CN1707465A - Automatic comparing system and method for testing point of main machine board - Google Patents
Automatic comparing system and method for testing point of main machine board Download PDFInfo
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- CN1707465A CN1707465A CN 200410027634 CN200410027634A CN1707465A CN 1707465 A CN1707465 A CN 1707465A CN 200410027634 CN200410027634 CN 200410027634 CN 200410027634 A CN200410027634 A CN 200410027634A CN 1707465 A CN1707465 A CN 1707465A
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Abstract
The present invention reveals automatic comparison system and method for the test point of mainboard. The system includes one application server, one database, and several client end computers. The application server is for the automatic comparison between the designed graphic file in source mainboard and that in target mainboard and generation of dissimilarity information report of mainboard test points. The application server includes: one test point information pick-up module, one listing information creating module, one comparison module and one dissimilarity information report creating module. The client end computers access the application server via network to obtain relative information.
Description
[technical field]
The invention relates to a kind of test point of mainboard and compare system and method automatically.
[background technology]
The competition of modern enterprise is more and more fierce, and for guaranteeing the market competition status of enterprise, how to enhance productivity has become a big focus of enterprise.Along with the raising of computer hardware performance and the reduction of price, the application of computing machine in the test of printed circuit board (PCB) popularized, and promotes the speed and the quality of test step greatly.At present, (whether Printed CircuitBoard PCB) has short circuit or the situation that opens circuit to testing printed circuit board, can use the electronics mode to test.Electronic Testing is checked all connections by flying needle detection instrument (Flying-Probe).And in the Electronic Testing mode, for the design version of a printed circuit board (PCB) different times, the slip-stick artist need spend the more time on the adjustment measurement jig.As in the motherboard R﹠D process, can produce the design version of different times usually.But with regard to each version, its physical construction, hardware structure are basic identical, and what changed has only wiring path, functional module and test point usually.These changes with the naked eye comparison not only consume energy but also take time.Wherein test point is the probe of measurement jig and the contact point of printed circuit board (PCB).
For solving above-mentioned shortcoming, need provide a kind of test point of mainboard to compare system and method automatically, it can compare two test points in the different designs version motherboard automatically, generate a form about different test point information, the slip-stick artist only needs that according to form the probe of same measurement jig is done simple change the (increase, reduce or displacement) then can test the motherboard of different editions, thereby raises labour productivity and reduce man-made failure operation.
[summary of the invention]
Fundamental purpose of the present invention is to provide a kind of test point of mainboard to compare system and method automatically, and it can be compared the information of all test points in two different editions motherboard designed graphic documents, generates the form of a different test point at last.
The present invention discloses a kind of test point of mainboard and compares system automatically.This test point of mainboard comparison system automatically comprises: an application server, a connection, a database, network, and a plurality of client computers.The client computer of distributed distribution links to each other with application server by network; This application server connects by one and links to each other with a database; Wherein, network is to be a kind of electric network, and it can be intranet (Intranet), Internet (Internet) or other type network; Connection is that a kind of database connects, as the open type data storehouse connect (OpenDatabase Connectivity, ODBC), perhaps the Java database connect (Java DatabaseConnectivity, JDBC) etc.A plurality of client computers provide an interactive user interface, and the user can check the information of all different test points on source host plate and the destination host plate by this interface.Database is used for the motherboard designed graphic document of each design version of storage host plate R﹠D process.Application server is used for comparing automatically at the test point of source host plate designed graphic document and destination host plate designed graphic document (following source designed graphic document and the target design figure shelves of abbreviating as respectively), puts different information report thereby generate one about host board testing.The different information that this form comprises has: aspect at the coordinate of the test quantity on the Net, each test point, Pad Stack (pad stack) type, Pad Stack title, Pad Stack place etc. in variable condition, target design figure shelves and the source designed graphic document of the title of vicissitudinous Net sequence number, Net, the last test point of Net in source designed graphic document and the target design figure shelves.
The present invention also provides a kind of test point of mainboard automatic comparison method, and this method includes following steps: the motherboard designed graphic document of (a) selecting two different editions; (b) information of all test points in the motherboard designed graphic document of two different editions of acquisition; (c) generate the tabulation of the information of two test points according to the information that captured; (d) information of test point in two tabulations of comparison; (e) form of generation one different test point information.
