CN1725027A - Method of realizing single board station testing and its system - Google Patents
Method of realizing single board station testing and its system Download PDFInfo
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- CN1725027A CN1725027A CN 200410050816 CN200410050816A CN1725027A CN 1725027 A CN1725027 A CN 1725027A CN 200410050816 CN200410050816 CN 200410050816 CN 200410050816 A CN200410050816 A CN 200410050816A CN 1725027 A CN1725027 A CN 1725027A
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Abstract
The invention is a method and system for realizing mono-chip working position testing, and the method includes the steps: starting up a testing background system and selecting the required testing items; communicating a foreground mono-chip with the background system, where the foreground mono-chip is normally power-on and enters in a testing mode; the background system starts up testing and sends the information corresponding to the testing items to the foreground mono-chip in turn; the foreground mono-chip receives the information to resolve it and makes a testing processing flow on it and after primary testing is completed, returns tested result in a fixed information returning form to the background system; the background system receives the tested result and then makes the corresponding resolution according to different testing items and displays the tested result in the interface of the background system. The invention raises the speed of a MCU processing other functions.
Description
Technical field
The present invention relates to a kind of method and system thereof of hardware single board station test of field of automatic testing, relate in particular to by monolithic processor controlled veneer and on station, carry out various hardware devices, performance and functional test and the method and the system thereof of multiple combined test repeatedly.
Background technology
The station test of veneer is the test step that veneer must be finished before dispatching from the factory, and its purpose is in order to guarantee the reliability and stability of veneer, to comprise: device detection, functional test and simple three aspects of performance test.Device detection mainly is meant to be tested the device path on the veneer; Can functional test be realize that to veneer its concrete function items tests; Simple performance test is meant to be tested basic performance index.Mono-chip working position method of testing commonly used at present is that the code of increase test was tested before entering formal board software working procedure accordingly in board software.Main realization flow is that the project that will need successively to test is tested item by item then the result to be returned successively and print to hyper terminal by standard output function and shown, must repeat to carry out according to top flow process if want repeatedly to test.
There is following defective in the above-mentioned method of testing of prior art: at first, the method for this test lacks dirigibility, and directly perceived inadequately, the tester can not select tested project dynamically.Not out-of-date when wherein a certain test of appearance, if want again it just to be tested and must all survey all test items again one time, so just influenced the speed and the efficient of mono-chip working position test greatly, unfavorable to producing.Secondly, since to test result what return employing is the standard input-output function of using always, printing is a kind of operation at a slow speed, when needing at short notice to print in a large number, communication port (serial ports etc.) output is too many to the resource occupation of system, and too much print statement causes taking a large amount of program's memory spaces, and the required application space of the normal operation of application program is reduced, and the difficulty that causes function of application to realize increases.
Therefore, there is defective in prior art, and awaits improving and development.
Summary of the invention
The purpose of this invention is to provide a kind of method and system thereof that realizes the mono-chip working position test, be in order to overcome single-chip microcomputer limited storage space in the prior art, station test underaction is shortcoming intuitively, therefore, a kind of method of carrying out the mono-chip working position test with the AM/BAM alternant way has been proposed, this method will be saved the shared space of a large amount of print statements, and with a large amount of explanatory, prompts is transferred to background process and shown; The backstage also can strengthen dirigibility, speed and the efficient of station test according to the different method of testing of different test item designs of veneer simultaneously.
Method of the present invention realizes by following scheme:
A kind of method that realizes the mono-chip working position test, described method of testing comprises the steps:
A) test item that startup testing background system, and selection needs;
B) foreground veneer is carried out communication with background system by communication port and be connected, described foreground veneer normally powers on and enters test pattern;
C) described background system starts test, and the pairing message of test item is issued described foreground veneer successively;
D) after described foreground veneer is received message, carry out the parsing of message, and carry out the test processes flow process of corresponding message, return to described background system according to fixing return messages form after once test finishes;
E) described background system is received the test result that described foreground veneer is beamed back, and resolves and be shown to the interface of described background system accordingly according to different test items.
Described method, wherein, described method also comprises:
F) receive that described background system interface transmits cease and desist order or after message is finished in the test of receiving described foreground veneer, end of test (EOT).
A kind of system of described realization mono-chip working position test wherein, comprises a foreground veneer in the described system, a background system and other testing tools, described foreground veneer carry out communication with described background system by communication port and be connected;
Described foreground veneer is a veneer to be tested, directly carries out the station test of this foreground veneer and the result is reported described background system;
Described background system is positioned on the multi-purpose computer, by each test item of clicking trigger, and test post is dealt into described foreground veneer, carries out the parsing and the demonstration of test result according to the foreground message that receives simultaneously;
Described testing tool is connected on the described foreground veneer, is used for tested usefulness or measures test result usefulness.
Described system, wherein, described communication port is a serial ports.
Described system, wherein, described communication port is a network interface.
