CN1804949B - Integrated photoelectrical experiment and test method - Google Patents
Integrated photoelectrical experiment and test method Download PDFInfo
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- CN1804949B CN1804949B CN 200510136070 CN200510136070A CN1804949B CN 1804949 B CN1804949 B CN 1804949B CN 200510136070 CN200510136070 CN 200510136070 CN 200510136070 A CN200510136070 A CN 200510136070A CN 1804949 B CN1804949 B CN 1804949B
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Abstract
The invention belongs to light, machine, and electric and computing compound type photo electricity combined test measuring method. The photo electricity combined test formed by the function circuit plate sets each parameter of the synchronous logical signal and opens the device and then enters into waiting condition; it waits for the hardware applying request; the hardware enters into multi-channel synchronous A/D transferring and stores the transferring result in the storage, then it accounts the number, if the accouter achieves the setting value, it applies the interrupt request, otherwise, it dose A/D transferring; when the hardware generates the interrupt request, the computer system responses the request and starts to transmit the data and displays the wave mode.
Description
Technical field
The invention belongs to the experimental teaching technical field, the integrated photoelectrical experiment and test method of should belong to light, mechanical, electrical more specifically, calculating mating type.
Technical background
Make a general survey of the experimental teaching of existing university of China science and engineering universities and colleges, the instrument that all belongs to single-mode, be the Experimental Teaching Method and the instrument of simple functions such as optical engineering class, mould electricity, the electric class of number, sensor class, though these experiment teaching instruments can carry out the branch education experiment of this subject, but, can not carry out the experimental teaching of multidisciplinary synthesis, more can't cultivate student's Comprehensive Experiment technical ability.
Summary of the invention
The objective of the invention is provides integrated photoelectrical experiment and test method by the integrated photoelectrical experiment platform, realizes the volt-ampere characteristic test function of the synchronous oscillography function of multichannel and transistor, photoelectric coupled device and various photoelectric devices.
The invention provides integrated photoelectrical experiment and test method, utilize computer system 1, the Experiments of Optics platform 2 of integrated photoelectrical experiment platform, measurement instrument platform 3, Experiment of Electrical Circuits platform 4, signal source output port 5, photomultiplier experimental provision 6, signal generating circuit plate 7, functional circuit plate 8, oscillography input port 9 parts such as grade are realized the volt-ampere characteristic test function of the synchronous oscillography function of multichannel and transistor, photoelectric coupled device and various photoelectric devices.
Method of testing of the present invention is as follows:
The structure of functional circuit plate 8 by synchronous logic controller 81, oscillography logic 82, parameter be provided with 83, A/D group 84, memory set 85, volt-ampere characteristic steering logic 86, digital staircase generator 87, digital saw-toothed wave generator group 88, interface control circuit 89 lines form.
Wherein, synchronous logic controller 81, oscillography logic 82, parameter are provided with 83, A/D group 84, memory set 85, interface control circuit 89 be used to realize the synchronous oscillography function of multichannel;
The volt-ampere characteristic test function that synchronous logic controller 81, parameter are provided with 83, A/D group 84, memory set 85, volt-ampere characteristic steering logic 86, digital staircase generator 87, digital saw-toothed wave generator group 88, interface control circuit 89 are used to realize photoelectric coupled device and various photoelectric devices.
The synchronous oscillography function of described multichannel is achieved in that and adopts the synchronous logic controller to produce the oscillography logic, control A/D group synchronously to multichannel measured signal change, and transformation result is left in the memory set.On interface control circuit output interface bus, pass to computer system again, waveform is presented on the computer screen.
The various concrete parameter of the oscillography logical signal of the synchronous oscillography function of above-described multichannel can be carried out the parameter setting by interface bus, interface control circuit by computer software, thereby realizes that synchronizing signal is adjustable.
The method of the volt-ampere characteristic of functional circuit board test photoelectric device: adopt synchronous logic controller, volt-ampere characteristic controller control figure staircase generator to produce staircase waveform and give plate outer light source; Volt-ampere characteristic controller also control figure saw-toothed wave generator group produces how the group sawtooth wave are controlled outer circuit-under-test of a plurality of plates or device; The output signal of outer circuit-under-test of plate or device links to each other with the input signal of A/D group by the oscillography input port 9 of integrated photoelectrical experiment platform; Volt-ampere characteristic controller A/D group synchronously to multichannel measured signal change, and transformation result is left in the memory set, on interface control circuit output interface bus, pass to computer system again, waveform is presented on the computer screen.
Described photoelectric device is transistor, photoelectric coupled device and various photoelectric device.
