer 26R state with the 300R of wiring portion.

As red terminal alignment layer 26R, except red data line 22R, green data line 22G and blue data line 22B dielectric film 261 tunicles.And 22R is stacked in red data line, with the electric conductor 262 of conductive elastomer formation.Electric conductor 262 is also thicker than dielectric film 261, and electric conductor 262 also protrudes one section than dielectric film 261.

In this constitutes, if the protuberance 311 of inspection probe 200 is pressed into red terminal alignment layer 26R, then as shown in figure 14, protuberance 311 contacts are layered in the electric conductor 262 of red data line 22R at it, if brute force is pushed protuberance 311, then protuberance 311 and electric conductor 262 are made elastic deformation and brute force is connected airtight jointly.Thus, red data line 22R and conducting wiring 330 is by protuberance 311 and electric conductor 262 reliable conductings.

According to such formation, electric conductor 262 is layered in the data line 22 that exposes as signal input terminal, so, correspondingly uprising with this electric conductor 262, protuberance 311 passes through electric conductor 262 conductings with data line 22.And because electric conductor 262 has thickness, electric conductor 262 protrudes one section than dielectric film 261, reliably contacts with electric conductor 262 so check the protuberance 311 of probe 200.Therefore, by protuberance 311 and electric conductor 262, can make data line 22 and the conducting wiring 330 reliable conductings of checking probe 200.

In addition, electric conductor 262 is elastic bodys, so when protuberance 311 and electric conductor 262 are crimped, make elastic deformation mutually and contact area broadens, can make protuberance 311 be connected more reliable with electric conductor 262.

(the 6th embodiment)

Below in conjunction with Figure 15 and Figure 16 the 6th embodiment of the present invention is described.

The liquid crystal display of the basic comprising of the liquid crystal display of the 5th embodiment and the 4th embodiment is same, but in the 6th embodiment, it is characterized in that: the lead division at sweep trace also is provided with inspection terminal alignment layer and wire connecting portion, checking that probe is provided with, be connected the wiring portion and the contact site portion that is connected the wire connecting portion of sweep trace that check with the terminal alignment layer.

Figure 15 is the pie graph of the liquid crystal display 20 of relevant the 6th embodiment, and Figure 16 is the inspection probe 200 of relevant the 6th embodiment.

In Figure 15, at the lead division 24 of data line 22, be provided with when checking with terminal alignment layer 26R, B, draw green data line 22G and in wire connecting portion 29 wiring.

And, also be provided with inspection terminal alignment layer 28 and wire connecting portion 39 at the lead division 25 of sweep trace 21.

At this, same as for sweep trace 21 and described the 3rd embodiment, as previously mentioned, formed and checked with terminal alignment layer 28.

In the inspection terminal alignment layer 28 of sweep trace 21, the lead division 25 in lead division 25 left side on right side is provided with dielectric film 281 every one sweep trace 21, and exposes as signal input terminal every one sweep trace 21.

And in checking with terminal alignment layer 28, making the sweep trace 21 that is insulated film covering 281 is to draw longly, with its lower end of wire connecting portion 39 wiring.

Figure 16 is the figure of the inspection probe of relevant the 6th embodiment.

The basic comprising and the 4th embodiment of the inspection probe 200 of the 6th embodiment are same, but, central authorities at substrate 210, be provided with on the basis of two 300R of wiring portion, B being connected data line 22 and contact site portion 350, about it, be provided with, be connected sweep trace the wiring portion 400 and the contact site portion 450 of sweep trace 21.The 300R of wiring portion, B illustrated in the formation of each sweep trace usefulness wiring portion 400 and the 4th embodiment are same, have possessed the shape of main shaft part 310 and binding axial region 320, are to possess conducting wiring 330 and protuberance 311.In addition, the formation of contact site portion 450 also with the 4th embodiment in the formation of illustrated contact site portion 350 same, contact in wire connecting portion 39 and with wire connecting portion 39 in sweep trace 21 conductings of wiring.

