CN1737675A - Method for improving optical characteristics of rare earth mixed aluminum oxide thin film utilizing laser annealing - Google Patents
Method for improving optical characteristics of rare earth mixed aluminum oxide thin film utilizing laser annealing Download PDFInfo
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- CN1737675A CN1737675A CN 200510046967 CN200510046967A CN1737675A CN 1737675 A CN1737675 A CN 1737675A CN 200510046967 CN200510046967 CN 200510046967 CN 200510046967 A CN200510046967 A CN 200510046967A CN 1737675 A CN1737675 A CN 1737675A
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- 238000005224 laser annealing Methods 0.000 title claims abstract description 20
- 238000000034 method Methods 0.000 title claims abstract description 18
- TWNQGVIAIRXVLR-UHFFFAOYSA-N oxo(oxoalumanyloxy)alumane Chemical compound O=[Al]O[Al]=O TWNQGVIAIRXVLR-UHFFFAOYSA-N 0.000 title claims description 16
- 229910052761 rare earth metal Inorganic materials 0.000 title claims description 6
- 150000002910 rare earth metals Chemical class 0.000 title claims description 6
- 230000003287 optical effect Effects 0.000 title abstract description 14
- 239000010409 thin film Substances 0.000 title 1
- 238000000137 annealing Methods 0.000 claims abstract description 31
- 229910052769 Ytterbium Inorganic materials 0.000 claims abstract description 15
- NAWDYIZEMPQZHO-UHFFFAOYSA-N ytterbium Chemical compound [Yb] NAWDYIZEMPQZHO-UHFFFAOYSA-N 0.000 claims abstract description 12
- 229910052691 Erbium Inorganic materials 0.000 claims description 18
- PNEYBMLMFCGWSK-UHFFFAOYSA-N Alumina Chemical compound [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 claims description 13
- 238000002425 crystallisation Methods 0.000 claims description 9
- 230000008025 crystallization Effects 0.000 claims description 9
- UYAHIZSMUZPPFV-UHFFFAOYSA-N erbium Chemical compound [Er] UYAHIZSMUZPPFV-UHFFFAOYSA-N 0.000 claims description 9
- 239000013078 crystal Substances 0.000 claims description 4
- 230000001105 regulatory effect Effects 0.000 claims description 4
- 238000009826 distribution Methods 0.000 claims description 2
- 238000007493 shaping process Methods 0.000 claims description 2
- 206010020843 Hyperthermia Diseases 0.000 claims 1
- 230000036031 hyperthermia Effects 0.000 claims 1
- 230000000694 effects Effects 0.000 abstract description 9
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- 230000008569 process Effects 0.000 abstract description 2
- 239000000523 sample Substances 0.000 description 30
- KWMNWMQPPKKDII-UHFFFAOYSA-N erbium ytterbium Chemical compound [Er].[Yb] KWMNWMQPPKKDII-UHFFFAOYSA-N 0.000 description 16
- 238000005424 photoluminescence Methods 0.000 description 12
- -1 erbium ion Chemical class 0.000 description 11
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- 150000002500 ions Chemical class 0.000 description 3
- 238000001228 spectrum Methods 0.000 description 3
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- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 2
- 239000002019 doping agent Substances 0.000 description 2
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- 229910000530 Gallium indium arsenide Inorganic materials 0.000 description 1
- 240000007594 Oryza sativa Species 0.000 description 1
- 235000007164 Oryza sativa Nutrition 0.000 description 1
- 229910052775 Thulium Inorganic materials 0.000 description 1
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Abstract
This invention belongs to optical communication technique source amplifier parts field and relates to one transistor method on alumna by use of laser annealing with ytterbium. The invention is characterized by the following: using low power CO2 laser to plasm splashing method to process it; the annealing effect adjusts laser working power and sample position and shining time control.
Description
Technical field
The invention belongs to active optical amplifier technical field in the optical communication technique, be specifically related to a kind ofly utilize laser annealing that er-doped/erbium and ytterbium codoping aluminum oxide film is carried out the method for crystallization.