The various concrete parameter of the volt-ampere characteristic control signal of the volt-ampere characteristic test function of above-described transistor, photoelectric coupled device and various photoelectric devices can be carried out the parameter setting by interface bus, interface control circuit by computer software, thereby realizes that the volt-ampere characteristic control signal is adjustable.
Integrated photoelectrical experiment and test method provided by the invention has outstanding technical progress and remarkable result, mainly contains the following aspects:
1, this method of testing makes the integrated photoelectrical experiment platform have light, mechanical, electrical, as to calculate mating type characteristics, and utilize that computing machine is soft, hardware technology replaces instrument and equipments such as electron oscillograph, transistor characteristic tester, signal generator and image display, realizes typical " virtual instrument " function.In experiment porch, utilize elementary logic circuit, A/D data acquisition circuit to cooperate control and software for calculation specifically, realize the function of measurement and graphic presentation.
2, in " Analog Electronics Technique " experiment, the electronic devices and components that experiment porch Experiment of Electrical Circuits platform is provided can connect into multiple mimic channel, utilize " oscillography " input port of experiment porch to carry out the observation of signal waveform, not only can acquire the characteristic and the application of various electron devices, can also understand and characteristic and the parameter of grasping multiple mimic channel.
3, in " Digital Electronic Technique " experiment, CPLD field programmable logic circuit and programming software that experiment porch provides are write out multiple logical circuit, the oscillography port of platform and the output that multiple logical circuit is observed by simulation software are provided, reach Digital Electronic Technique experiment and the desired purpose of logic circuit development.
4, aspect circuit measuring, " oscillography " input port of platform carries out the synchro measure and the demonstration of 4 tunnel signal waveforms by experiment;
5, when various photoelectric sensors are experimentized, " virtual instrument " function that experiment porch provides will provide the signal of various required waveforms, realize the test to characterisitic parameters such as photoelectric device volt-ampere characteristic, time response, spectral responses.
6, in the photoelectric detecting technology experiment, the spare part that utilizes experiment porch to provide can be built various photodetector systems, and, realize final object of experiment with measurement means and computer software and hardware that platform provides again with the circuit that its optoelectronic sensor access designs voluntarily.
7, test for " contemporary optics engineering ", utilize the optical bench and the various optical system support of experiment porch just can constitute various optical imaging systems, in its image planes position appropriate imageing sensor is installed, the output of imageing sensor is sent view data into computing machine by computer data acquisition system just can obtain functions such as experiment purpose test target and demonstration by software for calculation.
Certainly, the potential function of experiment porch is also a lot, and its optics in the physics experiment, electricity, photoelectricity, subject such as optomagnetic can be brought into play bigger effect surely, are the important platforms of college of science and engineering's experimental teaching, also are the exploitation experiment porchs of new high-tech enterprise.Pay attention to the cultivation of experimenter's manipulative ability and innovative thinking in the instrument overall design, the electronic devices and components, photoelectric sensor, optical component, the optics adjustment that provide by test platform make it can finish the experiment and the creationary contrived experiment of various standards under guide book of experiment and experiment instruction teacher's guidance with the installation clamping device.
Description of drawings
Fig. 1: integrated photoelectrical experiment platform basic structure;
Fig. 2: the functional circuit plate is formed module;
Fig. 3: the synchronous oscillography function system of multichannel;
Fig. 4: computer control process flow diagram;
Fig. 5: multichannel volt-ampere characteristic test macro;
Fig. 6: the synchronous oscillography synchronous logic of multichannel;
Fig. 7: volt-ampere characteristic test control signal logic.
Wherein: the 1-computer system, 2-Experiments of Optics platform, 3-measurement instrument platform, 4-electronic experiment operating platform, 5-signal source output port, 6-photomultiplier experimental provision, 7-signal generating circuit plate, 8-functional circuit plate, 9-oscillography input port, 81-synchronous logic controller, 82-oscillography logic, the setting of 83-parameter, 84-A/D group, 85-memory set, 86-volt-ampere characteristic steering logic, 87-numeral staircase generator, 88-numeral saw-toothed wave generator group, 89-interface control circuit, 90-interface bus.
