CN1667423A - Display test system and method - Google Patents
Display test system and method Download PDFInfo
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- CN1667423A CN1667423A CN 200510054393 CN200510054393A CN1667423A CN 1667423 A CN1667423 A CN 1667423A CN 200510054393 CN200510054393 CN 200510054393 CN 200510054393 A CN200510054393 A CN 200510054393A CN 1667423 A CN1667423 A CN 1667423A
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Abstract
The invention relates to a display measurement system and method, wherein, the system comprises a base plate, several signal lines on base plate, a drive circuit with several connection pads separately electrically connected to several signal lines, several first test points on base plate and electrically connected to several connection pans, and several first switches separately electrically connected to several first test points and several connection pads, wherein, the number of first test points is less than the number of connection pads.
Description
(1) technical field
The invention relates to a kind of test circuit of display, particularly about a kind of test macro and method of LCD.
(2) background technology
The test structure of membrane transistor LCD (TFT-LCD) mainly is divided into two kinds in the prior art, and a kind of is whole contact tests (full contact), and a kind of is short-circuit rods test (shorting bar).
Fig. 1 shows the framework of whole contact tests in the prior art.Test circuit comprises several sweep traces 101 and several data lines 102, and several data lines 102 of these several sweep traces 101 and this are orthogonal staggered.And test structure comprises two groups of input signals in order to test circuit, and one group is image signal 103, and another group is scanning signal 104, and these two groups of signals are all by dividing other test point 105 and 105 ' come test circuits.Its circuit working pattern is tested the point of aforementioned sweep trace and every data line 102 one by one for when scanning signal 104 is opened one of them bar sweep trace 101 by image signal 103.Although all contact test (fullcontact) can obtain complete test information, yet must have different test platforms made to order when but varying in size because of panel, so just cause the raising of manufacturing cost, moreover, the making of the minimum precision specification of test platform also is a restriction greatly of whole contact tests (full contact).
Fig. 2 shows the framework of short-circuit rods test (shorting bar) in the prior art.Its test circuit is same as aforesaid test circuit, also comprises several sweep traces 201 and several data lines 202.And test structure also comprises two groups of input signals, image signal 203 and scanning signal 204, and this two signal also is by dividing other test point 205 and 205 ' come test circuits in the same manner.Different is, the short-circuit rods test is connected the data line of fixed qty with the metal wire on the processing procedure 206 and 206 ', to improve the problem of test platform precision deficiency, such as U.S. Pat 5825196 announcement, be a kind of short-circuit rods test mode, at first first sub-pixel in the pixel is connected to first short-circuit rods, second sub-pixel is connected to second short-circuit rods and the 3rd sub-pixel is connected to the 3rd short-circuit rods, then only provide signal to first short-circuit rods, so picture then show first sub-pixel the color that should show.Then provide signal in regular turn, so just can find out defective to second short-circuit rods and the 3rd short-circuit rods.Yet because the simplification in the design causes trickle picture to test, the integrality of test data is under suspicion.Moreover, after test is finished, need utilize laser or additive method with the place of short circuit open circuit, not only increase burden on the processing procedure in this, more may bring other consequence that can't expect.
(3) summary of the invention
In view of this, need propose a kind of test structure that is applied to display, it not only can be along with demand be tested accurately, and can solve the problem of making the specification difficulty on the prior art.
The object of the present invention is to provide a kind of test macro of display, it can reach the shared purpose of test platform by the design of multiplex's control circuit.
Another object of the present invention is to provide a kind of test macro of display, test (full contact) to realize accurate test as whole contact, or test is as the purpose of short-circuit rods test (shortingbar) fast.
A further object of the present invention is to provide a kind of method of testing of display, avoids using destructive cutting action and the decline that causes fiduciary level on the processing procedure.
The object of the present invention is achieved like this: a kind of test macro of display comprises: several signal line one drive circuits, have several connection gaskets (IC pad), and be electrically connected to several signal line; Several test points are electrically connected to this connection gasket; And several switches, electrically connecting these several test points and this connection gasket wherein, the number of test point is less than the number of connection gasket.
