CN1809728A - 量子隧道效应传感装置 - Google Patents
量子隧道效应传感装置 Download PDFInfo
- Publication number
- CN1809728A CN1809728A CNA2004800110472A CN200480011047A CN1809728A CN 1809728 A CN1809728 A CN 1809728A CN A2004800110472 A CNA2004800110472 A CN A2004800110472A CN 200480011047 A CN200480011047 A CN 200480011047A CN 1809728 A CN1809728 A CN 1809728A
- Authority
- CN
- China
- Prior art keywords
- substrate
- mentioned
- electric
- sensing device
- hinge
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
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Classifications
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B81—MICROSTRUCTURAL TECHNOLOGY
- B81B—MICROSTRUCTURAL DEVICES OR SYSTEMS, e.g. MICROMECHANICAL DEVICES
- B81B3/00—Devices comprising flexible or deformable elements, e.g. comprising elastic tongues or membranes
- B81B3/0035—Constitution or structural means for controlling the movement of the flexible or deformable elements
- B81B3/0051—For defining the movement, i.e. structures that guide or limit the movement of an element
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B81—MICROSTRUCTURAL TECHNOLOGY
- B81B—MICROSTRUCTURAL DEVICES OR SYSTEMS, e.g. MICROMECHANICAL DEVICES
- B81B3/00—Devices comprising flexible or deformable elements, e.g. comprising elastic tongues or membranes
- B81B3/0018—Structures acting upon the moving or flexible element for transforming energy into mechanical movement or vice versa, i.e. actuators, sensors, generators
- B81B3/0021—Transducers for transforming electrical into mechanical energy or vice versa
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01C—MEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY
- G01C19/00—Gyroscopes; Turn-sensitive devices using vibrating masses; Turn-sensitive devices without moving masses; Measuring angular rate using gyroscopic effects
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
- G01D21/00—Measuring or testing not otherwise provided for
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01P—MEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION, OR SHOCK; INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT
- G01P15/00—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration
- G01P15/02—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses
- G01P15/08—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values
- G01P15/0894—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values by non-contact electron transfer, i.e. electron tunneling
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B81—MICROSTRUCTURAL TECHNOLOGY
- B81B—MICROSTRUCTURAL DEVICES OR SYSTEMS, e.g. MICROMECHANICAL DEVICES
- B81B2201/00—Specific applications of microelectromechanical systems
- B81B2201/02—Sensors
- B81B2201/0285—Vibration sensors
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B81—MICROSTRUCTURAL TECHNOLOGY
- B81B—MICROSTRUCTURAL DEVICES OR SYSTEMS, e.g. MICROMECHANICAL DEVICES
- B81B2203/00—Basic microelectromechanical structures
- B81B2203/01—Suspended structures, i.e. structures allowing a movement
- B81B2203/0109—Bridges
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B81—MICROSTRUCTURAL TECHNOLOGY
- B81B—MICROSTRUCTURAL DEVICES OR SYSTEMS, e.g. MICROMECHANICAL DEVICES
- B81B2203/00—Basic microelectromechanical structures
- B81B2203/05—Type of movement
- B81B2203/051—Translation according to an axis parallel to the substrate
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S977/00—Nanotechnology
- Y10S977/70—Nanostructure
- Y10S977/724—Devices having flexible or movable element