By utilizing system and method for the present invention, only need that the probe of same measurement jig is done simple change the (increase, reduce or displacement) and then can test the motherboard of different editions, thereby improved the work efficiency of test organization.
[description of drawings]
Fig. 1 is the hardware structure figure that compares system for test point of mainboard of the present invention automatically.
Fig. 2 is a functional block diagram of comparing the application server of system for test point of mainboard of the present invention automatically.
Fig. 3 is the operation process chart for the automatic comparison method of test point of mainboard of the present invention.
Fig. 4 is the different information report figure of test point that compares system for test point of mainboard of the present invention automatically.
[embodiment]
As shown in Figure 1, be the hardware structure figure that compares system for test point of mainboard of the present invention automatically.Wherein, this test point of mainboard comparison system automatically comprises: an application server 2, connects 3, one database 4, network 5, reaches a plurality of client computers 6.The client computer 6 of distributed distribution links to each other with application server 2 by network 5; This application server 2 connects 3 by one and links to each other with a database 4; Wherein, network 5 is to be a kind of electric network, and it can be intranet (Intranet), Internet (Internet) or other type network; Connecting 3 is that a kind of database connects, as the open type data storehouse connect (Open DatabaseConnectivity, ODBC), perhaps the Java database connect (Java DatabaseConnectivity, JDBC) etc.A plurality of client computers 6 provide an interactive user interface, and the user can check the information of all different test points on source host plate and the destination host plate by this interface.Database 4 is used for the motherboard designed graphic document of each design version of storage host plate R﹠D process.Application server 2 is used for comparing automatically at the test point of source host plate designed graphic document and destination host plate designed graphic document (following source designed graphic document and the target design figure shelves of abbreviating as respectively), puts different information report thereby generate one about host board testing.The different information that this form comprises has: aspect at the coordinate of the test quantity on the Net, each test point, Pad Stack (pad stack) type, Pad Stack title, Pad Stack place etc. in variable condition, target design figure shelves and the source designed graphic document of the title of vicissitudinous Net sequence number, Net, the last test point of Net in source designed graphic document and the target design figure shelves.
As shown in Figure 2, be the functional block diagram of comparing the application server of system for test point of mainboard of the present invention automatically.This application server 2 includes: a test point information extraction module 10, a tabulation generation module 20, a comparing module 30, an and different information report generation module 40.After the user selects a source designed graphic document and target design figure shelves, the relevant information of test point in test point information extraction module 10 acquisition source designed graphic documents and the target design figure shelves; Tabulation generation module 20 is to be used for respectively generating a tabulation according to the test point relevant information that is captured, and each tabulation comprises the relevant information of all test points in this designed graphic document; Comparing module 30 is two tabulations that are used to compare generation; Different information report generation module 40 is used for generating a different information report according to comparison result.
As shown in Figure 3, be operation process chart for the automatic comparison method of test point of mainboard of the present invention.At first, the user selects a source designed graphic document and target design figure shelves (step S300) as requested; Then, the information (step S301) of all test points in the test point information extraction module 10 acquisition source designed graphic documents; Tabulation generation module 20 information according to the test point that is captured generate test point tabulation (step S302); Simultaneously, all test point information (step S303) in the test point information extraction module 10 acquisition target design figure shelves; Table generation module 20 also generates a tabulation (step S304) according to the information of the test point that is captured side by side; Comparing module 30 is with two tabulations compare (step S305) of above-mentioned gained; At last, generate a different information report according to comparison result, this form comprises all different test point information (step S306) in two designed graphic documents.