The object of the present invention is achieved like this: a kind of method of testing of display, comprise: a substrate is provided, have several signal line, one drive circuit, several test points and several switches on the substrate, wherein said driving circuit comprises several connection gaskets, described signal line is electrically connected to described several connection gaskets, described several switches electrically connect described several connection gaskets and described several test points, and the number of described several test points is less than the number of described several connection gaskets; Input one test signal is to described several test points; And import one first signal to described several switches so that form between described several test points and described several connection gaskets and open circuit.
Effect of the present invention:
The test macro of display of the present invention and method propose a kind of test structure that is applied to display, and it not only can be along with demand be tested accurately, and can solve the problem of making the specification difficulty on the prior art.
For further specifying above-mentioned purpose of the present invention, design feature and effect, the present invention is described in detail below with reference to accompanying drawing.
(4) description of drawings
Fig. 1 shows the whole contact test of LCD (full contact) configuration diagram in the prior art;
Fig. 2 shows LCD short-circuit rods test (shorting bar) configuration diagram in the prior art;
Fig. 3 shows display apparatus test system schematic of the present invention;
Fig. 4 shows multiplexer and multiplex's control circuit local circuit synoptic diagram of display apparatus test of the present invention system;
Fig. 5 shows another local circuit synoptic diagram of multiplex's control circuit of display apparatus test of the present invention system; And
Fig. 6 shows another embodiment synoptic diagram of display apparatus test of the present invention system.
101,201 sweep traces, 102,202 data lines
103,203 image signals, 104,204 scanning signals
105,205 test points, 206 short-circuit rods
301 multiplex's control circuits, 302 scan drive circuits
303 multiplexers, 304 picture-display-regions
41 multiplex's control circuits, 411,413,415,417 set of test spots
412,414,416 switches set, 4111,4112,4131 test points
4121,4122 switches, 418 control circuits
419 test pattern signals, 42 multiplexers
421 connection gasket groups, 4211,4212,4213,4214 connection gaskets
511,513 set of test spots, 512 switches set
5111,5112,5113,5131 test points, 5121,5122,5123 switches
61 multiplex's control circuits, 611 switches set
6111,6112,6113,6114 switches, 612 set of test spots
6121 test points
(5) embodiment
Next be in conjunction with the accompanying drawings, the test macro of display of the present invention and the embodiment of method are elaborated.The detailed process and the operation principles that do not comprise the display apparatus test system in the following explanation.The prior art that the present invention continued to use is only done quoting of emphasis formula at this, to help elaboration of the present invention.And relevant diagram is also drawn according to actual ratio in the following interior literary composition, and its effect is only giving expression to feature of the present invention.
The test macro of display of the present invention is for there being most first test points on substrate, be electrically connected to driving circuit, wherein driving circuit is electrically connected to most bar signal line, and most first test points are connected to second test point by switch respectively, and the second test point number is less than first test point.After end of test (EOT), import a signal to this switch to close the connection between test point and the driving circuit.Further application of the invention is that driving circuit comprises many connection gaskets (IC pad), utilizes switches set to be connected to test point, and wherein these test point numbers are less than connection gasket (IC pad) number.
Fig. 3 shows one of display apparatus test of the present invention system embodiment.Driving circuit of the present invention is linked to picture-display-region 304 with image signal by selected test point, under the generalized case, driving circuit can comprise multiplex's control circuit 301 and multiplexer 303, wherein test points selected depends on user's demand, for example, when the test of user's demand better quality, use more test point, when the user considers the cost test, use less test point, what deserves to be explained is that multiplex's control circuit 301 is not limited at this, it also can be divided into the combination of a plurality of multiplex's control circuits, and each multiplex's control circuit has at least image signal is transmitted after tested and the path of switches set, and will divide other image signal to be sent to multiplexer 303 at last, and multiplex's control circuit 301 more can provide a perfect interface, is sent to scan drive circuit 302 and multiplexer 303 respectively in order to will drive signal and to switch signal.Scan drive circuit 302 be incorporated into face glass on, and, provide the signal in proper order of horizontal scanning according to the driving signal of multiplex's control circuit 301, drive signal in this and also can independently input to scan drive circuit 302.Multiplexer 303 is integrated the signal of vertical direction according to the switching signal of multiplex's control circuit 301, and image signal is sent to picture-display-region 304.Picture-display-region 304 is according to the position of switching signal to determine that picture shows of the driving signal and the multiplexer 303 of scan drive circuit 302, and then the image signal according to multiplexer 303 comes display frame.At this for convenience of explanation, picture-display-region does not present pixel cell; Yet, be familiar with those skilled in the art when the framework of knowing a perfect lattice row display (dots matrixdisplay) and peripheral circuit thereof, wherein in several signal line, comprised the signal line that can show different colours, for example, when the test signal is put after tested and is sent to multiplexer, and will test signal by multiplexer and input to a signal line, at this, signal line is divided into three groups usually, example: first signal line is in order to show that red signals, second signal line are in order to show that green signal, the 3rd signal line are in order to show blue signal.
