CN1661378A - Tft阵列及其试验方法、试验装置 - Google Patents
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Abstract
本发明提供一种TFT阵列及其试验装置,其可于电流拷贝型像素中,在接近实际使用状态的状态下,测定驱动用晶体管的电流量且试验像素是否存在缺陷。上述问题可通过一种像素的TFT阵列而解决,其特征在于含有像素,该像素包含控制电流量的晶体管、连接于上述晶体管的栅极端子与源极端子之间的电容器、连接于上述晶体管的栅极端子与漏极端子之间的第一开关、实行上述第一开关的控制的第一控制线、一端连接于上述晶体管的漏极端子的第二开关,以及实行上述第二开关的控制的第二控制线。
Description
技术领域
本发明涉及一种驱动EL元件的TFT阵列及其试验方法、试验装置,特别是涉及含有电流拷贝型像素的TFT阵列及其试验方法、试验装置。
背景技术
近年来作为平面/面板/显示器的显示用元件,EL元件(电致发光元件)受到瞩目。由于EL元件为自发光型元件,因而与先前的利用液晶的显示元件相比,具有所谓显示色域较广且消耗电力较小的特征。
EL元件的发光亮度根据驱动电流而变化。因此,EL元件驱动用的TFT阵列必须具有与先前的电压控制型的液晶用的TFT阵列不同,且可控制施加于发光元件的电流量的构成(参照日本专利文献1、2)。
在图2中表示代表性的EL元件驱动用的TFT阵列的像素2的电流拷贝型的像素构成。连接有EL元件25(TFT阵列的状态下未封入)的电极15、28为电极15接地且电极28连接于晶体管开关23。晶体管开关23的他端连接于供给EL元件25的驱动电流的驱动用晶体管22的漏极端子。驱动用晶体管22的栅极端子与源极端子之间连接有电容器24。在驱动用晶体管22的源极端子连接有设置于像素2外的EL元件25的驱动用电源27。另外,在驱动用晶体管22的栅极端子与漏极端子之间连接有晶体管开关21,且在漏极端子连接有其他晶体管开关20。晶体管开关20与21均通过相同的控制线12实行接通断开动作。另外,晶体管开关20的他端连接于数据线10,且数据线连接于设置于像素2外的电流源26。
接着,就图2的像素2的动作加以说明。首先,于控制线12施加电压将开关20与21设为接通状态,并且于控制线16施加断开电压将开关23设为断开状态。则自电源27供给的电流经由驱动用晶体管22与开关20流入电流源26。此时流动的电流量I通过电流源26而得以规定。另外,由于开关21为接通状态,因而电容器24得以充电。充电后的电容器24的电势等于电流量I流动于驱动用晶体管22时的栅极/源极间电压V。
当电容器24充电完毕则于控制线12施加断开电压将开关20与21设为断开状态。由于开关21为断开状态,因而电容器24保持电势差V。其后,于控制线16施加电压并将开关23设为接通状态。则自电源27供给的电流经由驱动用晶体管22与开关23流动于EL元件25。此时流动于EL元件25的电流量通过驱动用晶体管22的栅极/源极间电压得以控制。由于在驱动用晶体管22的栅极/源极之间连接有充电为电势差V的电容器24,因而栅极/源极之间的电压成为V。如上所述,栅极/源极间电压为V时,流动于驱动晶体管22的电流量成为I,因而电流量I的驱动电流会流动于EL元件25。
如此,图2的驱动晶体管22具有所谓于断绝与电流源26的连接后也可以电流源26所规定的电流量I驱动EL元件25的特征。将具有如此特征的像素称为电流拷贝型像素。再者,电极15不必接地,也可采用连接于特定电压源等的使用方面。
【日本专利文献1】日本专利特开2004-4801号公报
【日本专利文献2】日本专利特开2003-323152号公报
[发明所欲解决的问题]
TFT阵列是在基板上通过蚀刻、蒸镀、旋涂等不安定的制程依序形成各功能零件而得以制造,因而会制造出含有像素缺陷的TFT阵列。因此,必须试验于所制造的TFT阵列中是否含有像素缺陷。TFT阵列的像素缺陷的检查是通过与接地于数据线10的电流源26相同电流量的电流是否供给至EL元件25而加以判断。但,由于若在TFT阵列封入EL元件25后发现缺陷则会浪费高价的EL元件25,因而较好的是在封入EL元件前试验TFT阵列的像素缺陷。另外,在未封入EL元件25的状态下,由于图2的驱动电路未成为闭合电路,因而没有驱动电流流动。
此处,可考虑采用通过将流动于驱动用晶体管22的电流流动于除去电流源26的数据线10,并测定其电流量,从而实行与实际使用状态相近的电流量的测定的方法。具体地,在将电容器24充电为特定电压V后,将数据线10设为与实际使用状态的电极15相同的电势(本实施例中为接地),将流动于驱动用晶体管22的漏极/源极间的电流流动于数据线10,并实行流动于数据线10的电流量I的测定。
另外,由于图2的像素2为第一晶体管与第二晶体管的接通断开动作联锁的构造,因而若在数据线10的电流量测定时将开关20设为接通状态,则开关21也会联锁而成为接通状态。其结果为,仅可测定栅极电极与漏极电极为相同电势时的IV特性。但,由于在实际使用时将开关21设为断开状态而驱动EL元件25,因而栅极电极与漏极电极并非为相同电势。因此,存在所谓在图2的像素2中无法测定流动于实际使用状态下的驱动用晶体管22的电流的问题。
发明内容
本发明通过一种TFT阵列而解决上述问题,其特征在于含有像素,该像素包含控制电流量的晶体管、连接于上述晶体管的栅极端子与源极端子之间的电容器、连接于上述晶体管的栅极端子与漏极端子之间的第一开关、实行上述第一开关的控制的第一控制线、一端连接于上述晶体管的漏极端子的第二开关,以及实行上述第二开关的控制的第二控制线。