Background technology
In optical fiber telecommunications system, light signal exists loss when transmitting in optical fiber.Therefore in actual applications, one " repeater " will be set, the light signal of decay will be amplified, and continue to transmit along fibre circuit every tens kms.It is found that rare earth Er
3+Internal layer 4f electronics
4I
13/2-
4I
15/2Energy level transition, its characteristic wavelength is 1.54 μ m, just in time is in the lowest loss district of silica fibre, is the ideal transmission wave band of optical fiber communication, and also there is good shielding action in outer-shell electron, has good monochromaticity.Owing to have plurality of advantages, the research of the optical amplifier spare of erbium doped ion to obtain paying close attention to widely, obtained extensive studies in the last few years and be applied to fiber optic communication field.Britain University of Southampton had at first developed Erbium-Doped Fiber Amplifier (EDFA) in 1985.After this, important breakthrough constantly appears in the research work of Erbium-Doped Fiber Amplifier (EDFA). and develop into the nineties, the technology of Erbium-Doped Fiber Amplifier (EDFA) is ripe, be widely used, but self have many shortcomings that can't overcome, its doping content is lower, needs higher pump energy; Volume is big, complex structure, needs number to reach high-gain in the optical fiber of rice.These just have been subjected to very big restriction in application facet, also bring very big inconvenience to the user simultaneously.
1996, people such as Hoven made the long er-doped Al of 4cm
2O
3Flat optical waveguide amplifier, the net gain at 1.54 mu m wavebands acquisition 2.3dB makes erbium-doped optical waveguide amplifier (EDWA:erbium-dopedwaveguide amplifier) become one of worldwide research focus.EDWA has the characteristics of miniaturization, high-gain, is the basis of integrated optics, optoelectronic integration research.Yet, the trivalent erbium ion is less to the absorption cross section of 980nm pump laser, for improving pumping efficiency and suppressing effects such as conversion in the cooperation that cluster produced that the high-concentration dopant erbium ion forms, excited state absorption, other element of codope is as sensitizer, as ytterbium, silver, thulium etc. in er-doped matrix.Ytterbium is approximately 10 times of erbium to the absorption cross section of 980nm pump light.Mix altogether in the film at the ytterbium erbium, ytterbium ion will absorb most of pump power, and pass through ytterbium ion
2F
7/2→
2F
5/2And erbium ion
4I
11/2→
4I
15/2Resonance energy transfer that can inter-stage, for erbium ion provide a kind of indirectly, pump mode efficiently.The concentration quenching effect of ytterbium itself is very weak simultaneously, realizes high-concentration dopant easily, can suppress the formation of erbium ion cluster well, has reduced erbium concentration quenching phenomenon, and then has improved the photoluminescence property of erbium ion.Can predict, the ytterbium erbium is mixed optical waveguides amplifier (YECDWA:Ytterbium and ErbiumCo-Doped Waveguide Amplifiers) altogether will have more development potentiality.Some companies (as French Teem photon company, U.S. Northstar photon company etc.) have released the commercialization er-doped successively, the ytterbium erbium is mixed the optical waveguides amplifier product altogether, but the matrix of these products mostly is various silicate glass materials, as phosphate glass, fluorate glass etc.That the ytterbium erbium mixes altogether that the host material of film selects for use is Al
2O
3, reason is: (1) Er
2O
3, Yb
2O
3With Al
2O
3Similar crystalline network is arranged, allow at Al
2O
3Matrix in the erbium ion and the ytterbium ion of doped with high concentration; (2) Al
2O
3Refractive index [n (λ=1530nm)=1.65and n (λ=980nm)=1.74] and substrate Si O
2Refractive index [n (λ=1530nm)=1.445and n (λ=980nm)=1.451] differ bigger, well flashlight is constrained in the optical waveguide, and can guarantee the little radius-of-curvature in knee the time, film leaks also less; (3) Al
2O
3The own loss of film is little; (4) Al
2O
3Have extraordinary physics, chemical characteristic, as insulation, wear-resisting and anticorrosive etc.