Embodiment
The present invention will be further described in detail below in conjunction with accompanying drawing:
Integrated photoelectrical experiment platform as shown in Figure 1 comprises by computer system 1, Experiments of Optics platform 2, measurement instrument platform 3, Experiment of Electrical Circuits platform 4, signal source output port 5, photomultiplier experimental provision 6, signal generating circuit plate 7, functional circuit plate 8, oscillography input port 9 parts such as grade.Wherein functional circuit plate 8 as shown in Figure 2 mainly comprises modules such as synchronous logic controller 81, oscillography logic 82, parameter are provided with 83, A/D group 84, memory set 85, volt-ampere characteristic steering logic 86, digital staircase generator 87, digital saw-toothed wave generator group 88, interface control circuit 89.Functional circuit plate 8 links to each other with computer system 1 on the integrated photoelectrical experiment platform by interface bus 90.
The critical piece of photoelectricity experiment porch has:
1, photoelectric device such as semiconductor photoelectric device and photomultiplier
All can be by the semiconductor photoelectric device of buying various brands on the electronic market and photomultiplier as surveying device fully.
2, linear array CCD image sensor
The line array CCD that can be used for measuring grating has a lot, as TCD1500C (5340 pixel), TCD1702C (7500 pixel), TCD2901D (10550 * 3 pixel) etc., these line array CCDs are Toshiba Corp and produce, and the similar line array CCD of other company's production all can adopt certainly.
3, Array CCD sensor
Can be by the Array CCD sensor of buying multiple brand on the electronic market.
4, various light sources
Can buy various light sources from the electronic market.
5, computer system
Can be by the computer system of buying multiple brand on the electronic market.
6, digital voltmeter, digital electronic ammeter and digital illuminometer
Can be by digital voltmeter, digital electronic ammeter and the digital illuminometer of buying multiple brand on the electronic market.
Can finish following experiment by photoelectricity experiment porch of the present invention:
1. the synchronous oscillography function of multichannel
The synchronous oscillography function system of multichannel as shown in Figure 3.Concrete grammar is: synchronous logic controller 81 produces SH, SP and FC three road synchronizing pulses, and its logical relation produces oscillography control signal synchro control A/D change-over circuit group 84, A/D1～A/Dn by oscillography logic 82 as shown in Figure 6 again.CH
1～CHn is an oscillography input port 9 for the n bars passage that connects circuit-under-test, connecting n group A/D change-over circuit 84. respectively carries out the A/D conversion to n bars passage simultaneously and numerical information is stored in separately in the corresponding memory 85 under the control of oscillography control signal. and the oscillography logic generator is after number of samples reaches requirement, send signal to interface control circuit 89, request interface control circuit 89 transmission data. interface control circuit 89 is by the data transmission of 1 of computer interface bus 90 realizations and computer system. and computer software reads the data of each signalling channel, and be presented at .SH on the display of computer system 1 respectively, SP, the various concrete setting of signals such as FC is passed through interface bus 90 by computer software, interface control circuit 89 sends to synchronous logic controller 81, thereby reach the adjustable purpose of synchronizing signal, make it adapt to various needs.
The computer software control flow of the synchronous oscillography function of multichannel as shown in Figure 4.Be provided with by the parameters of computer system, and starting outfit starts working, enter waiting status then, wait for that the application of hardware capability circuit board interrupts the synchronous logic signal.Hardware carries out the A/D conversion of multi-channel synchronous after parameter and startup are set, and transformation result is deposited in the storer, and counting is applied for interrupting if the value of counter reaches the numerical value of setting then, changes otherwise continue A/D.After hardware produces interrupt request, the computer system response request, and begin to transmit data, display waveform.Behind the DTD, judge whether to want arrestment,, withdraw from the synchronous oscillography function of multichannel if arrestment then stops hardware device.Otherwise wait for hardware interrupts request next time.
2. the volt-ampere characteristic test function of transistor, photoelectric coupled device and various photoelectric devices
The method of the volt-ampere characteristic test function of transistor, photoelectric coupled device and various photoelectric devices as shown in Figure 5.Synchronous logic controller 81 produces SH, SP and FC three road synchronizing pulses among the figure, gives two groups of digital signal generators-digital staircase generator 87 and digital saw-toothed wave generator group 88 respectively by volt-ampere characteristic steering logic 86.The logical relation of SH, SP and FC and staircase waveform and sawtooth wave as shown in Figure 7.Step signal drives equipment such as external light source, and sawtooth signal drives n circuit-under-test or components and parts, and the equipment such as external light source that step signal drives pass to light signal n circuit-under-test or the components and parts that are subjected to the sawtooth signal driving.The output signal of n circuit-under-test or components and parts connects n group A/D change-over circuit A/D1～A/Dn respectively.Under the control of volt-ampere test signal, simultaneously n output signal carried out A/D conversion and numerical information is stored in separately in the corresponding memory.Volt-ampere test signal logic generator sends signal to interface control circuit after number of samples reaches requirement, request interface control circuit transmission data.Interface control circuit is by the data transmission of computer interface bus realization with intercomputer.Computer software reads the data of each signalling channel, and is presented on the display respectively.The various concrete setting of signals such as SH, SP, FC sends to the synchronous logic controller by computer system by interface bus, interface control circuit, thereby reaches the adjustable purpose of digital signal, makes it adapt to various needs.