In such formation, when checking that probe 200 is connected liquid crystal display 20, the 300R of each wiring portion, the B that check probe 200,400 and each contact site portion 350,450 be pressed into corresponding inspection usefulness terminal alignment layer 26,28 and wire connecting portion 29,39.If like this, can be checking that probe 200 is connected data line 22 and sweep trace 21 simultaneously.

In addition, the invention is not restricted to above-mentioned embodiment, can realize that the distortion of purpose scope of the present invention, improvement also belong to the present invention.

On checking with the terminal alignment layer, there is not specific restriction with the spacing of dielectric film tunicle data line and signal wire, can show the precision of inspection according to image, all changes certainly be arranged.

For example, in that every one signal wire (data line, sweep trace) dielectric film to be set also passable, in that every two signal wires dielectric film to be set also passable, the spacing of the signal wire that exposes as signal input terminal certainly shows according to image checks that desired precision can change.

In the above-described embodiment, liquid crystal display is that example is illustrated, but the present invention can be applied in, if arrange many signal line, for example as the e-machine that can import many signal line of identical inspection signal when checking that has of the e-machine of semiconductor etc.

In addition, the colored liquid crystal display that shows is that example is illustrated to mix R, G, B as optical panel (liquid crystal display), can certainly be the liquid crystal display such as monochrome.

The present invention can be used in the characteristic check that the image of being furnished with optical panel shows the e-machine of inspection and signal wire.

Claims (18)

1, a kind of e-machine is laid with a plurality of signal wires and is configured with the state of almost parallel each other at the described signal wire of the lead division of drawing described signal wire,

At described lead division, be formed with inspection terminal alignment layer, this is checked with in the terminal alignment layer, with the drawing on the direction that direction intersects of described signal wire, the described signal wire of regulation is insulated film and covers, and be not insulated the regulation that film covers described signal wire, expose as the signal input terminal of checking usefulness.

2, e-machine according to claim 1 is characterized in that:

The signal input terminal of described inspection usefulness is the signal input terminal that can import the regulation of same inspection signal;

Described inspection with the terminal alignment layer in, be insulated the signal wire of the described regulation that can the same inspection signal of input in the signal wire that film covers, draw longly than other signal wires, and be connected a wire connecting portion.

3, a kind of optical panel, in every row, has the pixel that produces same primary colours, and described different base colors at line direction with certain arranged in order, show the different base colors colour mixture more than two is carried out colour, and dispose the common data line that drives described pixel in every row, and drawing the lead division of described data line, described data line is with state configuration parallel to each other

At described lead division, be formed with inspection terminal alignment layer, this is checked with in the terminal alignment layer, with the drawing on the direction that direction intersects of described data line, data line beyond the primary colours of regulation is insulated film and covers, and be not insulated the described primary colours of the regulation that film covers data line, expose as the signal input terminal of checking usefulness.

4, optical panel according to claim 3 is characterized in that: described inspection terminal alignment layer is provided with by each primary colours drawing on the direction of described data line.

5, according to claim 3 or 4 described optical panel, it is characterized in that: use in the terminal alignment layer in described inspection, on the data line that exposes as described signal input terminal, be laminated with electric conductor.

6, according to each described optical panel in the claim 3～5, it is characterized in that: the data line of at least a color among beyond the primary colours of described regulation, draw longly than other signal wires, and be connected a wire connecting portion by color separately.

7, a kind of optical panel is laid with the sweep trace that drives described pixel, and is drawing the lead division of described sweep trace in every row, described sweep trace is with state configuration parallel to each other,

At described lead division, be formed with inspection terminal alignment layer, this is checked with in the terminal alignment layer, with the drawing on the direction that direction intersects of described sweep trace, the described sweep trace of regulation is insulated film and covers, and be not insulated the regulation that film covers described sweep trace, expose as the signal input terminal of checking usefulness.