Fig. 4 is one of multiplexer 42 and multiplex's control circuit 41 local circuit synoptic diagram in the display apparatus test system.Multiplexer 42 comprises connection gasket group 421, in order to be connected to the contact hole of other system, connection gasket group 421 comprises most connection gaskets, and the number of connection gasket and spacing (pitch) are size and the resolution that depends on picture-display-region, for example, when its resolution of picture-display-region in the time of 3 was 480 * 320, then the number of connection gasket was 480, and spacing is 30 microns.Be simplified illustration, will be only as an illustration in following example with connection gasket 4211 and 4212.The set of test spots 411 of multiplex's control circuit 41 among the figure, 413,415,417 do not show all test points, be example and also will only get test point 4111 and 4112, then switches set 412,414 in the following description, 416 do not show all switches yet, only take away pass 4121 and 4122 in the following description yet and are example.Set of test spots 411 is identical with connection gasket group 421 numbers and corresponding respectively, as test point 4111 corresponding connection gaskets 4211, and test point 4112 corresponding connection gaskets 4212.Spacing that what deserves to be explained is test point 4111 and 4112 can the elasticity adjustment, test for probe (probe card) as adjusting a suitable spacing in the scope that can use in system, for example, when the making of probe is difficult to meet 30 microns of connection gasket group 421 spacings, it is 50 microns that 411 of set of test spots are adjusted its spacing, so just meets the manufacturing specification of probe.Illustrate further, as import the test mode of image signals via set of test spots 411 with probe, just be equal to whole contact test (fullcontact) modes, that is to say via the method not single only to detect picture element flaw with the pure color picture, more can allow the panel display gray scale, disturb (cross talk) or flicker (flicker) picture mutually, to reach the purpose that detects the panel quality.
Then switches set 412 is controlled by control circuit 418.Switches set 412 is in order to link set of test spots 411 and set of test spots 413.For example, test point 4111 is linked to test point 4131 by switch 4121, and switch 4121 can be a nmos switch element in one embodiment, and is not limited at this, also can as the on-off element that uses PMOS.What deserves to be explained is that it is not limited that set of test spots 411 is linked to set of test spots 413 by switches set 412, in one embodiment, test point 4111 and 4112 is attached to test point 4131 by switch 4121 and 4122 short circuits respectively.So just to cause the test point number of set of test spots 413 be half of set of test spots 411 to structure.Certainly, the test point number of set of test spots 413 is that 1/3rd of set of test spots 411 also is passable.See also Fig. 5, in this embodiment, set of test spots 511 comprises test point 5111,5112 and 5113, test point 5111,5112 and 5113 pass through the switch 5121 of switches set 512 respectively, 5122 and 5123 are connected to test point 5131, in this structure as can be known, the test point number of set of test spots 513 is set of test spots 511 number of test points purposes 1/3, be noted that at this, set of test spots 511 is to link by switch with set of test spots 513, and the number of set of test spots 513 can be depending on client's demand, for example, need more accurate test report when keeping product quality as the client, can use more set of test spots test (as set of test spots 511), or the client be only need test major function for the low cost of begging to surrender the time, just can use less set of test spots test (as set of test spots 513), so the integrality of test function and test speed have just determined the number of test point.The rest may be inferred, and utilization is set up a hierarchy and controlled with a controlling signal also is the place that the present invention uses.