The volt-ampere characteristic test function the computer system control flow process identical with the computer system control flow process of the synchronous oscillography function of multichannel.
Can finish following experiment by integrated photoelectrical experiment method of the present invention:
1. the measurement of photoelectric device time response
On the integrated photoelectrical experiment platform, utilize method of testing of the present invention to measure to the time response of devices such as photoresistance, photodiode, phototriode, photoelectrical coupler, silicon photocell.
Now describe with the example that is measured as of measuring photoresistance time response. on integrated photoelectrical experiment platform circuitry experiment table, earlier with connecting lead with photoresistance, triode, reometer, voltage table, potentiometer is connected by photoresistance metering circuit time response with resistance etc. in computer system response test program 1 last working time, required parameters such as square wave frequency are passed through software in will measuring time response, interface bus 90, interface control circuit 89 grades are carried out the parameter setting to the oscillography logic. behind the software startup hardware device, synchronous logic controller 81 outputs synchronizing signal as shown in Figure 6, after oscillography logic 82, by set square wave frequency driven in synchronism A/D group 84, deposit data after the light source drive signal that the input end of A/D group 84 uses in being respectively and testing time response and the output signal .A/D conversion of tested photoresistance (can be a plurality of) is in memory set 85, through interface control circuit 89, interface bus 90 sends computer system 1 to, demonstrates data and curves time response that measures on screen.
2. the measurement of phototriode volt-ampere characteristic
On the integrated photoelectrical experiment platform, utilize method of testing of the present invention to measure to the volt-ampere characteristic of devices such as photodiode, phototriode, photoelectrical coupler.
Now describe with the example that is measured as of measuring the phototriode volt-ampere characteristic.On integrated photoelectrical experiment platform circuitry experiment table, phototriode voltammetric characteristic measuring circuit such as phototriode, triode, reometer, voltage table, potentiometer and resistance are connected earlier with the connection lead.Operation volt-ampere characteristic test procedure carries out parameter setting by software, interface bus 90, interface control circuit 89 etc. to the oscillography logic with parameters such as staircase waveform frequency required in the voltammetric characteristic measuring on computer system 1.Behind the software startup hardware device, synchronous logic controller 81 output synchronizing signals, output steering logic signal as shown in Figure 7 after volt-ampere characteristic steering logic 86, digital staircase generator 87, digital saw-toothed wave generator group 88.With the measured light in the step signal driving phototriode voltammetric characteristic measuring, its frequency is set frequency.With sawtooth signal control A/D group 84, the input end of A/D group 84 is tested phototriode (can be a plurality ofs') a output signal.Deposit data after the A/D conversion sends computer system 1 to through interface control circuit 89, interface bus 90 in memory set 85, can demonstrate the volt-ampere characteristic data and curves that measures on screen.
The present invention is open and propose integrated photoelectrical experiment and test method, and those skilled in the art can be by using for reference this paper content, and links such as appropriate configuration design realize.Method of the present invention is described by preferred embodiment, and person skilled obviously can be changed or suitably change and combination method as herein described in not breaking away from content of the present invention, spirit and scope, realizes the technology of the present invention.Special needs to be pointed out is, the replacement that all are similar and change apparent to those skilled in the artly, they are regarded as being included in the present invention.
Claims (5)
1. integrated photoelectrical experiment and test method, it is characterized in that: the functional circuit plate is provided with the parameters of synchronous logic signal, and the structure of functional circuit plate (8) is made up of synchronous logic controller (81), oscillography logic (82), parameter setting (83), A/D change-over circuit group (84), memory set (85), volt-ampere characteristic steering logic (86), digital staircase generator (87), digital saw-toothed wave generator group (88), interface control circuit (89) line; Be provided with by the parameters of computer system, and starting outfit starts working, enter waiting status then, wait for that the application of hardware capability circuit board interrupts the synchronous logic signal; Hardware carries out the A/D conversion of multi-channel synchronous after parameter and startup are set, and transformation result deposited in the storer, count then, if reaching the numerical value of setting, the value of counter applies for interrupting, otherwise continue the A/D conversion, after hardware produces interrupt request, the computer system response request, and begin to transmit data, display waveform; Behind the DTD, judge whether to want arrestment,, withdraw from the synchronous oscillography function of multichannel if arrestment then stops hardware device; Otherwise wait for hardware interrupts request next time.