8, optical panel according to claim 7 is characterized in that: the signal input terminal of described inspection usefulness is the sweep trace that can import the regulation of same inspection signal;

Described inspection with the terminal alignment layer in, be insulated the sweep trace of the described regulation that can the same inspection signal of input in the described sweep trace that film covers, draw longly than other signal wires, and be connected a wire connecting portion.

9, a kind of inspection probe in the characteristic check of the described e-machine of claim 1, temporarily is connected on the described signal wire, comprising:

Substrate; With

Wiring portion, its on described substrate, with the drawing on the direction that direction intersects of described signal wire, extend laying corresponding to described inspection with the terminal alignment layer, when during from the top crimping of described signal wire, contacting with described signal input terminal with the state that intersects with described signal wire.

10, a kind of inspection probe in the characteristic check of the described e-machine of claim 2, temporarily is connected on the described signal wire, comprising:

Substrate;

Wiring portion, its on described substrate, with the drawing on the direction that direction intersects of described signal wire, extend laying corresponding to described inspection with the terminal alignment layer, when during from the top crimping of described signal wire, contacting with described signal input terminal with the state that intersects with described signal wire; And

Contact site, it is located on the described substrate, when, contacting with described wire connecting portion during from the top crimping of described signal wire with described wiring portion and described signal input terminal state of contact.

11, a kind of inspection probe, the image of each described optical panel shows in the inspection in claim 3～5, temporarily is connected on the described data line, comprising:

Substrate; With

Wiring portion, its on described substrate, with the drawing on the direction that direction intersects of described data line, extend laying corresponding to described inspection with the terminal alignment layer, when during from the top crimping of described data line, contacting with described signal input terminal with the state that intersects with described data line.

12, a kind of inspection probe in the image demonstration of the described optical panel of claim 6 is checked, temporarily is connected on the described data line, comprising:

Substrate;

Wiring portion, its on described substrate, with the drawing on the direction that direction intersects of described data line, extend laying corresponding to described inspection with the terminal alignment layer, when during from the top crimping of described data line, contacting with described signal input terminal with the state that intersects with described data line; And

Contact site, it is located on the described substrate, when, contacting with described wire connecting portion during from the top crimping of described data line with described wiring portion and described signal input terminal state of contact.

13, a kind of inspection probe in the image demonstration of the described optical panel of claim 7 is checked, temporarily is connected on the described sweep trace, comprising:

Substrate; With

Wiring portion, its on described substrate, with the drawing on the direction that direction intersects of described sweep trace, extend laying corresponding to described inspection with the terminal alignment layer, when during from the top crimping of described sweep trace, contacting with described signal input terminal with the state that intersects with described sweep trace.

14, a kind of inspection probe in the image demonstration of the described optical panel of claim 8 is checked, temporarily is connected on the described sweep trace, comprising:

Substrate;

Wiring portion, its on described substrate, with the drawing on the direction that direction intersects of described sweep trace, extend laying corresponding to described inspection with the terminal alignment layer, when during from the top crimping of described sweep trace, contacting with described signal input terminal with the state that intersects with described sweep trace; And

Contact site, it is located on the described substrate, when, contacting with described wire connecting portion during from the top crimping of described sweep trace with described wiring portion and described signal input terminal state of contact.

15, according to each described inspection probe in the described claim 9～14, it is characterized in that:

Described wiring portion comprises: make the conducting wiring of signal conduction and cover described conducting wiring and the elastic body of the electric conductivity that is provided with.

16, a kind of testing fixture is characterized in that, possesses:

Each described inspection probe in the claim 9～15; With

Check signaling component, it will check with drive signal to be input to described inspection signal input terminal by described inspection probe.

17, a kind of inspection method of optical panel is characterized in that, possesses:

Connect operation, it connects arbitrary described inspection probe and described optical panel in the claim 9～16; With

Signal input operation, it will check with drive signal to be input to described optical panel by described inspection probe.

18, optical panel inspection method according to claim 17 is characterized in that possessing:

The excision operation after the inspection of its described optical panel in described signal input operation finishes, is excised described wire connecting portion.

Images