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S977/00—Nanotechnology
- Y10S977/70—Nanostructure
- Y10S977/724—Devices having flexible or movable element
- Y10S977/725—Nanomotor/nanoactuator
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S977/00—Nanotechnology
- Y10S977/70—Nanostructure
- Y10S977/724—Devices having flexible or movable element
- Y10S977/732—Nanocantilever
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S977/00—Nanotechnology
- Y10S977/70—Nanostructure
- Y10S977/724—Devices having flexible or movable element
- Y10S977/733—Nanodiaphragm
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Remote Sensing (AREA)
- Analytical Chemistry (AREA)
- Radar, Positioning & Navigation (AREA)
- Chemical & Material Sciences (AREA)
- Pressure Sensors (AREA)
- Gyroscopes (AREA)
- Micromachines (AREA)
- Measuring Volume Flow (AREA)
- Measurement Of Mechanical Vibrations Or Ultrasonic Waves (AREA)
- Superconductor Devices And Manufacturing Methods Thereof (AREA)
- Measuring Fluid Pressure (AREA)
- Piezo-Electric Or Mechanical Vibrators, Or Delay Or Filter Circuits (AREA)
Abstract
Description
Claims (9)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
AU2003901914 | 2003-04-22 | ||
AU2003901914A AU2003901914A0 (en) | 2003-04-22 | 2003-04-22 | Quantum tunnelling transducer device |
Publications (2)
Publication Number | Publication Date |
---|---|
CN1809728A true CN1809728A (zh) | 2006-07-26 |
CN100419383C CN100419383C (zh) | 2008-09-17 |
Family
ID=31500951
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CNB2004800110472A Expired - Fee Related CN100419383C (zh) | 2003-04-22 | 2004-04-22 | 量子隧道效应传感装置 |
Country Status (7)
Country | Link |
---|---|
US (1) | US8033091B2 (zh) |
EP (1) | EP1623188B1 (zh) |
JP (1) | JP4474624B2 (zh) |
CN (1) | CN100419383C (zh) |
AT (1) | ATE519095T1 (zh) |
AU (1) | AU2003901914A0 (zh) |
WO (1) | WO2004094956A1 (zh) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101776434A (zh) * | 2010-03-10 | 2010-07-14 | 南开大学 | 基于隧道电流反馈瞄准的小盲孔测量方法及测量装置 |
CN104291263A (zh) * | 2014-08-25 | 2015-01-21 | 厦门脉科优芯电子科技有限公司 | 一种金刚石桥膜结构微型红外光源芯片及制备方法 |
Families Citing this family (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7552636B2 (en) * | 2007-04-17 | 2009-06-30 | Ut-Battelle, Llc | Electron/hole transport-based NEMS gyro and devices using the same |
US8544324B2 (en) | 2007-08-24 | 2013-10-01 | Pilsne Research Co., L.L.C. | Quantum tunnelling sensor device and method |
AT513634B1 (de) * | 2012-12-05 | 2015-02-15 | Tech Universität Wien | MEMS-Sensor zur Detektion von Umgebungsparametern |
CA2948408C (en) | 2014-05-09 | 2023-03-07 | Quantum Numbers Corp. | Method for generating random numbers and associated random number generator |
US10168996B1 (en) | 2018-01-15 | 2019-01-01 | Quantum Numbers Corp. | Method and system for generating a random bit sample |
CN111397671A (zh) * | 2020-04-09 | 2020-07-10 | 杜宏宇 | 非稳定多相流开放式液体流量计 |
Family Cites Families (41)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3396317A (en) * | 1965-11-30 | 1968-08-06 | Texas Instruments Inc | Surface-oriented high frequency diode |
JPS5220317B2 (zh) * | 1974-12-25 | 1977-06-02 | ||
US4373165A (en) * | 1979-11-07 | 1983-02-08 | Texas Instruments Incorporated | Very high density punch-through read-only-memory |
EP0262253A1 (en) * | 1986-10-03 | 1988-04-06 | International Business Machines Corporation | Micromechanical atomic force sensor head |
US5265470A (en) * | 1987-11-09 | 1993-11-30 | California Institute Of Technology | Tunnel effect measuring systems and particle detectors |