即,通过独立地控制第一开关与第二开关而测定流动于实际使用时的动作点的驱动用晶体管的电流。更具体的是,通过一种试验方法而解决上述问题,其含有将电源连接于晶体管的源极端子的步骤、将第一开关以及第二开关设为接通状态的步骤、于第二开关的他端施加特定电流并将电容器充电的步骤、停止电流的施加并且将上述第一开关设为断开状态的步骤,以及测定流动于第二开关的电流量或流动于晶体管的电流量的步骤。
[发明效果]
根据本发明可在电流拷贝型像素中,以较接近实际使用状态的状态,测定驱动用晶体管的电流量,并试验像素是否存在缺陷。
附图说明
图1为本发明的像素与试验装置的说明图。
图2为先前的电流拷贝型像素的概略构成图。
图3为本发明相关的TFT阵列与试验装置的概略构成图。
具体实施方式
[实施例]
以下参照图式就本发明的优选实施方面详细地加以说明。图3为本发明的TFT阵列4与试验装置3的概略构成图。另外,图1为更详细地表示成为试验对象的像素1与试验装置3的电性连接的说明图。
TFT阵列4以矩阵状排列有复数个像素1。将供给驱动电流至EL元件(TFT阵列4的状态下未封入)的电源线11与用以选择像素的控制线70、数据线10连接于各像素。控制线70具有选择成为试验对象的像素的功能的数字信号线,更具体的是如图1般包含3条控制线12、13、14。另外,数据线10具有选择成为试验对象的像素的功能并且具有表示EL元件的驱动电流量(发光亮度)的作用的模拟信号线。另外,试验装置3包含将电源供给至电源线11的电源27、依据测定序列控制施加于控制线70(12、13、14)的电压的序列器62、以及存储有测定用的电流源61或电流计60等的测定部71。再者,开关20、21、23中的任一开关均为P通道的FET,当于栅极端子施加-5V时则成为接通状态(接通电压),施加0V则成为断开状态(断开电压)。
接着,就像素1与试验装置3参照图1详细地加以说明。本实施例的像素1与先前技术中说明的图2的像素2在开关20的控制线12与开关21的控制线13为独立设置的方面差异较大。
EL元件(未封入)所连接的电极15、28为电极15接地且电极28连接于晶体管开关23。晶体管开关23的他端连接于供给EL元件的驱动电流的驱动用晶体管22的漏极端子。在驱动用晶体管22的栅极端子与源极端子之间连接有电容器24。另外,在驱动用晶体管22的栅极端子与漏极端子之间连接有晶体管开关21,且在漏极端子连接有其他晶体管开关20。晶体管开关20通过控制线12控制接通断开,晶体管开关21通过控制线13控制接通断开。
接着,就图1的像素1以及试验装置3的动作加以说明。首先,序列器62于控制线12以及控制线13施加接通电压,将开关20与21设为接通状态。于控制线14施加断开电压,将开关23设为断开状态。另外,开关31与电流源61连接。则自电源27所供给的电流经由驱动用晶体管22与开关20流入电流源61。此时流动的电流量I通过电流源61而规定。另外,由于开关21处于接通状态,因而电容器24得以充电。充电后的电容器24的电势V等于电流量I流动于驱动用晶体管22时的栅极/源极之间的电压V。
电容器24充电完毕则序列器62于控制线13施加断开电压,将开关21设为断开状态。切换开关31与电流计60连接。由于开关21处于断开状态,因而电容器24保持电势差V,且于晶体管22流动电流量I的电流。晶体管22的电流经由开关20流动于数据线10。通过以电流计60测定该电流而测定流动于晶体管22的电流量I。所测定的电流量I若与电流源61的电流量相同,则可确认像素1正常动作。
再者,本实施例中将封入EL元件前的TFT阵列作为试验对象,但本发明对EL元件封入后的TFT面板也可以相同方法实行动作试验。另外,开关20、21、23可为可自像素1的外部控制接通断开的开关,也可为N通道的FET开关,也可为晶体管开关以外的开关。另外,电流计60的他端不必如本实施例般直接接地,也可经由电阻器或电源等接地。另外,用以测定流动于晶体管22的电流量的电流计60也可适当变更,不必如本实施例般设于开关31的输出侧,也可设置于开关31的输入侧,也可设置于电源线11等。电流计60也可为复数个。例如若测定数据线10与电源线11的两个电流量,则可同时测定像素1内的泄漏电流量。
以上,将本发明的技术性思想参照特定的实施例并且详细加以说明,但本发明的所属领域相关人员应了解:可以不背离权利要求的主旨以及范围的方式增加各种变更以及改变。
Claims (4)
1.一种TFT阵列,其特征在于含有像素,该像素包含
晶体管,其控制电流量,
电容器,其连接于上述晶体管的栅极端子与源极端子之间,
第一开关,其连接于上述晶体管的栅极端子与漏极端子之间,
第一控制线,其实行上述第一开关的控制,
第二开关,其一端连接于上述晶体管的漏极端子,以及
第二控制线,其实行上述第二开关的控制。
2.如权利要求1的TFT阵列,其中上述像素进而包含
电极,其连接上述EL元件,
第三开关,其连接于上述电极与上述晶体管的漏极端子之间,以及
第三控制线,其实行上述第三开关的控制。
3.一种试验方法,其特征在于其是具有像素的TFT阵列的试验方法,该像素含有
晶体管,其控制电流量,
电容器,其连接于上述晶体管的栅极端子与源极端子之间,
第一开关,其连接于上述晶体管的栅极端子与漏极端子之间,以及
第二开关,其一端连接于上述晶体管的漏极端子;该方法含有
将电源连接于上述晶体管的源极端子的步骤,
将上述第一开关以及上述第二开关设为接通状态的步骤,
于上述第二开关的他端施加特定的电流,将上述电容器充电的步骤,
