CN1614632A - 调制传递函数测量方法和系统 - Google Patents
调制传递函数测量方法和系统 Download PDFInfo
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- CN1614632A CN1614632A CNA2003101196942A CN200310119694A CN1614632A CN 1614632 A CN1614632 A CN 1614632A CN A2003101196942 A CNA2003101196942 A CN A2003101196942A CN 200310119694 A CN200310119694 A CN 200310119694A CN 1614632 A CN1614632 A CN 1614632A
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- 238000000034 method Methods 0.000 title claims abstract description 20
- 238000012546 transfer Methods 0.000 title abstract description 6
- 230000000877 morphologic effect Effects 0.000 claims abstract description 15
- 230000009466 transformation Effects 0.000 claims description 9
- 238000001514 detection method Methods 0.000 claims description 3
- 238000012797 qualification Methods 0.000 claims description 3
- 238000005070 sampling Methods 0.000 abstract description 5
- 238000006243 chemical reaction Methods 0.000 abstract 1
- 238000010586 diagram Methods 0.000 description 7
- 230000009471 action Effects 0.000 description 6
- 230000006870 function Effects 0.000 description 6
- 230000008569 process Effects 0.000 description 5
- 238000005260 corrosion Methods 0.000 description 2
- 230000007797 corrosion Effects 0.000 description 2
- 230000008901 benefit Effects 0.000 description 1
- 230000008859 change Effects 0.000 description 1
- 238000002591 computed tomography Methods 0.000 description 1
- 230000010339 dilation Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000003628 erosive effect Effects 0.000 description 1
- 238000003384 imaging method Methods 0.000 description 1
- 230000001788 irregular Effects 0.000 description 1
- 239000011159 matrix material Substances 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 238000000691 measurement method Methods 0.000 description 1
- 230000015654 memory Effects 0.000 description 1
- 238000005457 optimization Methods 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 230000000007 visual effect Effects 0.000 description 1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
- G01M11/02—Testing optical properties
- G01M11/0292—Testing optical properties of objectives by measuring the optical modulation transfer function
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/60—Analysis of geometric attributes
- G06T7/66—Analysis of geometric attributes of image moments or centre of gravity
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/70—Determining position or orientation of objects or cameras
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- Analytical Chemistry (AREA)
- Geometry (AREA)
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Abstract
Description
Claims (8)
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CNB2003101196942A CN1306454C (zh) | 2003-11-06 | 2003-11-06 | 调制传递函数测量方法和系统 |
JP2004205729A JP4102785B2 (ja) | 2003-11-06 | 2004-07-13 | Mtf測定方法および装置 |
DE102004053685A DE102004053685A1 (de) | 2003-11-06 | 2004-11-03 | MTF-Messverfahren und System |
US10/981,916 US7330609B2 (en) | 2003-11-06 | 2004-11-04 | MTF measuring method and system |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CNB2003101196942A CN1306454C (zh) | 2003-11-06 | 2003-11-06 | 调制传递函数测量方法和系统 |
Publications (2)
Publication Number | Publication Date |
---|---|
CN1614632A true CN1614632A (zh) | 2005-05-11 |
CN1306454C CN1306454C (zh) | 2007-03-21 |
Family
ID=34529397
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CNB2003101196942A Expired - Fee Related CN1306454C (zh) | 2003-11-06 | 2003-11-06 | 调制传递函数测量方法和系统 |