2. a kind of integrated photoelectrical experiment and test method as claimed in claim 1, the method that it is characterized in that the synchronous oscillography function of described functional circuit board test multichannel: produce SH, SP and FC three road synchronizing pulses by synchronous logic controller 81, produce the oscillography control signal by oscillography logic 82 again, control A/D group, measured signal is changed synchronously to multichannel, and transformation result left in the memory set, output on the interface bus through interface control circuit again, interface bus passes to computer system, and waveform is presented on the computer screen.
3. a kind of integrated photoelectrical experiment and test method as claimed in claim 2, the various concrete parameter that it is characterized in that the synchronous oscillography function logic of described multichannel signal is carried out the parameter setting by computer software by interface bus, interface control circuit, and the realization synchronizing signal can be adjusted.
4. a kind of integrated photoelectrical experiment and test method as claimed in claim 3, it is characterized in that synchronous logic controller (81) produces SH, SP and FC three road synchronizing pulses, produce the oscillography control signal by oscillography logic (82), control A/D change-over circuit group (84), A/D1～A/Dn; CH
1～CHn is for connecting the n bars passage of circuit-under-test, and promptly oscillography input port (9) connects n group A/D change-over circuit (84) respectively; Under the control of oscillography control signal, simultaneously n bars passage is carried out A/D conversion and numerical information is stored in separately in the corresponding memory (85); The oscillography logic generator is after number of samples reaches requirement, send signal to interface control circuit (89), request interface control circuit (89) transmission data, interface control circuit (89) is by the data transmission between computer interface bus (90) realization and computer system (1); Computer software reads the data of each signalling channel, and is presented at respectively on the display of computer system (1); The various concrete setting of SH, SP, FC signal sends to synchronous logic controller (81) by computer software by interface bus (90), interface control circuit (89).
5. utilize the method for integrated photoelectrical experiment platform test volt-ampere characteristic, the various concrete parameter that it is characterized in that described volt-ampere characteristic control signal can be carried out the parameter setting by interface bus, interface control circuit by computer software, thereby realizes that the volt-ampere characteristic control signal is adjustable; Synchronous logic controller (81) produces SH, SP and FC three road synchronizing pulses, give two groups of digital signal generators-digital staircase generator (87) and digital saw-toothed wave generator group (88) respectively by volt-ampere characteristic steering logic (86), drive external light source equipment with step signal; Sawtooth signal drives n circuit-under-test or components and parts, and the external light source equipment that step signal drives passes to the ladder light signal n circuit-under-test or the components and parts that are subjected to the sawtooth signal driving; The output signal of n circuit-under-test or components and parts connects n group A/D change-over circuit A/D1～A/Dn respectively; Under the control of volt-ampere test signal, simultaneously n output signal carried out A/D conversion and numerical information is stored in separately in the corresponding memory, volt-ampere test signal logic generator is after number of samples reaches requirement, send signal to interface control circuit, request interface control circuit transmission data; Interface control circuit realizes and the data transmission of intercomputer that by computer interface bus computer software reads the data of each signalling channel, and is presented on the display respectively; The various concrete setting of SH, SP, FC signal sends to the synchronous logic controller by computer software by interface bus, interface control circuit.
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| CN1804949B true CN1804949B (en) | 2010-05-05 |
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| CN102789705A (en) * | 2012-07-30 | 2012-11-21 | 桂林电子科技大学 | Wireless class teaching system based on virtual instrument |
| CN108037394A (en) * | 2017-12-22 | 2018-05-15 | 浙江八达电子仪表有限公司 | A kind of device of optocoupler time response detection |
| CN114863770A (en) * | 2022-05-27 | 2022-08-05 | 哈尔滨工程大学 | Photoelectric device characteristic measuring device and method for experiment teaching |
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1282058A (en) * | 2000-08-03 | 2001-01-31 | 吉林大学 | Optical bistable, non-stable, chaotic and dynamic storage experiment facility |
| CN2708326Y (en) * | 2003-07-28 | 2005-07-06 | 合肥工业大学 | CCD testing device |
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1282058A (en) * | 2000-08-03 | 2001-01-31 | 吉林大学 | Optical bistable, non-stable, chaotic and dynamic storage experiment facility |
| CN2708326Y (en) * | 2003-07-28 | 2005-07-06 | 合肥工业大学 | CCD testing device |
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