The inventor mixes Al altogether to the ytterbium erbium of various technology preparations
2O
3Film all adopts 900 ℃~1000 ℃, two hours thermal annealing of high temperature furnace under the air ambient.The high temperature heating will produce ion-exchange between film and substrate for a long time, cause matrix Al
2O
3Lattice mismatch and produce defective, and make that impurity mixes in the air, influence the ytterbium erbium and mixed Al altogether
2O
3The photoluminescence property of film.The laser annealing technology then can be rapidly heated and cool off, and can conveniently reconcile irradiation time, the radiation space of laser line.The present invention adopts continuously/pulse CO
2Laser instrument is mixed Al altogether to the ytterbium erbium of the auxiliary microwave plasma deposition of radio frequency preparation
2O
3Film sample is annealed, and has measured photoluminescence property.The result shows: when film sample placed 3 times of focal position of lens, the surface topography of film was unaffected substantially, approximate homo genizing annelaing in the zone that radius is 8 millimeters.The photoluminescence spectra strength ratio that the ytterbium erbium of laser annealing is mixed film has altogether improved 14.6 times with batch sample photoluminescence intensity behind 950 ℃, 2 hours thermal annealings.
Summary of the invention
The purpose of this invention is to provide a kind of method of utilizing laser annealing to improve er-doped/erbium and ytterbium codoping aluminum oxide film optical characteristics, to realize improving the purpose of aluminum oxide film crystallization.
Technical scheme of the present invention is to utilize computer-controlled CO
2Laser instrument is total to the alumina doped film to er-doped/erbium, ytterbium and shines, and laser beam produces high temperature in aluminum oxide film, and the aluminum oxide film crystallization degree is improved.Laser light path utilizes the He-Ne laser instrument that light path is regulated, the CO of outgoing
2Hot spot carries out strength retrogression and spot shaping through the overdamping concavees lens, and the light spot energy that obtains is moderate, and the non-homogeneous Gaussian distribution of light beam obtains on average.The power of laser illumination is all relevant with the annealing effect with the time, there is a power bracket in laser work, crystallization could take place greater than the threshold power alpha-alumina crystals, and the excessive film surface of power can form laser hole burning, laser power can be by adjusting the control of sample and lens position, equally also there is working range in laser irradiation time, and at three times of focal length places, the annealing effect was best in 32 seconds.
Membraneous material is wanted annealed processing after mixing, and the one, eliminate the damage of injection or deposition process, eliminate Al
2O
3Defective in the crystalline network, the port number of minimizing optical loss and radiationless relaxation increases the photoluminescence life-span that records, thereby increases photoluminescence intensity.The 2nd, activate the Er ion, studies show that the luminous O of requirement of Er
2+Participation could activate, annealing can make the Er number of ions of photoactivation increase, thereby also can improve photoluminescence intensity.
Effect of the present invention and benefit are that because vacuum chamber is under the temperature of 40-60 degree in its preparation process, and the alumina crystal temperature is very high usually for preparation er-doped aluminum oxide film membrane material.Utilize the CO of low-power output
2Laser beam is shone er-doped/erbium and ytterbium codoping aluminum oxide film surface, and laser beam is heated to high temperature to sample at short notice, makes aluminium oxide generation liquid phase crystallization, reaches the effect that improves er-doped alumina material fluorescence intensity.
Description of drawings
Fig. 1 is CO
2The laser annealing system synoptic diagram.
Among Fig. 1: 1He-Ne laser instrument, 2CO
2Laser instrument, 3 computer control systems, 4 decay lens, 5 sample adjusting brackets.
The ytterbium erbium of Fig. 2 after for different technical parameters annealing laser mixed Al altogether
2O
3The film surface appearance synoptic diagram.