停止上述电流的施加并且将上述第一开关设为断开状态的步骤,以及
测定流动于上述第二开关的电流量的步骤。
4.一种试验装置,其特征在于其是实行具有像素的TFT阵列的试验的试验装置,该像素含有
晶体管,其控制电流量,
电容器,其连接于上述晶体管的栅极端子与源极端子之间,
第一开关,其连接于上述晶体管的栅极端子与漏极端子之间,以及
第二开关,其一端连接于上述晶体管的漏极端子;又具有
电流源,其连接于上述第二开关的他端,
电源,其连接于上述晶体管的源极端子,
控制机构,其控制上述第一开关以及上述第二开关,以及
电流测量机构,其测定流入上述晶体管的电流量。
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JP2004052046 | 2004-02-26 | ||
JP2004052046A JP2005242003A (ja) | 2004-02-26 | 2004-02-26 | Tftアレイおよびその試験方法、試験装置 |
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US (1) | US20050190169A1 (zh) |
JP (1) | JP2005242003A (zh) |
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Cited By (2)
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CN100405068C (zh) * | 2006-01-13 | 2008-07-23 | 友达光电股份有限公司 | 有机发光显示面板的测试装置与方法 |
CN103927971A (zh) * | 2013-01-15 | 2014-07-16 | 三星显示有限公司 | 有机发光显示装置及测试该装置的方法 |
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JP2006073712A (ja) * | 2004-09-01 | 2006-03-16 | Agilent Technol Inc | Tftアレイ試験方法および試験装置 |
KR101348406B1 (ko) * | 2005-03-14 | 2014-01-07 | 엘지디스플레이 주식회사 | 구동회로 및 이를 포함하는 유기 이엘 디스플레이 장치 |
CN116794866B (zh) * | 2023-06-29 | 2024-05-10 | 京东方科技集团股份有限公司 | 显示面板、显示装置及母板 |
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TW299448B (zh) * | 1995-07-20 | 1997-03-01 | Matsushita Electric Ind Co Ltd | |
TW578124B (en) * | 2003-01-03 | 2004-03-01 | Au Optronics Corp | Method and driver for reducing power consumption of an LCD panel in a standby mode |
US7333099B2 (en) * | 2003-01-06 | 2008-02-19 | Semiconductor Energy Laboratory Co., Ltd. | Electronic circuit, display device, and electronic apparatus |
US7215369B2 (en) * | 2003-04-02 | 2007-05-08 | Micron Technology, Inc. | Compact pixel reset circuits using reversed current readout |
US6937687B2 (en) * | 2003-10-21 | 2005-08-30 | Au Optronics Corporation | Bi-directional shift register control circuit |
-
2004
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CN100405068C (zh) * | 2006-01-13 | 2008-07-23 | 友达光电股份有限公司 | 有机发光显示面板的测试装置与方法 |
CN103927971A (zh) * | 2013-01-15 | 2014-07-16 | 三星显示有限公司 | 有机发光显示装置及测试该装置的方法 |
CN103927971B (zh) * | 2013-01-15 | 2018-07-06 | 三星显示有限公司 | 有机发光显示装置及测试该装置的方法 |
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US20050190169A1 (en) | 2005-09-01 |
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JP2005242003A (ja) | 2005-09-08 |
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