CN1813197A - 存储总线检查过程 - Google Patents
存储总线检查过程 Download PDFInfo
- Publication number
- CN1813197A CN1813197A CNA2004800182818A CN200480018281A CN1813197A CN 1813197 A CN1813197 A CN 1813197A CN A2004800182818 A CNA2004800182818 A CN A2004800182818A CN 200480018281 A CN200480018281 A CN 200480018281A CN 1813197 A CN1813197 A CN 1813197A
- Authority
- CN
- China
- Prior art keywords
- bit pattern
- data bus
- received
- electronic module
- storage unit
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000000034 method Methods 0.000 title claims abstract description 42
- 230000015654 memory Effects 0.000 title description 9
- 230000004044 response Effects 0.000 claims abstract description 36
- 230000000295 complement effect Effects 0.000 claims abstract description 20
- 238000009434 installation Methods 0.000 claims description 22
- 238000012545 processing Methods 0.000 claims description 5
- 238000012360 testing method Methods 0.000 abstract description 49
- 230000006870 function Effects 0.000 description 7
- 238000010586 diagram Methods 0.000 description 5
- 239000004615 ingredient Substances 0.000 description 2
- 238000012546 transfer Methods 0.000 description 2
- 108010032595 Antibody Binding Sites Proteins 0.000 description 1
- 241000218645 Cedrus Species 0.000 description 1
- 230000005540 biological transmission Effects 0.000 description 1
- 238000004891 communication Methods 0.000 description 1
- 238000013500 data storage Methods 0.000 description 1
- 230000009977 dual effect Effects 0.000 description 1
- 238000005538 encapsulation Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 230000002349 favourable effect Effects 0.000 description 1
- 230000014509 gene expression Effects 0.000 description 1
- 238000003384 imaging method Methods 0.000 description 1
- 238000007689 inspection Methods 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 230000000717 retained effect Effects 0.000 description 1
- 230000000630 rising effect Effects 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/02—Detection or location of defective auxiliary circuits, e.g. defective refresh counters
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/2205—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested
- G06F11/221—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested to test buses, lines or interfaces, e.g. stuck-at or open line faults
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/02—Detection or location of defective auxiliary circuits, e.g. defective refresh counters
- G11C29/025—Detection or location of defective auxiliary circuits, e.g. defective refresh counters in signal lines
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
- G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
- G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
- G11C2029/4402—Internal storage of test result, quality data, chip identification, repair information
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Quality & Reliability (AREA)
- Techniques For Improving Reliability Of Storages (AREA)
- Test And Diagnosis Of Digital Computers (AREA)
Abstract
Description
主机 | MMC总线 | 卡 | |||
输出 | 输入 | 缺省 | 输入 | 输出 | |
周期I | 10101010 | 01011111 | 11111NC1NC1NC1NC | 1010 | 0101 |
周期II | 01010101 | 10101111 | 11111NC1NC1NC1NC | 0101 | 1010 |
主机 | MMC总线 | 卡 | ||
输出 | 输入 | 缺省 | 输入 | 输出 |
1010NCNCNCNC | 0101 | 1111NANANANA | 10101111 | 01010000 |
Claims (33)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US10/614,341 | 2003-07-02 | ||
US10/614,341 US7036054B2 (en) | 2003-07-02 | 2003-07-02 | Memory bus checking procedure |
Publications (2)
Publication Number | Publication Date |
---|---|
CN1813197A true CN1813197A (zh) | 2006-08-02 |
CN100451668C CN100451668C (zh) | 2009-01-14 |
Family
ID=33552820
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CNB2004800182818A Expired - Lifetime CN100451668C (zh) | 2003-07-02 | 2004-05-19 | 存储总线检查过程 |
Country Status (9)
Country | Link |
---|---|
US (2) | US7036054B2 (zh) |
EP (1) | EP1639378B1 (zh) |
JP (1) | JP4291368B2 (zh) |
KR (1) | KR100803768B1 (zh) |
CN (1) | CN100451668C (zh) |
BR (1) | BRPI0411797A (zh) |
HK (1) | HK1092532A1 (zh) |
TW (1) | TWI253504B (zh) |
WO (1) | WO2005003797A1 (zh) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN103229424A (zh) * | 2011-10-13 | 2013-07-31 | 松下电器产业株式会社 | 近距离非接触通信装置、系统及方法 |
CN112530510A (zh) * | 2020-11-30 | 2021-03-19 | 武汉攀升鼎承科技有限公司 | 电脑内存条自动化检测设备 |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7624211B2 (en) * | 2007-06-27 | 2009-11-24 | Micron Technology, Inc. | Method for bus width negotiation of data storage devices |
US7631233B2 (en) * | 2007-10-07 | 2009-12-08 | United Memories, Inc. | Data inversion register technique for integrated circuit memory testing |