Among Fig. 2: a is not for adding the decay extender lens, 1 second sample of annealing time; B is positioned at one times of focal length place for adding the decay extender lens, 4 seconds sample of annealing time; C is positioned at three times of focal length places for adding the decay extender lens, annealing time 60 seconds; D is positioned at three times of focal length places for adding the decay extender lens, 32 seconds sample of annealing time.
Fig. 3 is the fluorescence Spectra synoptic diagram of different samples.
Among Fig. 3: 6 are the fluorescent spectrum through laser annealing, and 7 are the fluorescent spectrum through thermal annealing, and 8 is not annealed fluorescent spectrum, and 9 is wavelength (nanometer), and 10 is fluorescence Spectra intensity, and fluorescence intensity level is an arbitrary unit.
Fig. 4 is that fluorescence Spectra intensity changes synoptic diagram with the laser beam off-centring.
Among Fig. 4: 11 is the fluorescence Spectra variation of annealing under one times of focal length, 12 is that the fluorescence Spectra of annealing under two times of focal lengths changes, and 13 is the fluorescence Spectra variation of annealing three times of focal lengths under, 14 be with the center spot side-play amount (centimetre), 15 is fluorescence Spectra intensity, and fluorescence intensity level is an arbitrary unit.
Embodiment
Be described in detail specific embodiments of the invention below in conjunction with technical scheme and accompanying drawing.
This method utilizes laser beam that er-doped/erbium and ytterbium codoping aluminum oxide film is shone, and the operating power of control laser instrument and the distance of sample and decay lens.Embodiment proves that this method is a kind of method of effective raising er-doped aluminum oxide film membrane material fluorescence intensity.
Embodiment:
The laser annealing embodiment device as shown in Figure 1.CO
2The form of laser output beam (continuous/pulse), time and pulsed frequency, dutycycle all can be regulated by power-supply controller of electric.The He-Ne laser instrument is used for auxiliary 10.6 mum wavelength CO
2Laser Output Beam is mixed Al altogether at the ytterbium erbium
2O
3Space orientation on the film sample.CO
2The laser instrument output facula is φ 3mm, if shine directly into the film sample surface, energy is too concentrated first, and technological parameter is wayward, the time slightly length will cause film surface fusing hole burning, even substrate explosion; Second laser beam energy is that Gauss distributes, can not uniform strength annealing on the irradiated area.Therefore, make light beam shine sample surfaces more in large area, equably by the decay extender lens.The laser continuous power output of considering 60W is strong excessively, adopts the square-wave pulse mode to export, and frequency is 40kHz.
The ytterbium erbium that the inventor utilizes the auxiliary microwave plasma magnetron sputtering technique deposition of radio frequency to prepare a collection of different technical parameters, different levels of doping is mixed Al altogether
2O
3Film.Each sputtering sedimentation prepares six 20 * 20mm simultaneously
2The film sample of size, existing is example with concentration of Er 0.2at.%, the film sample of mixing ytterbium concentration 1.4at.%.
The ytterbium erbium of Fig. 2 after for different technical parameters annealing laser mixed Al altogether
2O
3Film surface scanning electron microscope (SEM) image.Wherein, Fig. 2 (a) is when not adding the decay extender lens, CO
2Laser beam shines directly into the surface topography image of annealing on the film sample surface, annealing time 1 second.As can be seen, both having made enlargement ratio is 100 times, because laser energy is concentrated, film surface is explosion; Fig. 2 (b) utilizes focal length for the lens of 20mm laser beam to be carried out decay expansion bundle, and film sample places one times of focal length place of lens, annealing time 4 seconds.The surface topography that can see sample is still very coarse; Fig. 2 (c) then places film sample three times of focal length places, annealing time 60 seconds, enlargement ratio is 1000 times, the existing bigger Fig. 2 of improvement (d) of surface topography is with film sample is placed three times of focal length places, annealing time was reduced to 32 seconds, enlargement ratio is 1000 times, surface topography to unannealed before similar substantially.Find out that thus different spatial, different time that sample is in laser beam have very big influence to the surface topography of film.