Consult Fig. 4 once more, set of test spots 413 is connected to set of test spots 415 by switches set 414, and then set of test spots 415 is connected to set of test spots 417 by switches set 416, because of identical with foregoing structure, is the application of higher stratum only, will not give unnecessary details at this.
Test pattern signal 419 inputs to control circuit 418 and uses that set of test spots in order to decision.In one embodiment, use test point group 411 test, then the multiplex (MUX) of control circuit 418 export 1, the multiplex (MUX) export 2 and the multiplex (MUX) export 3 and do not drive.Among another embodiment, 413 tests of use test point group, then the multiplex (MUX) of control circuit 418 exports 1 driving, and the multiplex (MUX) export 2 and the multiplex (MUX) export 3 and do not drive, for example, when switch that switches set 412,414,416 is formed for NMOS, and test pattern signal 419 is a logic high voltage, the multiplex (MUX) exports 1 conducting (being short circuit), the multiplex (MUX) export 2 and the multiplex (MUX) export 3 not conductings (promptly opening circuit), then as can be known by circuit structure, switch 4121 and 4122 short circuits, test point 4111 is linked to test point 4131 with test point 4112 short circuits.Be noted that the present invention utilizes test pattern signal 419 to decide by what group test point and tests, and what deserves to be explained is that test pattern signal 419 is not limited to logic high voltage, for example when the switch signal was PMOS, test pattern signal 419 was low-voltage.
Consult Fig. 6, Fig. 6 is another embodiment of the present invention, and multiplexer 42 comprises connection gasket group 421 in order to be connected to the contact hole of other system, and connection gasket group 421 comprises most connection gaskets, at this for the purpose of simplifying the description, only as an illustration with connection gasket 4211,4212,4213 and 4214.Multiplex's control circuit 61 comprises switches set 611 and set of test spots 612 among the figure, this for convenience of explanation also will be only with switch 6111,6112,6113 and 6114 and test point 6121 explanations.Controlling signal off switch group 611 in one embodiment, for example, switch 6111,6112,6113 and 6114 conductings, then connection gasket 4211,4212,4213 and 4214 is just by switch 6111,6112,6113 and 6114 conductings, be connected to test point 6121, will test signal at last and input to test point 6121.It should be noted that at this utilizing switches set is not limited to connect connection gasket group and test point, two connection gaskets or five connection gaskets are connected to a test point also can, and several connection gaskets will be connected, this is to depend on that the tester is consideration for the requirement of product quality and the cost of test.Multiplexer then can be formed on the substrate by low temperature polycrystalline silicon (Low TemperaturePoly-Silicon) processing procedure.
Those of ordinary skill in the art will be appreciated that, above embodiment is used for illustrating the present invention, and be not to be used as limitation of the invention, as long as in connotation scope of the present invention, all will drop in the scope of claims of the present invention variation, the modification of the above embodiment.
Claims (19)
1. the test macro of a display is characterized in that comprising:
One substrate;
Several signal line are positioned on the described substrate;
One drive circuit has several connection gaskets, is electrically connected to described several signal line respectively;
Several first test points are positioned on the described substrate, are electrically connected to described several connection gaskets; And
Several first switches electrically connect described several first test points and electrically connect described several connection gaskets respectively, and the number of wherein said several first test points is less than the number of described several connection gaskets.
2. the test macro of display as claimed in claim 1 is characterized in that described several first switches are PMOS.
3. the test macro of display as claimed in claim 1 is characterized in that described several first switches are NMOS.
4. the test macro of display as claimed in claim 1 is characterized in that also comprising several second test points, is positioned on the described substrate, and electrically connects described several connection gaskets and described several first switches respectively.
5. the test macro of display as claimed in claim 4 is characterized in that the number of described several second test points equals the number of described several connection gaskets.
6. the test macro of display as claimed in claim 4 is characterized in that also comprising several second switches, electrically connects described several second test points and described several connection gaskets.
7. the test macro of display as claimed in claim 6 is characterized in that the number of described several second test points is less than the number of described several connection gaskets.
8. the test macro of display as claimed in claim 1 is characterized in that described several signal line comprise several first signal line, several second signal line and several the 3rd signal line.