FR2937052A1 (fr) * | 2008-10-08 | 2010-04-16 | Biomerieux Sa | Milieu reactionnel pour les bacteries staphylococcus aureus |
Family Cites Families (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0357278A2 (en) * | 1988-08-29 | 1990-03-07 | Eaton Corporation | Versatile control system utilizing a microcontroller |
CN1045655A (zh) * | 1988-11-23 | 1990-09-26 | 约翰弗兰克制造公司 | 系统自动诊断的内核测试接口和方法 |
US4958347A (en) * | 1988-11-23 | 1990-09-18 | John Fluke Mfg. Co., Inc. | Apparatus, method and data structure for validation of kernel data bus |
JPH0691513B2 (ja) * | 1989-01-27 | 1994-11-14 | 富士通株式会社 | データ伝送誤り検出方式 |
EP0913837A1 (de) * | 1997-11-03 | 1999-05-06 | Siemens Aktiengesellschaft | Verfahren zur Prüfung der Busanschlüsse von beschreib- und lesbaren integrierten, elektronischen Schaltkreisen, insbesondere von Speicherbausteinen |
US6324666B1 (en) * | 1998-04-20 | 2001-11-27 | Mitsubishi Denki Kabushiki Kaisha | Memory test device and method capable of achieving fast memory test without increasing chip pin number |
US6473871B1 (en) * | 1999-08-31 | 2002-10-29 | Sun Microsystems, Inc. | Method and apparatus for HASS testing of busses under programmable control |
US6820148B1 (en) * | 2000-08-17 | 2004-11-16 | Sandisk Corporation | Multiple removable non-volatile memory cards serially communicating with a host |
US6704677B2 (en) * | 2001-12-14 | 2004-03-09 | Sun Microsystems, Inc. | Method and apparatus for generating a data pattern for simultaneously testing multiple bus widths |
-
2003
- 2003-07-02 US US10/614,341 patent/US7036054B2/en not_active Expired - Fee Related
-
2004
- 2004-05-19 BR BRPI0411797-2A patent/BRPI0411797A/pt not_active IP Right Cessation
- 2004-05-19 WO PCT/IB2004/001632 patent/WO2005003797A1/en active Search and Examination
- 2004-05-19 EP EP04733859.5A patent/EP1639378B1/en not_active Expired - Lifetime
- 2004-05-19 CN CNB2004800182818A patent/CN100451668C/zh not_active Expired - Lifetime
- 2004-05-19 KR KR1020057025243A patent/KR100803768B1/ko active IP Right Grant
- 2004-05-19 JP JP2006516501A patent/JP4291368B2/ja not_active Expired - Lifetime
- 2004-06-30 TW TW093119230A patent/TWI253504B/zh active
-
2006
- 2006-04-06 US US11/400,327 patent/US7275186B2/en not_active Expired - Lifetime
- 2006-11-30 HK HK06113204.9A patent/HK1092532A1/xx not_active IP Right Cessation
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN103229424A (zh) * | 2011-10-13 | 2013-07-31 | 松下电器产业株式会社 | 近距离非接触通信装置、系统及方法 |
CN103229424B (zh) * | 2011-10-13 | 2014-12-10 | 松下电器产业株式会社 | 近距离非接触通信装置、系统及方法 |
CN112530510A (zh) * | 2020-11-30 | 2021-03-19 | 武汉攀升鼎承科技有限公司 | 电脑内存条自动化检测设备 |
CN112530510B (zh) * | 2020-11-30 | 2022-03-22 | 武汉攀升鼎承科技有限公司 | 电脑内存条自动化检测设备 |
Also Published As
Publication number | Publication date |
---|---|
EP1639378A4 (en) | 2010-07-14 |
TWI253504B (en) | 2006-04-21 |
WO2005003797A1 (en) | 2005-01-13 |
US20050005209A1 (en) | 2005-01-06 |
KR20060028435A (ko) | 2006-03-29 |
EP1639378B1 (en) | 2020-09-23 |
US20060187726A1 (en) | 2006-08-24 |
KR100803768B1 (ko) | 2008-02-15 |
TW200513658A (en) | 2005-04-16 |
EP1639378A1 (en) | 2006-03-29 |
US7275186B2 (en) | 2007-09-25 |
US7036054B2 (en) | 2006-04-25 |
JP4291368B2 (ja) | 2009-07-08 |
CN100451668C (zh) | 2009-01-14 |
HK1092532A1 (en) | 2007-02-09 |
JP2007528042A (ja) | 2007-10-04 |
BRPI0411797A (pt) | 2006-08-08 |
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Legal Events
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Owner name: MEMORY TECHNOLOGIES LLC Free format text: FORMER OWNER: NOKIA OY Effective date: 20140708 Owner name: NOKIA OY Free format text: FORMER OWNER: NOKIA OYJ Effective date: 20140708 |
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C41 | Transfer of patent application or patent right or utility model | ||
TR01 | Transfer of patent right |
Effective date of registration: 20140708 Address after: Nevada Patentee after: Memory Technologies LLC Address before: American California Patentee before: NOKIA Corp. Effective date of registration: 20140708 Address after: American California Patentee after: NOKIA Corp. Address before: Espoo, Finland Patentee before: NOKIA Corp. |
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TR01 | Transfer of patent right | ||
TR01 | Transfer of patent right |
Effective date of registration: 20211026 Address after: 5A, 5 / F, second warehouse, China Travel Association warehouse, 1 Cheong Hang Road, Hung Hom, Kowloon, Hong Kong, China Patentee after: Jiangbolong Electronics (Hong Kong) Co.,Ltd. Address before: Nevada Patentee before: Memory Technologies LLC |
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CX01 | Expiry of patent term |
Granted publication date: 20090114 |
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CX01 | Expiry of patent term |