Pump light source is that specified continuous power output is the 980nm semiconductor laser of 2W, and its output beam shines directly into the end face of film sample after convergent lens focuses on.1.53 the photoluminescence spectra about μ m is focused into the entrance slit that is mapped to monochromator after being collected by convergent lens via optical chopper.The be coupled InGaAs near infrared detector of semiconductor refrigerating of the exit slit of monochromator.The electric signal of detector output is amplified by lock-in amplifier, and carries out data processing and waveform demonstration by computing machine.Whole measuring process is carried out under room temperature environment.
Fig. 3 is that the ytterbium erbium of laser annealing is mixed Al altogether
2O
3The synthetic comparison diagram of film photoluminescence spectra (spectral line 6) and thermal annealing photoluminescence spectra (spectral line 7).Can see that the peak strength of spectral line 6 is 1095 (arbitrary units), be 14.6 times of spectral line 7 peak strengths 75.Because the ytterbium erbium of the auxiliary microwave plasma deposition of radio frequency is mixed Al altogether
2O
3Film, the unannealed preceding crystalline attitude of right and wrong, therefore the photoluminescence spectral line 8 (having taken advantage of 100 times) before the annealing crest do not occur at 1.53 mu m wavebands.
Fig. 4 is that the ytterbium erbium is mixed Al altogether
2O
3Film is after laser annealing, and photoluminescence spectrum peak value intensity is with the relation of laser beam radial variations.Place 1 times of focal length place laser annealing of lens when film sample after, the photoluminescence spectral intensity distributes at the tangible Gauss of the radially one-tenth of spot center point, is that the 1.5mm place drops to half of peak value at radius; After film sample placed 2 times of focal length place laser annealings of lens, photoluminescence spectrum peak value intensity descended to some extent than the annealing of 1 times of focal length, but photoluminescence intensity does not have obvious variation in the 3.5mm radius region, radius during greater than 6mm spectral intensity begin to descend; After film sample places 3 times of focal length place laser annealings of lens, sample photoluminescence intensity center is on a declining curve to the 2mm place, increase and slowly increase with radial distance greater than 2mm fluorescence Spectra intensity, though bulk strength will be weaker than the sample of 1 times and 2 times focal length, but the fluctuation of intensity illustrates that less than the former variation the homogeneity of annealing is better.Above-mentioned measurement indication, Guass hot spot can be by well being improved the distance between laser beam expanding, increase film sample and lens in the photoluminescence intensity heterogeneity that radially produces.Suitably increase laser irradiation time and can reach identical annealing effect.
Find among the embodiment that the power of laser illumination is all relevant with the annealing effect with the time.There is a power bracket in laser work, crystallization could take place greater than the threshold power alpha-alumina crystals, and the excessive film surface of power can form laser hole burning, and equally also there is this scope in laser irradiation time, and the laser works correlation parameter can obtain by embodiment.Significant advantage of laser annealing is the area that can control sample effect.Therefore, the er-doped or the ytterbium erbium of even doping preparation are mixed Al altogether
2O
3When carrying out regulating in the zones of different different laser annealing technique parameter on the film sample, can cause the annealing temperature of film sample to change by design proposal with the zone.Al under the different annealing temperature effect
2O
3The crystalline state difference, the erbium ion difference that is activated can reach the purpose of control erbium ion concentration equally, and then makes the non-uniform doping optical waveguides amplifier.
Claims (3)
1. a method of utilizing laser annealing to improve rare earth mixed aluminum oxide Film Optics characteristic is characterized in that utilizing laser beam irradiation to produce localized hyperthermia's crystallization aluminium oxide; Implementation step is to utilize computer-controlled CO2 laser instrument that er-doped/erbium, ytterbium are total to the alumina doped film to shine, and laser beam produces high temperature in aluminum oxide film, and the aluminum oxide film crystallization degree is improved.