9. the test macro of display as claimed in claim 8, it is characterized in that described driving circuit comprises a multiplexer, in order to a test signal is inputed to described several first signal line, described several second signal line or described several the 3rd signal line.
10. the test macro of display as claimed in claim 8 is characterized in that described several first signal line are in order to input red display signal.
11. the test macro of display as claimed in claim 8 is characterized in that described several second signal line are in order to import green display signal.
12. the test macro of display as claimed in claim 8 is characterized in that described several the 3rd signal line are in order to import blue display signal.
13. the test macro of display as claimed in claim 9 is characterized in that described multiplexer is to be formed on the substrate with the low temperature polycrystalline silicon processing procedure.
14. the method for testing of a display is characterized in that comprising:
One substrate is provided, have several signal line, one drive circuit, several test points and several switches on the substrate, wherein said driving circuit comprises several connection gaskets, described signal line is electrically connected to described several connection gaskets, described several switches electrically connect described several connection gaskets and described several test points, and the number of described several test points is less than the number of described several connection gaskets;
Input one test signal is to described several test points; And
Importing one first signal to described several switches so that form between described several test points and described several connection gaskets opens circuit.
15. the method for testing of display as claimed in claim 14 is characterized in that also comprising before the step of described input one test signal:
Import one second signal to described on-off circuit, so that form short circuit between described several test points and this several connection gaskets.
16. the method for testing of display as claimed in claim 14, it is characterized in that described several signal line comprise several first signal line, several second signal line and several the 3rd signal line, described driving circuit comprises a multiplexer, and the step of described input one test signal comprises:
Import described test signal to described several first signal line by described multiplexer
Import described test signal to described several second signal line by described multiplexer; And
Import described test signal to described several the 3rd signal line by described multiplexer.
17. the method for testing of display as claimed in claim 16 is characterized in that described several first signal line are in order to input red display signal.
18. the method for testing of display as claimed in claim 16 is characterized in that described several second signal line are in order to import green display signal.
19. the method for testing of display as claimed in claim 16 is characterized in that described several the 3rd signal line are in order to import blue display signal.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CNB2005100543935A CN100371721C (en) | 2005-03-08 | 2005-03-08 | Display test system and method |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CNB2005100543935A CN100371721C (en) | 2005-03-08 | 2005-03-08 | Display test system and method |
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| CN1667423A true CN1667423A (en) | 2005-09-14 |
| CN100371721C CN100371721C (en) | 2008-02-27 |
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| CNB2005100543935A Active CN100371721C (en) | 2005-03-08 | 2005-03-08 | Display test system and method |
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Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101153978B (en) * | 2006-09-29 | 2010-05-12 | 胜华科技股份有限公司 | Matching table forming method of inside and outside joint cushion and its matching method |
| CN101452123B (en) * | 2007-12-07 | 2010-09-22 | 北京京东方光电科技有限公司 | Substrate test circuit |
| CN101515442B (en) * | 2008-02-21 | 2012-06-06 | 中华映管股份有限公司 | Peripheral circuit |
| CN113436562A (en) * | 2021-06-24 | 2021-09-24 | 京东方科技集团股份有限公司 | Display panel, test method and display device |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP3235618B2 (en) * | 1995-12-28 | 2001-12-04 | 松下電器産業株式会社 | Liquid crystal display panel manufacturing method |
-
2005
- 2005-03-08 CN CNB2005100543935A patent/CN100371721C/en active Active
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101153978B (en) * | 2006-09-29 | 2010-05-12 | 胜华科技股份有限公司 | Matching table forming method of inside and outside joint cushion and its matching method |
| CN101452123B (en) * | 2007-12-07 | 2010-09-22 | 北京京东方光电科技有限公司 | Substrate test circuit |
| CN101515442B (en) * | 2008-02-21 | 2012-06-06 | 中华映管股份有限公司 | Peripheral circuit |
| CN113436562A (en) * | 2021-06-24 | 2021-09-24 | 京东方科技集团股份有限公司 | Display panel, test method and display device |
| CN113436562B (en) * | 2021-06-24 | 2023-12-19 | 京东方科技集团股份有限公司 | Display panel, testing method and display device |
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| Publication number | Publication date |
|---|---|
| CN100371721C (en) | 2008-02-27 |
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