US5203208A (en) * | 1991-04-29 | 1993-04-20 | The Charles Stark Draper Laboratory | Symmetrical micromechanical gyroscope |
WO1993000589A1 (en) * | 1991-06-25 | 1993-01-07 | Sundstrand Corporation | Coriolis rate sensor using tunnel-effect displacement sensor |
DE69232257T2 (de) * | 1991-09-30 | 2002-08-08 | Texas Industries, Inc. | Durch Verarmung kontrollierte Isolationsstufe |
US5461916A (en) * | 1992-08-21 | 1995-10-31 | Nippondenso Co., Ltd. | Mechanical force sensing semiconductor device |
US5673139A (en) * | 1993-07-19 | 1997-09-30 | Medcom, Inc. | Microelectromechanical television scanning device and method for making the same |
US5367136A (en) * | 1993-07-26 | 1994-11-22 | Westinghouse Electric Corp. | Non-contact two position microeletronic cantilever switch |
US5389182A (en) * | 1993-08-02 | 1995-02-14 | Texas Instruments Incorporated | Use of a saw frame with tape as a substrate carrier for wafer level backend processing |
JPH07113645A (ja) * | 1993-10-15 | 1995-05-02 | Toyota Motor Corp | 振動ジャイロ |
BR9507650A (pt) * | 1994-05-14 | 1997-09-09 | Scient Generics Ltd | Codificador de posiçao |
JP3182301B2 (ja) * | 1994-11-07 | 2001-07-03 | キヤノン株式会社 | マイクロ構造体及びその形成法 |
EP0743508A2 (en) * | 1995-05-16 | 1996-11-20 | Mitutoyo Corporation | Induced current position transducer |
NL1000698C2 (nl) * | 1995-06-29 | 1996-12-31 | Karel Jan Vollers | Bevestigingsinrichting voor het aan een gebouw bevestigen van gevel panelen, en gebouw voorzien van met die bevestigingsinrichting bevestig de gevelpanelen. |
US5756895A (en) * | 1995-09-01 | 1998-05-26 | Hughes Aircraft Company | Tunneling-based rate gyros with simple drive and sense axis coupling |
GB9524241D0 (en) * | 1995-11-28 | 1996-01-31 | Smiths Industries Plc | Rate sensors |
DE69626972T2 (de) * | 1996-07-31 | 2004-01-08 | Stmicroelectronics S.R.L., Agrate Brianza | Integrierter kapazitiver Halbleiter-Beschleunigungsmessaufnehmer sowie Verfahren zu seiner Herstellung |
EP1135665B1 (en) * | 1998-09-07 | 2010-07-14 | Quantrum Precision Instruments Asia Pte Ltd | Measurements using tunnelling current between elongate conductors |
US6137206A (en) * | 1999-03-23 | 2000-10-24 | Cronos Integrated Microsystems, Inc. | Microelectromechanical rotary structures |
US6534839B1 (en) * | 1999-12-23 | 2003-03-18 | Texas Instruments Incorporated | Nanomechanical switches and circuits |
US6674141B1 (en) * | 2000-08-01 | 2004-01-06 | Hrl Laboratories, Llc | Single crystal, tunneling and capacitive, three-axes sensor using eutectic bonding and a method of making same |
US6630367B1 (en) * | 2000-08-01 | 2003-10-07 | Hrl Laboratories, Llc | Single crystal dual wafer, tunneling sensor and a method of making same |
US6555404B1 (en) * | 2000-08-01 | 2003-04-29 | Hrl Laboratories, Llc | Method of manufacturing a dual wafer tunneling gyroscope |
US6495905B2 (en) * | 2000-11-09 | 2002-12-17 | Texas Instruments Incorporated | Nanomechanical switches and circuits |
US7330271B2 (en) * | 2000-11-28 | 2008-02-12 | Rosemount, Inc. | Electromagnetic resonant sensor with dielectric body and variable gap cavity |
SG103276A1 (en) * | 2001-01-03 | 2004-04-29 | Inst Materials Research & Eng | Vibratory in-plane tunnelling gyroscope |
US6740922B2 (en) * | 2001-08-14 | 2004-05-25 | Agere Systems Inc. | Interdigitated capacitor and method of manufacturing thereof |
JP2003240797A (ja) * | 2002-02-18 | 2003-08-27 | Mitsubishi Electric Corp | 半導体加速度センサ |