2. a kind of method of utilizing laser annealing to improve rare earth mixed aluminum oxide Film Optics characteristic according to claim 1, it is characterized in that: laser light path utilizes the He-Ne laser instrument that light path is regulated, the CO of outgoing
2Hot spot carries out strength retrogression and spot shaping through the overdamping concavees lens, and the light spot energy that obtains is moderate, and the non-homogeneous Gaussian distribution of light beam obtains on average.
3. a kind of method of utilizing laser annealing to improve rare earth mixed aluminum oxide Film Optics characteristic according to claim 1, it is characterized in that: there is a power bracket in laser work, crystallization could take place greater than the threshold power alpha-alumina crystals, laser power can be by adjusting the control of sample and lens position, equally also there is working range in laser irradiation time, sample position is at three times of focal length places, and annealing time is 32 seconds.
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Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN102844852A (en) * | 2009-12-15 | 2012-12-26 | 爱克西可法国公司 | Method for making semiconductor device by laser irradiation |
CN108955582A (en) * | 2018-06-21 | 2018-12-07 | 中国人民解放军战略支援部队航天工程大学 | Laser focal beam spot area measuring device |
CN111489968A (en) * | 2019-01-29 | 2020-08-04 | 武汉锐晶激光芯片技术有限公司 | Laser-assisted heating annealing method |
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JPS61185702A (en) * | 1985-02-14 | 1986-08-19 | Fujikura Ltd | Optical fiber |
JPS62205267A (en) * | 1986-03-06 | 1987-09-09 | Toshiba Corp | Production of aluminum oxide film |
JPS63276823A (en) * | 1987-05-06 | 1988-11-15 | Furukawa Electric Co Ltd:The | Manufacture of superconductive film |
JPH0680844B2 (en) * | 1987-09-14 | 1994-10-12 | 富士電機株式会社 | Superconducting circuit manufacturing method |
JPH0827980B2 (en) * | 1989-01-23 | 1996-03-21 | 松下電器産業株式会社 | Optical information recording / reproducing / erasing member |
EP0454585B1 (en) * | 1990-04-27 | 1994-08-03 | Nippon Telegraph And Telephone Corporation | An antenna selection diversity reception system |
KR100353418B1 (en) * | 1999-03-11 | 2002-09-18 | 삼성전자 주식회사 | Manufacturing erbium doped optical fiber formed grating therein and optical fiber amplifier using it |
JP3977038B2 (en) * | 2001-08-27 | 2007-09-19 | 株式会社半導体エネルギー研究所 | Laser irradiation apparatus and laser irradiation method |
JP2005129769A (en) * | 2003-10-24 | 2005-05-19 | Hitachi Ltd | Method for modifying semiconductor thin film, modified semiconductor thin film, method for evaluating the same, thin film transistor formed of semiconductor thin film, and image display device having circuit constituted by using the thin film transistor |
CN1621929A (en) * | 2004-12-14 | 2005-06-01 | 大连理工大学 | Process for the manufacture of Er doped / Er, Yb codoping aluminium oxide optical wave guide amplifier |
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Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
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CN102844852A (en) * | 2009-12-15 | 2012-12-26 | 爱克西可法国公司 | Method for making semiconductor device by laser irradiation |
CN102844852B (en) * | 2009-12-15 | 2016-06-08 | 激光系统解决方案欧洲公司 | The method making semiconductor device is irradiated by laser |
CN108955582A (en) * | 2018-06-21 | 2018-12-07 | 中国人民解放军战略支援部队航天工程大学 | Laser focal beam spot area measuring device |
CN111489968A (en) * | 2019-01-29 | 2020-08-04 | 武汉锐晶激光芯片技术有限公司 | Laser-assisted heating annealing method |
CN111489968B (en) * | 2019-01-29 | 2023-07-25 | 武汉锐晶激光芯片技术有限公司 | Laser-assisted heating annealing method |
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