A kind of method and system thereof that realizes the mono-chip working position test provided by the present invention, because the AM/BAM alternant way that the output result who has adopted the AM/BAM system that mono-chip working position is tested shows on the backstage, make the mono-chip working position test procedure content on foreground reduce, saved memory headroom, station test mode more flexibly also is provided simultaneously, the tester can come test item is selected on the backstage, the parameter that also can input test needs, can also be more abundant in the content performance of test result, a large amount of test results can process on the backstage, reduced the processing of foreground single-chip microcomputer, improved the processing speed of single-chip microcomputer other functions.
Description of drawings
Fig. 1 is the mono-chip working position test architecture figure of the inventive method;
Fig. 2 is the mono-chip working position method of testing process flow diagram of the inventive method.
Embodiment
Below in conjunction with accompanying drawing implementation method is described in detail.
Comprise a foreground veneer in the described system, a background system and other testing tools, described foreground veneer and background system, carry out communication and connect as serial ports or network interface etc. by communication port.
Described foreground veneer is a veneer to be tested, directly carries out the station test of this foreground veneer and the result is reported background system.
Described background system is positioned on the multi-purpose computer, by the various test items of clicking trigger, and test post is dealt into foreground veneer, carry out the parsing and the demonstration of test result according to the foreground message that receives simultaneously, system of the present invention can repeatedly select, repeat test, test when also can carry out the test of independent test item and many test items.
Described testing tool is connected on the foreground veneer, is used for tested usefulness or measure test result and use.
Described method of testing of the present invention comprises the steps:
1, the test item that startup testing background system, and selection needs.
2, foreground veneer is linked to each other by communication port (serial ports or network interface etc.) with background system, foreground veneer normally powers on and enters test pattern.
3, background system starts test, and the pairing message of test item is issued foreground veneer successively.
4, after foreground veneer is received message, carry out the parsing of message, and carry out the test processes flow process of corresponding message, return to background system according to fixing return messages form after once test finishes.
5, background system is received the test result that foreground veneer is beamed back, and resolves and be shown to the background system interface accordingly according to different test items.
6, receive that the background system interface transmits cease and desist order or after message is finished in the test of receiving foreground veneer 0, end of test (EOT).
As shown in Figure 1, the system of realization mono-chip working position test of the present invention has comprised several parts of foreground veneer station test: testing tool is the instrument that the hardware of veneer is carried out basic test; Foreground veneer is meant tested single board system, and it should comprise the testing software of veneer inside.Background system is meant that the test that links to each other by communication port (serial ports or network interface etc.) with described foreground veneer is initiated and the system of demonstration.
As shown in Figure 2, be the method flow diagram that the present invention realizes the mono-chip working position test.After the background system that starts the mono-chip working position test and foreground veneer power on, select to carry out individual event test or multinomial test according to the needs of user test, the debugging communication port (serial ports or network interface etc.) that is connected with foreground veneer by background system one by one of the message that will test sends to described foreground veneer then.Described foreground veneer after (foreground software just) does corresponding processing in this foreground veneer software, is responded corresponding test post and is given background system after receiving test post.Background system receives that the bar test post responds the result, and good according to a preconcerted arrangement analysis mode is done corresponding parsing to receiveing the response, and shows result after the parsing by the background system interface at last.Simultaneously different test items is set corresponding timeout treatment, overtime back is pointed out the tester and is proceeded the test of next selected test item.Test item for needs manually stop then starts the back at this test item and shows the button that stops to test, and thinks up to the tester not stop when needing to test.
In mobile communication system, be that example is described the process of carrying out the station test with this patent method below with monolithic processor controlled radio frequency veneer.
The main hardware of veneer comprises I2C, E2PROM, 16C554, AD7859 etc., testing tool comprises oscillograph, multimeter, GPIB card etc., by serial ports tested foreground veneer is linked to each other with the station testing background system, simultaneously testing tool is linked to each other with foreground veneer, build a mono-chip working position test macro.At first, formulate at the background system interface test item to corresponding hardware, to the test item of functional test.Between background system and foreground veneer, provide the test post frame structure of corresponding test item then, and the analysis protocol that test is receiveed the response to foreground veneer.Its step is as follows:
On the background system interface, set up device test item: I2C, E2PROM, 16C554, AD7859 testing button; Functional test item parameter load button is joined number etc. as phaselocked loop; The test result display window.
1, at first, starting the station testing background system powers on the station test foreground system of foreground veneer simultaneously.
2, click the device test item and initiate the device test command, can test item by item also and can multinomially test.
3, message structure framing according to the rules sends to the test foreground veneer by communication port (serial ports or network interface etc.).Described foreground veneer is tested according to different command words after receiving test post, returns test result.The form of test result also is to return with the message structure that provides.
4, described background system waits for that the test of foreground veneer receives the response, and carries out the judgement that whether this test is stopped simultaneously.If stop the test directly arrive step 6.
5, carry out overtime judgement,, show overtimely, jump to step 6 again if overtime; Do not have overtime then backstage after receiving the test return messages, good according to the rules form is resolved, and increases the corresponding results display items in the display window of backstage, checks for the tester.