SE0200868D0 (sv) * | 2002-03-20 | 2002-03-20 | Chalmers Technology Licensing | Theoretical model för a nanorelay and same relay |
US6895818B2 (en) * | 2002-12-20 | 2005-05-24 | Robert Bosch Gmbh | Differential in-plane tunneling current sensor |
JP3792675B2 (ja) * | 2003-06-05 | 2006-07-05 | ファナック株式会社 | 微細位置決め装置及び工具補正方法 |
US7177505B2 (en) * | 2004-03-04 | 2007-02-13 | Rosemount Inc. | MEMS-based actuator devices using electrets |
JP2005283393A (ja) * | 2004-03-30 | 2005-10-13 | Fujitsu Media Device Kk | 慣性センサ |
US7225674B2 (en) * | 2004-04-30 | 2007-06-05 | The Regents Of The University Of California | Self-stabilizing, floating microelectromechanical device |
US7355318B2 (en) * | 2004-06-12 | 2008-04-08 | Auburn University | Micromachined device utilizing electrostatic comb drives to filter mechanical vibrations |
US20070163346A1 (en) * | 2006-01-18 | 2007-07-19 | Honeywell International Inc. | Frequency shifting of rotational harmonics in mems devices |
JP4874067B2 (ja) * | 2006-02-07 | 2012-02-08 | セイコーインスツル株式会社 | 角速度センサ |
EP1879034B1 (en) * | 2006-07-14 | 2009-11-18 | STMicroelectronics S.r.l. | Microelectromechanical inertial sensor, in particular for free-fall detection applications |
-
2003
- 2003-04-22 AU AU2003901914A patent/AU2003901914A0/en not_active Abandoned
-
2004
- 2004-04-22 EP EP04728741A patent/EP1623188B1/en not_active Expired - Lifetime
- 2004-04-22 US US10/554,312 patent/US8033091B2/en not_active Expired - Fee Related
- 2004-04-22 AT AT04728741T patent/ATE519095T1/de not_active IP Right Cessation
- 2004-04-22 JP JP2006504018A patent/JP4474624B2/ja not_active Expired - Fee Related
- 2004-04-22 WO PCT/AU2004/000523 patent/WO2004094956A1/en active Application Filing
- 2004-04-22 CN CNB2004800110472A patent/CN100419383C/zh not_active Expired - Fee Related
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101776434A (zh) * | 2010-03-10 | 2010-07-14 | 南开大学 | 基于隧道电流反馈瞄准的小盲孔测量方法及测量装置 |
CN101776434B (zh) * | 2010-03-10 | 2011-12-14 | 南开大学 | 基于隧道电流反馈瞄准的小盲孔测量方法及测量装置 |
CN104291263A (zh) * | 2014-08-25 | 2015-01-21 | 厦门脉科优芯电子科技有限公司 | 一种金刚石桥膜结构微型红外光源芯片及制备方法 |
CN104291263B (zh) * | 2014-08-25 | 2017-02-01 | 厦门脉科优芯电子科技有限公司 | 一种金刚石桥膜结构微型红外光源芯片及制备方法 |
Also Published As
Publication number | Publication date |
---|---|
EP1623188A4 (en) | 2009-05-27 |
EP1623188A1 (en) | 2006-02-08 |
CN100419383C (zh) | 2008-09-17 |
US8033091B2 (en) | 2011-10-11 |
EP1623188B1 (en) | 2011-08-03 |
JP2006524320A (ja) | 2006-10-26 |
AU2003901914A0 (en) | 2003-05-08 |
JP4474624B2 (ja) | 2010-06-09 |
WO2004094956A1 (en) | 2004-11-04 |
ATE519095T1 (de) | 2011-08-15 |
US20060285789A1 (en) | 2006-12-21 |
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Legal Events
Date | Code | Title | Description |
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C06 | Publication | ||
PB01 | Publication | ||
C10 | Entry into substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
C14 | Grant of patent or utility model | ||
GR01 | Patent grant | ||
ASS | Succession or assignment of patent right |
Owner name: PSINI RESEARCH CO., LTD. Free format text: FORMER OWNER: QUANTRUM PREC INSTR ASIA PTE L. Effective date: 20120517 |
|
C41 | Transfer of patent application or patent right or utility model | ||
TR01 | Transfer of patent right |
Effective date of registration: 20120517 Address after: Delaware Patentee after: Research limited liability company Address before: Singapore Singapore Patentee before: Quantrum Prec Instr Asia Pte L. |
|
C17 | Cessation of patent right | ||
CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20080917 Termination date: 20130422 |