Country Status (4)
Country | Link |
---|---|
US (1) | US7330609B2 (zh) |
JP (1) | JP4102785B2 (zh) |
CN (1) | CN1306454C (zh) |
DE (1) | DE102004053685A1 (zh) |
Cited By (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101452199B (zh) * | 2007-11-30 | 2011-03-30 | 鸿富锦精密工业(深圳)有限公司 | 调制传递函数值的测量方法 |
CN101122544B (zh) * | 2006-08-07 | 2011-07-20 | 安奇逻辑股份有限公司 | Mtf测定系统、mtf测定方法及mtf测定装置 |
CN102204828A (zh) * | 2011-05-13 | 2011-10-05 | 天津大学 | 数字x射线成像系统的调制传递函数精确测量方法 |
CN102809494A (zh) * | 2012-07-10 | 2012-12-05 | 天津大学 | 数字x射线成像系统调制传递函数的刀口法测量方法 |
CN103389309A (zh) * | 2012-05-11 | 2013-11-13 | 三星泰科威株式会社 | 用于检查过孔的方法和设备 |
CN103471811A (zh) * | 2012-06-06 | 2013-12-25 | 上海西门子医疗器械有限公司 | 测量探测量子效率的方法以及系统 |
CN104933713A (zh) * | 2015-06-12 | 2015-09-23 | 杭州电子科技大学 | 一种利用边缘分析的图像mtf估计方法 |
CN107219062A (zh) * | 2017-06-20 | 2017-09-29 | 南京航空航天大学 | 相位调制器的频响测量方法及装置 |
Families Citing this family (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE10161613A1 (de) * | 2001-12-15 | 2003-06-18 | Leica Microsystems | Verfahren zur Selbstüberwachung eines Mikroskopsystems, Mikroskopsystem und Software zur Selbstüberwachung |
US8224017B2 (en) * | 2006-01-13 | 2012-07-17 | New Jersey Institute Of Technology | Method for identifying marked content |
US20090268953A1 (en) * | 2008-04-24 | 2009-10-29 | Apteryx, Inc. | Method for the automatic adjustment of image parameter settings in an imaging system |
CN101756709A (zh) * | 2008-12-26 | 2010-06-30 | Ge医疗系统环球技术有限公司 | X射线ct设备 |
US10185303B2 (en) * | 2015-02-21 | 2019-01-22 | Kla-Tencor Corporation | Optimizing computational efficiency by multiple truncation of spatial harmonics |
US11340136B2 (en) | 2017-06-02 | 2022-05-24 | Trioptics Gmbh | Apparatus for detecting a modulation transfer function and centering of an optical system |
PL3410091T3 (pl) * | 2017-06-02 | 2022-01-17 | Trioptics Gmbh | Sposób wykrywania funkcji przenoszenia modulacji i osiowania układu optycznego |
DE202021103431U1 (de) * | 2021-06-28 | 2021-07-12 | Trioptics Gmbh | Vorrichtung zur Abbildung durch ein zu prüfendes optisches System und System zum Prüfen eines optischen Systems |
Family Cites Families (16)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4132654A (en) * | 1976-07-02 | 1979-01-02 | The Machlett Laboratories, Inc. | X-ray focal spot test system |
US4097793A (en) * | 1976-10-22 | 1978-06-27 | The Machlett Laboratories, Inc. | X-ray testing system |
US4239395A (en) * | 1978-08-07 | 1980-12-16 | Modisette James E | Radiographic imaging system quality monitor |
US4394737A (en) * | 1979-07-11 | 1983-07-19 | Fuji Photo Film Co., Ltd. | Method of processing radiographic image |
US4331021A (en) * | 1980-09-11 | 1982-05-25 | The United States Of America As Represented By The Secretary Of The Department Of Health And Human Services | Contrast resolution tissue equivalent ultrasound test object |
NL9001265A (nl) * | 1990-06-05 | 1992-01-02 | Philips Nv | Werkwijze voor bepaling van een modulatie-overdrachtfunctie van een digitaal beeldvormend systeem. |
US5657400A (en) * | 1995-01-31 | 1997-08-12 | General Electric Company | Automatic identification and correction of bad pixels in a large area solid state x-ray detector |
ES2205019T3 (es) * | 1995-03-03 | 2004-05-01 | Northrop Grumman Corporation | Medicion de la funcion de transferencia de modulacion. |
KR100271904B1 (ko) * | 1995-11-28 | 2001-01-15 | 토비 에취. 쿠스머 | X-선튜우브초점의사전교정장치와방법 |