Whether is the individual event test 6,, be the test of then carrying out step 7; Otherwise, send the test post repeating step 3,4 and 5 of next test item to foreground veneer, finish up to all device detection items tests.
7, after device detection is finished, carry out the test parameter setting.Phaselocked loop is set joins numerical value, carry out phase-locked-loop configuration, by testing tool some functions of foreground veneer are carried out simulation test again behind the pll lock, test result shows by instrument.Test is finished.
The method and the system thereof of realization mono-chip working position of the present invention test can not only satisfy basic station test, can also increase dynamically and delete that the work of doing only is to increase corresponding message, has dirigibility and practicality according to different testing single-boards.
Should be pointed out that the above embodiment of the present invention description is too concrete, can not therefore be interpreted as the restriction of request scope of patent protection of the present invention, scope of patent protection of the present invention should be as the criterion with claims.
Claims (5)
1, a kind of method that realizes the mono-chip working position test, described method of testing comprises the steps:
A) test item that startup testing background system, and selection needs;
B) foreground veneer is carried out communication with background system by communication port and be connected, described foreground veneer normally powers on and enters test pattern;
C) described background system starts test, and the pairing message of test item is issued described foreground veneer successively;
D) after described foreground veneer is received message, carry out the parsing of message, and carry out the test processes flow process of corresponding message, return to described background system according to fixing return messages form after once test finishes;
E) described background system is received the test result that described foreground veneer is beamed back, and resolves and be shown to the interface of described background system accordingly according to different test items.
2, method according to claim 1 is characterized in that, described method also comprises:
F) receive that described background system interface transmits cease and desist order or after message is finished in the test of receiving described foreground veneer, end of test (EOT).
3, a kind of system of realization mono-chip working position test as claimed in claim 1, it is characterized in that, comprise a foreground veneer in the described system, a background system and other testing tools, described foreground veneer carry out communication with described background system by communication port and are connected;
Described foreground veneer is a veneer to be tested, directly carries out the station test of this foreground veneer and the result is reported described background system;
Described background system is positioned on the multi-purpose computer, by each test item of clicking trigger, and test post is dealt into described foreground veneer, carries out the parsing and the demonstration of test result according to the foreground message that receives simultaneously;
Described testing tool is connected on the described foreground veneer, is used for tested usefulness or measures test result usefulness.
4, system according to claim 3 is characterized in that, described communication port is a serial ports.
5, system according to claim 3 is characterized in that, described communication port is a network interface.
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 200410050816 CN1725027A (en) | 2004-07-23 | 2004-07-23 | Method of realizing single board station testing and its system |
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| Application Number | Priority Date | Filing Date | Title |
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| CN 200410050816 CN1725027A (en) | 2004-07-23 | 2004-07-23 | Method of realizing single board station testing and its system |
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| CN1725027A true CN1725027A (en) | 2006-01-25 |
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Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102262207A (en) * | 2010-05-27 | 2011-11-30 | 上海华虹Nec电子有限公司 | Method for rapidly judging test result of SOC (System-On-a-Chip) chip |
| CN102621432A (en) * | 2012-04-11 | 2012-08-01 | 北京四方继保自动化股份有限公司 | Method for automatically testing single board of protective relay device |
| CN101688888B (en) * | 2007-06-07 | 2013-04-17 | Abb技术有限公司 | Increased reliability in the processing of digital signals |
| CN108761302A (en) * | 2018-03-02 | 2018-11-06 | 深圳怡化电脑股份有限公司 | The method and system that currency examination device mainboard is tested |
| CN109765478A (en) * | 2019-01-16 | 2019-05-17 | 浙江众合科技股份有限公司 | A kind of interactive single board testing system |
| CN110687429A (en) * | 2019-09-18 | 2020-01-14 | 西安万像电子科技有限公司 | Single board testing method, single board and system |
-
2004
- 2004-07-23 CN CN 200410050816 patent/CN1725027A/en active Pending
Cited By (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101688888B (en) * | 2007-06-07 | 2013-04-17 | Abb技术有限公司 | Increased reliability in the processing of digital signals |
| CN102262207A (en) * | 2010-05-27 | 2011-11-30 | 上海华虹Nec电子有限公司 | Method for rapidly judging test result of SOC (System-On-a-Chip) chip |
| CN102621432A (en) * | 2012-04-11 | 2012-08-01 | 北京四方继保自动化股份有限公司 | Method for automatically testing single board of protective relay device |
| CN102621432B (en) * | 2012-04-11 | 2014-02-05 | 北京四方继保自动化股份有限公司 | Method for automatically testing single board of protective relay device |
| CN108761302A (en) * | 2018-03-02 | 2018-11-06 | 深圳怡化电脑股份有限公司 | The method and system that currency examination device mainboard is tested |
| CN109765478A (en) * | 2019-01-16 | 2019-05-17 | 浙江众合科技股份有限公司 | A kind of interactive single board testing system |
| CN110687429A (en) * | 2019-09-18 | 2020-01-14 | 西安万像电子科技有限公司 | Single board testing method, single board and system |
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