As shown in Figure 4, be the different information report figure of test point that compares system automatically and generated for test point of mainboard of the present invention.The information that this form comprises all different test points in source designed graphic document and the target design figure shelves is promptly: vicissitudinous Net sequence number (No.) in source designed graphic document and the target design figure shelves, the title of Net (Net Name), the variable condition of the last test point of Net (Status), test quantity (TPNumber) in target design figure shelves and the source designed graphic document on the Net, the coordinate of each test point (Location), Pad Stack type (Pad Type), Pad Stack title (Pad Name), and the aspect (TP Layer) at Pad Stack place.For example: the vicissitudinous sequence number of test point is 1 Net, the name of its Net is called+12V, the state of the last test point of Net is for increasing, target design figure shelves are that the test point quantity on 1 the Net is 1 and the source designed graphic document is test point quantity on 1 the Net at sequence number is 0 at sequence number, be that the coordinate of the test point on 1 the Net is for (100.0-8545.0) at sequence number in the target design figure shelves, the Pad Name name of this test point is called S42D30, Pad Stack type is Pin, and Pad Stack place aspect is Etch/Bottom.
Claims (5)
1. a test point of mainboard is compared system automatically, is used for comparing at the test point of the two motherboard designed graphic documents of selecting, and it comprises a database and an application server, it is characterized in that, this test point of mainboard comparison system automatically comprises:
Database is used for the motherboard designed graphic document of each design version of storage host plate R﹠D process;
Application server comprises:
One test point information extraction module is the test point information that is used to capture the motherboard designed graphic document of two different editions;
One tabulation generation module is to be used for generating corresponding tabulation according to the test point information of each the motherboard designed graphic document that is captured;
One comparing module is to be used for all test point information of two tabulations are compared one by one;
One different information report generation module is according to the form of comparison result generation one about the information of different test point.
2. test point of mainboard as claimed in claim 1 is compared system automatically, it is characterized in that, wherein this test point of mainboard is compared system automatically and also included a connection, and database links to each other with application server by this connection.
3. test point of mainboard as claimed in claim 1 is compared system automatically, it is characterized in that wherein said form includes: the aspect at the coordinate of the test quantity on the Net, each test point, Pad Stack type, Pad Stack title, Pad Stack place in variable condition, target design figure shelves and the source designed graphic document of the title of different Net sequence number, Net, the last test point of Net in the two motherboard designed graphic documents.
4. automatic comparison method of test point of mainboard is characterized in that this method includes following steps:
Select the motherboard designed graphic document of two different editions;
The information of all test points in the motherboard designed graphic document of two different editions of acquisition;
Generate the tabulation of the information of two test points according to the information that is captured;
Compare the information of test point in two tabulations;
Generate the form of a different test point information.
5. the automatic comparison method of test point of mainboard as claimed in claim 4, it is characterized in that wherein said form includes: the aspect at the coordinate of the test quantity on the Net, each test point, Pad Stack type, Pad Stack title, Pad Stack place in variable condition, target design figure shelves and the source designed graphic document of the title of different Net sequence number, Net, the last test point of Net in the two motherboard designed graphic documents.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 200410027634 CN1707465A (en) | 2004-06-07 | 2004-06-07 | Automatic comparing system and method for testing point of main machine board |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 200410027634 CN1707465A (en) | 2004-06-07 | 2004-06-07 | Automatic comparing system and method for testing point of main machine board |
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| Publication Number | Publication Date |
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| CN1707465A true CN1707465A (en) | 2005-12-14 |
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| Application Number | Title | Priority Date | Filing Date |
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| CN 200410027634 Pending CN1707465A (en) | 2004-06-07 | 2004-06-07 | Automatic comparing system and method for testing point of main machine board |
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102166747A (en) * | 2010-02-26 | 2011-08-31 | 鸿富锦精密工业（深圳）有限公司 | System for testing object by mechanical arm and method thereof |
| CN102567152A (en) * | 2010-12-27 | 2012-07-11 | 佛山市顺德区顺达电脑厂有限公司 | Automatic point-sorting system for on-line test device and method thereof |
-
2004
- 2004-06-07 CN CN 200410027634 patent/CN1707465A/en active Pending
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102166747A (en) * | 2010-02-26 | 2011-08-31 | 鸿富锦精密工业（深圳）有限公司 | System for testing object by mechanical arm and method thereof |
| CN102567152A (en) * | 2010-12-27 | 2012-07-11 | 佛山市顺德区顺达电脑厂有限公司 | Automatic point-sorting system for on-line test device and method thereof |
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