US5760403A (en) * | 1996-04-18 | 1998-06-02 | Loral Fairchild Corp. | High modulation transfer function CCD X-ray image sensor apparatus and method |
US6233349B1 (en) * | 1997-06-20 | 2001-05-15 | General Electric Company | Apparata and methods of analyzing the focal spots of X-ray tubes |
US5959726A (en) * | 1997-07-25 | 1999-09-28 | Neopath, Inc. | Modulation transfer function test compensation for test pattern duty cycle |
DE19852324C2 (de) * | 1998-11-12 | 2000-11-16 | Siemens Ag | Phantom zur Messung von Schichtempfindlichtkeitsprofilen und der axialen Modulationstransferfunktion (MTF) an einem Röntgencomputertomographen |
US6694047B1 (en) * | 1999-07-15 | 2004-02-17 | General Electric Company | Method and apparatus for automated image quality evaluation of X-ray systems using any of multiple phantoms |
US6895077B2 (en) * | 2001-11-21 | 2005-05-17 | University Of Massachusetts Medical Center | System and method for x-ray fluoroscopic imaging |
CN1202490C (zh) * | 2003-03-19 | 2005-05-18 | 上海交通大学 | 虹膜纹理归一化处理方法 |
-
2003
- 2003-11-06 CN CNB2003101196942A patent/CN1306454C/zh not_active Expired - Fee Related
-
2004
- 2004-07-13 JP JP2004205729A patent/JP4102785B2/ja not_active Expired - Lifetime
- 2004-11-03 DE DE102004053685A patent/DE102004053685A1/de not_active Ceased
- 2004-11-04 US US10/981,916 patent/US7330609B2/en active Active
Cited By (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101122544B (zh) * | 2006-08-07 | 2011-07-20 | 安奇逻辑股份有限公司 | Mtf测定系统、mtf测定方法及mtf测定装置 |
CN101452199B (zh) * | 2007-11-30 | 2011-03-30 | 鸿富锦精密工业(深圳)有限公司 | 调制传递函数值的测量方法 |
CN102204828A (zh) * | 2011-05-13 | 2011-10-05 | 天津大学 | 数字x射线成像系统的调制传递函数精确测量方法 |
CN102204828B (zh) * | 2011-05-13 | 2013-04-10 | 天津大学 | 数字x射线成像系统的调制传递函数精确测量方法 |
CN103389309A (zh) * | 2012-05-11 | 2013-11-13 | 三星泰科威株式会社 | 用于检查过孔的方法和设备 |
CN103389309B (zh) * | 2012-05-11 | 2018-05-04 | 韩华泰科株式会社 | 用于检查过孔的方法和设备 |
CN103471811A (zh) * | 2012-06-06 | 2013-12-25 | 上海西门子医疗器械有限公司 | 测量探测量子效率的方法以及系统 |
CN102809494A (zh) * | 2012-07-10 | 2012-12-05 | 天津大学 | 数字x射线成像系统调制传递函数的刀口法测量方法 |
CN104933713A (zh) * | 2015-06-12 | 2015-09-23 | 杭州电子科技大学 | 一种利用边缘分析的图像mtf估计方法 |
CN104933713B (zh) * | 2015-06-12 | 2018-01-30 | 杭州电子科技大学 | 一种利用边缘分析的图像mtf估计方法 |
CN107219062A (zh) * | 2017-06-20 | 2017-09-29 | 南京航空航天大学 | 相位调制器的频响测量方法及装置 |
Also Published As
Publication number | Publication date |
---|---|
CN1306454C (zh) | 2007-03-21 |
JP2005137883A (ja) | 2005-06-02 |
JP4102785B2 (ja) | 2008-06-18 |
US7330609B2 (en) | 2008-02-12 |
DE102004053685A1 (de) | 2005-06-09 |
US20050100244A1 (en) | 2005-05-12 |
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Effective date of registration: 20090109 Address after: No. 2 North Yongchang Road, Beijing economic and Technological Development Zone, Beijing, China: 100176 Co-patentee after: GE Medical System Global Technology Co., Ltd. Patentee after: Air defence General Electric Medical System Co Ltd Address before: Wisconsin Patentee before: GE Medical System Global Technology Co., Ltd. |
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ASS | Succession or assignment of patent right |
Owner name: HANGWEI GENERAL ELECTRIC MEDICAL SYSTEM CO., LTD. Free format text: FORMER OWNER: GE MED SYS GLOBAL TECH CO. LLC Effective date: 20090109 |
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CF01 | Termination of patent right due to non-payment of annual fee | ||
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Granted publication date: 20070321 Termination date: 20201106 |